Patents by Inventor Kiyomi Yoshinari
Kiyomi Yoshinari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11955327Abstract: The present invention implements an ion detector with which it is possible to avoid direct collisions of negative ions with a scintillator, prevent degradation of the scintillator, prolong life of the scintillator, reduce the need for maintenance, and perform highly sensitive detection of both positive and negative ions. With respect to a reference line 65 connecting a central point 63 of a positive ion CD 52 and a central point 64 of a counter electrode 54, a central point 66 of a negative ion CD 53 is provided in a region of a side opposite to a region of a side of a central point 67 of a scintillator 56. Positive ions entering from an ion entrance 62 receive a deflection force and collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 to generate light. The generated light passes through a light guide 59 and is detected by a photomultiplier tube 58. A negative potential barrier is generated along the reference line 65.Type: GrantFiled: January 22, 2020Date of Patent: April 9, 2024Assignee: Hitachi High-Tech CorporationInventors: Kiyomi Yoshinari, Masuyuki Sugiyama, Yuichiro Hashimoto, Shin Imamura
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Publication number: 20220319825Abstract: An object of the invention is to provide a mass spectrometer capable of preventing a sample from remaining inside an ion source container for a long time. In the mass spectrometer according to the invention, in addition to a first gas used for ionizing an ion source, a second gas flowing toward an exhaust unit along an inner wall of the ion source container is supplied inside the ion source container (see FIG. 1).Type: ApplicationFiled: July 10, 2019Publication date: October 6, 2022Inventors: Kouji ISHIGURO, Kiyomi YOSHINARI
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Publication number: 20220181138Abstract: The present invention implements an ion detector with which it is possible to avoid direct collisions of negative ions with a scintillator, prevent degradation of the scintillator, prolong life of the scintillator, reduce the need for maintenance, and perform highly sensitive detection of both positive and negative ions. With respect to a reference line 65 connecting a central point 63 of a positive ion CD 52 and a central point 64 of a counter electrode 54, a central point 66 of a negative ion CD 53 is provided in a region of a side opposite to a region of a side of a central point 67 of a scintillator 56. Positive ions entering from an ion entrance 62 receive a deflection force and collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 to generate light. The generated light passes through a light guide 59 and is detected by a photomultiplier tube 58. A negative potential barrier is generated along the reference line 65.Type: ApplicationFiled: January 22, 2020Publication date: June 9, 2022Inventors: Kiyomi YOSHINARI, Masuyuki SUGIYAMA, Yuichiro HASHIMOTO, Shin IMAMURA
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Patent number: 11049706Abstract: The mass spectrometer includes an ionization unit that ionizes a sample; a nozzle unit having an inflow port that is connected to the ionization unit by a flow pipe and through which the ionized sample flows, and an outflow port from which the sample flowing in flows out; a vacuum chamber that is evacuated by vacuum evacuation means and into which the sample flows from the nozzle unit; a mass analysis unit that is located downstream of a flow of the sample relative to the vacuum chamber and that selects ions from the sample; and an ion detection unit that detects the ions selected by the mass analysis unit, wherein a division portion that divides a flow of the sample is provided inside the nozzle unit, and the division portion has a tapered projection whose diameter decreases toward the outflow port.Type: GrantFiled: May 1, 2018Date of Patent: June 29, 2021Assignee: Hitachi High-Tech CorporationInventors: Kiyomi Yoshinari, Yasushi Terui
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Publication number: 20210159063Abstract: The mass spectrometer includes an ionization unit that ionizes a sample; a nozzle unit having an inflow port that is connected to the ionization unit by a flow pipe and through which the ionized sample flows, and an outflow port from which the sample flowing in flows out; a vacuum chamber that is evacuated by vacuum evacuation means and into which the sample flows from the nozzle unit; a mass analysis unit that is located downstream of a flow of the sample relative to the vacuum chamber and that selects ions from the sample; and an ion detection unit that detects the ions selected by the mass analysis unit, wherein a division portion that divides a flow of the sample is provided inside the nozzle unit, and the division portion has a tapered projection whose diameter decreases toward the outflow port.Type: ApplicationFiled: May 1, 2018Publication date: May 27, 2021Inventors: Kiyomi YOSHINARI, Yasushi TERUI
