Patents by Inventor Michael Friedmann

Michael Friedmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190017946
    Abstract: Methods and systems for performing measurements of semiconductor structures based on high-brightness, polychromatic, reflective small angle x-ray scatterometry (RSAXS) metrology are presented herein. RSAXS measurements are performed over a range of wavelengths, angles of incidence, and azimuth angles with small illumination beam spot size, simultaneously or sequentially. In some embodiments, RSAXS measurements are performed with x-ray radiation in the soft x-ray (SXR) region at grazing angles of incidence in the range of 5-20 degrees. In some embodiments, the x-ray illumination source size is 10 micrometers or less, and focusing optics project the source area onto a wafer with a demagnification factor of 0.2 or less, enabling an incident x-ray illumination spot size of less than two micrometers.
    Type: Application
    Filed: July 9, 2018
    Publication date: January 17, 2019
    Inventors: Daniel Wack, Oleg Khodykin, Andrei V. Shchegrov, Alexander Kuznetsov, Nikolay Artemiev, Michael Friedmann
  • Patent number: 10151584
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: December 11, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Publication number: 20180188192
    Abstract: Methods and systems for controlling illumination beam spot size for Transmission, Small-Angle X-ray Scatterometry (T-SAXS) measurements of different sized metrology targets are described herein. An X-ray illumination optics subsystem includes one or more focusing optical elements with object and image planes at fixed locations and one or more illumination apertures or slits that independently control magnification and beam divergence. In a further aspect, the illumination source size and shape is controlled, along with magnification and beam divergence. In this manner, beam divergence and illumination spot size on a specimen are independently controlled, while maintaining constant illumination flux.
    Type: Application
    Filed: December 19, 2017
    Publication date: July 5, 2018
    Inventors: Nikolay Artemiev, Michael Friedmann
  • Publication number: 20180100735
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Application
    Filed: October 30, 2017
    Publication date: April 12, 2018
    Applicant: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Patent number: 9835447
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Grant
    Filed: October 24, 2016
    Date of Patent: December 5, 2017
    Assignee: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Publication number: 20170038198
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Application
    Filed: October 24, 2016
    Publication date: February 9, 2017
    Applicant: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Patent number: 9476698
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Grant
    Filed: December 7, 2015
    Date of Patent: October 25, 2016
    Assignee: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Publication number: 20160084639
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Application
    Filed: December 7, 2015
    Publication date: March 24, 2016
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Patent number: 9234745
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Grant
    Filed: July 1, 2015
    Date of Patent: January 12, 2016
    Assignee: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Publication number: 20150300815
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Application
    Filed: July 1, 2015
    Publication date: October 22, 2015
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Patent number: 9103662
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Grant
    Filed: September 24, 2013
    Date of Patent: August 11, 2015
    Assignee: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Patent number: 8793248
    Abstract: A recommender system for recommending items to a user based on geo-Tagged information related to him, in which items associated with a GeoTag are stored in a database. Feedback regarding the various items is obtained from the user and the provided rating of items is propagated to closely located items based on their associated GeoTags. A user-to-user similarity matrix is calculated and a predicted score is assigned for each user and item, using a recommendation server. All the items in the catalog of items are sorted according to their predicted scores as calculated for the user, and all items that have been already rated by the user are filtered out. Then, items from the catalog of items are presented to the user, according to their scores.
    Type: Grant
    Filed: April 23, 2012
    Date of Patent: July 29, 2014
    Assignee: YooChoose GmbH
    Inventors: Michael Friedmann, David Ben-Shimon, Lior Rokach
  • Publication number: 20140046946
    Abstract: A recommender system for recommending items to a user based on geo-Tagged information related to him, in which items associated with a GeoTag are stored in a database. Feedback regarding the various items is obtained from the user and the provided rating of items is propagated to closely located items based on their associated GeoTags. A user-to-user similarity matrix is calculated and a predicted score is assigned for each user and item, using a recommendation server. All the items in the catalog of items are sorted according to their predicted scores as calculated for the user, and all items that have been already rated by the user are filtered out. Then, items from the catalog of items are presented to the user, according to their scores.
    Type: Application
    Filed: April 23, 2012
    Publication date: February 13, 2014
    Applicant: YooChoose GmbH
    Inventors: Michael Friedmann, David Ben-Shimon, Lior Rokach
  • Publication number: 20140022563
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Application
    Filed: September 24, 2013
    Publication date: January 23, 2014
    Applicant: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Patent number: 8570515
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Grant
    Filed: November 30, 2009
    Date of Patent: October 29, 2013
    Assignee: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Patent number: 8525994
    Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.
    Type: Grant
    Filed: April 22, 2009
    Date of Patent: September 3, 2013
    Assignee: KLA-Tencor Corporation
    Inventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
  • Publication number: 20120303626
    Abstract: A recommender system for recommending items to a user based on geo-Tagged information related to him, in which items associated with a GeoTag are stored in a database. Feedback regarding the various items is obtained from the user and the provided rating of items is propagated to closely located items based on their associated GeoTags. A user-to-user similarity matrix is calculated and a predicted score is assigned for each user and item, using a recommendation server. All the items in the catalog of items are sorted according to their predicted scores as calculated for the user, and all items that have been already rated by the user are filtered out. Then, items from the catalog of items are presented to the user, according to their scores.
    Type: Application
    Filed: April 23, 2012
    Publication date: November 29, 2012
    Applicant: YooChoose GmbH
    Inventors: Michael Friedmann, David Ben-Shimon, Lior Rokach
  • Publication number: 20120129554
    Abstract: There is disclosed a method and device for operating an image database shared by a plurality of users. In an embodiment, each image captured by a user and stored in a shared image database is associating with the geographic coordinates of the location at which the image was captured. A search engine for the image database is configured to accept geographic coordinates as a search criterion for locating at least one captured image stored in the shared image database. The images having location coordinates within a predefined range of geographic coordinates is displayed to the user.
    Type: Application
    Filed: January 30, 2012
    Publication date: May 24, 2012
    Applicant: RESEARCH IN MOTION LIMITED
    Inventor: Michael FRIEDMANN
  • Publication number: 20110207480
    Abstract: There is disclosed a method and device for operating an image database shared by a plurality of users. In an embodiment, each image captured by a user and stored in a shared image database is associating with the geographic coordinates of the location at which the image was captured. A search engine for the image database is configured to accept geographic coordinates as a search criterion for locating at least one captured image stored in the shared image database. The images having location coordinates within a predefined range of geographic coordinates is displayed to the user.
    Type: Application
    Filed: May 4, 2011
    Publication date: August 25, 2011
    Applicant: RESEARCH IN MOTION LIMITED
    Inventor: Michael FRIEDMANN
  • Patent number: 7933016
    Abstract: Disclosed are techniques, apparatus, and targets for determining overlay error between two layers of a sample. A plurality of targets is provided. Each target includes a portion of the first and second structures and each is designed to have an offset between its first and second structure portions. The targets are illuminated with electromagnetic radiation to thereby obtain spectra from each target at a ?1st diffraction order and a +1st diffraction order.
    Type: Grant
    Filed: December 18, 2009
    Date of Patent: April 26, 2011
    Assignee: KLA-Tencor Technologies Corporation
    Inventors: Walter D. Mieher, Ady Levy, Boris Golovanevsky, Michael Friedmann, Ian Smith, Michael Adel, Anatoly Fabrikant, Christopher F. Bevis, John Fielden, Noah Bareket, Kenneth P. Gross, Piotr Zalicki, Dan Wack, Paola Dececco, Thaddeus G. Dziura, Mark Ghinovker