Patents by Inventor Naoya Sakamoto

Naoya Sakamoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5298455
    Abstract: A MOS-FET transistor is produced on a substrate made of glass which has a non single crystal semiconductor film (2'). The average diameter of a crystal grain in said film is in the range between 0.5 times and 4 times of thickness of said film, and said average diameter is 250 .ANG.-8000 .ANG. , and said film thickness is 500 .ANG.-2000 .ANG.. The density of oxygen in the semiconductor film (2') is less than 2.times.10.sup.19 /cm.sup.3. A photo sensor having PIN structure is also produced on the substrate, to provide an image sensor for a facsimile transmitter together with the transistors. Said film (2') is produced by placing amorphous silicon film on the glass substrate through CVD process using disilane gas, and effecting solid phase growth to said amorphous silicon film by heating the substrate together with said film in nitrogen gas atmosphere. The film (2') thus produced is subject to implantation of dopant for providing a transistor.
    Type: Grant
    Filed: January 27, 1992
    Date of Patent: March 29, 1994
    Assignee: TDK Corporation
    Inventors: Michio Arai, Masaaki Ikeda, Kazushi Sugiura, Nobuo Furukawa, Mitsufumi Kodama, Yukio Yamauchi, Naoya Sakamoto, Takeshi Fukada, Masaaki Hiroki, Ichirou Takayama
  • Patent number: 5294238
    Abstract: A glass substrate usable for a semiconductor device which shrinks less during a heating process. Specifically, lithium is added to the glass substrate material prior to formation. Further, the glass substrate can be thermal annealed in advance. In accordance with the present invention, it is possible to reduce substrate shrinkage even during TFT processing, by using glass material including more than 4% by weight of lithium, and further by heating the glass substrate at a temperature below the glass strain point temperature.
    Type: Grant
    Filed: March 18, 1992
    Date of Patent: March 15, 1994
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Takeshi Fukada, Naoya Sakamoto
  • Patent number: 5283205
    Abstract: A method for manufacturing a semiconductor device which allows to form a semiconductor device on an insulating amorphous material or an insulating crystallized glass in high precision alignment is provided.The present invention is characterized in that alignment markers of masks are formed along a direction in which a degree of expansion-contraction of a substrate is smaller when the semiconductor device is fabricated by laminating thin films having patterns on the substrate.
    Type: Grant
    Filed: March 17, 1992
    Date of Patent: February 1, 1994
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventor: Naoya Sakamoto
  • Patent number: 5264077
    Abstract: A conductive oxide film is formed on a substrate at a low temperature. The formed conductive oxide film is not very dense because of the low temperature. Therefore the formed conductive oxide film can easily be etched by an etchant having a weak etching capability. And by the etching a pattern of the formed conductive oxide film is produced. The patterned conductive oxide film is oxidized at a temperature in the range of 100.degree.-400.degree. C. In this way a conductive oxide pattern is produced in a shorter time in the method of the present invention than in a conventional method and the conductive oxide pattern produced by the method of the present invention has the almost same resistivity as the conductive oxide pattern produced by the conventional method and has an improved pattern edge and an improved reproducibility.
    Type: Grant
    Filed: November 2, 1992
    Date of Patent: November 23, 1993
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Takashi Fukui, Naoya Sakamoto, Takeshi Fukada
  • Patent number: 5187601
    Abstract: A method for forming a resistance-reducing electrode pattern in an electrooptical device includes the steps of: forming a transparent conductive film on a substrate; forming a plurality of opaque conductive strips on the film; and scribing the combined structure with a laser through the two layers to simultaneously divide the conductive strips into two parts and pattern the transparent film. In this manner, a pattern of transparent electrodes bordered with an opaque electrode pattern is formed. In specific embodiments, the opaque strips may comprise chromium, and the opaque conductive strips may be formed prior to application of the steps above by laser scribing an applied opaque film layer.