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Patent number: 11011361Abstract: The mass spectrometer includes an ionization unit that ionizes a sample; a nozzle unit having an inflow port that is connected to the ionization unit by a flow pipe and through which the ionized sample flows, and an outflow port from which the sample flowing in flows out; a vacuum chamber that is evacuated by vacuum evacuation means and into which the sample flows from the nozzle unit; a mass analysis unit that is located downstream of a flow of the sample relative to the vacuum chamber and that selects ions from the sample; and an ion detection unit that detects the ions selected by the mass analysis unit, wherein a division portion that divides a flow of the sample is provided inside the nozzle unit, and the division portion has a tapered projection whose diameter decreases toward the outflow port.Type: GrantFiled: May 1, 2018Date of Patent: May 18, 2021Assignee: Hitachi High-Tech CorporationInventors: Kiyomi Yoshinari, Yasushi Terui
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Patent number: 10607825Abstract: Acceleration of decelerated ions and a reduction in the velocity dispersion width of decelerated ions are both achieved, whereby the sensitivity of detected ion sensitivity is improved and resolution is improved. The distance dx between at least one set of facing rod-shaped electrodes among rod-shaped electrodes (4-2-a) to (4-2-d) differs at the inlet part at which ions enter and the outlet part at which ions exit, and the distance dx between the at least one set of facing rod-shaped electrodes is gradually reduced or increased from the inlet part toward the outlet part.Type: GrantFiled: November 9, 2016Date of Patent: March 31, 2020Assignee: Hitachi High-Technologies CorporationInventors: Kiyomi Yoshinari, Yasushi Terui
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Patent number: 10332736Abstract: An object of the invention is to provide a mass spectrometer system capable of obtaining a mass spectrum with high resolution as the mass number of an ion becomes higher. In the mass spectrometer system of the invention, a control unit 8 controls a mass spectrometry unit 4 so that a direct current voltage U, an amplitude V of a radio-frequency voltage, and a frequency F of the radio-frequency voltage, which are applied to a quadrupole electrode 13, are increased as a mass-to-charge ratio m/z of an ion of a target for mass spectrometry becomes larger. By controlling in this manner, the ion frequency when the ion passes through the inside of the mass spectrometry unit 4 is increased as the mass number of an ion becomes higher, and therefore, it is possible to obtain the mass spectrum with higher resolution.Type: GrantFiled: January 24, 2014Date of Patent: June 25, 2019Assignee: Hitachi High-Technologies CorporationInventors: Kiyomi Yoshinari, Yasushi Terui
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Patent number: 10229821Abstract: With regard to an object of the invention, in a tandem type mass spectrometry system including three stages of a QMS, sensitivity of a daughter ion decreases due to loss resulting from destabilization of the daughter ion or a decrease in daughter ion generation rate, and an improvement insensitivity of the daughter ion is a significant issue. To solve the above-mentioned problem, the invention provides a mass spectrometry system having means of decreasing a q value of a parent ion and not decreasing a fundamental vibration frequency of the parent ion. According to the means of the invention, the invention may have effects that a mass number range of a daughter ion that may be stably transmitted is expanded, the number of vibrations of a parent ion is substantially the same as that in a first stage of the QMS, and generation efficiency of the daughter ion does not decrease and can be maintained.Type: GrantFiled: January 4, 2016Date of Patent: March 12, 2019Assignee: Hitachi High-Technologies CorporationInventors: Kiyomi Yoshinari, Yasushi Terui
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Publication number: 20190006164Abstract: Acceleration of decelerated ions and a reduction in the velocity dispersion width of decelerated ions are both achieved, whereby the sensitivity of detected ion sensitivity is improved and resolution is improved. The distance dx between at least one set of facing rod-shaped electrodes among rod-shaped electrodes (4-2-a) to (4-2-d) differs at the inlet part at which ions enter and the outlet part at which ions exit, and the distance dx between the at least one set of facing rod-shaped electrodes is gradually reduced or increased from the inlet part toward the outlet part.Type: ApplicationFiled: November 9, 2016Publication date: January 3, 2019Inventors: Kiyomi YOSHINARI, Yasushi TERUI
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Publication number: 20180269049Abstract: With regard to an object of the invention, in a tandem type mass spectrometry system including three stages of a QMS, sensitivity of a daughter ion decreases due to loss resulting from destabilization of the daughter ion or a decrease in daughter ion generation rate, and an improvement insensitivity of the daughter ion is a significant issue. To solve the above-mentioned problem, the invention provides a mass spectrometry system having means of decreasing a q value of a parent ion and not decreasing a fundamental vibration frequency of the parent ion. According to the means of the invention, the invention may have effects that amass number range of a daughter ion that may be stably transmitted is expanded, the number of vibrations of a parent ion is substantially the same as that in a first stage of the QMS, and generation efficiency of the daughter ion does not decrease and can be maintained.Type: ApplicationFiled: January 4, 2016Publication date: September 20, 2018Inventors: Kiyomi YOSHINARI, Yasushi TERUI
