Abstract: A method of performing logic synthesis of at least a part of an integrated circuit design. The method comprises identifying a first and at least one further module within the IC design that are mutually exclusive, selecting at least one register element within the first identified module and at least one register element within the at least one further identified module to be shared, and merging the first and at least one further mutually exclusive modules such that at least one common register element is shared between the first and at least one further mutually exclusive modules for the register elements selected to be shared.

Abstract: The invention provides a method for launch-off-shift at-speed scan testing for at least two scan chains of an integrated circuit comprises iteratively shifting set values for functional elements of a first one of the scan chains clocked with a shift clock, iteratively shifting set values for functional elements of a second one of the scan chains clocked with the shift clock, launching an at-speed scan test clocked with a functional clock for the first one of the scan chains at a last shift cycle of the first one of the scan chains, delaying the last shift cycle for the second one of the scan chains for a predetermined time span, launching an at-speed scan test clocked with a functional clock for the second one of the scan chains at the last shift cycle of the second one of the scan chains, capturing the sample values of the functional elements of the first and second scan chains after the last shift cycle of the scan chains.

Abstract: Processing logic circuit for use in a computing system has State Retention Power Gating logic circuit including at least two scan chains having different lengths and operable to collect state information about at least a portion of the processing logic circuit before the at least a portion of the processing logic circuit is placed from a first state into a second, different, state. The processing logic circuit includes a memory operable to store collected state information about the at least a portion of the processing logic circuit, and logic circuit operable to rearrange the collected state information data for scan chains shorter than a longest scan chain within the at least a portion of the processing logic circuit, to enable valid return of the collected state information data, for the scan chains shorter than a longest scan chain, to the at least a portion of the processing logic circuit when the at least a portion of the processing logic circuit returns to the first state.

Abstract: The invention provides a method for recovering NBTI/PBTI related parameter degradation in MOSFET devices. The method includes operating the at least one MOSFET device in a standby mode, exiting the at least one MOSFET device from the standby mode, holding the at least one MOSFET device in an active state for a predetermined time span after exiting the standby mode, and operating the at least one MOSFET device in an operational mode after the predetermined time span has elapsed.

Abstract: There is provided a processor for use in a computing system, said processor including at least one Central Processing Unit (CPU), a cache memory coupled to the at least one CPU, and a control unit coupled to the cache memory and arranged to obscure the existing data in the CPU cache memory, and assign control of the CPU cache memory to at least one other entity within the computing system. There is also provided a method of using a CPU cache memory for non-CPU related tasks in a computing system.

Abstract: The present invention provides a clock source for an integrated circuit, comprising a primary oscillator adapted to generate a primary clock signal based on a reference control signal, at least one secondary oscillator each secondary oscillator being adapted to generate a secondary clock signal based on the reference control signal, wherein for each secondary oscillator a frequency correction unit is provided and adapted to adjust the reference control signal for the associated secondary oscillator based on the primary clock signal and the secondary clock signal of the associated secondary oscillator such that the clock frequency of the secondary clock signal of the associated secondary oscillator essentially equals the clock frequency of the primary clock signal. The present invention furthermore provides a method for providing a clock signal, and an integrated circuit.

Abstract: A clock distribution module for a digital synchronous system is described. The clock distribution module comprising a first node arranged to comprise a clock signal comprising a propagation delay relative to a reference clock signal, at least one further node arranged to comprise a clock signal comprising a propagation delay relative to the reference clock signal corresponding to that of the first node, and a clock configuration module. The clock configuration module is arranged to receive at least one indication of clock skew between the first node and at least one further node of the clock distribution module, and to selectively couple the first node to the at least one further node based at least partly on the at least one indication of clock skew there between.

Abstract: A method of calculating at least one delay timing value for at least one setup timing stage within an integrated circuit design includes applying Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage, and calculating the at least one delay timing value for the at least one setup timing stage based at least partly on the N/PBTI compensated delay values. The method further includes identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage, and applying reduced N/PBTI compensation margins to delay values for the identified at least partially equivalent elements within parallel timing paths of the at least one setup timing stage.

Abstract: The invention relates to a method of designing a processor core arrangement which comprises a first processor core for operation at a first operation frequency and having an associated first leakage and a second processor core for operation at a second operation frequency lower than the first operation frequency and having an associated second leakage lower than the first leakage. The processor core arrangement is capable of switching from the first processor core to the second processor core and vice versa.

Abstract: There is provided an integrated circuit comprising at least one logic path, comprising a plurality of sequential logic elements operably coupled into a scan chain to form at least one scan chain under test, at least one IR drop sensor operably coupled to the integrated circuit power supply, operable to output a first logic state when a sensed supply voltage is below a first predefined value and to output a second logic state when the sensed supply voltage is above the first predefined value, at least one memory buffer operably coupled to a scan test data load-in input and a scan test data output of the at least one scan chain under test, and control logic operable to gate logic activity including the scan shift operation inside the integrated circuit for a single cycle when the at least one IR drop sensor outputs the first logic state and to allow normal scan test flow when the at least one IR drop sensor outputs the second logic state.

