Abstract: A pumping voltage generating circuit of a semiconductor memory apparatus, the pumping voltage generating circuit includes a detecting unit configured to compare a level of a pumping voltage with a level of a reference voltage to generate a detection signal, an oscillating signal generator configured to sequentially generate a first oscillating signal and a second oscillating signal in response to the detection signal, and to elevate frequencies of the first and second oscillating signals when the second oscillating signal is generated, a first pump configured to perform a pumping operation in response to the first oscillating signal, and a second pump configured to perform a pumping operation in response to the second oscillating signal, wherein output terminals of the first pump and the second pump are commonly connected, and the pumping voltage is output at the output terminals of the first pump and the second pump.

Abstract: The present invention relates to a buffer circuit of a semiconductor memory device, and includes a common bias supply unit and a plurality of interface units having a differential amplifying structure. Each interface unit receives an input signal and differentially amplifies the input signal and a common bias. The common bias supply unit is driven by a reference voltage to provide the common bias signal to each of the interface units. The buffer circuit makes it possible to reduce the area occupied by the buffer circuit in a semiconductor memory device.

Abstract: A sense amplifier control signal generating circuit of a semiconductor memory apparatus is provided. The sense amplifier control signal generating circuit includes a timing control unit that models a transmission path of data from a memory cell to a sense amplifier through a bit line and generates a timing control signal at a sensing timing when the sense amplifier starts a sensing operation. A sense amplifier control signal generating unit receives the timing control signal and generates a sense amplifier control signal.

Abstract: A pumping voltage generating circuit of a semiconductor memory apparatus, the pumping voltage generating circuit includes a detecting unit configured to compare a level of a pumping voltage with a level of a reference voltage to generate a detection signal, an oscillating signal generator configured to sequentially generate a first oscillating signal and a second oscillating signal in response to the detection signal, and to elevate frequencies of the first and second oscillating signals when the second oscillating signal is generated, a first pump configured to perform a pumping operation in response to the first oscillating signal, and a second pump configured to perform a pumping operation in response to the second oscillating signal, wherein output terminals of the first pump and the second pump are commonly connected, and the pumping voltage is output at the output terminals of the first pump and the second pump.

Abstract: A charge pumping circuit consumes less current by reducing the number of charge pumps operating simultaneously. The charge pumping circuit includes a voltage sensor that detects a level of a high voltage and outputs a control signal based on the detection result. An oscillator provides an oscillating clock signal in response to the control signal of the voltage sensor, and the oscillator sequentially outputs the clock signal as a plurality of clock signals having shifted phases A plurality of high-voltage pumps are disposed in a plurality of regions to pump the high voltage in response to the clock signals and a different phase is designated for each region.

Abstract: The buffer circuit includes a differential amplifier differentially amplifying a reference node corresponding to a reference voltage and an input node corresponding to the input signal by sensing a potential difference of the reference voltage and the input signal. A coupling unit couples the input signal to the reference node, making it possible to improve the operating speed of the buffer circuit and operate normally when a level of the input signal or the reference voltage becomes low.

Abstract: A precharge circuit of a semiconductor memory apparatus includes a first precharge unit and a second precharge unit. The first precharge unit applies a first core voltage to a pair of local input/output lines, in response to a first precharge signal, to precharge the pair of local input/output lines. The second precharge unit applies a clamp voltage, which is generated using a first supply voltage, to the pair of local input/output lines, in response to the first precharge signal, to precharge the pair of local input/output lines.

Abstract: The present invention relates to a buffer circuit of a semiconductor memory device, and includes a common bias supply unit and a plurality of interface units having a differential amplifying structure. Each interface unit receives an input signal and differentially amplifies the input signal and a common bias. The common bias supply unit is driven by a reference voltage to provide the common bias signal to each of the interface units. The buffer circuit makes it possible to reduce the area occupied by the buffer circuit in a semiconductor memory device.

Abstract: An internal voltage generator of a semiconductor memory device is capable of changing driving abilities between standby and active modes, to respond faster in the active mode and prevent a leakage current in the standby mode. The internal voltage generator of a semiconductor memory device comprises a driving controller for generating drive control signals having information about standby and active modes, a first voltage generator enabled by the drive control signals for comparing an internal voltage with a reference voltage in the standby and active modes, a first driver for generating the internal voltage according to a comparison performed by the first voltage generator, a second voltage generator enabled by the drive control signal for comparing the internal voltage with the reference voltage in the active mode, and a second driver for generating the internal voltage according to a comparison performed by the second voltage generator.

Abstract: A sense amplifier control signal generating circuit of a semiconductor memory apparatus is provided. The sense amplifier control signal generating circuit includes a timing control unit that models a transmission path of data from a memory cell to a sense amplifier through a bit line and generates a timing control signal at a sensing timing when the sense amplifier starts a sensing operation. A sense amplifier control signal generating unit receives the timing control signal and generates a sense amplifier control signal.

