Abstract: In a solid-state imaging element that detects a change in an amount of light on the basis of a photocurrent, erroneous detection due to a dark current or dark current shot noise is reduced. The solid-state imaging element includes a limiting circuit, a differentiating circuit, and a comparison circuit. The limiting circuit limits an electric signal generated by photoelectric conversion by a predetermined limit value and outputs the electric signal limited as an output signal. The differentiating circuit obtains an amount of change of the output signal output from the limiting circuit. The comparison circuit performs comparison between the amount of change obtained by the differentiating circuit and a predetermined threshold value to output a result of the comparison as a result of detection of an address event.

Abstract: A high-quality image is taken by a solid-state imaging element that detects an address event. The solid-state imaging element is provided with a pixel array unit and an analog-to-digital conversion unit. In the pixel array unit in the solid-state imaging element, a normal pixel that generates an analog signal by photoelectric conversion of incident light and outputs the analog signal and a detection pixel that detects that an amount of change in incident light becomes larger than a predetermined threshold and outputs a detection result are arranged. Furthermore, the analog-to-digital conversion unit converts the analog signal into a digital signal.

Abstract: A solid-state imaging element that detects address events captures high-quality images. The solid-state imaging element includes a pixel array section that has a plurality of pixels including a specific pixel arranged in a two-dimensional lattice pattern. The specific pixel includes a pixel circuit and two analog-digital converters. The pixel circuit outputs two analog signals proportional to an amount of charge produced by photoelectric conversion. The analog-digital converters convert the respective two analog signals into digital signals with different resolutions.

Abstract: The present disclosure relates to an imaging element, a control method, and an electronic device that are capable of improving noise characteristics at low illuminance levels. A pixel includes a pixel circuit that outputs an analog pixel signal and an analog-to-digital converter circuit that converts the analog pixel signal to a digital pixel signal. The pixel circuit includes a photoelectric conversion section and a charge-to-voltage conversion section. The photoelectric conversion section receives light incident on the pixel, subjects the received light to photoelectric conversion, and generates an electric charge corresponding to a quantity of the light. The charge-to-voltage conversion section is able to select either a reference conversion efficiency used as a reference or a high conversion efficiency higher than the reference conversion efficiency as an efficiency at which the electric charge generated in the photoelectric conversion section is converted to a voltage.

Abstract: The present technology relates to an imaging apparatus and electronic equipment that can reduce noise. A photoelectric conversion element, a conversion unit that converts a signal from the photoelectric conversion element into a digital signal, a bias circuit that supplies a bias current for controlling a current flowing through an analog circuit in the conversion unit, and a control unit that controls the bias circuit on the basis of an output signal from the conversion unit are provided, and at the start of transfer of a charge from the photoelectric conversion element, the control unit boosts a voltage at a predetermined position of the analog circuit. The conversion unit converts the signal from the photoelectric conversion element into a digital signal using a slope signal whose level monotonously decreases with time. The present technology is applicable to, for example, an imaging apparatus.

Abstract: The present technology relates to a DAC circuit, a solid-state imaging element, and electronic equipment that can be achieved with a small-scale circuit configuration. The DAC circuit includes: a ramp DAC that generates a ramp signal that changes in voltage with a constant time gradient; an injection DAC that outputs a predetermined voltage during a reset period for resetting a comparison target voltage to be compared with the ramp signal; and an adding circuit that adds an output of the ramp DAC and an output of the injection DAC and outputs the outputs to a comparison circuit as a comparison reference voltage. The present technology can be applied to, for example, a DAC circuit of a solid-state imaging element, and the like.

Abstract: A solid-state imaging element including a well improves area efficiency while reducing malfunction of a circuit on the well. The solid-state imaging element includes a first well, a second well, a first circuit, and a second circuit. The first well contains an impurity having a polarity identical to a polarity of an impurity in a substrate. The second well contains an impurity having a polarity identical to the polarity of the impurity in the substrate and is disposed adjacent to the first well. The first circuit is disposed on the first well and generates noise in a predetermined period. The second circuit is disposed on the second well and generates noise in a period different from the predetermined period.

