Abstract: Stiffening is provided for an electronic package assembly having a substrate. A first electronic package, having a first function, is electromechanically fastened to a first surface of the substrate with a first array of electrically conductive interconnects, which is disposed over a central area of the substrate first surface. A second electronic package, having a second function, is fastened to the first substrate surface with a second conductive interconnect array. At least a pair of the first array conductors is electrically coupled to at least a pair of the second array conductors for data/signal exchange and at least a component of the first electronic package interacts with at least a component of the second package. A metallic stiffener ring is disposed about an outer periphery of at least the central area of the substrate.

Abstract: A packaging substrate, a packaged semiconductor device, a computing device and methods for forming the same are provided. In one embodiment, a packaging substrate is provided that includes a packaging structure having a chip mounting surface and a bottom surface. The packaging structure has at a plurality of conductive paths formed between the chip mounting surface and the bottom surface. The conductive paths are configured to provide electrical connection between an integrated circuit chip disposed on the chip mounting surface and the bottom surface of the packaging structure. The packaging structure has an opening formed in the chip mounting surface proximate a perimeter of the packaging structure. A stiffening microstructure is disposed in the opening and is coupled to the packaging structure.

Abstract: An integrated circuit system includes a heat spreader that is thermally coupled to a semiconductor chip and has a cavity or opening formed in the heat spreader. The cavity or opening is positioned so that capacitors and/or other passive components mounted to the same packaging substrate as the semiconductor chip are at least partially disposed in the cavity or opening. Because the passive components are disposed in the cavity or opening, the integrated circuit system has a reduced package thickness.

Abstract: A system, method, and computer program product are provided for producing a high bandwidth bottom package of a die-on-package structure. The method includes the steps of receiving a bottom package comprising a substrate material having a top layer and an integrated circuit die that is coupled to the top layer of the substrate material. A first set of pads is formed on the top layer of the substrate material and a layer of dielectric material is applied on a top surface of the bottom package to cover the integrated circuit die and the first set of pads.

Abstract: One embodiment of the present invention sets forth an integrated circuit package including a substrate, an integrated circuit die, and a plurality of solder bump structures. The substrate includes a first plurality of interconnects disposed on a first surface of the substrate. The integrated circuit die includes a second plurality of interconnects disposed on a first surface of the integrated circuit die. The plurality of solder bump structures couple the first plurality of interconnects to the second plurality of interconnects. The first plurality of interconnects are configured to be substantially aligned with the second plurality of interconnects when the integrated circuit package is at a first temperature within a range of about 0° C. to about ?100° C. The first plurality of interconnects are configured to be offset from the second plurality of interconnects when the integrated circuit package is at a temperature above the first temperature.

Abstract: An integrated circuit package is described including a substrate, an integrated circuit die, a first plurality of solder bump structures, and a first plurality of variable-size solder bump structures. The first plurality of solder bump structures electrically couple the integrated circuit die to the substrate. The first plurality of variable-size solder bump structures are disposed on a bottom surface of the substrate. The first plurality of variable-size solder bump structures are sized to be substantially coplanar with a seating plane of the integrated circuit package.

Abstract: An integrated circuit package includes a packaging substrate with an electrical connection pad formed thereon and an integrated circuit die coupled to the electrical connection pad. The electrical connection pad includes an electroplated surface finish layer, but does not include an electrical trace configured as a plating tail. Because the electrical connection pad is free of a plating tail, signal degradation caused by the presence of plating tails in the integrated circuit package is avoided.

Abstract: One embodiment sets forth an integrated circuit package that includes a substrate, one or more devices mounted on the substrate, a layer of under-fill configured to secure the one or more devices on the substrate, and a solder trench formed in the substrate, where the aggregate volume of the solder trench is large enough to capture a flow of excess under-fill during fabrication. One advantage of the disclosed integrated circuit package is that the solder trench is used in lieu of solder dam structures, thereby allowing a stencil to be lowered closer to the substrate surface during fabrication, which facilitates depositing solder paste during fabrication.

Abstract: Embodiments of the invention generally relate to package substrates for integrated circuits. The package substrates each include a core having electrically conductive vias therethrough. Build-up layers formed from dielectric materials having different compositions are disposed around the core and include interconnects formed therein for facilitating electrical connections between integrated circuits coupled to the package substrate. The dielectric materials are selected to allow finer interconnect geometries where desired, and to increase the rigidity, and thus planarity, of the package substrate. Exemplary dielectric materials include pre-impregnated composite fibers for increasing the rigidity of a package substrate, and Ajinomoto Build-up Film for allowing the formation finer interconnect geometries.