Abstract: Disclosed herein is a word line driving circuit in which sub-word lines are prevented from floating by using a sub-word line driver having two transistors. A plurality of sub-word line drivers is connected to one main word line. Each of the plurality of the sub-word lines includes a PMOS transistor and a NMOS transistor serially connected between a sub-word line driving voltage FX and a ground voltage. A floating prevention unit selects the main word line to a level of a threshold voltage using a driving signal having the level of the threshold voltage, thus preventing sub-word lines of a sub-word line driver, where the sub-word line driving voltage FX is off, from floating.

Abstract: A data output apparatus and method in a global input and output (GIO) line transmits data via the GIO line. This data output apparatus includes a read driver driven responsive to an input of read data for inverting and amplifying the data to output inverted and amplified data onto the GIO line, a GIO termination unit driven responsive to a termination signal for rising or falling a voltage level on the GIO line by a preset level, prior to driving the data onto the GIO line by the read driver, and a receiver driven responsive to the read data transmitted through the GIO line for inverting and amplifying the read data to provide inverted and amplified data. This data output apparatus can enable a high rate data transmission by decreasing a swing width of data transmitted via the GIO line and also reduce a coupling noise on adjacent lines.

Abstract: The present invention provides an input buffer for use in a semiconductor device reducing a current consumption and maintaining a reliable operation speed by detecting a level of the reference voltage. The input buffer includes a comparator, having a first biasing device controlled by a buffer enable signal, for sensing a logic level of an input data by comparing voltage levels of a reference voltage and the input data, a reference voltage detector for detecting the level of the reference voltage, and a second biasing device controlled by an output signal from the reference voltage detector and parallel connected to the first biasing device.

Abstract: An internal voltage generator of a semiconductor memory device is capable of changing driving abilities between standby and active modes, to respond faster in the active mode and prevent a leakage current in the standby mode. The internal voltage generator of a semiconductor memory device comprises a driving controller for generating drive control signals having information about standby and active modes, a first voltage generator enabled by the drive control signals for comparing an internal voltage with a reference voltage in the standby and active modes, a first driver for generating the internal voltage according to a comparison performed by the first voltage generator, a second voltage generator enabled by the drive control signal for comparing the internal voltage with the reference voltage in the active mode, and a second driver for generating the internal voltage according to a comparison performed by the second voltage generator.

Abstract: Disclosed is a precharge circuit of a semiconductor apparatus. The precharge circuit of a semiconductor memory apparatus includes a first precharge unit and a second precharge unit. The first precharge unit applies a first core voltage to a pair of local input/output lines, in response to a first precharge signal, to precharge the pair of local input/output lines. The second precharge unit applies a clamp voltage, which is generated using a first supply voltage, to the pair of local input/output lines, in response to the first precharge signal, to precharge the pair of local input/output lines.

Abstract: Disclosed herein is a word line driving circuit in which sub-word lines are prevented from floating by using a sub-word line driver having two transistors. A plurality of sub-word line drivers is connected to one main word line. Each of the plurality of the sub-word lines includes a PMOS transistor and a NMOS transistor serially connected between a sub-word line driving voltage FX and a ground voltage. A floating prevention unit selects the main word line to a level of a threshold voltage using a driving signal having the level of the threshold voltage, thus preventing sub-word lines of a sub-word line driver, where the sub-word line driving voltage FX is off, from floating.

Abstract: There is provided a reference voltage generator that generates a constant reference voltage regardless of a change in temperature. The reference voltage generator includes a temperature-compensated current generating part for reducing a supply current provided to an output terminal in response to an increase of temperature, and a diode for receiving the supply current through the output terminal.

Abstract: A data output apparatus and method in a global input and output (GIO) line transmits data via the GIO line. This data output apparatus includes a read driver driven responsive to an input of read data for inverting and amplifying the data to output inverted and amplified data onto the GIO line, a GIO termination unit driven responsive to a termination signal for rising or falling a voltage level on the GIO line by a preset level, prior to driving the data onto the GIO line by the read driver, and a receiver driven responsive to the read data transmitted through the GIO line for inverting and amplifying the read data to provide inverted and amplified data. This data output apparatus can enable a high rate data transmission by decreasing a swing width of data transmitted via the GIO line and also reduce a coupling noise on adjacent lines.

Abstract: The present invention provides an input buffer for use in a semiconductor device reducing a current consumption and maintaining a reliable operation speed by detecting a level of the reference voltage. The input buffer includes a comparator, having a first biasing device controlled by a buffer enable signal, for sensing a logic level of an input data by comparing voltage levels of a reference voltage and the input data, a reference voltage detector for detecting the level of the reference voltage, and a second biasing device controlled by an output signal from the reference voltage detector and parallel connected to the first biasing device.

Abstract: Provided is a self refresh oscillator which includes a plurality of inverters serially connected between an input terminal and an output terminal; a pull up driver for charging a first node in accordance with a level of the output terminal; a comparator for comparing a potential of the first node with a reference voltage and outputting the result to the input terminal; and a period adjusting unit for operating based on a level of the output terminal and adjusting an amount of current discharged into a ground of the first node in accordance with a temperature.