Abstract: A solid-state imaging element that detects address events captures high-quality images. The solid-state imaging element includes a pixel array section that has a plurality of pixels including a specific pixel arranged in a two-dimensional lattice pattern. The specific pixel includes a pixel circuit and two analog-digital converters. The pixel circuit outputs two analog signals proportional to an amount of charge produced by photoelectric conversion. The analog-digital converters convert the respective two analog signals into digital signals with different resolutions.

Abstract: The present disclosure relates to a solid state imaging device and an electronic device from which a holding unit for holding information in a pixel can be eliminated. When a charge distribution unit distributes a pixel signal SIG to a first ADC, a pixel signal representing only reflection light is divided for allocation. When the charge distribution unit distributes a pixel signal SIG to a second ADC, a pixel signal representing background light and reflection light (partial) is divided for allocation. When the charge distribution unit distributes a pixel signal SIG to a third ADC, a pixel signal representing background light and reflection light (the rest) is divided for allocation. During a period in which no signal is acquired, a discharge transistor functions as an overflow portion for releasing electrical charge. The present disclosure can be applied to, for example, a solid state imaging device used for an imaging device.

Abstract: Decrease of the frame rate is suppressed in a solid-state image pickup device that generates a frame having an increased dynamic range. A measurement section measures a reception light amount in each of a plurality of regions to generate a measurement result. A selection section selects one of a plurality of exposure periods different from each other based on the measurement result in each of the plurality of regions. An image data generation section performs exposure for each of the plurality of regions over the selected exposure period to generate image data. An image processing section adjusts a value of the image data generated for each of the plurality of regions based on the measurement result.

Abstract: The present technology relates to an imaging apparatus and electronic equipment that can reduce noise. A photoelectric conversion element, a conversion unit that converts a signal from the photoelectric conversion element into a digital signal, a bias circuit that supplies a bias current for controlling a current flowing through an analog circuit in the conversion unit, and a control unit that controls the bias circuit on the basis of an output signal from the conversion unit are provided, and at the start of transfer of a charge from the photoelectric conversion element, the control unit boosts a voltage at a predetermined position of the analog circuit. The conversion unit converts the signal from the photoelectric conversion element into a digital signal using a slope signal whose level monotonously decreases with time. The present technology is applicable to, for example, an imaging apparatus.

Abstract: The present disclosure relates to a solid-state electronic circuit, an image pickup element, a method of controlling the image pickup element, and an electronic device that enable inhibition of a deterioration in yield due to densification of image pickup elements. Wiring replacement units are provided between a plurality of transfer paths allowing bitwise transfer of a predetermined bit length of time code for use in conversion of a pixel signal corresponding to a quantity of light received in a pixel into a digital signal. In a case where an error has occurred in any of the plurality of transfer paths, replacement with the transfer path lowest in priority is performed. The present disclosure can be applied to image pickup elements.

Abstract: In a solid-state image sensor in which an arbiter arbitrates a request, a failure point is identified. A plurality of pixels generates a request for requesting transmission of a predetermined detection signal, in a case where a predetermined event is detected. A test circuit outputs the request of each of the plurality of pixels as an output request in a case where a test is not instructed, and generates a plurality of new requests and outputs each as the output request in a case where the test is instructed. The arbiter arbitrates the output request. A communication circuit transmits the detection signal on the basis of an arbitration result of the arbiter. A failure determination unit determines whether or not the arbiter has a failure on the basis of the detection signal in a case where the test is instructed.

