Abstract: A display device having a first flat region, a second flat region, and a foldable region located between the first flat region and the second flat region is provided. The display device includes a display layer, a supporting layer, and a cover layer. The supporting layer is disposed under the display layer and includes a first part and a second part separated from the first part by a gap. The cover layer is disposed on the display layer, wherein in a cross section view, a portion of the display layer and the first part of the supporting layer are overlapped in the first flat region, and another portion of the display layer and the second part of the supporting layer are overlapped in the second flat region.

Abstract: A circuit includes local computing cells. Each of the local computing cells can provide, in response to identifying that the input data elements and weight data elements are in a first data type, a first sum including (i) a first product of a first input data element and a first weight data element; and (ii) a second product of a second input data element and a second weight data element. Each of the local computing cells can provide, in response to identifying that the input data elements and weight data elements are in a second data type, (i) a second sum of a first portion of a third input data element and a first portion of a third weight data element; and (ii) a third product of a second portion of the third input data element and a second portion of the third weight data element.

Abstract: A memory test circuit is provided. The memory test circuit is disposed in a memory array and including: a test array, including test cells out of memory cells of the memory array; a write multiplexer, configured to selectively output one of a test signal and a reference voltage based on a write measurement signal, wherein the test signal is output to write into at least one test cell and the reference voltage is output to a sense amplifier; and a read multiplexer, configured to selectively receive and output one of a readout signal corresponding to the test signal and an amplified signal based on a read measurement signal, wherein the readout signal is read from the at least one test cell and the amplified signal is obtained for a read margin evaluation from the sense amplifier by amplifying a voltage difference between the readout signal and the reference voltage.

Abstract: A sense amplifier of a memory device that includes sense amplifier circuits and a reference sharing circuit is introduced. The sense amplifier circuits are configured to sense the plurality of bit lines according to an enable signal. The reference sharing circuit includes first switches and second switches that are coupled to the reference nodes and second reference nodes of the sense amplifier circuits, respectively. The first switches and second switches are controlled according to a control signal to control a first electrical connection among the first reference nodes, and to control a second electrical connection among the second reference nodes. An operation method of the sense amplifier and a memory device including the sense amplifier are also introduced.

Abstract: The sense amplifier circuit includes a differential amplifier, a first switch, and a second switch. The differential amplifier includes a first input node, a second input node, a first output node, and a second output node. The differential amplifier amplifies a voltage difference of the first output node and the second output node according to a first input voltage of the first input node and a second input voltage of the second input node. A control node of the first (second) switch is coupled to a control line, the first (second) switch is coupled to the first (second) input node, and the first (second) switch is coupled to the first (second) output node. The first (second) switch pre-charges the first (second) input node by a first (second) output voltage of the first (second) output node while the control line is received a select signal.

Abstract: The present disclosure provides a display device including a display panel, an optical layer, and a cover layer. The display panel has a substrate with two opposite first edges. The optical layer is disposed on the display panel, and the optical layer has two opposite second edges corresponding to the two opposite first edges respectively. The cover layer is disposed on the optical layer. One of the two opposite first edges and one of the two opposite second edges corresponding to the one of the two opposite first edges are not aligned.

Abstract: A memory test circuit is provided. The memory test circuit is disposed in a memory array and including: a test array, including test cells out of memory cells of the memory array; a write multiplexer, configured to selectively output one of a test signal and a reference voltage based on a write measurement signal, wherein the test signal is output to write into at least one test cell and the reference voltage is output to a sense amplifier; and a read multiplexer, configured to selectively receive and output one of a readout signal corresponding to the test signal and an amplified signal based on a read measurement signal, wherein the readout signal is read from the at least one test cell and the amplified signal is obtained for a read margin evaluation from the sense amplifier by amplifying a voltage difference between the readout signal and the reference voltage.

Abstract: A sense amplifier of a memory device that includes sense amplifier circuits and a reference sharing circuit is introduced. The sense amplifier circuits are configured to sense the plurality of bit lines according to an enable signal. The reference sharing circuit includes first switches and second switches that are coupled to the reference nodes and second reference nodes of the sense amplifier circuits, respectively. The first switches and second switches are controlled according to a control signal to control a first electrical connection among the first reference nodes, and to control a second electrical connection among the second reference nodes. An operation method of the sense amplifier and a memory device including the sense amplifier are also introduced.

Abstract: A memory cell includes a write access transistor, a storage transistor, and a read access transistor. A gate of the write access transistor is connected to a write word line, a source of the write access transistor is connected to a write bit line, and a drain of the write access transistor is connected to a gate of the storage transistor. A source of the storage transistor is connected to a source line and a drain of the storage transistor is connected to a source of the read access transistor. A gate of the read access transistor is connected to a read bit line and a drain of the read access transistor is connected to read bit line. The memory cell further includes a capacitive element having a first connection to the gate of the storage transistor and a second connection to a reference voltage source.