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Patent number: 10068756Abstract: The objective of the presently disclosed subject matter is to provide a mass spectrometer that improves the ionic permeability ratio at the entrance to an ion transport part or the entrance to a mass spectrometry part, and to acquire a high-sensitivity mass spectrum. To reduce the electric-field distortion that is caused by ion loss, electrodes are arranged so that the radius of a circle inscribed within the electrodes of the ion transport part is larger than the radius of a circle inscribed within the electrodes of the mass spectrometry part. The entrance to the electrodes of the mass spectrometry part also can have a tapered, inclined, folded-over, or rounded configuration. Together, these reduce the sharply fluctuating (peak-shaped) distribution of electric potential generated near the entrance to the ion transport part and the entrance to the mass spectrometry part.Type: GrantFiled: May 11, 2015Date of Patent: September 4, 2018Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Kiyomi Yoshinari, Yasushi Terui
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Publication number: 20170125230Abstract: The objective of the presently disclosed subject matter is to provide a mass spectrometer that improves the ionic permeability ratio at the entrance to an ion transport part or the entrance to a mass spectrometry part, and to acquire a high-sensitivity mass spectrum. To reduce the electric-field distortion that is caused by ion loss, electrodes are arranged so that the radius of a circle inscribed within the electrodes of the ion transport part is larger than the radius of a circle inscribed within the electrodes of the mass spectrometry part. The entrance to the electrodes of the mass spectrometry part also can have a tapered, inclined, folded-over, or rounded configuration. Together, these reduce the sharply fluctuating (peak-shaped) distribution of electric potential generated near the entrance to the ion transport part and the entrance to the mass spectrometry part.Type: ApplicationFiled: May 11, 2015Publication date: May 4, 2017Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Kiyomi Yoshinari, Yasushi Terui
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Publication number: 20160020082Abstract: An object of the invention is to provide a mass spectrometer system capable of obtaining a mass spectrum with high resolution as the mass number of an ion becomes higher. In the mass spectrometer system of the invention, a control unit 8 controls a mass spectrometry unit 4 so that a direct current voltage U, an amplitude V of a radio-frequency voltage, and a frequency F of the radio-frequency voltage, which are applied to a quadrupole electrode 13, are increased as a mass-to-charge ratio m/z of an ion of a target for mass spectrometry becomes larger. By controlling in this manner, the ion frequency when the ion passes through the inside of the mass spectrometry unit 4 is increased as the mass number of an ion becomes higher, and therefore, it is possible to obtain the mass spectrum with higher resolution.Type: ApplicationFiled: January 24, 2014Publication date: January 21, 2016Inventors: Kiyomi YOSHINARI, Yasushi TERUI
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Publication number: 20140337402Abstract: A method for efficiently carrying out an analysis and computation using mesh structures is disclosed. When an insulator is brought into contact with two conductors, the mesh structures are generated and a displacement current is analyzed. In the generated structures, the insulator is considered a three-dimensional mesh structure and at least a portion of the conductor brought into contact with the insulator is considered a three-dimensional structure whereas the other portions are taken as a one- or two-dimensional structures. In an alternative, the insulator is considered a three-dimensional structure and at least a portion of the conductor brought into contact with the insulator is considered a three-dimensional structure whereas the other portions are considered three- to one-dimensional structures. In the conductor, a short-circuit section with no mesh elements is provided between at least a portion brought into contact with the insulator and the other portions.Type: ApplicationFiled: November 14, 2011Publication date: November 13, 2014Applicant: Hitachi, Ltd.Inventors: Kazutami Tago, Nobuhiro Kusuno, Kiyomi Yoshinari, Akira Mishima
