Abstract: A method of operating a memory device is provided, including operations: generating, based on at least one weight stored in a first memory, a weight feature to be stored in a second memory different from the first memory, wherein the weight feature is associated with a number of repetitious bits, that are in neighbor positions of and the same as a most significant bit, in the at least one weight; and accessing, according to the weight feature and an address of the at least one weight, the first memory and the second memory to transmit the at least one weight to a multiply and accumulate circuit for a first neural network layer operation.

Abstract: A circuit for data processing is provided. The circuit comprises a dual-mode adder, a max finder circuit, a zone detector circuit and an alignment circuit. The dual-mode adder generates products between first exponents of first floating point numbers and second exponents of second floating point numbers. The max finder circuit finds a maximum among first portions of the products. The zone detector circuit classify the first portions into zones by comparing the first portions and the maximum. The alignment circuit align first mantissas of the first floating point numbers according to the zones and second portions of the products to generate aligned mantissas for a floating point number operation.

Abstract: A memory device includes a memory array storing weights; a pre-charging circuit coupled to the memory array through data lines and charging, in response to a pre-charge signal, at least one data line in the data lines to a read voltage in a read operation to one in the weights; and a calibration circuit generating the pre-charge signal according to an address of the one in the weights.

Abstract: In a matrix of SOT-MRAM cells, a first row is selected for writing and a second row is selected for reading. A first SOT-MRAM cell of the first row and a second SOT-MRAM of the second row are in a first column, while a third SOT-MRAM cell of the first row and a fourth SOT-MRAM of the second row are in a second column. The currents for writing the first SOT-MRAM cell and the third SOT-MRAM cell are in opposite direction. A first sense amplifier is configured to detect a voltage change on the first read bit line which is charged with a first read current in the second SOT-MRAM cell. A second sense amplifier is configured to detect a voltage change on the second read bit line which is discharged with a second read current in a fourth SOT-MRAM cell.

Abstract: In this disclosure, a storage circuit is provided. The storage circuit includes a gain-cell, a self-refresh unit, and a latch circuit. The gain-cell is configured to store first data in a gate of a storage transistor. The self-refresh unit is configured to read the first data from the gain-cell and write the first data back to the gain-cell. The latch circuit is configured to read the first data from the self-refresh unit and latch the first data.

Abstract: An IC device includes first and second transistors and a memory device. The first transistor includes a first source/drain (S/D) terminal coupled to a first select line, a second S/D terminal, and a gate coupled to a first word line. The second transistor includes a first S/D terminal coupled to a first bit line, a second S/D terminal, and a gate. The memory device is coupled to the second S/D terminal of the second transistor, and a first storage node includes the second S/D terminal of the first transistor and the gate of the second transistor.

Abstract: The disclosure introduces a shift register is configured to enter a low power mode by disabling a portion of flip-flops (FFs) that handles upper bits of input data. The shift register includes first FF(s), second FF(s) and gating circuit. The first flip-flop (FF), includes input terminal coupled to first portion of input data. The second FF includes input terminal coupled to second portion of input data, an output terminal, a clock terminal coupled to a clock signal, a power terminal coupled to a supply power. The second portion of the input data is subsequent to the first portion of the input data. The gating circuit is coupled to the output terminal of the first FF, and configured to disable the second FF for storing the second portion of a subsequent input data according to output data currently being stored in the first FF.

Abstract: A memory test circuit is provided. The memory test circuit is disposed in a memory chip and electrically coupled to a memory macro of the memory chip. A high speed clock receives an input signal and an external clock signal. The input signal includes a plurality of test bits. A finite state machine controller provides a pattern type. A pattern generator generates and provides a test signal to at least one memory cell of the memory chip to write the test signal to the at least one memory cell based on the pattern type and the external clock signal. A test frequency of the test signal is determined based on the high speed clock. An output comparator outputs a comparison signal based on a difference between the test signal and a readout signal corresponding to the test signal read from the at least one memory cell.

Abstract: A circuit includes first and second data lines, a sense amplifier including first and second input terminals, a first p-type metal-oxide-semiconductor (PMOS) transistor coupled in series with a first capacitive device between the first data line and the second input terminal, a second PMOS transistor coupled in series with a second capacitive device between the second data line and the first input terminal, a third PMOS transistor coupled between the first data line and the first input terminal, a fourth PMOS transistor coupled between the second data line and the second input terminal, a first n-type metal-oxide-semiconductor (NMOS) transistor configured to selectively couple each of the first PMOS transistor and the first capacitive device to a ground node, and a second NMOS transistor configured to selectively couple each of the second PMOS transistor and the second capacitive device to the ground node.

Abstract: The disclosure provides a method for controlling a sense amplifier. The control device includes a latch circuit and a control circuit. The latch circuit receives a plurality of memory data signals from the sense amplifier, wherein the latch circuit respectively generates a plurality of reference data signals based on the plurality of memory data signals. The control circuit is coupled to the latch circuit, provides an enable signal to the sense amplifier in response to a pass gate signal of the sense amplifier, and stops providing the enable signal in response to at least one of the plurality of reference data signals, wherein the enable signal controls a sensing period of the sense amplifier.

