Abstract: There is provided an integrated circuit comprising at least one logic path, comprising a plurality of sequential logic elements operably coupled into a scan chain to form at least one scan chain under test, at least one IR drop sensor operably coupled to the integrated circuit power supply, operable to output a first logic state when a sensed supply voltage is below a first predefined value and to output a second logic state when the sensed supply voltage is above the first predefined value, at least one memory buffer operably coupled to a scan test data load-in input and a scan test data output of the at least one scan chain under test, and control logic operable to gate logic activity including the scan shift operation inside the integrated circuit for a single cycle when the at least one IR drop sensor outputs the first logic state and to allow normal scan test flow when the at least one IR drop sensor outputs the second logic state.

Abstract: There is provided a multimedia computing apparatus for processing and displaying video data with overlay graphic data, said multimedia computing apparatus comprising a compression unit arranged to compress graphic overlay data prior to storage of said compressed overlay graphic data in a compressed display buffer, and a control unit arranged to determine when to compress the overlay graphic data dependent upon a refresh parameter of the overlay graphic data. There is also provided a method of adaptively compressing graphics data in a multimedia computing system comprising dynamically controlling compression of graphic overlay data in a display buffer dependent upon a refresh parameter of the graphic overlay data.

Abstract: A method and apparatus for calculating delay timing values for at least a part of an integrated circuit design. The method comprises applying a first Negative/Positive Bias Temperature Instability compensation margin to delay values for elements within the at least part of the IC design, identifying at least one lower-rate switching element within the at least part of the IC design, and applying at least one further, increased N/PBTI compensation margin to the delay value(s) for the at least one identified lower-rate switching element.

Abstract: An electronic device comprising a first power switch connectable or connected between a first voltage source and a load is proposed. The first power switch assumes a conductive state in response to a power-on request and a non-conductive state in response to a power-off request, for energizing and deenergizing the load, so that a voltage across the first power switch tends to a positive high level when the first power switch is in the non-conductive state and to a positive low level when the first power switch is in the conductive state. The device further comprises a second power switch connectable or connected between a second voltage source and the load. The second power switch assumes a conductive state in response to the power-on request and a non-conductive state when the voltage across the first power switch is below a defined switch-off threshold lower than the high level. The second voltage source thus assists the first voltage source in powering up the load.

Abstract: There is provided a method, apparatus and integrated circuit for measuring a signal, the apparatus comprising a plurality of sample stages arranged in series, each sample stage comprising a delay element, and a sample element, wherein an input of the sample element is coupled to an output of the delay element, and a strobe line for controlling a sample time of the sample elements, the strobe line comprising a plurality of strobe delay elements arranged in series, wherein an output of each strobe delay element is coupled to one or more sample elements.

Abstract: A method generates scan patterns for testing an electronic device called DUT having a scan path. A scan tester is arranged for executing a scan shift mode and a capture mode. A scan test interface has a clock control unit for stretching a shift cycle of the scan clock in dependence of a scan clock pattern. The method determines at least one power shift cycle which is expected to cause a voltage drop of a supply voltage exceeding a predetermined threshold during respective shift cycles of the scan shift mode, and generates, in addition to the scan pattern, a scan clock pattern indicative of stretching the power shift cycle. Advantageously, a relatively high scan shift frequency may be used while avoiding detrimental effects of said voltage drop by extending the respective power shift cycle, whereby test time and yield loss are reduced.

Abstract: The invention relates to a method of designing a processor core arrangement which comprises a first processor core for operation at a first operation frequency and having an associated first leakage and a second processor core for operation at a second operation frequency lower than the first operation frequency and having an associated second leakage lower than the associated first leakage. The processor core arrangement is capable of switching from the first processor core to the second processor core and vice versa.

Abstract: An integrated circuit for bias stress condition removal comprising at least one input/output (IO) buffer driver circuit comprising at least one input signal is described. A primary buffer driver stage receives the at least one input signal and providing an output signal in a first time period; and a secondary buffer driver stage receives the at least one input signal and providing an output signal in a second time period. The primary buffer driver stage and the secondary buffer driver stage cooperate and an operational mode of the primary buffer driver stage and an operational mode of the secondary buffer driver stage is varied to produce a varying output signal.

Abstract: A method and device for simulating a semiconductor IC is provided, which comprises generating a high level description of the IC, generating a low level description of the IC comprising a plurality of instances describing the operation of the IC, conducting a low level function analysis of the IC based on metrics values associated with the instances, and performing a design optimization scheme. The scheme comprises mapping the metric values of instances describing functional units different from standard cells, to standard cells logically connected to said instances, by dividing each of the instance metrics values between a group of standard cells logically connected to the corresponding instance and adding each resulting portion of said instance metric value to the metric value of each of the group of standard cells, respectively.

Abstract: A register file module comprising at least one register array comprising a plurality of latch devices is described. The plurality of latch devices is arranged to individually provide memory bit-cells when the register file module is configured to operate in a first, functional operating mode, and at least one clock control component is arranged to receive a clock signal and to propagate the clock signal to the latch devices within the at least one register array. The register file module is configurable to operate in a second, scan mode in which the latch devices within the at least one register array are arranged into at least one scan chain. The at least one clock control component is arranged to propagate the clock signal to the latch devices within the at least one register array such that alternate latch devices within the at least one scan chain receive an inverted form of the clock signal.

