Patents by Inventor Kiyomi Yoshinari

Kiyomi Yoshinari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7544930
    Abstract: The present invention provides a tandem type mass analysis system capable of carrying out the differential analysis with high efficiency by the tandem type mass analysis. A predetermined number of m/z regions are set up for carrying out the mass analysis with the all ions included therein being dissociated collectively for each m/z region so as to obtain measurement MS2 data. By comparing the measurement MS2 data with reference MS2 data stored in a reference data base, a difference thereof is detected. For the m/z region with a differential component detected, the mass analysis is carried out collectively without dissociation for the all ions included therein so as to obtain measurement MS1 data. By comparing the measurement MS1 data with the reference MS1 data, a difference thereof is detected. From the difference thereof, a parent ion considered to be the differential component factor is presumed for carrying out the mass analysis with the same being dissociated.
    Type: Grant
    Filed: January 18, 2007
    Date of Patent: June 9, 2009
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kiyomi Yoshinari, Yasushi Terui, Toshiyuki Yokosuka, Kinya Kobayashi, Atsumu Hirabayashi
  • Patent number: 7473892
    Abstract: During the structural analysis of a protein or peptide by tandem mass spectroscopy, a peptide ion derived from a protein that has already been measured and that is expressed in great quantities is avoided as a tandem mass spectroscopy target. A peptide derived from a minute amount of protein, which has heretofore been difficult to analyze, can be automatically determined as a tandem mass spectroscopy target within the real time of measurement. Data concerning a protein that has already been measured and a peptide derived from the protein is automatically stored in an internal database. The stored data is collated with measured data with high accuracy to determine an isotope peak. In this way, the process of selecting a peptide peak that has not been measured as the target for the next tandem analysis can be performed within the real time of measurement and a redundant measurement of peptides derived from the same protein can be avoided.
    Type: Grant
    Filed: May 20, 2004
    Date of Patent: January 6, 2009
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Akihiro Sano, Atsumu Hirabayashi, Yasushi Terui, Kinya Kobayashi, Kiyomi Yoshinari, Kenko Uchida, Toshiyuki Yokosuka
  • Patent number: 7435949
    Abstract: A tandem analysis system is provided for ionizing a substance, performing mass spectrometric analysis of various ion types generated, selecting and dissociating an ion type, the ion type having a specific mass-to-charge ratio, and thereby, repeating mass spectrometric analysis measurement on the ion of the ion type over n-th stages. A processing judges control content for the analysis next to MSn (the n-th stage mass spectrometric analysis) within a predetermined time, based on ion intensity being represented by an ion peak with respect to the mass-to-charge ratio of each ion in the MSn result. An ion detection unit judges isotope-peak from the measured ionized data. Assuming that the MS1 count number of a parent-ion peptide measured during a certain constant time-interval is I, a data processing unit makes the MS2 integration number-of-times or analysis time of the peptide proportional to 1/I.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: October 14, 2008
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsushi Ohtake, Kinya Kobayashi, Toshiyuki Yokosuka, Kiyomi Yoshinari
  • Patent number: 7332713
    Abstract: In a method for mass spectrometry, a plurality of juxtaposed chromatography apparatus connected to a mass spectrometer start eluting at a predetermined time difference and the following mass spectrometer conducts mass spectrometry. A chromatogram in a preceding chromatography apparatus is analyzed on real time base and results of the analysis are used on real time base to change an elusion condition of a succeeding chromatography apparatus. A mass spectrometric system suitable for carrying out the method is also provided.
    Type: Grant
    Filed: August 25, 2005
    Date of Patent: February 19, 2008
    Assignee: Hitachi, Ltd.
    Inventors: Kiyomi Yoshinari, Toshiyuki Yokosuka, Atsushi Ootake, Kinya Kobayashi, Yuichiro Hashimoto
  • Publication number: 20070221836
    Abstract: An object of the present invention is to evaluate quantitatively a peptide derived from a protein, whose analysis has been difficult so far, by analyzing a peptide ion derived from a protein already measured but having a different total ion amount as the tandem mass analysis target at the time of quantitatively evaluating a fluctuating component between different kinds of specimens by the tandem mass analysis of a protein or a peptide. In the present invention, in order to achieve the above-mentioned object, data of a derived peptide obtained by a first time measurement are stored automatically in an internal database and collated with second time measurement data highly accurately. The processing for selecting the peak of the already measured peptide with the relative amount fluctuation as the next tandem analysis target is implemented within the real time of the measurement for avoiding the analysis of a peptide without the relative amount fluctuation.
    Type: Application
    Filed: January 26, 2007
    Publication date: September 27, 2007
    Inventors: Kinya Kobayashi, Kiyomi Yoshinari, Toshiyuki Yokosuka, Atsumu Hirabayashi
  • Publication number: 20070187588
    Abstract: The present invention provides a tandem type mass analysis system capable of carrying out the differential analysis with high efficiency by the tandem type mass analysis. A predetermined number of m/z regions are set up for carrying out the mass analysis with the all ions included therein being dissociated collectively for each m/z region so as to obtain measurement MS2 data. By comparing the measurement MS2 data with reference MS2 data stored in a reference data base, a difference thereof is detected. For the m/z region with a differential component detected, the mass analysis is carried out collectively without dissociation for the all ions included therein so as to obtain measurement MS1 data. By comparing the measurement MS1 data with the reference MS1 data, a difference thereof is detected. From the difference thereof, a parent ion considered to be the differential component factor is presumed for carrying out the mass analysis with the same being dissociated.
    Type: Application
    Filed: January 18, 2007
    Publication date: August 16, 2007
    Inventors: Kiyomi Yoshinari, Yasushi Terui, Toshiyuki Yokosuka, Kinya Kobayashi, Atsumu Hirabayashi
  • Patent number: 7180056
    Abstract: In a method of measuring by a tandem mass spectrometer a sample labeled with an isotope, measuring throughput is improved. In a technique in which tandem mass spectrometer is used to analyze a sample labeled with an isotope, spectra obtained by a first-stage measurement (MS1) are analyzed during a measuring session in a realtime fashion to determine ions to be used in second-stage and subsequent dissociation• spectral measurement (MS2).
    Type: Grant
    Filed: June 3, 2005
    Date of Patent: February 20, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Ohtake, Kinya Kobayashi, Kiyomi Yoshinari, Toshiyuki Yokosuka, Atsumu Hirabayashi
  • Patent number: 7158893
    Abstract: A main object is to cope with an unknown structure substance thereby to identify the structure of a parent ion highly precisely and to derive a supposed structure. A method for analyzing mass spectrometric data is disclosed, which: acquires mass spectrometric data on an ionized sample and dissociated ions dissociated from the sample as a parent ion; derives dissociated ion candidates by analyzing the molecular orbits on the candidates of the structures of the parent ion; and displays the analytical results of the parent ion candidates and the dissociated ion candidates and compares the data of the dissociated ion candidates and the data of dissociated ions actually measured, to evaluate the structures of the parent ion candidates.
    Type: Grant
    Filed: November 22, 2004
    Date of Patent: January 2, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Kiyomi Yoshinari, Kinya Kobayashi, Lee Chahn
  • Publication number: 20060289735
    Abstract: A tandem analysis system is provided for ionizing a substance, performing mass spectrometric analysis of various ion types generated, selecting and dissociating an ion type, the ion type having a specific mass-to-charge ratio, and thereby, repeating mass spectrometric analysis measurement on the ion of the ion type over n-th stages. A processing judges control content for the analysis next to MSn (the n-th stage mass spectrometric analysis) within a predetermined time, based on ion intensity being represented by an ion peak with respect to the mass-to-charge ratio of each ion in the MSn result. An ion detection unit judges isotope-peak from the measured ionized data. Assuming that the MS1 count number of a parent-ion peptide measured during a certain constant time-interval is I, a data processing unit makes the MS2 integration number-of-times or analysis time of the peptide proportional to 1/I.