Abstract: A method of performing state retention, for example during power gating, for at least one functional block within an integrated circuit device. The method comprises enabling at least one scan chain within the at least one functional block, scanning out a set of scan chain values from the at least one scan chain, a subset of the set of scan chain values comprising validation values, and writing the set of scan chain values to at least one memory element. The method further comprises retrieving the set of scan chain values from the at least one memory element, and validating the validation values within the retrieved set of scan chain values.

Abstract: An integrated circuit comprising a power supply node, a ground node and a gated domain coupled between the power node and the ground node. A Charged Device Model electrostatic discharge protection module is provided for shunting electrical energy of a CDM ESD event away from the gated domain. A gating switch makes an electrical connection in a connected state between the gated domain and at least one of the power node and the ground node. ESD gating control circuitry is coupled to the CDM ESD protection module and controls shunting of energy away from the gated domain by the CDM ESD protection module, thereby avoiding the energy flowing through the gated domain. The ESD gating control circuitry inhibits actuation of the CDM ESD protection module to prevent response to CDM ESD events when the gating domain is powered-up.

Abstract: There is provided a method of placing a plurality of operational cells of a semiconductor device within a semiconductor layout, comprising determining timing data for each of the plurality of operational cells, determining switching activity from RTL or design constraints for each of the plurality of operational cells, determining power grid switch locations relative to each of the plurality of operational cells, deriving a cost function based upon the determined timing data, determined switching activity from RTL/design constraints and determined relative power grid switch locations and initially placing the plurality of operational cells according to the derived cost function.

Abstract: An information processing device comprises a first memory, a second memory, data transfer circuitry, power gating circuitry, and a controller. The first memory comprises at least two volatile memory units. The controller receives or generates a request for setting the information processing device into a reduced power mode; in response to the request, it selects specific memory units among the memory units; controls the data transfer circuitry to transfer data from the selected memory units to the second memory; and controls the power gating circuitry to power down the selected memory units.

Abstract: A method generates scan patterns for testing an electronic device called DUT having a scan path. A scan tester is arranged for executing a scan shift mode and a capture mode. A scan test interface has a clock control unit for stretching a shift cycle of the scan clock in dependence of a scan clock pattern. The method determines at least one power shift cycle which is expected to cause a voltage drop of a supply voltage exceeding a predetermined threshold during respective shift cycles of the scan shift mode, and generates, in addition to the scan pattern, a scan clock pattern indicative of stretching the power shift cycle. Advantageously, a relatively high scan shift frequency may be used while avoiding detrimental effects of said voltage drop by extending the respective power shift cycle, whereby test time and yield loss are reduced.

Abstract: An integrated circuit includes an input/output “I/O” cell arranged to drive an output signal and an activity analysis unit arranged to generate an activity factor based on the output signal. The activity factor represents a switching activity intensity of the I/O cell. The switching activity intensity is associated with an ageing effect of the I/O cell. The circuit further includes a calibration unit arranged to generate a switching pattern signal based on the generated activity factor and an I/O calibration cell arranged to be driven by the switching pattern signal, wherein the switching pattern signal emulates the ageing effect of the I/O cell.

Abstract: A There is proposed a method and device for simulating a semiconductor IC is provided, which comprises generating a high level description of the IC, generating a low level description of the IC comprising a plurality of instances describing the operation of the IC, conducting a low level function analysis of the IC based on metrics values associated with the instances, and performing a design optimization scheme. The scheme comprises mapping the metric values of instances describing functional units different from standard cells, to standard cells logically connected to said instances, by dividing each of the instance metrics values between a group of standard cells logically connected to the corresponding instance and adding each resulting portion of said instance metric value to the metric value of each of the group of standard cells, respectively.

Abstract: A memory unit comprises at least two volatile memory elements, analyzing circuitry and power gate. The memory elements may for example be latches, flip-flops, or registers. Each of the memory elements has at least two different states including a predefined reset state. The analyzing circuitry generates a power-down enable signal in response to each of the memory elements being in its reset state. The power gate powers down the memory elements in response to the power-down enable signal. The memory elements may be arranged to assume their reset states upon powering up the memory unit.

Abstract: A sequential logic circuit comprising a first latch component comprising a data input arranged to receive an input signal, a data output arranged to output a current logical state of the first latch component and a clock input arranged to receive a clock signal; the first latch component being arranged to comprise a transparent state upon the clock signal received thereby comprising a first logical state, and to comprise a latched state upon the clock signal received thereby comprising a second logical state, and a second latch component comprising a data input arranged to receive an input signal, a data output operably coupled to an output of the sequential logic circuit and arranged to output a current state of the second latch component and a clock input arranged to receive a clock signal; the second latch component being arranged to comprise a transparent state upon the clock signal received thereby comprising a second logical state, and to comprise a latched state upon the clock signal received thereby c

Abstract: A clock signal generator module arranged to generate at least one clock signal for at least one functional module is described. The clock signal generator module comprises a first clock source component associated with at least one functional module, at least one further clock source component associated with the at least one functional module, and at least one management unit arranged to controllably enable signal generation by the first and at least one further clock source components in accordance with at least one operating characteristic of the at least one functional module associated therewith.