Abstract: The present invention provides a clock source for an integrated circuit, comprising a primary oscillator adapted to generate a primary clock signal based on a reference control signal, at least one secondary oscillator each secondary oscillator being adapted to generate a secondary clock signal based on the reference control signal, wherein for each secondary oscillator a frequency correction unit is provided and adapted to adjust the reference control signal for the associated secondary oscillator based on the primary clock signal and the secondary clock signal of the associated secondary oscillator such that the clock frequency of the secondary clock signal of the associated secondary oscillator essentially equals the clock frequency of the primary clock signal. The present invention furthermore provides a method for providing a clock signal, and an integrated circuit.

Abstract: The invention provides a method for launch-off-shift at-speed scan testing for at least two scan chains of an integrated circuit comprises iteratively shifting set values for functional elements of a first one of the scan chains clocked with a shift clock, iteratively shifting set values for functional elements of a second one of the scan chains clocked with the shift clock, launching an at-speed scan test clocked with a functional clock for the first one of the scan chains at a last shift cycle of the first one of the scan chains, delaying the last shift cycle for the second one of the scan chains for a predetermined time span, launching an at-speed scan test clocked with a functional clock for the second one of the scan chains at the last shift cycle of the second one of the scan chains, capturing the sample values of the functional elements of the first and second scan chains after the last shift cycle of the scan chains.

Abstract: An electronic device may include a set of two or more scan chains and a buffer chain. Each of the scan chains includes a sequence of stateful elements connected in series, and each of the scan chains is arranged to hold a string having a length identical to the length of the respective scan chain. The strings of the scan chains are shifted in parallel from the scan chains into the memory unit and back from the memory unit into the respective scan chains. The store operation and the restore operation each include at least N0 elementary downstream shift operations. The set of scan chains includes a short chain and a detour chain, and the short chain has a length N1 which is shorter than N0. The set of scan chains further includes a buffer chain. The output end of the short chain is coupled to an input end of the buffer chain. The buffer chain is provided at least partly by the detour chain.

Abstract: A method of performing logic synthesis of at least a part of an integrated circuit design. The method comprises identifying a first and at least one further module within the IC design that are mutually exclusive, selecting at least one register element within the first identified module and at least one register element within the at least one further identified module to be shared, and merging the first and at least one further mutually exclusive modules such that at least one common register element is shared between the first and at least one further mutually exclusive modules for the register elements selected to be shared.

Abstract: Processing logic circuit has State Retention Power Gating logic circuit including at least two scan chains having different lengths and operable to collect state information about at least a portion of the processing logic circuit before the at least a portion of the processing logic circuit is placed from a first state into a second, different, state. The processing logic circuit includes a memory operable to store collected state information about the at least a portion of the processing logic circuit, and logic circuit operable to rearrange the collected state information data for scan chains shorter than a longest scan chain, to enable valid return of the collected state information data, for the scan chains shorter than a longest scan chain, to the at least a portion of the processing logic circuit when the at least a portion of the processing logic circuit returns to the first state.

Abstract: A method of detecting irregular high current flow within an integrated circuit (IC) device is described. The method comprises obtaining infrared (IR) emission information for the IC device, identifying at least one functional component within the IC device comprising a high current flow, based at least partly on the obtained IR emission information, obtaining IR emission information for at least one reference component within the IC device, and determining whether the high current flow of the at least one functional component comprises an irregular high current flow based at least partly on a comparison of respective IR emission information for the at least one functional component and the at least one reference component.

Abstract: A method of calculating at least one delay timing value for at least one setup timing stage within an integrated circuit design includes applying Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage, and calculating the at least one delay timing value for the at least one setup timing stage based at least partly on the N/PBTI compensation margins applied to the delay values. The method further includes identifying at least partially equivalent elements within the parallel timing paths of the at least one setup timing stage, and applying reduced N/PBTI compensation margins to delay values for the identified at least partially equivalent elements within parallel timing paths of the at least one setup timing stage.

Abstract: An electronic device comprises one or more functional units, each functional unit being clocked by a respective clock signal. The electronic device further comprises a monitoring unit for providing a real-time estimate of an electrical current consumed by the functional units. The monitoring unit provides the real-time estimate on the basis of characteristic signals. The characteristic signals may comprise one or more of said clock signals, or one or more clock generating signals used to generate said clock signals. The electronic device may further comprise a power regulator responsive to the real-time estimate. A method of estimating in real-time an electrical current consumed by one or more functional units is also described.

Abstract: A method and apparatus for selecting data path elements for cloning within an integrated circuit (IC) design is described. The method comprises performing timing analysis of at least one data path within the IC design to determine at least one timing slack value for the at least one data path, calculating at least one annotated delay value for cloning a candidate element within the at least one data path, calculating at least one modified slack value for the at least one data path in accordance with the at least one calculated annotated delay value, and validating the cloning of the candidate element based at least partly on the at least one modified slack value.

Abstract: An electronic device comprises a secured module arranged to store secured data. A component outside the secured module has a normal operating mode with a normal mode operating voltage. An interface is arranged to provide access to the secured module. A voltage monitoring unit is connected to the component and arranged to monitor an operating voltage Vsup of the component. An interface control unit is connected to the voltage monitoring unit and the interface. The interface control unit is arranged to inhibit access to the secured module through the interface when the operating voltage is below a predetermined secure access voltage level, the secure access voltage being higher than the normal mode operating voltage.