Abstract: An imaging device may include a plurality of single-photon avalanche diode (SPAD) pixels. The SPAD pixels may be overlapped by microlenses to direct light incident on the pixels onto photosensitive regions of the pixels and a containment grid with openings that surround each of the microlenses. During formation of the microlenses, the containment grid may prevent microlens material for adjacent SPAD pixels from merging. To ensure separation between the microlenses, the containment grid may be formed from material phobic to microlens material, or phobic material may be added over the containment grid material. Additionally, the containment grid may be formed from material that can absorb stray or off-angle light so that it does not reach the associated SPAD pixel, thereby reducing crosstalk during operation of the SPAD pixels.

Abstract: Methods, apparatus, systems, and computer-readable media are provided for generating and applying outgoing communication templates. In various implementations a corpus of outgoing communications sent by a user may be grouped into a plurality of clusters based on one or more attributes of a context of the user. One or more segments of each outgoing communication of a particular cluster may be classified as fixed in response to a determination that a count of occurrences of the one or more segments across the particular cluster satisfies a criterion. One or more remaining segments of each communication of the particular cluster may or may not be classified as transient. Based on sequences of classified segments associated with each communication of the particular cluster, an outgoing communication template may be generated to automatically populate at least a portion of a draft outgoing communication being prepared by the user.

Abstract: A semiconductor wafer has a plurality of non-rectangular semiconductor die with an image sensor region. The non-rectangular semiconductor die has a circular, elliptical, and shape with non-linear side edges form factor. The semiconductor wafer is singulated with plasma etching to separate the non-rectangular semiconductor die. A curved surface is formed in the image sensor region of the non-rectangular semiconductor die. The non-rectangular form factor effectively removes a portion of the base substrate material in a peripheral region of the semiconductor die to reduce stress concentration areas and neutralize buckling in the curved surface of the image sensor region. A plurality of openings or perforations can be formed in a peripheral region of a rectangular or non-rectangular semiconductor die to reduce stress concentration areas and neutralize buckling. A second semiconductor die can be formed in an area of the semiconductor wafer between the non-rectangular semiconductor die.

Abstract: An imaging system may include an image sensor with phase detection pixel groups for depth sensing or automatic focusing operations. Each phase detection pixel group may have two or more photosensitive regions covered by a single microlens so that each photosensitive region has an asymmetric angular response. The image sensor may be sensitive to both near-infrared (NIR) and visible light. Each phase detection pixel group may be designed to include light-scattering structures that increase NIR sensitivity while minimizing disruptions of phase detection and visible light performance. Deep trench isolation may be formed between adjacent photosensitive areas within the phase detection pixel group. The light-scattering structures may have a non-uniform distribution to minimize disruptions of phase detection performance.

Abstract: An imaging device may include a plurality of single-photon avalanche diode (SPAD) pixels. The SPAD pixels may be overlapped by square toroidal microlenses to direct light incident on the pixels onto photosensitive regions of the pixels. The square toroidal microlenses may be formed as first and second sets of microlenses aligned with every other SPAD pixel and may allow the square toroidal microlenses to be formed without gaps between adjacent lenses. Additionally or alternatively, a central portion of each square toroidal microlenses may be filled by a fill-in microlens. Together, the square toroidal microlenses and the fill-in microlenses may form convex microlenses over each SPAD pixel. The fill-in microlenses may be formed from material having a higher index of refraction than material that forms the square toroidal microlenses.

Abstract: An imaging system may include an image sensor with phase detection pixel groups for depth sensing or automatic focusing operations. Each phase detection pixel group may have two or more photosensitive regions covered by a single microlens so that each photosensitive region has an asymmetric angular response. The image sensor may be sensitive to both near-infrared (NIR) and visible light. Each phase detection pixel group may be designed to include light-scattering structures that increase NIR sensitivity while minimizing disruptions of phase detection and visible light performance. Deep trench isolation may be formed between adjacent photosensitive areas within the phase detection pixel group. The light-scattering structures may have a non-uniform distribution to minimize disruptions of phase detection performance.

Abstract: A space modeling method, apparatus and system. The system includes a space modeling system, comprising: a space modeling apparatus, a display space, frame-work options module, aspects module, wherein the space modeling apparatus utilizes the frame-work options module and the aspect module to design a model and present the model in the display space.

Abstract: An image sensor may include high dynamic range imaging pixels having an inner sub-pixel surrounded by an outer sub-pixel. To steer light away from the inner sub-pixel and towards the outer sub-pixel, the high dynamic range imaging pixels may be covered by a toroidal microlens. To mitigate cross-talk caused by high-angled incident light, various microlens arrangements may be used. A toroidal microlens may have planar portions on its outer perimeter. A toroidal microlens may be covered by four additional microlenses, each additional microlens positioned in a respective corner of the pixel. Each pixel may be covered by four microlenses in a 2×2 arrangement, with an opening formed by the space between the four microlenses overlapping the inner sub-pixel.

Abstract: Methods, apparatus, and computer-readable media are provided for analyzing a cluster of communications, such as B2C emails, to generate a template for the cluster that defines transient segments and fixed segments of the cluster of communications. More particularly, methods, apparatus, and computer-readable media are provided for generating and/or applying a trained structured machine learning model for a generated template that can be used to determine, for one or more transient segments of subsequent communications, a corresponding probability that a given semantic label is the correct semantic label for extracted content of the transient segment(s).

Abstract: Various embodiments of the present technology may comprise a method and apparatus for an image sensor with a thermal equalizer for distributing heat. The method and apparatus may comprise a thermal equalizer disposed between a sensor die and a circuit die to prevent uneven heating of the pixels in the sensor die. The method and apparatus may comprise a thermal equalizer integrated within the circuit die.