Abstract: A system, method, and computer program product are provided for producing a high bandwidth bottom package of a die-on-package structure. The method includes the steps of receiving a bottom package comprising a substrate material having a top layer and an integrated circuit die that is coupled to the top layer of the substrate material. A first set of pads is formed on the top layer of the substrate material and a layer of dielectric material is applied on a top surface of the bottom package to cover the integrated circuit die and the first set of pads.

Abstract: One aspect of the present disclosure provides an IC package that includes a printed circuit board (PCB) having a first material layer located thereon. The first material layer has bond pads located therein that form a contact array defined by a perimeter. A second material layer is located at or adjacent an outer edge of the PCB. The second material layer is located outside the perimeter of the contact array and has a higher coefficient of thermal expansion (CTE) value and a greater thickness than the first material layer.

Abstract: A system, method, and computer program product are provided for affixing a post to a substrate pad. In use, a post is affixed to each of one or more pads of a substrate, where each post receives a ball of a package during an assembly process.

Abstract: A microelectronic package includes larger diameter solder bumps and smaller diameter solder bumps for coupling an interposer to a packaging substrate. The larger diameter solder bumps are positioned on a peripheral surface of the interposer and the smaller diameter solder bumps are positioned on a center surface of the interposer. The solder bumps positioned in the peripheral region can more reliably withstand the higher mechanical stresses that occur in this peripheral region during operation of the microelectronic package.

Abstract: One aspect of the present disclosure provides an IC substrate, comprising a first material layer located on a first side of the IC substrate, and a second material layer located on a second, opposing side of the IC substrate, wherein the second material layer has a higher coefficient of thermal expansion CTE value than the first material layer.

Abstract: One aspect of the present disclosure provides an IC substrate, comprising a first material layer located on a first side of the IC substrate, and a second material layer located on a second, opposing side of the IC substrate, wherein the second material layer has a higher coefficient of thermal expansion CTE value than the first material layer.

Abstract: A microelectronic package includes larger diameter solder bumps and smaller diameter solder bumps for coupling an interposer to a packaging substrate. The larger diameter solder bumps are positioned on a peripheral surface of the interposer and the smaller diameter solder bumps are positioned on a center surface of the interposer. The solder bumps positioned in the peripheral region can more reliably withstand the higher mechanical stresses that occur in this peripheral region during operation of the microelectronic package.

Abstract: Stiffening is provided for an electronic package assembly having a substrate. A first electronic package, having a first function, is electromechanically fastened to a first surface of the substrate with a first array of electrically conductive interconnects, which is disposed over a central area of the substrate first surface. A second electronic package, having a second function, is fastened to the first substrate surface with a second conductive interconnect array. At least a pair of the first array conductors is electrically coupled to at least a pair of the second array conductors for data/signal exchange and at least a component of the first electronic package interacts with at least a component of the second package. A metallic stiffener ring is disposed about an outer periphery of at least the central area of the substrate.

Abstract: An integrated circuit package includes a packaging substrate with an electrical connection pad formed thereon and an integrated circuit die coupled to the electrical connection pad. The electrical connection pad includes an electroplated surface finish layer, but does not include an electrical trace configured as a plating tail. Because the electrical connection pad is free of a plating tail, signal degradation caused by the presence of plating tails in the integrated circuit package is avoided.

Abstract: An integrated circuit package includes a packaging substrate, which has an electrically conductive grid formed on a dielectric layer, and an integrated circuit die electrically coupled to the electrically conductive grid at one or more locations. In this embodiment, the electrically conductive grid includes a plurality of electrically conductive portions, wherein each portion is electrically coupled to at least one other portion, and a plurality of void regions that are electrically non-contiguous and substantially free of electrically conductive material. One advantage of the integrated circuit package is that a packaging substrate that is reduced in thickness, and therefore rigidity, can still maintain planarity during operation.

Abstract: One embodiment of the invention sets forth a packaging system, which includes a first package substrate, an electrically conductive pad formed on a surface of the first package substrate, and a supporting structure formed on the electrically conductive pad. The supporting structure has a top surface and a side surface, and only the top surface of the supporting structure is coupled to a solder joint to establish an electrical connection between the first package substrate and an adjacent, parallel second package substrate. By having the solder joint connected only to the top surface of the supporting structure, the resulting solder joint structure is narrower and taller. Therefore, even if solder joints are placed at a finer pitch, a standoff height between the first and second package substrates can be maintained at a desired height to accommodate a fixed-size IC chip that is disposed between the first and second package substrates.