Patents by Inventor Kiyomi Yoshinari

Kiyomi Yoshinari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6914239
    Abstract: A system for analyzing mass spectrometric data is provided, which has an data input means for entering mass spectrometric data of a parent ion and dissociated ions resulting from multiple dissociation of the parent ion, and an analytical means for providing characteristics of a candidate for estimated structure of a precursor ion that is representative of pre-dissociation structure at each stage of dissociation. The system analyzes one of the structure of precursor ion at each stage of dissociation and the structure of parent ion based on the characteristics and spectrometric data.
    Type: Grant
    Filed: November 10, 2003
    Date of Patent: July 5, 2005
    Assignees: Hitachi, Ltd., Hitachi High-Technologies Corporation
    Inventors: Kiyomi Yoshinari, Kinya Kobayashi, Atsushi Otake, Toyoharu Okumoto
  • Publication number: 20050139761
    Abstract: A main object is to cope with an unknown structure substance thereby to identify the structure of a parent ion highly precisely and to derive a supposed structure. A method for analyzing mass spectrometric data is disclosed, which: acquires mass spectrometric data on an ionized sample and dissociated ions dissociated from the sample as a parent ion; derives dissociated ion candidates by analyzing the molecular orbits on the candidates of the structures of the parent ion; and displays the analytical results of the parent ion candidates and the dissociated ion candidates and compares the data of the dissociated ion candidates and the data of dissociated ions actually measured, to evaluate the structures of the parent ion candidates.
    Type: Application
    Filed: November 22, 2004
    Publication date: June 30, 2005
    Inventors: Kiyomi Yoshinari, Kinya Kobayashi, Lee Chahn
  • Patent number: 6907352
    Abstract: A main object is to cope with an unknown structure substance thereby to identify the structure of a parent ion highly precisely and to derive a supposed structure. A method for analyzing mass spectrometric data is disclosed, which: acquires mass spectrometric data on an ionized sample and dissociated ions dissociated from the sample as a parent ion; derives dissociated ion candidates by analyzing the molecular orbits on the candidates of the structures of the parent ion; and displays the analytical results of the parent ion candidates and the dissociated ion candidates and compares the data of the dissociated ion candidates and the data of dissociated ions actually measured, to evaluate the structures of the parent ion candidates.
    Type: Grant
    Filed: September 25, 2002
    Date of Patent: June 14, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Kiyomi Yoshinari, Kinya Kobayashi, Lee Chahn
  • Publication number: 20050063864
    Abstract: During the structural analysis of a protein or peptide by tandem mass spectroscopy, a peptide ion derived from a protein that has already been measured and that is expressed in great quantities is avoided as a tandem mass spectroscopy target. A peptide derived from a minute amount of protein, which has heretofore been difficult to analyze, can be automatically determined as a tandem mass spectroscopy target within the real time of measurement. Data concerning a protein that has already been measured and a peptide derived from the protein is automatically stored in an internal database. The stored data is collated with measured data with high accuracy to determine an isotope peak. In this way, the process of selecting a peptide peak that has not been measured as the target for the next tandem analysis can be performed within the real time of measurement and a redundant measurement of peptides derived from the same protein can be avoided.
    Type: Application
    Filed: May 20, 2004
    Publication date: March 24, 2005
    Inventors: Akihiro Sano, Atsumu Hirabayashi, Yasushi Terui, Kinya Kobayashi, Kiyomi Yoshinari, Kenko Uchida
  • Patent number: 6852972
    Abstract: Heavy ions are ejected earlier than light ions sequentially at almost zero energy and they are accelerated at a fixed voltage so as to be guided to a pusher of a TOF spectrometer. After ions are ejected in a procedure of giving an electric field gradient to an ion trap and linearly decreasing its RF voltage, a condition of spatially focusing ions having all mass numbers of a single point on the pusher is found. The focused ions are vertically accelerated using the pusher to perform the TOF mass spectrometry.
    Type: Grant
    Filed: May 29, 2003
    Date of Patent: February 8, 2005
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takashi Baba, Yuichiro Hashimoto, Kiyomi Yoshinari
  • Publication number: 20040262512
    Abstract: In a mass spectrometer utilizing an atmospheric pressure ion source, the amount of un-vaporized droplets that reach a mass spectrometric section is reduced. A mass spectrometer comprises: an ionization section for ionizing a sample at substantially atmospheric pressure; a first and a second intermediate pressure section in which the pressure is maintained lower than the pressure in said ionization section; a high vacuum section in which the pressure is maintained lower than the pressure in said intermediate pressure section and in which a mass spectrometric means for subjecting ions to mass spectrometry is disposed; a first pore electrode disposed between said ionization section and said first intermediate pressure section; an intermediate pore electrode disposed between said first intermediate pressure section and said second intermediate pressure section; and a second pore electrode disposed between said second intermediate pressure section and said high vacuum section.
