Abstract: A method and an apparatus for detecting a port scan in a network are disclosed. For example, the method extracts statistics from a message, detects the port scan for a source internet protocol address, determines whether a port scan record exists for the source internet protocol address, creates a port scan record for the source internet protocol address that is extracted when the port scan record does not exist, determines an elapsed time when the port scan record does exist, wherein the elapsed time is determined as a difference between the time stamp that is extracted and a recorded time stamp, sets the recorded time stamp to be the extracted time stamp when the elapsed time is less than an intra-scan time, and determines the port scan has ended for the source internet protocol address when the elapsed time is not less than the intra-scan time.

Abstract: Concepts and technologies disclosed herein are directed to data-driven feedback control systems for an acceptable level of real-time application transaction completion rate in virtualized networks, while maximizing virtualized server utilization. According to one aspect disclosed herein, a network virtualization platform (“NVP”) includes a plurality of hardware resources, a virtual machine (“VM”), and a virtual machine monitor (“VMM”). The VMM can track an execution state of each of a plurality of applications associated with the VM. The VMM can measure a real-time application transaction completion rate of the VM. The VMM can determine whether a trigger condition exists for priority scheduling of real-time applications based upon the real-time application transaction completion rate and a pre-set threshold value.

Abstract: A method includes forming trenches on a semiconductor substrate, thereby defining regions for forming semiconductor devices; extracting a profile of the regions; determining an etch recipe based on at least the profile of the regions; filling in the trenches with a dielectric material; and performing an etching process to the dielectric material using the etch recipe.

Abstract: The present invention provides a common-mode signal absorber, which comprises an impedance-matching network and a common-mode signal reflection circuit. A differential-mode signal is inputted into input ends of the impedance-matching network, and outputted from output ends of the common-mode signal reflection circuit. When a common-mode signal is inputted into the common-mode signal absorber, the common-mode signal reflection circuit is for reflecting the common-mode signal within a specific frequency band. Afterward, the reflection of the common-mode signal within the specific frequency band will be absorbed by an impedance element of the impedance-matching network. Thus, the common-mode signal within the specific frequency band may be absorbed by the impedance-matching network so as to avoid to interfere signals transmitted on a communication system.

Abstract: A method and an apparatus for detecting a port scan in a network are disclosed. For example, the method extracts statistics from a message, detects the port scan for a source internet protocol address, determines whether a port scan record exists for the source internet protocol address, creates a port scan record for the source internet protocol address that is extracted when the port scan record does not exist, determines an elapsed time when the port scan record does exist, wherein the elapsed time is determined as a difference between the time stamp that is extracted and a recorded time stamp, sets the recorded time stamp to be the extracted time stamp when the elapsed time is less than an intra-scan time, and determines the port scan has ended for the source internet protocol address when the elapsed time is not less than the intra-scan time.

Abstract: Concepts and technologies disclosed herein are directed to data-driven feedback control systems for an acceptable level of real-time application transaction completion rate in virtualized networks, while maximizing virtualized server utilization. According to one aspect disclosed herein, a network virtualization platform (“NVP”) includes a plurality of hardware resources, a virtual machine (“VM”), and a virtual machine monitor (“VMM”). The VMM can track an execution state of each of a plurality of applications associated with the VM. The VMM can measure a real-time application transaction completion rate of the VM. The VMM can determine whether a trigger condition exists for priority scheduling of real-time applications based upon the real-time application transaction completion rate and a pre-set threshold value.

Abstract: A processor may determine a message type of a message of a message set and extract strings from the message based upon the message type, each string associated with a field type within the message type. The processor may write one of the strings to a string table, when not already stored in the string table, and add an offset position of the string in the string table to a column list for the field type associated with the string, when not already stored in the column list. There may be different column lists for different field types. The processor may populate an entry of a data table corresponding to the message and to the field type associated with the string with an index of the offset position within the column list, and store a compressed version of the message set including the string table, column lists, and data table.

Abstract: A disposable lens applied to electronic operation device for recognition includes a substrate, a lens and a fix adhesive. It is only necessary for the user to fix the disposable lens to the electronic operation device provided with an image-capturing unit and enable the image-capturing unit to align with a recognized unit to be recognized through the lens, such that the image of the recognized unit is expanded through the lens through optical properties. Thus, the image signal captured by the image-capturing unit is clearer, and then processed by the electronic operation device. Not only compactness with portability enabling the user to recognize the recognized unit immediately, but also the effect of low-priced material are provided due to simple structure of the disposable lens of the present invention. Thereby, relative advantages in volume, convenience and cost are all obtained.

Abstract: A disposable lens applied to electronic operation device for recognition includes a substrate, a lens and a fix adhesive. It is only necessary for the user to fix the disposable lens to the electronic operation device provided with an image-capturing unit and enable the image-capturing unit to align with a recognized unit to be recognized through the lens, such that the image of the recognized unit is expanded through the lens through optical properties. Thus, the image signal captured by the image-capturing unit is clearer, and then processed by the electronic operation device. Not only compactness with portability enabling the user to recognize the recognized unit immediately, but also the effect of low-priced material are provided due to simple structure of the disposable lens of the present invention. Thereby, relative advantages in volume, convenience and cost are all obtained.

