Patents by Inventor Matthias Eberlein

Matthias Eberlein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230297127
    Abstract: A voltage reference circuit included in a computer system includes two bipolar devices with two different current densities which are used to generate two base-emitter voltages, which are scaled using divider circuits. The voltage reference circuit also includes a feedback circuit that generates a reference voltage using the scaled base-emitter voltages and a feedback signal. The feedback signal is generated using the reference signal and combined with one of the scaled base-emitter voltages to compensate for variations in load current from the reference circuit.
    Type: Application
    Filed: March 16, 2022
    Publication date: September 21, 2023
    Inventor: Matthias Eberlein
  • Patent number: 11609127
    Abstract: An apparatus comprises: a first circuitry to charge first and second capacitors to a predetermined voltage level; a second circuitry to discharge the first capacitor through a diode at a first time; a third circuitry to discharge the second capacitor through the diode at a second time, wherein the second time is greater than the first time; a comparator to compare a first voltage of the first capacitor with a second voltage of the second capacitor; and logic to adjust a scaling factor applied to the second voltage according to an output of the comparator.
    Type: Grant
    Filed: April 26, 2021
    Date of Patent: March 21, 2023
    Assignee: Intel Corporation
    Inventor: Matthias Eberlein
  • Patent number: 11493968
    Abstract: An apparatus is provided which generates a reverse bandgap reference using capacitive bias, which is applied to a single n-well diode. The capacitive bias allows for determining the current density precisely by pure timing control. An apparatus is also described for sensing temperature in which a forward-bias diode voltage can be sampled with a capacitor, and large current ratios are possible (e.g., ratio N greater than 1000). Duty cycle of a digital output of the sensor is used to determine the temperature sensed by the sensor.
    Type: Grant
    Filed: August 9, 2019
    Date of Patent: November 8, 2022
    Assignee: Intel Corporation
    Inventor: Matthias Eberlein
  • Publication number: 20220316956
    Abstract: A temperature sensor circuit is disclosed that uses multiple bipolar devices to generate a proportional to absolute temperature (PTAT) current and a complementary to absolute temperature (CTAT) current. A difference in the PTAT and CTAT current is evaluated using a feedback loop of an amplifier circuit which alternatively charges and discharges a capacitor to create a time-varying analog signal. A comparator circuit compares the analog signal to threshold values to generate an output digital signal whose duty cycle varies with temperature.
    Type: Application
    Filed: March 29, 2022
    Publication date: October 6, 2022
    Inventor: Matthias Eberlein
  • Publication number: 20210262864
    Abstract: An apparatus comprises: a first circuitry to charge first and second capacitors to a predetermined voltage level; a second circuitry to discharge the first capacitor through a diode at a first time; a third circuitry to discharge the second capacitor through the diode at a second time, wherein the second time is greater than the first time; a comparator to compare a first voltage of the first capacitor with a second voltage of the second capacitor; and logic to adjust a scaling factor applied to the second voltage according to an output of the comparator.
    Type: Application
    Filed: April 26, 2021
    Publication date: August 26, 2021
    Applicant: Intel IP Corporation
    Inventor: Matthias Eberlein
  • Patent number: 11029718
    Abstract: An apparatus is provided which includes: a first supply node; a second supply node; a first transistor coupled to the first supply node, the first transistor is to provide a first current which is complementary to absolute temperature (CTAT); a second transistor coupled to the first supply node, the second transistor is to provide a second current which is proportional to absolute temperature (PTAT); a resistive device coupled in series at a node with the first and second transistors, and coupled to the second supply node, wherein the node is to sum the CTAT and the PTAT currents.
    Type: Grant
    Filed: September 29, 2017
    Date of Patent: June 8, 2021
    Assignee: Intel Corporation
    Inventor: Matthias Eberlein
  • Patent number: 11015985
    Abstract: An apparatus comprises: a first circuitry to charge first and second capacitors to a predetermined voltage level; a second circuitry to discharge the first capacitor through a diode at a first time; a third circuitry to discharge the second capacitor through the diode at a second time, wherein the second time is greater than the first time; a comparator to compare a first voltage of the first capacitor with a second voltage of the second capacitor; and logic to adjust a scaling factor applied to the second voltage according to an output of the comparator.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: May 25, 2021
    Assignee: Intel IP Corporation
    Inventor: Matthias Eberlein
  • Patent number: 10946832
    Abstract: A method for monitoring an interior of a motor vehicle using at least one camera directed into the interior during a temporary access to the interior or to a trunk of the motor vehicle, the camera being switched on by a control unit during the entire access or in the event of deviations from specified rules for the access and transmitting the recorded data to a storage device.