    Type: Application
    Filed: April 30, 2004
    Publication date: December 30, 2004
    Inventors: Tomoyuki Tobita, Toshihiro Ishizuka, Masaru Tomioka, Kiyomi Yoshinari, Masami Sakamoto
  • Publication number: 20040211898
    Abstract: An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.
    Type: Application
    Filed: May 17, 2004
    Publication date: October 28, 2004
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Tadao Mimura, Masaru Tomioka
  • Publication number: 20040195502
    Abstract: A mass spectrometer according to the present invention has an ionization source for generating ions; an ion trap for accumulating the ions; a time-of-flight mass spectrometer for performing mass spectrometry analysis on the ions by use of a flight time; a collision damping chamber disposed between the ion trap and the time-of-flight mass spectrometer and having a plurality of electrodes therein, which produce a multi-pole electric field, wherein a gas is introduced into the collision damping chamber to reduce kinetic energy of the ions ejected from the ion trap; and an ion transmission adjusting mechanism disposed between the ion trap and the collision damping chamber to allow or prevent injection of the ions from the ion trap to the collision damping chamber. The mass spectrometer provides greatly enhanced qualitative and quantitative analysis capabilities, as compared with conventional techniques.
    Type: Application
    Filed: March 31, 2003
    Publication date: October 7, 2004
    Inventors: Yuichiro Hashimoto, Izumi Waki, Kiyomi Yoshinari, Yasushi Terui, Tsukasa Shishika, Marvin L. Vestal
  • Publication number: 20040181347
    Abstract: A system for analyzing mass spectrometric data is provided, which has an data input means for entering mass spectrometric data of a parent ion and dissociated ions resulting from multiple dissociation of the parent ion, and an analytical means for providing characteristics of a candidate for estimated structure of a precursor ion that is representative of pre-dissociation structure at each stage of dissociation. The system analyzes one of the structure of precursor ion at each stage of dissociation and the structure of parent ion based on the characteristics and spectrometric data.
    Type: Application
    Filed: November 10, 2003
    Publication date: September 16, 2004
    Applicants: HITACHI LTD., HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kiyomi Yoshinari, Kinya Kobayashi, Atsushi Otake, Toyoharu Okumoto
  • Publication number: 20040169138
    Abstract: The measurement throughput and the precision in sample identification are improved in a tandem type mass spectrograph. Thus, in a mass spectrum analyzing system utilizing a tandem type mass spectrograph in which the selection of an ionic species to serve as the measurement target, dissociation thereof and spectral measurement are repeated in n stages, the ionic species to be measured in MSn is selected based on the mass-to-charge ratios (m/z values) obtained as a result of the spectral analysis in MSn−1 (n≧2), and this procedure is repeated until the sequence of a required number of amino acids is determined.
    Type: Application
    Filed: February 4, 2004
    Publication date: September 2, 2004
    Inventors: Atsushi Ootake, Kinya Kobayashi, Kiyomi Yoshinari, Atsumu Hirabayashi, Izumi Waki
  • Patent number: 6759652
    Abstract: An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: July 6, 2004
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Tadao Mimura, Masaru Tomioka
  • Publication number: 20040111228
    Abstract: An apparatus for analyzing mass spectrometric data is provided, which has a feature that the apparatus includes the following means. They are namely a first input means for entering first data of an ion measured by mass spectrometry, a second input means for entering second data of a dissociated ion of the ion measured by mass spectrometry, a first data storing means for storing third data of mass spectrometry of a plurality of candidates for the structure of ion, a calculation means for producing fourth data of mass spectrometry of dissociated ions to be used in analyzing the plurality of candidates and an evaluation means for evaluating the plurality of candidates by making comparisons between the first and third data and between the second and fourth data, so that the structure of ion can be identified.
    Type: Application
    Filed: August 19, 2003
    Publication date: June 10, 2004
    Applicants: Hitachi, LTD., HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kinya Kobayashi, Kiyomi Yoshinari, Atsushi Otake
  • Patent number: 6745134
    Abstract: A main object is to cope with an unknown structure substance thereby to identify the structure of a parent ion highly precisely and to derive a supposed structure. A method for analyzing mass spectrometric data is disclosed, which: acquires mass spectrometric data on an ionized sample and dissociated ions dissociated from the sample as a parent ion; derives dissociated ion candidates by analyzing the molecular orbits on the candidates of the structures of the parent ion; and displays the analytical results of the parent ion candidates and the dissociated ion candidates and compares the data of the dissociated ion candidates and the data of dissociated ions actually measured, to evaluate the structures of the parent ion candidates.