    Type: Grant
    Filed: December 17, 1991
    Date of Patent: February 16, 1993
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Takeshi Fukada, Mitsunori Sakama, Nobumitsu Amachi, Naoya Sakamoto, Mitsufumi Codama, Takashi Fuki, Ichiro Takayama
  • Patent number: 5103321
    Abstract: An image sensor is described. The sensor comprises a sensor array and an alternating electric power supply. The frequency of the power supply is selected to be equal to or a multiple of the frequency at which the sensor array is scanned.
    Type: Grant
    Filed: December 13, 1988
    Date of Patent: April 7, 1992
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Nobumitsu Amachi, Toshiji Hamatani, Takeshi Fukada, Mitsunri Sakama, Naoya Sakamoto, Mitsufumi Codama
  • Patent number: 5091638
    Abstract: An improved image sensor is described. The sensor includes a photosensitive semiconductor device comprises a glass substrate, a light blocking electrode formed on the glass substrate, a photosensitive semiconductor film formed on the electrode, a transparent electrode. A light window is opened through the semiconductor device. On the light path including the light window, an uneven interface is formed in order that light rays incident on the sensor is modified and reachs the photosensitive semiconductor after reflection on an original.
    Type: Grant
    Filed: July 19, 1990
    Date of Patent: February 25, 1992
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Takeshi Fukada, Mitsunori Sakama, Hisato Shinohara, Nobumitsu Amachi, Naoya Sakamoto, Takashi Inuzima
  • Patent number: 5043567
    Abstract: A method of manufacturing image sensors where (a) a first conductive film of a transparent material is formed over and in contact with a transparent substrate; (b) a photosensitive semiconductor film is formed over and in contact with the film; (c) the first conductive film and the semiconductor film are patterned by laser scribing; (d) a first insulating film is formed over the above films and in contact with the first conductive film and the semiconductor film and portions thereof are removed which are not necessary to define the image sensors in the patterned semiconductor film; (e) a second conductive film is formed over the semiconductor film and the remaining portions of the first insulating film in order to make contact with the semiconductor film; (f) the second conductive film is patterned; (g) a second insulating film is formed over and in contact with the second conductive film; (h) the second insulating film is patterned; and (i) an electrode arrangement is formed for withdrawing electrical signal
    Type: Grant
    Filed: May 21, 1990
    Date of Patent: August 27, 1991
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Mitsunori Sakama, Takeshi Fukada, Naoya Sakamoto, Nobumitsu Amachi, Shigenori Hayashi, Takashi Inushima
  • Patent number: 5037977
    Abstract: This invention concerns a method for the production of dimeric alkaloids, characterized by reacting of catharanthine with vindoline in the presence of Fe.sup.3+ and (1) removing or inactivating the Fe.sup.3+ and allowing the reaction product to react with a reducing agent or (2) allowing presence of oxygen and a dicarboxylic acid or a derivative thereof in the reaction system and allowing the reaction product to react with a hydride source.In accordance with this invention, such dimeric alkaloid as vinblastine, leurosidin, and 3',4'-anhydrovinblastine which are useful as antineoplastic drugs can be produced in high yields.
    Type: Grant
    Filed: August 8, 1989
    Date of Patent: August 6, 1991
    Assignee: Mitsui Petrochemical Industries Ltd.
    Inventors: Hiroaki Tan, Naoya Sakamoto, Eiichiro Hata, Takeshi Ishitoku, Noriaki Kihara
  • Patent number: 5017502
    Abstract: Disclosed is a method for producing image sensors having a plurality of sensing elements including the formation of parallel separating grooves by laser irradiation, the filling of the grooves with an insulating film, and the subsequent provision of a groove in the insulating film in a direction diagonal to the parallel grooves for metallization.
    Type: Grant
    Filed: January 22, 1990
    Date of Patent: May 21, 1991
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Mitsunori Sakama, Takeshi Fukada, Naoya Sakamoto, Nobumitsu Amachi, Shigenori Hayashi, Takashi Inushima
  • Patent number: 5017828
    Abstract: An improved image sensor made of photosensitive semiconductor materials with a number of pixels each including an n-type semiconductor layer, a p-type semiconductor layer and an intrinsic semiconductor layer disposed between the n-type and p-type layers. The n-type and p-type layers are made from a semiconductor material having a high resistivity. The high resistivity of the n-type layer and the p-type layer functions to prevent crosstalk currents from passing between the pixels.