    Type: Application
    Filed: May 25, 2006
    Publication date: December 28, 2006
    Inventors: Atsushi Ohtake, Kinya Kobayashi, Toshiyuki Yokosuka, Kiyomi Yoshinari
  • Patent number: 7126113
    Abstract: According to the existing mass spectrometric system, whether or not the informations are sufficient for analyzing substances (particularly proteins, sugars, etc.) cannot be judged in the process of measurement. Further, it is difficult to find out isomers having just the same mass number or compounds very close in mass only from the MS data. According to this invention, whether or not the retention time in the LC (or GC) of peptide formed at the time of enzymatic decomposition of protein coincides with the predicted retention time assumed from the amino acid sequence predicted from MS2 mass spectrometry data is judged within the actual time period of measurement, and thereby the quality of MS2 mass spectrometry data (quantity of information) is judged.
    Type: Grant
    Filed: January 25, 2005
    Date of Patent: October 24, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Toshiyuki Yokosuka, Atsumu Hirabayashi, Yasushi Terui, Kinya Kobayashi, Kiyomi Yoshinari
  • Publication number: 20060169889
    Abstract: The present invention can provide a mass spectrometric system judging whether a measurement target is a substance required by an operator within an actual measurement time, when a substance (particularly such as protein or sugar chains) is analyzed. In the mass spectrometric system using a tandem mass spectrometer, a particular substance obtained by separating a sample is ionized, and mass analysis of the ionized substance is performed to obtain a spectrum. This spectrum is compared with a particular spectrum stored in advance, to thereby determine whether both the spectra match with each other. When a match is determined, a particular ion is further ionized within a particular time for detailed analysis. The invention also provides a mass spectrometric method, a diagnosis system and an inspection system each using the mass spectrometric system, and a program for operating a computer to control those systems with desired functions.
    Type: Application
    Filed: December 23, 2005
    Publication date: August 3, 2006
    Inventors: Toshiyuki Yokosuka, Kinya Kobayashi, Kiyomi Yoshinari, Atsushi Otake, Atsumu Hirabayashi, Yasushi Terui
  • Patent number: 7075069
    Abstract: Depending on the RF driving voltage amplitude value and the frequency of each frequency component of wideband auxiliary AC voltages, the wideband auxiliary AC voltage comprising plural different frequency components is optimized so that undesired ions having mass-to-charge ratios within the required range will be resonantly ejected from the ion trap electrodes.
    Type: Grant
    Filed: May 30, 2003
    Date of Patent: July 11, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Katsuhiro Nakagawa, Shinji Nagai
  • Patent number: 7064319
    Abstract: A mass spectrometer according to the present invention has an ionization source for generating ions; an ion trap for accumulating the ions; a time-of-flight mass spectrometer for performing mass spectrometry analysis on the ions by use of a flight time; a collision damping chamber disposed between the ion trap and the time-of-flight mass spectrometer and having a plurality of electrodes therein, which produce a multi-pole electric field, wherein a gas is introduced into the collision damping chamber to reduce kinetic energy of the ions ejected from the ion trap; and an ion transmission adjusting mechanism disposed between the ion trap and the collision damping chamber to allow or prevent injection of the ions from the ion trap to the collision damping chamber. The mass spectrometer provides greatly enhanced qualitative and quantitative analysis capabilities, as compared with conventional techniques.
    Type: Grant
    Filed: March 31, 2003
    Date of Patent: June 20, 2006
    Assignees: Hitachi High-Technologies Corporation, Applera Corporation
    Inventors: Yuichiro Hashimoto, Izumi Waki, Kiyomi Yoshinari, Yasushi Terui, Tsukasa Shishika, Marvin L. Vestal
  • Patent number: 7053367
    Abstract: In a mass spectrometer utilizing an atmospheric pressure ion source, the amount of un-vaporized droplets that reach a mass spectrometric section is reduced. A mass spectrometer comprises: an ionization section for ionizing a sample at substantially atmospheric pressure; a first and a second intermediate pressure section in which the pressure is maintained lower than the pressure in said ionization section; a high vacuum section in which the pressure is maintained lower than the pressure in said intermediate pressure section and in which a mass spectrometric means for subjecting ions to mass spectrometry is disposed; a first pore electrode disposed between said ionization section and said first intermediate pressure section; an intermediate pore electrode disposed between said first intermediate pressure section and said second intermediate pressure section; and a second pore electrode disposed between said second intermediate pressure section and said high vacuum section.
