Abstract: A process for manufacturing a printed circuit board having high-density microvias formed in a thick substrate is disclosed. The method includes the steps of forming one or more holes in a thick substrate using a laser drilling technique, electroplating the one or more holes with a conductive material, wherein the conductive material does not completely fill the one or more holes, and filling the one or more plated holes with a non-conductive material.

Abstract: One embodiment sets forth an integrated circuit package that includes a substrate, one or more devices mounted on the substrate, a layer of under-fill configured to secure the one or more devices on the substrate, and a solder trench formed in the substrate, where the aggregate volume of the solder trench is large enough to capture a flow of excess under-fill during fabrication. One advantage of the disclosed integrated circuit package is that the solder trench is used in lieu of solder dam structures, thereby allowing a stencil to be lowered closer to the substrate surface during fabrication, which facilitates depositing solder paste during fabrication.

Abstract: An integrated circuit system includes a heat spreader that is thermally coupled to a semiconductor chip and has a cavity or opening formed in the heat spreader. The cavity or opening is positioned so that capacitors and/or other passive components mounted to the same packaging substrate as the semiconductor chip are at least partially disposed in the cavity or opening. Because the passive components are disposed in the cavity or opening, the integrated circuit system has a reduced package thickness.

Abstract: One embodiment of the present invention sets forth an integrated circuit package including a substrate, an integrated circuit die, a first plurality of solder bump structures, and a first plurality of variable-size solder bump structures. The first plurality of solder bump structures electrically couple the integrated circuit die to the substrate. The first plurality of variable-size solder bump structures are disposed on a bottom surface of the substrate. The first plurality of variable-size solder bump structures are sized to be substantially coplanar with a seating plane of the integrated circuit package.

Abstract: One embodiment of the present invention sets forth an integrated circuit package including a substrate, an integrated circuit die, and a plurality of solder bump structures. The substrate includes a first plurality of interconnects disposed on a first surface of the substrate. The integrated circuit die includes a second plurality of interconnects disposed on a first surface of the integrated circuit die. The plurality of solder bump structures couple the first plurality of interconnects to the second plurality of interconnects. The first plurality of interconnects are configured to be substantially aligned with the second plurality of interconnects when the integrated circuit package is at a first temperature within a range of about 0° C. to about ?100° C. The first plurality of interconnects are configured to be offset from the second plurality of interconnects when the integrated circuit package is at a temperature above the first temperature.

Abstract: A packaging substrate, a packaged semiconductor device, a computing device and methods for forming the same are provided. In one embodiment, a packaging substrate is provided that includes a packaging structure having a chip mounting surface and a bottom surface. The packaging structure has at a plurality of conductive paths formed between the chip mounting surface and the bottom surface. The conductive paths are configured to provide electrical connection between an integrated circuit chip disposed on the chip mounting surface and the bottom surface of the packaging structure. The packaging structure has an opening formed in the chip mounting surface proximate a perimeter of the packaging structure. A stiffening microstructure is disposed in the opening and is coupled to the packaging structure.

Abstract: Embodiments of the invention generally relate to package substrates for integrated circuits. The package substrates each include a core having electrically conductive vias therethrough. Build-up layers formed from dielectric materials having different compositions are disposed around the core and include interconnects formed therein for facilitating electrical connections between integrated circuits coupled to the package substrate. The dielectric materials are selected to allow finer interconnect geometries where desired, and to increase the rigidity, and thus planarity, of the package substrate. Exemplary dielectric materials include pre-impregnated composite fibers for increasing the rigidity of a package substrate, and Ajinomoto Build-up Film for allowing the formation finer interconnect geometries.

Abstract: Embodiments of the present invention provide a packaging system, which generally includes a substrate, a first electrical conductive pad and a second electrical conductive pad formed on a top surface of the substrate, and a mask section formed on the top surface of the substrate and disposed between the first electrical conductive pad and the second electrical conductive pad. The packaging system further includes a passive component mounted onto a top surface of the mask section, wherein a portion of a back surface of the passive component is in physical contact with the first electrical conductive pad and the second electrical conductive pad, respectively.

Abstract: One embodiment of the present invention sets forth an integrated circuit package that includes a substrate, one or more devices mounted on the substrate, and a lid having a top portion and an end portion and configured to encapsulate the one or more devices. The top portion is thinner than the end portion. One advantage of the disclosed design is that the overall height of an IC package may be reduced without significantly impacting the structural integrity or co-planarity of the IC package.

Abstract: A packaging substrate includes a high reliability via structure that extends through multiple layers of the packaging substrate. The via structure includes an opening formed through multiple layers of the packaging substrate and an electrically conductive layer that is deposited in the opening. The opening is formed in a single material removal process and the conductive layer is formed in a single deposition process. Because the conductive layer is formed in a single deposition process, the conductive layer provides an interface-free conductive path between the multiple layers.

Abstract: A system, method, and computer program product are provided for preparing a substrate post. In use, a first solder mask is applied to a substrate. Additionally, a post is affixed to each of one or more pads of the substrate. Further, a second solder mask is applied to the substrate.

Abstract: A system, method, and computer program product are provided for controlling warping of a substrate. In use, a first solder mask is attached to a top side of a substrate. Additionally, a second solder mask is attached to a bottom side of the substrate, wherein the first solder mask and the second solder mask control warping of the substrate.

Abstract: A system, method, and computer program product are provided for affixing a post to a substrate pad. In use, a post is affixed to each of one or more pads of a substrate, where each post receives a ball of a package during an assembly process.

Abstract: A semiconductor device includes a semiconductor die and a plurality of lead-free solder bumps disposed on a surface of the semiconductor die. A substrate includes a plurality of metal layers and a plurality of dielectric layers. One of the metal layers includes a plurality of contact pads corresponding to the plurality of lead-free solder bumps, and one of the dielectric layers is an exterior dielectric layer having a plurality of respective openings for the contact pad. A plurality of respective copper posts is disposed on the contact pads. The respective copper post for each contact pad extends from the contact pad through the respective opening for the contact pad. The semiconductor die is mounted on the substrate with connections between the plurality of lead-free solder bumps and the plurality of copper posts.

Abstract: A semiconductor device includes a semiconductor die and lead-free solder bumps disposed on a surface of the semiconductor die. A substrate includes metal layers and dielectric layers. One of the metal layers includes contact pads corresponding to lead-free solder bumps, and one of the dielectric layers is an exterior dielectric layer having respective openings for the contact pad. Respective copper posts are disposed on the contact pads. The respective copper post for each contact pad extends from the contact pad through the respective opening for the contact pad. The semiconductor die is mounted on the substrate with connections between the lead-free solder bumps and the copper posts.

Abstract: A through hole is formed in a circuit board that has fibers dispersed in a polymer matrix. Copper is sputtered within the through hole to form a sufficiently conductive layer for electrolytic plating over the sputtered copper layer.

Abstract: A method of enabling a circuit board analysis is disclosed. The method comprising removing a portion of the circuit board on a first side of the circuit board opposite a second side of the circuit board having an integrated circuit package; removing the circuit board from the integrated circuit package; performing a dye mapping to analyze bonds between the integrated circuit package and the circuit board; and performing an analysis of the integrated circuit package.

Abstract: A substrate for an integrated circuit package is disclosed. The substrate comprises a core comprising a first dielectric layer having a first thickness; conductive traces formed on the first dielectric layer for routing signals within the integrated circuit package, wherein the conductive traces have a second thickness; and a substrate support structure comprising conductive traces formed on the first dielectric layer, where the conductive traces of the substrate support structure have a third thickness which is greater than the second thickness. A method of forming an integrated circuit package is also disclosed.

Abstract: In various embodiments, provided are multi-functional biodegradable particles for selectable targeting, imaging, and delivery of therapeutic agents. Also provided are methods of using the provided particles for treatment of ocular disorders, such as for the treatment of age-related macular degeneration. The provided particles and methods provide a clinician with options for control over, and monitoring of, the delivery of therapeutic agents.

Abstract: A contact pad in an integrated circuit is disclosed. The contact pad comprises a flat portion comprising a base of the contact pad; a plurality of projections extending from and substantially perpendicular to the flat portion; and a solder ball attached to the projections and the flat portion. A method of forming a contact pad is also disclosed.