Abstract: Disclosed is a page buffer for a nonvolatile semiconductor memory device and a related method of operation. The page buffer includes a unidirectional driver between a loading latch unit used for storing a data bit in the page buffer and a bitline used to program a memory cell connected to the page buffer.

Abstract: Nonvolatile memory devices include a memory cell array having memory cells arranged in rows and columns, and an address storing unit that is configured to store therein an indicator of an initial column address and an indicator of an end column address, to identify a subset of the columns that extends from the initial column address to the end column address. A program circuit is configured to verify a programming operation for a selected row at the subset of the columns that extends from the initial column address to the end column address. Analogous methods of programming a nonvolatile memory device also may be provided.

Abstract: A non-volatile memory device capable of improving a read characteristic is disclosed. A non-volatile memory device includes memory blocks, each memory block having a plurality of word lines. A common source line is arranged to be shared by the memory blocks. A first transistor is connected to the common source line, and a voltage higher than a power supply voltage is applied to a gate of the first transistor during a read operation. A second transistor connects the first transistor to a reference voltage during the read operation.

Abstract: A memory device includes a non-volatile memory core that includes a memory cell array and a page buffer configured to store data to be programmed in the memory cell array. The device also includes a test data input buffer configured to receive test data from an external source, and control circuit that controls the non-volatile memory core and the test data input buffer. The control circuit is configured to load test data from the test data buffer to the page buffer, to program the loaded test data in the page buffer in the memory cell array, and to retain the test data in the page buffer for subsequent programming of the memory cell array. The device may further include a test data output buffer configured to receive data read from the memory cell array, and the control circuit may be operative to convey the read data from the test data output buffer to an external recipient.

Abstract: Method and device for programming control information, such as a flag, a control flag, a mark, or a control mark. The method and device may perform a lower-speed programming of a given cell type in a first area of memory array, confirm a result of the lower-speed programming of the given cell type in the first area of memory array, and perform a higher-speed programming of the given cell type in a second area of memory array after confirming the result of the lower-speed programming, wherein an initial programming voltage of the higher-speed programming may be different from that of the lower-speed programming. The first and second programming may be different, for example, the first programming may be a lower-speed operation, such as the writing of data, and the second programming may be a higher-speed operation, such as the writing of control information.

Abstract: A non-volatile semiconductor memory device includes memory blocks and an erase controller configured to control a multi-block erase operation where at least two of the memory blocks are simultaneously erased. According to some embodiments, after selecting and simultaneously erasing the selected memory blocks, an erase verify operation for each of the erased memory blocks is performed according to an externally provided erase verify command and block address. According to some embodiments, if a suspend command is received by the memory device while selected memory blocks are being erased, the erase operation ceases and another operation, such as a read operation, begins. When a resume command is received by the memory device, the erase operation resumes. Other embodiments are described and claimed.

Abstract: Method and device for reading data from a semiconductor device, where tR is a read operation time, tT is a buffer transfer time, and tH is a host transfer time, where at least two of tR, tT, and tH may be overlapped to reduce a total transfer time.

Abstract: A NAND-type flash memory device including a memory cell array having a plurality of memory blocks is provided.

Abstract: A dual-chip package is disclosed which includes at least two memory chips each of which may contain buffer and flash memories having different address systems from each other. Each memory chip may include a register for storing first and second flag signals each indicative of selections of corresponding memory chips, a comparator circuit for comparing the first and second flag signals in the register with a reference signal to generate a flash access signal and a buffer access signal, and a controller for controlling the buffer memory and the flash memory in response to the flash access signal and the buffer access signal.

Abstract: A flash memory system capable of inputting/outputting data in units of sectors at random. The flash memory system includes a flash memory (a cell array), a buffer memory, a random data input/output circuit, and a control circuit. The random data input/output circuit receives data in units of sectors from the buffer memory or outputs the data in units of sectors to the buffer memory. The control circuit controls the order and the number of times of inputting/outputting data between the buffer memory and the random data input/output circuit.