    Type: Grant
    Filed: February 11, 2003
    Date of Patent: June 1, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Kinya Kobayashi, Kiyomi Yoshinari, Lee Chahn
  • Publication number: 20040050974
    Abstract: A valve encased nozzle device comprising a valve chamber having an introduction port for introducing pressurized liquid, and an opening for injecting the liquid, and a valve for closing and opening one or both of the introduction port and the injecting port, wherein the valve is disposed together with a valve driving mechanism in the valve chamber, whereby the introduction port or the injecting port or both are closed or opened by movement of the valve driven by the driving mechanism.
    Type: Application
    Filed: August 8, 2003
    Publication date: March 18, 2004
    Inventors: Chahn Lee, Kiyomi Yoshinari, Kinya Kobayashi
  • Patent number: 6683303
    Abstract: An ion trap mass spectrometer and spectrometry capable of dissociating ions to be dissociated efficiently regardless of ionic species without useless time and performing high-sensitive MS/MS spectrometry, lengthens a period for applying a CID voltage in accordance with a mass number or characteristics of ions to be dissociated in proportion to a mass-to-charge ratio of ions to be dissociated to thereby optimize the application period of the supplementary AC voltage applied in superposition manner in order to dissociate specific ionic species, so that ions to be dissociated are dissociated efficiently and high-sensitive analysis of dissociated ions can be attained without useless time.
    Type: Grant
    Filed: March 5, 2002
    Date of Patent: January 27, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Tadao Mimura, Shinji Nagai
  • Publication number: 20030236634
    Abstract: A main object is to cope with an unknown structure substance thereby to identify the structure of a parent ion highly precisely and to derive a supposed structure. A method for analyzing mass spectrometric data is disclosed, which: acquires mass spectrometric data on an ionized sample and dissociated ions dissociated from the sample as a parent ion; derives dissociated ion candidates by analyzing the molecular orbits on the candidates of the structures of the parent ion; and displays the analytical results of the parent ion candidates and the dissociated ion candidates and compares the data of the dissociated ion candidates and the data of dissociated ions actually measured, to evaluate the structures of the parent ion candidates.
    Type: Application
    Filed: September 25, 2002
    Publication date: December 25, 2003
    Inventors: Kiyomi Yoshinari, Kinya Kobayashi, Lee Chahn
  • Publication number: 20030236636
    Abstract: A main object is to cope with an unknown structure substance thereby to identify the structure of a parent ion highly precisely and to derive a supposed structure. A method for analyzing mass spectrometric data is disclosed, which: acquires mass spectrometric data on an ionized sample and dissociated ions dissociated from the sample as a parent ion; derives dissociated ion candidates by analyzing the molecular orbits on the candidates of the structures of the parent ion; and displays the analytical results of the parent ion candidates and the dissociated ion candidates and compares the data of the dissociated ion candidates and the data of dissociated ions actually measured, to evaluate the structures of the parent ion candidates.
    Type: Application
    Filed: February 11, 2003
    Publication date: December 25, 2003
    Inventors: Kiyomi Yoshinari, Kinya Kobayashi, Lee Chahn
  • Publication number: 20030222214
    Abstract: Heavy ions are ejected earlier than light ions sequentially at almost zero energy and they are accelerated at a fixed voltage so as to be guided to a pusher of a TOF spectrometer. After ions are ejected in a procedure of giving an electric field gradient to an ion trap and linearly decreasing its RF voltage, a condition of spatially focusing ions having all mass numbers of a single point on the pusher is found. The focused ions are vertically accelerated using the pusher to perform the TOF mass spectrometry.
    Type: Application
    Filed: May 29, 2003
    Publication date: December 4, 2003
    Inventors: Takashi Baba, Yuichiro Hashimoto, Kiyomi Yoshinari
  • Publication number: 20030205667
    Abstract: Depending on the RF driving voltage amplitude value and the frequency of each frequency component of wideband auxiliary AC voltages, the wideband auxiliary AC voltage comprising plural different frequency components is optimized so that undesired ions having mass-to-charge ratios within the required range will be resonantly ejected from the ion trap electrodes.
    Type: Application
    Filed: May 30, 2003
    Publication date: November 6, 2003
    Applicant: Hitachi, Ltd.
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Katsuhiro Nakagawa, Shinji Nagai
  • Patent number: 6633033
    Abstract: Depending on the RF driving voltage amplitude value and the frequency of each frequency component of wideband auxiliary AC voltages, the wideband auxiliary AC voltage comprising plural different frequency components is optimized so that undesired ions having mass-to-charge ratios within the required range will be resonantly ejected from the ion trap electrodes.
    Type: Grant
    Filed: December 6, 2000
    Date of Patent: October 14, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Katsuhiro Nakagawa, Shinji Nagai