Abstract: A resistive random access memory (ReRAM) apparatus is provided. The ReRAM apparatus includes a plurality of memory cells, each of the memory cells comprises a transistor and a resistor; a bit line connected to a first terminal of the resistor of each of the memory cells; a local source line connected to a source electrode of the transistor of each of the memory cells; and a driving cell connected between the local source line and a global source line. A method for operating the ReRAM apparatus is also provided.

Abstract: An integrated circuit includes a memory storage having bit cells, a write path switch configured to have a connection state determined by a reliability indicator, and a write driver having an input configured to receive an input data from a write terminal through either a first write path or a second write path. The input data received through the first write path is configured to be equal to the data at the write terminal, and the input data received through the second write path is configured to be a bitwise complement of the data at the write terminal. The reliability indicator is configured to be set based on a majority bit value in the data or based on a minority bit value in the data.

Abstract: A system includes a memory cell array including multi-level cells, an input data scramble circuit configured to receive input data and match lower error tolerant bits with higher error tolerant bits to provide matched bit sets, wherein each of the matched bit sets includes at least one lower error tolerant bit and at least one higher error tolerant bit, and a write driver configured to receive the matched bit sets and store each of the matched bit sets into one memory cell of the multi-level cells.

Abstract: A memory device includes a set of word lines, first and second sets of bit lines, a first source line having first and second source line contacts, first and second strings of transistors electrically coupled in parallel between the first and second source line contacts of the source line, and first and second sets of data storage elements. Each word line in the set of word lines is electrically coupled to gates of a transistor in the first string and a corresponding transistor in the second string. The first set of data storage elements is electrically coupled between the first string of transistors and the first set of bit lines. The second set of data storage elements is electrically coupled between the second string of transistors and the second set of bit lines.

Abstract: A device includes a write bit line and a read bit line extending in a first direction, and a write word line and a read word line extending in a second direction perpendicular to the first direction. The device further includes a memory cell including a write transistor and a read transistor. The write transistor includes a first gate connected to the write word line, a first source/drain connected to the write bit line, and a second source/drain connected to a data storage node. The read transistor includes a second gate connected to the data storage node, a third source/drain connected to the read bit line, and a fourth source/drain connected to the read word line.

Abstract: A method of storing an input data of a data set into a memory storage having bit cells. The method includes determining a bit value of a characterization bit in the input data. The method also includes writing each of remaining bits in the input data into one of the bit cells either as the first state or as the second state conditioning upon whether the bit value of the characterization bit is a first value or a second value. Reading the bit cell with the first state consumes less energy than reading the bit cell with the second state or the bit cell with the first state has less retention errors than the bit cell with the second state.

Abstract: A memory device includes a set of word lines, a set of bit lines, a source line having first and second source line contacts, a set of transistors serially coupled between the first and second source line contacts of the source line, and a set of data storage elements. The set of transistors has gates coupled to corresponding word lines in the set of word lines. Each data storage element in the set of data storage elements is coupled between a common terminal of a corresponding pair of adjacent transistors in the set of transistors, and a corresponding bit line in the set of bit lines.

Abstract: A system includes a memory cell array including multi-level cells, an input data scramble circuit configured to receive input data and match lower error tolerant bits with higher error tolerant bits to provide matched bit sets, wherein each of the matched bit sets includes at least one lower error tolerant bit and at least one higher error tolerant bit, and a write driver configured to receive the matched bit sets and store each of the matched bit sets into one memory cell of the multi-level cells.

Abstract: A method of storing a data into a memory storage having bit cells. The method includes identifying each of the binary one and the binary zero in the data as either a majority bit value or a minority bit value based on the probability of finding the binary one in the data or based on the probability of finding the binary zero in the data. In the method, a bit of the data is stored into the bit cell as the more preferred state if the bit of the data has the majority bit value, and a bit of the data is stored into the bit cell as the less preferred state if the bit of the data has the minority bit value.

Abstract: The disclosure introduces a shift register is configured to enter a low power mode by disabling a portion of flip-flops (FFs) that handles upper bits of input data. The shift register includes first FF(s), second FF(s) and gating circuit. The first flip-flop (FF), includes input terminal coupled to first portion of input data. The second FF includes input terminal coupled to second portion of input data, an output terminal, a clock terminal coupled to a clock signal, a power terminal coupled to a supply power. The second portion of the input data is subsequent to the first portion of the input data. The gating circuit is coupled to the output terminal of the first FF, and configured to disable the second FF for storing the second portion of a subsequent input data according to output data currently being stored in the first FF.

Abstract: A semiconductor device includes a memory cell including a first transistor, a second transistor, and a third transistor. The first transistor has a first gate terminal and the second transistor has a second gate terminal, the first gate terminal and the second gate terminal being connected to a first word line and a second word line, respectively. The first transistor has a pair of first source/drain terminals and the second transistor has a pair of second source/drain terminals, one of the pair of first source/drain terminals and one of the pair of second source/drain terminals being connected to a common bit line. The third transistor has a third gate terminal connected to the other of the pair of first source/drain terminals, and a pair of third source/drain terminals connected to the other of the pair of second source/drain terminals and a supply voltage, respectively.