Patents by Inventor John Dunklee

John Dunklee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Chuck with integrated wafer support
    Publication number: 20080157796
    Abstract: An improved chuck with lift pins within a probe station.
    Type: Application
    Filed: March 10, 2008
    Publication date: July 3, 2008
    Inventors: Peter Andrews, Brad Froemke, John Dunklee
  • Chuck with integrated wafer support
    Patent number: 7362115
    Abstract: An improved chuck assembly with lift pins. The chuck assembly may have an outer periphery and an upper surface. The lift pins may be positioned within the periphery of the chuck assembly and may be capable of relative vertical movement with respect to the upper surface of the chuck assembly.
    Type: Grant
    Filed: January 19, 2007
    Date of Patent: April 22, 2008
    Assignee: Cascade Microtech, Inc.
    Inventors: Peter Andrews, Brad Froemke, John Dunklee
  • Chuck for holding a device under test
    Patent number: 7352168
    Abstract: A chuck for a probe station.
    Type: Grant
    Filed: August 15, 2005
    Date of Patent: April 1, 2008
    Assignee: Cascade Microtech, Inc.
    Inventor: John Dunklee
  • Chuck for holding a device under test
    Publication number: 20080054884
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: March 6, 2008
    Inventor: John Dunklee
  • Chuck for holding a device under test
    Publication number: 20080054883
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: March 6, 2008
    Inventor: John Dunklee
  • Chuck for holding a device under test
    Publication number: 20080054885
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: March 6, 2008
    Inventor: John Dunklee
  • Probe for testing a device under test
    Publication number: 20080054929
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20080054923
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Chuck for holding a device under test
    Publication number: 20080048648
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: February 28, 2008
    Inventor: John Dunklee
  • Probe for testing a device under test
    Publication number: 20080048692
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: February 28, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Chuck for holding a device under test
    Publication number: 20080048647
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: February 28, 2008
    Inventor: John Dunklee
  • Probe station
    Publication number: 20080042669
    Abstract: A probe station for testing a wafer.
    Type: Application
    Filed: October 18, 2007
    Publication date: February 21, 2008
    Inventors: Greg Nordgren, John Dunklee
  • Chuck for holding a device under test
    Publication number: 20080042374
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: February 21, 2008
    Inventor: John Dunklee
  • Probe station
    Publication number: 20080042670
    Abstract: A probe station for testing a wafer.
    Type: Application
    Filed: October 18, 2007
    Publication date: February 21, 2008
    Inventors: Greg Nordgren, John Dunklee
  • Probe station thermal chuck with shielding for capacitive current
    Publication number: 20080042680
    Abstract: To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to the thermal unit but free of direct electrical connection thereto.
    Type: Application
    Filed: October 17, 2007
    Publication date: February 21, 2008
    Inventors: Clarence Cowan, Paul Tervo, John Dunklee
  • Chuck for holding a device under test
    Publication number: 20080042674
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: February 21, 2008
    Inventor: John Dunklee
  • Probe station
    Publication number: 20080042376
    Abstract: A probe station for testing a wafer.
    Type: Application
    Filed: October 18, 2007
    Publication date: February 21, 2008
    Inventors: Greg Nordgren, John Dunklee
  • Chuck for holding a device under test
    Publication number: 20080042642
    Abstract: A chuck for a probe station.
    Type: Application
    Filed: October 23, 2007
    Publication date: February 21, 2008
    Inventor: John Dunklee
  • Probe for testing a device under test
    Publication number: 20080024149
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: September 27, 2007
    Publication date: January 31, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Shielded probe for high-frequency testing of a device under test
    Patent number: 7304488
    Abstract: A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a second surface a ground path that shields both the signal path and the probe tip.
    Type: Grant
    Filed: December 1, 2006
    Date of Patent: December 4, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat