Patents by Inventor John Dunklee

John Dunklee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Chuck for holding a device under test
    Publication number: 20040232935
    Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck.
    Type: Application
    Filed: April 21, 2004
    Publication date: November 25, 2004
    Inventors: Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rod Jones, John Dunklee, Tim Lesher, David Newton
  • Probe for testing a device under test
    Publication number: 20040232927
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: May 18, 2004
    Publication date: November 25, 2004
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Switched suspended conductor and connection
    Publication number: 20040222807
    Abstract: A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly.
    Type: Application
    Filed: March 5, 2004
    Publication date: November 11, 2004
    Inventor: John Dunklee
  • Probe for testing a device under test
    Patent number: 6815963
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: May 23, 2003
    Date of Patent: November 9, 2004
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Guarded tub enclosure
    Publication number: 20040113639
    Abstract: A probe station with an improved guarding structure.
    Type: Application
    Filed: December 13, 2002
    Publication date: June 17, 2004
    Inventors: John Dunklee, Greg Norgden, C. Eugene Cowan
  • Probe for testing a device under test
    Publication number: 20040004491
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: May 23, 2003
    Publication date: January 8, 2004
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Chuck for holding a device under test
    Publication number: 20020027433
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: June 7, 2001
    Publication date: March 7, 2002
    Applicant: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Probe station
    Publication number: 20020027434
    Abstract: A probe station for testing a wafer.
    Type: Application
    Filed: June 12, 2001
    Publication date: March 7, 2002
    Inventors: Greg Nordgren, John Dunklee