    Type: Grant
    Filed: January 11, 2018
    Date of Patent: March 16, 2021
    Assignee: Robert Bosch GmbH
    Inventor: Matthias Eberlein
  • Publication number: 20210041928
    Abstract: An apparatus is provided which generates a reverse bandgap reference using capacitive bias, which is applied to a single n-well diode. The capacitive bias allows for determining the current density precisely by pure timing control. An apparatus is also described for sensing temperature in which a forward-bias diode voltage can be sampled with a capacitor, and large current ratios are possible (e.g., ratio N greater than 1000). Duty cycle of a digital output of the sensor is used to determine the temperature sensed by the sensor.
    Type: Application
    Filed: August 9, 2019
    Publication date: February 11, 2021
    Applicant: Intel Corporation
    Inventor: Matthias Eberlein
  • Patent number: 10866145
    Abstract: Some embodiments include apparatuses and methods having a node to receive ground potential, a first diode including an anode coupled to the node, a second diode including an anode coupled to the node, a first circuit to apply a voltage to a cathode of each of the first and second diodes to cause the first and second diodes to be in a forward-bias condition, and a second circuit to generate a signal having a duty cycle based on a first voltage across the first diode and a second voltage across the second diode. At least one of such the embodiments includes a temperature calculator to calculate a value of temperature based at least in part on the duty cycle of the signal.
    Type: Grant
    Filed: November 13, 2017
    Date of Patent: December 15, 2020
    Assignee: Intel IP Corporation
    Inventor: Matthias Eberlein
  • Publication number: 20190351869
    Abstract: A method for monitoring an interior of a motor vehicle using at least one camera directed into the interior during a temporary access to the interior or to a trunk of the motor vehicle, the camera being switched on by a control unit during the entire access or in the event of deviations from specified rules for the access and transmitting the recorded data to a storage device.
    Type: Application
    Filed: January 11, 2018
    Publication date: November 21, 2019
    Inventor: Matthias Eberlein
  • Publication number: 20190101948
    Abstract: An apparatus comprising: a first supply node; a second supply node; a first transistor coupled to the first supply node, the first transistor is to provide a first current which is complementary to absolute temperature (CTAT); a second transistor coupled to the first supply node, the second transistor is to provide a second current which is proportional to absolute temperature (PTAT); a resistive device coupled in series at a node with the first and second transistors, and coupled to the second supply node, wherein the node is to sum the CTAT and the PTAT currents.
    Type: Application
    Filed: September 29, 2017
    Publication date: April 4, 2019
    Applicant: Intel Corporation
    Inventor: Matthias EBERLEIN
  • Publication number: 20190041272
    Abstract: An apparatus comprises: a first circuitry to charge first and second capacitors to a predetermined voltage level; a second circuitry to discharge the first capacitor through a diode at a first time; a third circuitry to discharge the second capacitor through the diode at a second time, wherein the second time is greater than the first time; a comparator to compare a first voltage of the first capacitor with a second voltage of the second capacitor; and logic to adjust a scaling factor applied to the second voltage according to an output of the comparator.
    Type: Application
    Filed: March 30, 2018
    Publication date: February 7, 2019
    Inventor: Matthias Eberlein
  • Patent number: 10109551
    Abstract: Embodiments of the present disclosure provide techniques and configurations for integrally determining a parameter (e.g., temperature) of a die of an integrated circuit. In one instance, the apparatus may comprise a die including a first (e.g., remote) area and a second (e.g., local) area disposed at a distance from the first area, and circuitry to determine a parameter associated with the remote area of the die. The circuitry may include: a first sensing device disposed in the remote area, to provide first readings associated with the parameter; a second sensing device disposed in the local area, to provide second readings associated with the parameter; and a control module coupled with the sensing devices and disposed in the local area, to facilitate a determination of the parameter based on the first and second readings provided by the first and second sensing devices. Other embodiments may be described and/or claimed.
