Patents by Inventor Renato C. Padilla
Renato C. Padilla has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20190250824Abstract: Memory devices are disclosed. A memory device may include main memory and a hybrid cache. The hybrid cache includes a dynamic cache including x-level cell (XLC) blocks of non-volatile memory cells shared between the dynamic cache and the main memory. The hybrid cache further includes a static cache including single-level cell (SLC) blocks of non-volatile memory cells. The memory device further includes a memory controller configured to disable at least one of the static cache and the dynamic cache responsive to a workload of the hybrid cache relative to a Total Bytes Written (TBW) Spec for the memory device. Methods of operating a memory device and an electronic system are also described.Type: ApplicationFiled: April 26, 2019Publication date: August 15, 2019Inventors: Kishore K. Muchherla, Ashutosh Malshe, Sampath K. Ratnam, Peter Feeley, Michael G. Miller, Christopher S. Hale, Renato C. Padilla
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Patent number: 10380018Abstract: An example apparatus for garbage collection can include a memory including a plurality of mixed mode blocks. The example apparatus can include a controller. The controller can be configured to write a first portion of sequential host data to the plurality of mixed mode blocks of the memory in a single level cell (SLC) mode. The controller can be configured to write a second portion of sequential host data to the plurality of mixed mode blocks in an XLC mode. The controller can be configured to write the second portion of sequential host data by performing a garbage collection operation. The garbage collection operation can include adding more blocks to a free block pool than a quantity of blocks that are written to in association with writing the second portion of sequential host data to the plurality of mixed mode blocks.Type: GrantFiled: April 4, 2017Date of Patent: August 13, 2019Assignee: Micron Technology, Inc.Inventors: Kishore K. Muchherla, Sampath K. Ratnam, Peter Feeley, Michael G. Miller, Daniel J. Hubbard, Renato C. Padilla, Ashutosh Malshe, Harish R. Singidi
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Publication number: 20190243707Abstract: A determination can be made that an error control operation associated with user data has failed. An initial operating characteristic associated with the error control operation that failed can be identified. A complementary operating characteristic to replace the operating characteristic associated with the error control operation that failed can be determined. The error control operation for the user data can be performed based on the complementary operating characteristic.Type: ApplicationFiled: October 18, 2018Publication date: August 8, 2019Inventors: Vamsi Pavan Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Shane Nowell, Renato C. Padilla
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Patent number: 10366767Abstract: Memory devices include an array of memory cells and circuitry for control and/or access of the array of memory cells, wherein the circuitry is configured to perform a method including applying a particular voltage to an unselected access line of a program operation, sensing a current of a selected access line of the program operation while applying the particular voltage to the unselected access line, indicating a fail status of the program operation if an absolute value of the sensed current of the selected access line is greater than a particular current, and proceeding with the program operation if the absolute value of the sensed current of the selected access line is less than a particular current.Type: GrantFiled: August 25, 2017Date of Patent: July 30, 2019Assignee: Micron Technology, Inc.Inventors: Jeffrey A. Kessenich, Joemar Sinipete, Chiming Chu, