Patents by Inventor John Dunklee

John Dunklee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Chuck for holding a device under test
    Patent number: 7969173
    Abstract: A chuck for a probe station.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: June 28, 2011
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Chuck for holding a device under test
    Patent number: 7876115
    Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.
    Type: Grant
    Filed: February 17, 2009
    Date of Patent: January 25, 2011
    Assignee: Cascade Microtech, Inc.
    Inventors: Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rod Jones, John Dunklee, Tim Lesher, David Newton
  • Chuck for holding a device under test
    Publication number: 20100109695
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: May 6, 2010
    Inventor: John Dunklee
  • Chuck with integrated wafer support
    Patent number: 7688091
    Abstract: An improved chuck with lift pins within a probe station. The chuck assembly may have an outer periphery and an upper surface. The lift pins may be positioned within the periphery of the chuck assembly and may be capable of relative vertical movement with respect to the upper surface of the chuck assembly.
    Type: Grant
    Filed: March 10, 2008
    Date of Patent: March 30, 2010
    Assignee: Cascade Microtech, Inc.
    Inventors: Peter Andrews, Brad Froemke, John Dunklee
  • Probe station
    Patent number: 7688062
    Abstract: A probe station for testing a wafer.
    Type: Grant
    Filed: October 18, 2007
    Date of Patent: March 30, 2010
    Assignee: Cascade Microtech, Inc.
    Inventors: Greg Nordgren, John Dunklee
  • Guarded tub enclosure
    Patent number: 7639003
    Abstract: A probe station with an improved guarding structure.
    Type: Grant
    Filed: April 11, 2007
    Date of Patent: December 29, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: John Dunklee, Greg Norgden, C. Eugene Cowan
  • Fluid dispensing system
    Patent number: 7618590
    Abstract: A fluid dispensing apparatus and system for facilitating dispensing small volume, fluid samples to microfluidic devices.
    Type: Grant
    Filed: June 26, 2006
    Date of Patent: November 17, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Peter Navratil, John Martin, John Dunklee, Cali Sartor, Thane Allison
  • Probe station
    Patent number: 7554322
    Abstract: A probe station for testing a wafer.
    Type: Grant
    Filed: March 16, 2005
    Date of Patent: June 30, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: Greg Nordgren, John Dunklee
  • Chuck for holding a device under test
    Publication number: 20090153167
    Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck.
    Type: Application
    Filed: February 17, 2009
    Publication date: June 18, 2009
    Inventors: Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rodd Jones, John Dunklee, Tim Lesher, David Newton
  • Shielded probe for testing a device under test
    Patent number: 7518387
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: April 14, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Chuck for holding a device under test
    Patent number: 7518358
    Abstract: A chuck for a probe station.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: April 14, 2009
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Chuck for holding a device under test
    Patent number: 7514915
    Abstract: A chuck for a probe station.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: April 7, 2009
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Chuck for holding a device under test
    Patent number: 7501810
    Abstract: A chuck for a probe station.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: March 10, 2009
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Probe station with low inductance path
    Patent number: 7498828
    Abstract: A probe assembly suitable for high-current measurements of an electrical device.
    Type: Grant
    Filed: June 20, 2007
    Date of Patent: March 3, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: John Dunklee, Clarence E. Cowan
  • Chuck for holding a device under test
    Patent number: 7492172
    Abstract: A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.
    Type: Grant
    Filed: April 21, 2004
    Date of Patent: February 17, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rod Jones, John Dunklee, Tim Lesher, David Newton
  • Shielded probe for testing a device under test
    Patent number: 7489149
    Abstract: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and the probe tip.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: February 10, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Shielded probe for testing a device under test
    Patent number: 7482823
    Abstract: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: January 27, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Switched suspended conductor and connection
    Patent number: 7468609
    Abstract: A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly.
    Type: Grant
    Filed: April 11, 2007
    Date of Patent: December 23, 2008
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Shielded probe with low contact resistance for testing a device under test
    Patent number: 7436194
    Abstract: A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: October 14, 2008
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Chuck for holding a device under test
    Patent number: 7423419
    Abstract: A chuck for a probe station.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: September 9, 2008
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee