Test and measurement instrument and accessories
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The broken lines in the drawings depict environmental structure as well as unclaimed portions of the test and measurement instrument and accessories, neither of which form any part of the claimed design.
Claims
The ornamental design for a test and measurement instrument and accessories, as shown and described.
D340701 | October 26, 1993 | Takeuchi |
D345346 | March 22, 1994 | Alfonso |
D354743 | January 24, 1995 | Vieira |
D355170 | February 7, 1995 | Mizusugi |
D356548 | March 21, 1995 | Bottcher |
D386099 | November 11, 1997 | Billington |
6437552 | August 20, 2002 | Sekel |
7463015 | December 9, 2008 | Mende |
D742371 | November 3, 2015 | Bopp |
D797586 | September 19, 2017 | Umezawa |
D864952 | October 29, 2019 | Tsukamoto |
D898735 | October 13, 2020 | Li |
D909899 | February 9, 2021 | Clayton et al. |
306801536 | September 2021 | CN |
D1663342 | July 2020 | JP |
D201506 | December 2019 | TW |
Type: Grant
Filed: Sep 29, 2021
Date of Patent: Oct 31, 2023
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Chris A. Valentine (Portland, OR), Neil Clayton (Hillsboro, OR), David M. Ediger (Portland, OR), Marc A. Gessford (North Plains, OR), Taylor S. K. Heen (Beaverton, OR), Brian A. Hollenberg (Sherwood, OR), Steve U. Reinhold (Hillsboro, OR), Prashanth Thota (Tigard, OR), Satya N. Whitlock (Aloha, OR)
Primary Examiner: Antoine Duval Davis
Application Number: 29/809,745