Abstract: An image sensor may include high dynamic range imaging pixels having an inner sub-pixel surrounded by an outer sub-pixel. To steer light away from the inner sub-pixel and towards the outer sub-pixel, the high dynamic range imaging pixels may be covered by a toroidal microlens. To mitigate cross-talk caused by high-angled incident light, various microlens arrangements may be used. A toroidal microlens may have planar portions on its outer perimeter. A toroidal microlens may be covered by four additional microlenses, each additional microlens positioned in a respective corner of the pixel. Each pixel may be covered by four microlenses in a 2×2 arrangement, with an opening formed by the space between the four microlenses overlapping the inner sub-pixel.

Abstract: Global shutter imaging pixels may include a charge storage region that receives charge from a respective photodiode. Global shutter imaging pixels may be formed as frontside illuminated imaging pixels or backside illuminated imaging pixels. Shielding charge storage regions from incident light may be important for image sensor performance. To shield charge storage regions in backside illuminated global shutter imaging pixels, shielding structures may be included over the charge storage region. The shielding structures may include backside trench isolation structures, a metal layer formed in a backside trench between backside trench isolation structures, and frontside deep trench isolation structures. The metal layer may have angled portions that reflect light towards the photodiodes.

Abstract: An image sensor package may include a semiconductor wafer having a pixel array, a color filter array (CFA) formed over the pixel array, and one or more lenses formed over the CFA. A light block layer may couple over the semiconductor wafer around a perimeter of the lenses and an encapsulation layer may be coupled around the perimeter of the lenses and over the light block layer. The light block layer may form an opening providing access to the lenses. A mold compound layer may be coupled over the encapsulation layer and the light block layer. A temporary protection layer may be used to protect the one or more lenses from contamination during application of the mold compound and/or during processes occurring outside of a cleanroom environment.

Abstract: Implementations of image sensors may include a silicon layer having a first side and a second side opposite the first side, an opening extending into the silicon layer from the first side of the silicon layer toward the second side, a via extending into the silicon layer from the second side of the silicon layer, and a conductive pad within the opening. The conductive pad may be coupled to the via. The opening may include a fill material. At least a portion of the fill material may form a plane that is substantially parallel with the first side of the silicon layer. The conductive pad may be exposed through an opening in the fill material.

Abstract: Implementations of image sensors may include a silicon layer having a first side and a second side opposite the first side, an opening extending into the silicon layer from the first side of the silicon layer toward the second side, a via extending into the silicon layer from the second side of the silicon layer, and a conductive pad within the opening. The conductive pad may be coupled to the via. The opening may include a fill material. At least a portion of the fill material may form a plane that is substantially parallel with the first side of the silicon layer. The conductive pad may be exposed through an opening in the fill material.

Abstract: Techniques are described herein for generating and applying event data extraction templates. In various implementations, a data extraction template may be applied to structured communications to extract, from each structured communication, event data associated with a transient markup language path indicated in the data extraction template. The data extraction template may include an event-related semantic data type assigned to the transient markup language path and a strength of association between the transient structural path and the event-related semantic data type. Feedback may be obtained concerning event data extracted from one or more of the structured communications. Based on the feedback, the strength of association between the transient markup language path and the event-related semantic data type may be altered.

Abstract: Methods, apparatus, systems, and computer-readable media are provided for generating and applying outgoing communication templates. In various implementations a corpus of outgoing communications sent by a user may be grouped into a plurality of clusters based on one or more attributes of a context of the user. One or more segments of each outgoing communication of a particular cluster may be classified as fixed in response to a determination that a count of occurrences of the one or more segments across the particular cluster satisfies a criterion. One or more remaining segments of each communication of the particular cluster may or may not be classified as transient. Based on sequences of classified segments associated with each communication of the particular cluster, an outgoing communication template may be generated to automatically populate at least a portion of a draft outgoing communication being prepared by the user.

Abstract: An image sensor package may include a semiconductor wafer having a pixel array, a color filter array (CFA) formed over the pixel array, and one or more lenses formed over the CFA. A light block layer may couple over the semiconductor wafer around a perimeter of the lenses and an encapsulation layer may be coupled around the perimeter of the lenses and over the light block layer. The light block layer may form an opening providing access to the lenses. A mold compound layer may be coupled over the encapsulation layer and the light block layer. A temporary protection layer may be used to protect the one or more lenses from contamination during application of the mold compound and/or during processes occurring outside of a cleanroom environment.

Abstract: An image sensor package may include a semiconductor wafer having a pixel array, a color filter array (CFA) formed over the pixel array, and one or more lenses formed over the CFA. A light block layer may couple over the semiconductor wafer around a perimeter of the lenses and an encapsulation layer may be coupled around the perimeter of the lenses and over the light block layer. The light block layer may form an opening providing access to the lenses. A mold compound layer may be coupled over the encapsulation layer and the light block layer. A temporary protection layer may be used to protect the one or more lenses from contamination during application of the mold compound and/or during processes occurring outside of a cleanroom environment.

Abstract: Multi-photodiode image pixels may include sub-pixels with differing light sensitivities. Microlenses may be formed over the multi-photodiode image pixels so that light sensitivity of sub-pixels in an outer group of sub-pixels is enhanced. To prevent high angle light incident upon one of the sub-pixels of the image pixel from generating charges in a photosensitive region of another sub-pixel of the image pixel, intra-pixel isolation structures may be formed. Intra-pixel isolation structures may surround, and in some embodiments, overlap the light collecting region of an inner photodiode. When the intra-pixel isolation structures have a different index of refraction than light filtering material formed adjacent to the isolation structures, high angle light incident upon the isolation structures may be reflected back into the sub-pixel it was initially incident upon.