Abstract: The present disclosure relates to a solid state imaging device and an electronic device from which a holding unit for holding information in a pixel can be eliminated. When a charge distribution unit distributes a pixel signal SIG to a first ADC, a pixel signal representing only reflection light is divided for allocation. When the charge distribution unit distributes a pixel signal SIG to a second ADC, a pixel signal representing background light and reflection light (partial) is divided for allocation. When the charge distribution unit distributes a pixel signal SIG to a third ADC, a pixel signal representing background light and reflection light (the rest) is divided for allocation. During a period in which no signal is acquired, a discharge transistor functions as an overflow portion for releasing electrical charge. The present disclosure can be applied to, for example, a solid state imaging device used for an imaging device.

Abstract: The present technology relates to an image capturing apparatus and an electronic device that are capable of reducing noise. A photoelectric conversion element, a conversion unit configured to convert a signal from the photoelectric conversion element into a digital signal, and a control unit configured to control current flowing to an analog circuit on the basis of an output signal from the conversion unit are provided. The conversion unit converts the signal from the photoelectric conversion element into a digital signal by using a slope signal having a level that monotonically decreases as time elapses. The control unit performs control to increase or reduce current flowing to the analog circuit in a case where the output signal has a large level. The present technology is applicable to, for example, an image capturing apparatus.

Abstract: In a solid-state image sensor in which an arbiter arbitrates a request, a failure point is identified. A plurality of pixels generates a request for requesting transmission of a predetermined detection signal, in a case where a predetermined event is detected. A test circuit outputs the request of each of the plurality of pixels as an output request in a case where a test is not instructed, and generates a plurality of new requests and outputs each as the output request in a case where the test is instructed. The arbiter arbitrates the output request. A communication circuit transmits the detection signal on the basis of an arbitration result of the arbiter. A failure determination unit determines whether or not the arbiter has a failure on the basis of the detection signal in a case where the test is instructed.

Abstract: Decrease of the frame rate is suppressed in a solid-state image pickup device that generates a frame having an increased dynamic range. A measurement section measures a reception light amount in each of a plurality of regions to generate a measurement result. A selection section selects one of a plurality of exposure periods different from each other based on the measurement result in each of the plurality of regions. An image data generation section performs exposure for each of the plurality of regions over the selected exposure period to generate image data. An image processing section adjusts a value of the image data generated for each of the plurality of regions based on the measurement result.

Abstract: An increase in memory capacity is suppressed in a solid-state imaging element that performs correlated double sampling processing. A pixel circuit sequentially generates each of a predetermined reset level and a plurality of signal levels corresponding to the exposure amount. An analog-to-digital converter converts a predetermined reset level into digital data and outputs the data as reset data, converts each of the plurality of pieces of signal data into digital data, and outputs the data as signal data. An arithmetic circuit holds a difference between the reset data and the signal data output first, as held data in a memory, and then adds the held data and the signal data output second and subsequent times together and causes the memory to hold the added data as new held data.

Abstract: An imaging device for improving the determining speed of a comparator and reducing power consumption. The comparator imaging device includes a differential input circuit that operates with a first power supply voltage, the differential input circuit outputs a signal when an input signal is higher than a reference signal in voltage, and a positive feedback circuit that operates with a second power supply voltage lower than the first power supply voltage. The positive feedback circuit accelerates transition speed when a compared result signal indicating a compared result between the input signal and the reference signal in voltage, is inverted, on the basis of the output signal of the differential input circuit. The imaging device further includes a voltage conversion circuit that converts the output signal of the differential input circuit into a signal corresponding to the second power supply voltage.

Abstract: Erroneous detection caused by flicker is suppressed in a solid-state imaging element that detects an address event. solid-state imaging element includes a plurality of pixels, a current detection unit, and a threshold control unit. In the solid-state imaging element, each of the plurality of pixels compares an amount of change in a voltage corresponding to a photocurrent with a predetermined threshold. Further, the current detection unit detects a sum of the photocurrents of the respective plurality of pixels as a total current. Further, the threshold control unit controls the predetermined threshold to a value corresponding to the total current detected by the current detection unit.