    Type: Grant
    Filed: September 15, 2015
    Date of Patent: October 23, 2018
    Assignee: Intel Corporation
    Inventors: Cho-Ying Lu, Matthias Eberlein, Hyung-Jin Lee
  • Patent number: 10073483
    Abstract: An apparatus is described having a reference voltage circuit. The reference voltage circuit includes a diode to receive first and second currents having first and second respective current densities, where, the first and second current densities are different and determined by circuitry that precisely controls the respective amount of time the first and second currents flow into the diode. The reference voltage circuit also comprises circuitry to form a reference voltage by combining first and second voltages generated from respective voltages of the diode that result from the first and second currents flowing through the diode.
    Type: Grant
    Filed: April 1, 2016
    Date of Patent: September 11, 2018
    Assignee: Intel Corporation
    Inventor: Matthias Eberlein
  • Publication number: 20180066999
    Abstract: Some embodiments include apparatuses and methods having a node to receive ground potential, a first diode including an anode coupled to the node, a second diode including an anode coupled to the node, a first circuit to apply a voltage to a cathode of each of the first and second diodes to cause the first and second diodes to be in a forward-bias condition, and a second circuit to generate a signal having a duty cycle based on a first voltage across the first diode and a second voltage across the second diode. At least one of such the embodiments includes a temperature calculator to calculate a value of temperature based at least in part on the duty cycle of the signal.
    Type: Application
    Filed: November 13, 2017
    Publication date: March 8, 2018
    Inventor: Matthias Eberlein
  • Patent number: 9816871
    Abstract: Some embodiments include apparatuses and methods having a node to receive ground potential, a first diode including an anode coupled to the node, a second diode including an anode coupled to the node, a first circuit to apply a voltage to a cathode of each of the first and second diodes to cause the first and second diodes to be in a forward-bias condition, and a second circuit to generate a signal having a duty cycle based on a first voltage across the first diode and a second voltage across the second diode. At least one of such the embodiments includes a temperature calculator to calculate a value of temperature based at least in part on the duty cycle of the signal.
    Type: Grant
    Filed: September 25, 2015
    Date of Patent: November 14, 2017
    Assignee: Intel IP Corporation
    Inventor: Matthias Eberlein
  • Publication number: 20170285680
    Abstract: An apparatus is described having a reference voltage circuit. The reference voltage circuit includes a diode to receive first and second currents having first and second respective current densities, where, the first and second current densities are different and determined by circuitry that precisely controls the respective amount of time the first and second currents flow into the diode. The reference voltage circuit also comprises circuitry to form a reference voltage by combining first and second voltages generated from respective voltages of the diode that result from the first and second currents flowing through the diode.
    Type: Application
    Filed: April 1, 2016
    Publication date: October 5, 2017
    Inventor: Matthias EBERLEIN
  • Publication number: 20170089765
    Abstract: Some embodiments include apparatuses and methods having a node to receive ground potential, a first diode including an anode coupled to the node, a second diode including an anode coupled to the node, a first circuit to apply a voltage to a cathode of each of the first and second diodes to cause the first and second diodes to be in a forward-bias condition, and a second circuit to generate a signal having a duty cycle based on a first voltage across the first diode and a second voltage across the second diode. At least one of such the embodiments includes a temperature calculator to calculate a value of temperature based at least in part on the duty cycle of the signal.
    Type: Application
    Filed: September 25, 2015
    Publication date: March 30, 2017
    Inventor: Matthias Eberlein
  • Publication number: 20170074924
    Abstract: Embodiments of the present disclosure provide techniques and configurations for integrally determining a parameter (e.g., temperature) of a die of an integrated circuit. In one instance, the apparatus may comprise a die including a first (e.g., remote) area and a second (e.g., local) area disposed at a distance from the first area, and circuitry to determine a parameter associated with the remote area of the die. The circuitry may include: a first sensing device disposed in the remote area, to provide first readings associated with the parameter; a second sensing device disposed in the local area, to provide second readings associated with the parameter; and a control module coupled with the sensing devices and disposed in the local area, to facilitate a determination of the parameter based on the first and second readings provided by the first and second sensing devices. Other embodiments may be described and/or claimed.
    Type: Application
    Filed: September 15, 2015
    Publication date: March 16, 2017
    Inventors: Cho-Ying Lu, Matthias Eberlein, Hyung-Jin Lee