    Type: Grant
    Filed: April 25, 1989
    Date of Patent: May 21, 1991
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Takeshi Fukada, Mitsunori Sakama, Nobumitsu Amachi, Naoya Sakamoto, Mitsufumi Codama, Toru Takayama
  • Patent number: 5014100
    Abstract: A contact image sensor for use in facsimile machines is described. A light window is opened through a photosensitive semiconductor film deposited on a glass sustrate. Light rays are passed through the light window, reflected on an original and absorbed by the semiconductor film in order to produce image signals containing visual information of the original. Provided on the light incident side of the semiconductor film is a light blocking electrode which prevents incident light rays from directly entering the semiconductor film therethrough without reflection on the original. The opposing electrode formed on the other side of the semiconductor film is made of a transparent film covering the side surface of the light window. The opposing electrode on the side surface functions to eliminate noise signals caused by undesirable light rays incident through the side surface, which otherwise, would deteriorate the output signals of the image sensor.
    Type: Grant
    Filed: December 16, 1988
    Date of Patent: May 7, 1991
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Takeshi Fukada, Mitsufumi Codama, Mitsunori Sakama, Nobumitsu Amachi, Naoya Sakamoto, Ichiro Takayama
  • Patent number: 4959533
    Abstract: An improved image sensor is described. The sensor includes a photosensitive semiconductor device comprises a glass substrate, a light blocking electrode formed on the glass substrate, a photosensitive semiconductor film formed on the electrode, a transparent electrode. A light window is opened through the semiconductor device. On the light path including the light window, an uneven interface is formed in order that light rays incident on the sensor is modified and reachs the photosensitive semiconductor after reflection on an original.
    Type: Grant
    Filed: October 18, 1988
    Date of Patent: September 25, 1990
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Takeshi Fukada, Mitsunori Sakama, Hisato Shinohara, Nobumitsu Amachi, Naoya Sakamoto, Takashi Inuzima
  • Patent number: 4945226
    Abstract: A photosensing system is described. Light rays to be sensed is incident on a photosensitive semiconductor device which allows much current to pass therethrough during receiving the incident light and which passes a little current when there is no incident light. The current passing through the semiconductor device is accumulated in a suitable storage means. The accumulated charge is detected, in order to judge the existence or the absence of the incident light, a certain time period after the pulsed signal is outputted.
    Type: Grant
    Filed: October 27, 1988
    Date of Patent: July 31, 1990
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Takeshi Fukuda, Nobumitsu Amachi, Mitsunori Sakama, Naoya Sakamoto, Shunpei Yamazaki
  • Patent number: 4943710
    Abstract: This invention relates to an image sensor and manufacturing method for the same.
    Type: Grant
    Filed: June 22, 1988
    Date of Patent: July 24, 1990
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Mitsunori Sakama, Takeshi Fukada, Naoya Sakamoto, Nobumitsu Amachi, Shigenori Hayashi, Takashi Inushima
  • Patent number: 4891465
    Abstract: In a process for producing an alkyl group-substituted aromatic hydrocarbon according to the present invention, (i) an aromatic hydrocarbon is reacted with (ii) an alkylating agent selected from the group consisting of olefins, lower aliphatic alcohols and alkyl halides in the presence of a mordenite-type zeolite catalyst treated with a fluorine-containing compound, and therefore the conversion of the aromatic compound can be increased and further it is possible to introduce the specific number of alkyl groups into the specific position of the aromatic compound.In particular, when biphenyl is used as the aromatic hydrocarbon and propylene is used as the alkylating agent, p,p'-diisopropylbiphenyl can be obtained in a high yield and high selectivity.
    Type: Grant
    Filed: July 6, 1988
    Date of Patent: January 2, 1990
    Assignee: Mitsui Petrochemical Industries, Ltd.
    Inventors: Katsuo Taniguchi, Michio Tanaka, Kazunori Takahata, Naoya Sakamoto, Toshihiro Takai, Yoshito Kurano, Masayasu Ishibashi