Abstract: A flash memory device includes a flash memory cell array, and an interface circuit, which receives a command and addresses sequentially in synchronization to an external system clock after a predetermined first latency is elapsed from when a chip enable signal is activated, in a read operation, in a program operation, and in an erase operation. The interface circuit receives the command in response to activation of an invoke signal. Therefore, since the flash memory device does not require CLE (Command Latch Enable) signals, ALE (Address Latch Enable) signals, RE (Read Enable) signals and WE (Write Enable) signals, internal circuits of the flash memory device can be simply controlled, thereby reducing a probability of skew generation in chips, improving performance, and decreasing the number of required pins.

Abstract: A flash memory device includes a flash memory and a buffer memory. The flash memory is divided into a main region and a spare region. The buffer memory is a random access memory and has the same structure as the flash memory. In addition, the flash memory device further includes control means for mapping an address of the flash memory applied from a host so as to divide a structure of the buffer memory into a main region and a spare region and for controlling the flash memory and the buffer memory to store data of the buffer memory in the flash memory or to store data of the flash memory in the buffer memory.

Abstract: A dual buffer memory system capable of improving system performance by reducing a data transmission time and a control method thereof are provided. The dual buffer memory system includes a flash memory block and a plurality of buffers. The dual buffer memory system uses a dual buffering scheme in which one buffer among the plurality of buffers interacts with the flash memory block and simultaneously a different buffer among the plurality of buffers interacts with a host. Therefore, it is possible to reduce a data transmission time between the flash memory and the host, thereby improving system performance.

Abstract: Methods of controlling a memory system having a non-volatile memory and a volatile memory are provided in which data is received that is to be stored in the non-volatile memory, the received data is temporarily stored in the volatile memory, the temporarily stored data is stored in the non-volatile memory, an address designating a region of the volatile memory as a locked region is received, an input address is received, and it is determined whether the input address corresponds to the locked region. Operation of the non-volatile and volatile memories may also be controlled such that write operations are not performed to the volatile memory if it is determined that the input address corresponds to the locked region.

Abstract: The disclosure is NAND flash memory device with a partial copy-back mode, comprised of a cell array constructed of pages, a page buffer block composed of page buffers storing data in correspondence with the pages, a selection circuit for designating one or more pages to be initialized in the partial copy-back mode, and a control circuit for generating control signals to operate the page buffers and the selection circuit.

Abstract: The disclosure is a NAND flash memory with the function of error checking and correction during a page copy operation. The NAND flash memory is able to prohibit transcription of erroneous bits to a duplicate page from a source page. Embodiments of the inventive flash memory include a correction circuit for correcting bit errors of source data stored in a page buffer, a circuit configured to provide the source data to the correction circuit and to provide correction data to the page buffer, and a copy circuit configured to copy the source data to the page buffer, and to store the correction data in the other page from the page buffer.

Abstract: A NAND-type flash memory device including a memory cell array having a plurality of memory blocks is provided.

Abstract: A NAND flash memory device includes a first and second memory blocks. A shared row selection circuit is provided between the first and second memory blocks, selectively or simultaneously selecting the first and second memory blocks, and transferring wordline voltages to a selected memory block by means in a multi-boosting manner.

Abstract: A non-volatile semiconductor memory device and/or a data processing system include a non-volatile memory array having a plurality of memory blocks and a write-protection control circuit that controls access to blocks of memory based on a start block address and an end block address. The write-protection control circuit may store start and end block addresses of an unlock region of the non-volatile memory array, and selectively activate a write enable signal according to the relationship between a write address and the start and end block addresses.

Abstract: A NAND flash memory device includes a first and second memory blocks. A shared row selection circuit is provided between the first and second memory blocks, selectively or simultaneously selecting the first and second memory blocks, and transferring wordline voltages to a selected memory block by means in a multi-boosting manner.