Abstract: Methods for forming the fin field effect transistor (FinFET) device structure are provided. The method includes forming first fin structures and second fin structures on a first region and a second region of a substrate, respectively, and a number of the first fin structures is greater than a number of the second fin structures. The method also includes forming a sacrificial layer on the first fin structures and the second fin structures and performing an etching process to the sacrificial layer to form an isolation structure on the substrate.

Abstract: A method includes forming trenches on a semiconductor substrate, thereby defining regions for forming semiconductor devices; extracting a profile of the regions; determining an etch recipe based on at least the profile of the regions; filling in the trenches with a dielectric material; and performing an etching process to the dielectric material using the etch recipe.

Abstract: Concepts and technologies disclosed herein are directed to an auto-scaling software-defined monitoring (“SDM”) platform for software-defined networking (“SDN”) service assurance. According to one aspect of the concepts and technologies disclosed herein, an SDM controller can monitor event data associated with a network even that occurred within a virtualized IP SDN network that is monitored by a virtualized SDM resources platform. The SDM controller can measure, based upon the event data, a quality of service (“QoS”) performance metric associated with the virtualized SDM resource platform. The SDN controller can determine, based upon the QoS performance metric, whether an auto-scaling operation is to be performed. The auto-scaling operation can include reconfiguring the virtualized SDM resources platform by adding virtual machine capacity for supporting event management tasks either by instantiating a new virtual machine or by migrating an existing virtual machine to a new hardware host.

Abstract: A method for forming a semiconductor device structure is provided. The method includes forming a dielectric layer over a substrate. The dielectric layer has a trench passing through the dielectric layer. The method includes forming a gate stack in the trench. The method includes performing a hydrogen-containing plasma process over the gate stack. The method includes removing a top portion of the gate stack to form a first recess surrounded by the gate stack and the dielectric layer. The method includes forming a cap layer in the first recess to fill the first recess.

Abstract: Concepts and technologies disclosed herein are directed to context-aware virtualized control decision support system (“DSS”) for providing quality of experience (“QoE”) assurance for Internet protocol (“IP”) streaming video services. A QoE assurance DSS can monitor QoE event and context data to be utilized for QoE assurance analytics, measure QoE performance, perform QoE assurance analytics, and determine whether the QoE assurance analytics indicate that the QoE has been degraded, and if so, construct a fault correlation information model to be utilized for root cause analysis to determine a root cause of the QoE being degraded. The QoE assurance DSS also can determine, based upon the fault correlation information model, whether the root cause of the QoE being degraded is due to a capacity reduction, and if so, the QoE assurance DSS can identify a new network resource for capacity reallocation to accommodate a virtual machine migration.

Abstract: A biochemical detection apparatus includes an electronic computing device and an optical device. The optical device includes a main body. The main body includes an accommodating space provided in the main body, and an insertion slot, an optical lens and an opening that are in communication with the accommodating space. The optical lens and the opening are disposed on a same plane of the main body, and the optical lens is located above an image capturing unit of the electronic computing device. The optical device may be installed at a handheld electronic computing device commonly carried by an individual, and is capable of immediately performing detection for an environmental parameter or a biological parameter by a biochemical sheet. The optical device having a simple structure is small in volume, convenient and low in cost, and may replace expensive precision detection apparatuses.

Abstract: A method of fabricating a semiconductor device is disclosed. A substrate having an oxide layer is provided. At least a portion of the oxide layer is removed and forms a nitride layer. The nitride layer is removed, leaving nitride precipitates. The nitride precipitates are removed using phosphoric acid.

Abstract: The present disclosure provides a method for fabricating an integrated circuit in accordance with some embodiments. The method includes forming a trench on a semiconductor substrate, thereby defining fin active regions; extracting a profile of the fin active regions; determining an etch dosage according to the profile of the fin active regions; filling in the trench with a dielectric material; and performing an etching process to the dielectric material using the etch dosage, thereby recessing the dielectric material and defining a fin height of the fin active regions.

Abstract: A method for forming a semiconductor device structure is provided. The method includes forming a dielectric layer over a substrate. The dielectric layer has a trench passing through the dielectric layer. The method includes forming a gate stack in the trench. The method includes performing a hydrogen-containing plasma process over the gate stack. The method includes removing a top portion of the gate stack to form a first recess surrounded by the gate stack and the dielectric layer. The method includes forming a cap layer in the first recess to fill the first recess.

Abstract: A service impact event analyzer is used to evaluate service assurance risk in cloud SDN networks. Using data fusion, an alarm subset dataset is generated from a raw trap dataset. Service impact events are identified in the subset dataset. The service impact events are categorized into service impacted event categories, and a model is created for associating the event categories with process function classes. Time durations of the service impact events are computed using correlated secondary alarms from the alarm subset dataset. The service assurance risk is evaluated using the model and the time duration.

Abstract: Concepts and technologies are disclosed herein for a realtime dynamic virtual network topology discovery engine to discover a dynamic network topology in virtualized networks in realtime. A processor that executes a network topology discovery engine can obtain network data that can describe elements of a data center and operational state of the elements. Obtaining network data can include obtaining network data from a network topology inventory database and through detecting operational state change events from virtual network components. The processor can construct a network topology model based upon the network data. The network topology model can include an object (representing an element of the data center) and an attribute representing a state of the element. The processor can update the network topology model in realtime. The network topology model and configurations can be stored for root cause analysis of fault events, resource orchestration in SDN networks, and other applications.