Patents by Inventor John Dunklee

John Dunklee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe station with low inductance path
    Publication number: 20070247178
    Abstract: A probe assembly suitable for high-current measurements of an electrical device.
    Type: Application
    Filed: June 20, 2007
    Publication date: October 25, 2007
    Inventors: John Dunklee, Clarence Cowan
  • Switched suspended conductor and connection
    Publication number: 20070205784
    Abstract: A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly.
    Type: Application
    Filed: April 11, 2007
    Publication date: September 6, 2007
    Inventor: John Dunklee
  • Guarded tub enclosure
    Publication number: 20070194778
    Abstract: A probe station with an improved guarding structure.
    Type: Application
    Filed: April 11, 2007
    Publication date: August 23, 2007
    Inventors: John Dunklee, Greg Norgden, C. Cowan
  • Probe station with low inductance path
    Patent number: 7250779
    Abstract: A probe assembly suitable for making test measurements using test signals having high currents. The disclosed probe assembly provides for a test signal exhibiting relatively low inductance when compared to existing probe assemblies by preferably reducing the electrical path distance between the test instrumentation and the electrical device being tested.
    Type: Grant
    Filed: September 25, 2003
    Date of Patent: July 31, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: John Dunklee, Clarence E. Cowan
  • Chuck with integrated wafer support
    Publication number: 20070115013
    Abstract: An improved chuck with lift pins within a probe station.
    Type: Application
    Filed: January 19, 2007
    Publication date: May 24, 2007
    Inventors: Peter Andrews, Brad Froemke, John Dunklee
  • Guarded tub enclosure
    Patent number: 7221146
    Abstract: A probe station with an improved guarding structure.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: May 22, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: John Dunklee, Greg Norgden, C. Eugene Cowan
  • Switched suspended conductor and connection
    Patent number: 7221172
    Abstract: A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly.
    Type: Grant
    Filed: March 5, 2004
    Date of Patent: May 22, 2007
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Probe for testing a device under test
    Publication number: 20070075716
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: December 1, 2006
    Publication date: April 5, 2007
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Chuck with integrated wafer support
    Patent number: 7187188
    Abstract: An improved chuck with lift pins within a probe station.
    Type: Grant
    Filed: August 26, 2004
    Date of Patent: March 6, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: Peter Andrews, Brad Froemke, John Dunklee
  • Probe station thermal chuck with shielding for capacitive current
    Publication number: 20070030021
    Abstract: To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to the thermal unit but free of direct electrical connection thereto.
    Type: Application
    Filed: October 11, 2006
    Publication date: February 8, 2007
    Inventors: Clarence Cowan, Paul Tervo, John Dunklee
  • Probe for testing a device under test
    Patent number: 7161363
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: January 9, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Fluid dispensing system
    Publication number: 20070003447
    Abstract: A fluid dispensing apparatus and system for facilitating dispensing small volume, fluid samples to microfluidic devices.
    Type: Application
    Filed: June 26, 2006
    Publication date: January 4, 2007
    Inventors: K. Gleason, Peter Navratil, John Martin, John Dunklee, Cali Sartor, Thane Allison
  • Chuck for holding a device under test
    Publication number: 20060028200
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: August 15, 2005
    Publication date: February 9, 2006
    Inventor: John Dunklee
  • Chuck for holding a device under test
    Patent number: 6965226
    Abstract: A chuck for a probe station that include a first chuck assembly element defining a substantially planar upper and lower surfaces, and another chuck assembly element defining a substantially planar surface. The chuck includes a spacing mechanism having exactly three independent supports interconnecting the first chuck assembly element and the another chuck assembly element defining the spacing between the first chuck assembly element and the another chuck assembly element in such a manner that the substantially planar lower surface of the first chuck assembly element and the substantially planar upper surface of the another chuck assembly element are in opposing relationship with respect to one another.
    Type: Grant
    Filed: June 7, 2001
    Date of Patent: November 15, 2005
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Probe station
    Publication number: 20050179427
    Abstract: A probe station for testing a wafer.
    Type: Application
    Filed: March 16, 2005
    Publication date: August 18, 2005
    Inventors: Greg Nordgren, John Dunklee
  • Probe station
    Patent number: 6914423
    Abstract: A chuck assembly includes a rotational member and an auxiliary chuck. The rotational member is suitable for supporting a chuck thereon wherein the rotational member is rotatable with respect to the chuck assembly. The auxiliary chuck is free from rotating with respect to the chuck assembly.
    Type: Grant
    Filed: June 12, 2001
    Date of Patent: July 5, 2005
    Assignee: Cascade Microtech, Inc.
    Inventors: Greg Nordgren, John Dunklee
  • Chuck with integrated wafer support
    Publication number: 20050140384
    Abstract: An improved chuck with lift pins within a probe station.
    Type: Application
    Filed: August 26, 2004
    Publication date: June 30, 2005
    Inventors: Peter Andrews, Brad Froemke, John Dunklee
  • Guarded tub enclosure
    Publication number: 20050122125
    Abstract: A probe station with an improved guarding structure.
    Type: Application
    Filed: January 14, 2005
    Publication date: June 9, 2005
    Inventors: John Dunklee, Greg Norgden, C. Cowan
  • Probe station with low inductance path
    Publication number: 20050099192
    Abstract: A probe assembly suitable for high-current measurements of an electrical device.
    Type: Application
    Filed: September 25, 2003
    Publication date: May 12, 2005
    Inventors: John Dunklee, Clarence Cowan
  • Guarded tub enclosure
    Patent number: 6861856
    Abstract: A probe station with an improved guarding structure.
    Type: Grant
    Filed: December 13, 2002
    Date of Patent: March 1, 2005
    Assignee: Cascade Microtech, Inc.
    Inventors: John Dunklee, Greg Norgden, C. Eugene Cowan