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Publication number: 20140200845Abstract: It is an object of the present invention to analyze heat transfers with a high degree of precision at a computation cost within a realistic range for a large-scale object such as an entire power-electronic system. In order to solve the problems described above, the present invention provides a numerical analysis system based mainly on a configuration for dividing the analysis area into at least two division areas, for analyzing at least one of the division areas by adoption of a finite element method or a boundary element method and for carrying out an analysis by adoption of a technique based on equivalent circuit approximation for at least one of the other division areas.Type: ApplicationFiled: August 24, 2011Publication date: July 17, 2014Applicant: Hitachi Ltd.Inventors: Kiyomi Yoshinari, Takuro Kanazawa
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Publication number: 20110101215Abstract: In quantitation without using the isotope labeling technique, there is no means to detect the presence/absence and the time region of the occurrence of quantitative analysis-inhibitory factors in data for the analysis, and the reliability of the data for the analysis cannot be evaluated. Also, the error of the data due to the occurrence of the quantitative analysis-inhibitory factors cannot be evaluated. In order to solve the problems, first, an internal standard to be detected simultaneously with a component for the analysis is mixed in a mobile phase or an eluate of a liquid chromatograph; under the condition where no quantitative analysis-inhibitory factors occur, a blank sample is analyzed to acquire a mass chromatogram of ions originated from the internal standard; and the result is stored in a data storage unit.Type: ApplicationFiled: March 27, 2009Publication date: May 5, 2011Inventors: Atsumu Hirabayashi, Masako Ishimaru, Kiyomi Yoshinari, Naomi Manri
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Patent number: 7932486Abstract: During the structural analysis of a protein or peptide by tandem mass spectroscopy, a peptide ion derived from a protein that has already been measured and that is expressed in great quantities is avoided as a tandem mass spectroscopy target. A peptide derived from a minute amount of protein, which has heretofore been difficult to analyze, can be automatically determined as a tandem mass spectroscopy target within the real time of measurement. Data concerning a protein that has already been measured and a peptide derived from the protein is automatically stored in an internal database. The stored data is collated with measured data with high accuracy to determine an isotope peak. In this way, the process of selecting a peptide peak that has not been measured as the target for the next tandem analysis can be performed within the real time of measurement and a redundant measurement of peptides derived from the same protein can be avoided.Type: GrantFiled: December 8, 2008Date of Patent: April 26, 2011Assignee: Hitachi High-Technologies CorporationInventors: Akihiro Sano, Atsumu Hirabayashi, Yasushi Terui, Kinya Kobayashi, Kiyomi Yoshinari, Kenko Uchida, Toshiyuki Yokosuka
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Patent number: 7595484Abstract: The present invention can provide a mass spectrometric system judging whether a measurement target is a substance required by an operator within an actual measurement time, when a substance (particularly such as protein or sugar chains) is analyzed. In the mass spectrometric system using a tandem mass spectrometer, a particular substance obtained by separating a sample is ionized, and mass analysis of the ionized substance is performed to obtain a spectrum. This spectrum is compared with a particular spectrum stored in advance, to thereby determine whether both the spectra match with each other. When a match is determined, a particular ion is further ionized within a particular time for detailed analysis. The invention also provides a mass spectrometric method, a diagnosis system and an inspection system each using the mass spectrometric system, and a program for operating a computer to control those systems with desired functions.Type: GrantFiled: December 23, 2005Date of Patent: September 29, 2009Assignee: Hitachi High-Technologies Corp.Inventors: Toshiyuki Yokosuka, Kinya Kobayashi, Kiyomi Yoshinari, Atsushi Otake, Atsumu Hirabayashi, Yasushi Terui
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Publication number: 20090189063Abstract: During the structural analysis of a protein or peptide by tandem mass spectroscopy, a peptide ion derived from a protein that has already been measured and that is expressed in great quantities is avoided as a tandem mass spectroscopy target. A peptide derived from a minute amount of protein, which has heretofore been difficult to analyze, can be automatically determined as a tandem mass spectroscopy target within the real time of measurement. Data concerning a protein that has already been measured and a peptide derived from the protein is automatically stored in an internal database. The stored data is collated with measured data with high accuracy to determine an isotope peak. In this way, the process of selecting a peptide peak that has not been measured as the target for the next tandem analysis can be performed within the real time of measurement and a redundant measurement of peptides derived from the same protein can be avoided.Type: ApplicationFiled: December 8, 2008Publication date: July 30, 2009Inventors: Akihiro Sano, Atsumu Hirabayashi, Yasushi Terui, Kinya Kobayashi, Kiyomi Yoshinari, Kenko Uchida, Toshiyuki Yokosuka