Abstract: An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.

Abstract: An ion-deflecting device is located between a mass spectrometer and a detector, and undesired signal sources are prevented from reaching the detector during the ion-trapping period by switching the voltage applied to the detector between the ion-trapping period and the mass-analyzing period. A first voltage is applied to the detector during an ion-trapping period while a second voltage is applied to the detector during a mass-analyzing period. An ion-deflecting device deflects ions such that they do not reach the detector during an ion-trapping period while they do reach the detector during a mass-analyzing period. This way, the life of the detector is increased.

Abstract: Disclosed is a mass spectrometer capable of highly sensitively and highly efficiently measuring the masses of ions regardless of the polarity, mass numbers and energy of the ions. An ion beam transport unit (5), a conversion dynode (6) and a secondary electron detecting system (7) are disposed so that an acute angle is formed between the direction of travel of an ion beam striking on the conversion dynode (6), and a line (75) connecting the center (64) of a secondary electron exit (63) to the center (73) of a scintillator (71). The center axis (74) of the scintillator (71) lies between an end (52) of the ion transport unit (5) and the center axis (64) of the secondary electron exit (63). Since the secondary electron exit (63) is apart from an electric field created between the ion transport unit (5) and the scintillator (71), the secondary electrons are able to reach the scintillator (71) without being deflected.

Abstract: An ion trap mass spectrometer and spectrometry capable of dissociating ions to be dissociated efficiently regardless of ionic species without useless time and performing high-sensitive MS/MS spectrometry, lengthens a period for applying a CID voltage in accordance with a mass number or characteristics of ions to be dissociated in proportion to a mass-to-charge ratio of ions to be dissociated to thereby optimize the application period of the supplementary AC voltage applied in superposition manner in order to dissociate specific ionic species, so that ions to be dissociated are dissociated efficiently and high-sensitive analysis of dissociated ions can be attained without useless time.

Abstract: In the ion transport system for transporting ions from the ion source to the mass spectrometer, the multipole ion guide for transmitting ions necessary for analysis highly efficiently and eliminating unwanted ions before arriving at the mass spectrometer is realized.

Abstract: Depending on the RF driving voltage amplitude value and the frequency of each frequency component of wideband auxiliary AC voltages, the wideband auxiliary AC voltage comprising plural different frequency components is optimized so that undesired ions having mass-to-charge ratios within the required range will be resonantly ejected from the ion trap electrodes.

Abstract: The present invention provides an ion trap mass spectrometry method and its mass spectrometer of an internal ionization type for ejecting ions generated in a large amount when ionizing specimen gas or reagent gas by electron impact ionization (EI) or others in the ion trap from the space between the ion trap electrodes, trapping negative ions generated only in an extremely small amount in priority, and making an analysis in high sensitivity. During the ionization period for ionizing specimen gas or reagent gas by electron impact ionization (EI) or others in the ion trap, a static field is superimposed between the ion trap electrodes in addition to the RF field, and positive ions are made unstable and ejected from the space between the ion trap electrodes simultaneously with ionization, and negative ions generated only in an extremely small amount are trapped in priority, and a mass analysis is made.

Abstract: An numerical analysis time which is assigned to mass select one ion species having a specific mass-to-charge ratio mass selected is divided into the first part time and the second part time, and a dipole auxiliary electric field capable of spatially reducing a spread is superimposed in the first part time of the numerical analysis time and a quadrupole auxiliary voltage capable of rapidly emitting ions when position coordinates are large is superimposed in the second part of the time. Therefore, the initial spatial spread is reduced in the first part time and the trajectories of ions is rapidly amplified in the second part time, and the ions are emitted. Thus, the entire mass sweep time can be reduced and a high-resolution numerical analysis can be accelerated.

Abstract: By preventing the trapping efficiency of ions from largely depending on the mass-to-charge ratio, an ion trap mass spectrometer suitable for obtaining a high sensitive mass spectrum is provided. Ions of a specimen to be mass analyzed generated at an external ion source pass through an ion transportation portion and then injected into a space (ion trap volume) between the ring electrode and the end cap electrodes. An RF trap voltage power source applies an RF frequency V.multidot.cos .OMEGA.t between the ring electrode and the end cap electrodes to form a radio frequency electric field in the ion trap volume. The RF trap voltage is changed so that the optimum trap frequency is in inverse proportion to 1/2 power of a mass-to-charge ratio while the ions are being trapped in the radio frequency electric field formed in the ion trap volume.

Abstract: A scanning electron microscope in the present invention, by employing a retarding method and suppressing interferences between an electron beam and secondary electrons or back scattered electrons, makes it possible to obtain a clearer SEM image with a higher resolution. In the scanning electron microscope in the present invention, a shield electrode 117 is provided for shielding the electron beam 104 from electric fields of an energy analyzer 118 and a detector 121, and the energy analyzer 118 and the detector 121 are located in contact with an electron beam aperture 115 and the shield electrode 117.

Abstract: A sample separated through a pre-processor part having a gas chromatography (GC) or a liquid chromatography (LC) and a moving bed eliminating part is ionized by an ion source and mass-analyzed by a mass-analyzing part. The mass-analyzed ions are deflected and focused by a deflecting portion and a focusing portion in a deflecting and focusing part, and is detected by an ion detecting part. The result of detection is processed by a data processing part.

Abstract: A mass spectrometer and a mass spectrometry method having a high ion selection efficiency are provided. The mass spectrometer comprises an ion trap, a sample introducing device, an electron gun, a detector, a power supply for applying voltage to the ion trap, a control device for controlling the power supply and the electron gun, a mass analyzing device for performing mass spectrometry based on a detected signal of the detector. Using an auxiliary power supply, direction of an auxiliary electric field generated between end cap electrodes is made to point only toward the detector. In this occasion, by setting the cycle of the auxiliary voltage near the oscillation cycle of interest ion species in the axial direction, the interest ion species are synchronized with the auxiliary electric field to be certainly unstabilized in the detector side.

Abstract: An ion beam having a good converging property and a good quality is provided by satisfying the limitations controlling both angle of dispersion and the width of beam at the same time. The voltage 12d of a repeller electrode 1f in an ion source of electron bombardment type is input to an ion source state monitor 11 and the ion source state monitor 11 output a predicted value 12e of the voltage applied to an extractor electrode 1g to an extractor power source 9. As for the extractor electrode system, the width of a slit in the acceleration electrode 1b is made larger than the width of a slit of the extractor electrode 1g, and the extractor electrode 1g is set in a position apart from the acceleration electrode 1b by the distance nearly equal to the distance between the acceleration electrode 1b and the ion generating region 2a. By doing so, the electric field leaked from the slit of the acceleration electrode 1b to the inside of the ionization chamber 1a expands to the vicinity of the ion generating region.