    Type: Grant
    Filed: November 7, 2001
    Date of Patent: May 30, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomoyuki Tobita, Toshihiro Ishizuka, Masaru Tomioka, Kiyomi Yoshinari, Masami Sakamoto
  • Publication number: 20060043281
    Abstract: In a method for mass spectrometry, a plurality of juxtaposed chromatography apparatus connected to a mass spectrometer start eluting at a predetermined time difference and the following mass spectrometer conducts mass spectrometry. A chromatogram in a preceding chromatography apparatus is analyzed on real time base and results of the analysis are used on real time base to change an elusion condition of a succeeding chromatography apparatus. A mass spectrometric system suitable for carrying out the method is also provided.
    Type: Application
    Filed: August 25, 2005
    Publication date: March 2, 2006
    Inventors: Kiyomi Yoshinari, Toshiyuki Yokosuka, Atsushi Ootake, Kinya Kobayashi, Yuichiro Hashimoto
  • Patent number: 6977373
    Abstract: An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.
    Type: Grant
    Filed: May 17, 2004
    Date of Patent: December 20, 2005
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Tadao Mimura, Masaru Tomioka
  • Publication number: 20050274884
    Abstract: In a method of measuring by a tandem mass spectrometer a sample labeled with an isotope, measuring throughput is improved. In a technique in which tandem mass spectrometer is used to analyze a sample labeled with an isotope, spectra obtained by a first-stage measurement (MS1) are analyzed during a measuring session in a realtime fashion to determine ions to be used in second-stage and subsequent dissociation•spectral measurement (MS2).
    Type: Application
    Filed: June 3, 2005
    Publication date: December 15, 2005
    Inventors: Atsushi Otake, Kinya Kobayashi, Kiyomi Yoshinari, Toshiyuki Yokosuka, Atsumu Hirabayashi
  • Patent number: 6957159
    Abstract: An apparatus for analyzing mass spectrometric data is described. The apparatus has a first input section for entering first data of an ion measured by mass spectrometry, a second input section for entering second data of a dissociated ion of the ion measured by mass spectrometry, a first data storing section for storing third data of mass spectrometry of a plurality of candidates for the structure of ion, a calculation section for producing fourth data of mass spectrometry of dissociated ions to be used in analyzing the plurality of candidates and an evaluation section for evaluating the plurality of candidates by making comparisons between the first and third data and between the second and fourth data, so that the structure of ion can be identified.
    Type: Grant
    Filed: August 19, 2003
    Date of Patent: October 18, 2005
    Assignees: Hitachi Ltd., Hitachi High-Technologies Corporation
    Inventors: Kinya Kobayashi, Kiyomi Yoshinari, Atsushi Otake
  • Publication number: 20050184232
    Abstract: According to the existing mass spectrometric system, whether or not the informations are sufficient for analyzing substances (particularly proteins, sugars, etc.) cannot be judged in the process of measurement. Further, it is difficult to find out isomers having just the same mass number or compounds very close in mass only from the MS data. According to this invention, whether or not the retention time in the LC (or GC) of peptide formed at the time of enzymatic decomposition of protein coincides with the predicted retention time assumed from the amino acid sequence predicted from MS2 mass spectrometry data is judged within the actual time period of measurement, and thereby the quality of MS2 mass spectrometry data (quantity of information) is judged.
    Type: Application
    Filed: January 25, 2005
    Publication date: August 25, 2005
    Inventors: Toshiyuki Yokosuka, Atsumu Hirabayashi, Yasushi Terui, Kinya Kobayashi, Kiyomi Yoshinari
  • Patent number: 6917037
    Abstract: The measurement throughput and the precision in sample identification are improved in a tandem type mass spectrograph. Thus, in a mass spectrum analyzing system utilizing a tandem type mass spectrograph in which the selection of an ionic species to serve as the measurement target, dissociation thereof and spectral measurement are repeated in n stages, the ionic species to be measured in MSn is selected based on the mass-to-charge ratios (m/z values) obtained as a result of the spectral analysis in MSn?1 (n?2), and this procedure is repeated until the sequence of a required number of amino acids is determined.
    Type: Grant
    Filed: February 4, 2004
    Date of Patent: July 12, 2005
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsushi Ootake, Kinya Kobayashi, Kiyomi Yoshinari, Atsumu Hirabayashi, Izumi Waki