Abstract: A circuit includes a sense amplifier, a first clamping circuit, a second clamping circuit, and a feedback circuit. The first clamping circuit includes first clamping branches coupled in parallel between the sense amplifier and a memory array. The second clamping circuit includes second clamping branches coupled in parallel between the sense amplifier and a reference array. The feedback circuit is configured to selectively enable or disable one or more of the first clamping branches or one or more of the second clamping branches in response to an output data outputted by the sense amplifier.

Abstract: An integrated circuit includes a memory storage having bit cells, a write path switch configured to have a connection state determined by a reliability indicator, and a write driver having an input configured to receive an input data from a write terminal through either a first write path or a second write path. The input data received through the first write path is configured to be equal to the data at the write terminal, and the input data received through the second write path is configured to be a bitwise complement of the data at the write terminal. The reliability indicator is configured to be set based on a majority bit value in the data or based on a minority bit value in the data.

Abstract: A memory device is provided. The memory device includes: a write transistor, with a gate terminal connected to a write word line, and having a first source/drain terminal connected to a bit line; a storage transistor, with a gate terminal coupled to a second source/drain terminal of the write transistor to form a storage node, and having a first source/drain terminal connected to a source line; and a read transistor, with a gate terminal coupled to a read word line, and having a first source/drain terminal connected to the bit line. The read transistor and the storage transistor share a second source/drain terminal.

Abstract: A sensing method of a sense amplifier circuit is provided. The sense amplifier circuit comprises a differential amplifier. The differential amplifier comprises a first input node, a second input node, a first output node and a second output node. The sensing method comprising: providing a first switch and a second switch, wherein the first switch is coupled to the first input node and the first output node; pre-charging the first input node using a first output voltage of the first output node in response to a select signal by the first switch; and pre-charging the second input node using a second output voltage of the second output node in response to a select signal by the second switch.

Abstract: The disclosure provides a method for controlling a sense amplifier. The control device includes a latch circuit and a control circuit. The latch circuit receives a plurality of memory data signals from the sense amplifier, wherein the latch circuit respectively generates a plurality of reference data signals based on the plurality of memory data signals. The control circuit is coupled to the latch circuit, provides an enable signal to the sense amplifier in response to a pass gate signal of the sense amplifier, and stops providing the enable signal in response to at least one of the plurality of reference data signals, wherein the enable signal controls a sensing period of the sense amplifier.

Abstract: A computing circuit is configured to perform a bit-serial multiplication of an input signal and a weight signal. A multiplier circuit is configured to receive the input signal and the weight signal and to provide a product sum. An adder circuit is configured to receive the product sum and to provide a partial sum. A partial sum register is configured to: clock-gate a second part of the partial sum register; receive the partial sum; provide, based on the partial sum, a first output of the bit-serial multiplication through a first part of the partial sum register; determine whether not to clock-gate the second part of the partial sum register or not based on a first feature bit of the partial sum; and provide, based on the first feature bit of the partial sum, a second output of the bit-serial multiplication through the second part of the partial sum register.

Abstract: A circuit includes local computing cells. Each of the local computing cells can provide, in response to identifying that the input data elements and weight data elements are in a first data type, a first sum including (i) a first product of a first input data element and a first weight data element; and (ii) a second product of a second input data element and a second weight data element. Each of the local computing cells can provide, in response to identifying that the input data elements and weight data elements are in a second data type, (i) a second sum of a first portion of a third input data element and a first portion of a third weight data element; and (ii) a third product of a second portion of the third input data element and a second portion of the third weight data element.

Abstract: A memory test circuit is provided. The memory test circuit is disposed in a memory array and including: a test array, including test cells out of memory cells of the memory array; a write multiplexer, configured to selectively output one of a test signal and a reference voltage based on a write measurement signal, wherein the test signal is output to write into at least one test cell and the reference voltage is output to a sense amplifier; and a read multiplexer, configured to selectively receive and output one of a readout signal corresponding to the test signal and an amplified signal based on a read measurement signal, wherein the readout signal is read from the at least one test cell and the amplified signal is obtained for a read margin evaluation from the sense amplifier by amplifying a voltage difference between the readout signal and the reference voltage.

Abstract: A sense amplifier of a memory device that includes sense amplifier circuits and a reference sharing circuit is introduced. The sense amplifier circuits are configured to sense the plurality of bit lines according to an enable signal. The reference sharing circuit includes first switches and second switches that are coupled to the reference nodes and second reference nodes of the sense amplifier circuits, respectively. The first switches and second switches are controlled according to a control signal to control a first electrical connection among the first reference nodes, and to control a second electrical connection among the second reference nodes. An operation method of the sense amplifier and a memory device including the sense amplifier are also introduced.

Abstract: The sense amplifier circuit includes a differential amplifier, a first switch, and a second switch. The differential amplifier includes a first input node, a second input node, a first output node, and a second output node. The differential amplifier amplifies a voltage difference of the first output node and the second output node according to a first input voltage of the first input node and a second input voltage of the second input node. A control node of the first (second) switch is coupled to a control line, the first (second) switch is coupled to the first (second) input node, and the first (second) switch is coupled to the first (second) output node. The first (second) switch pre-charges the first (second) input node by a first (second) output voltage of the first (second) output node while the control line is received a select signal.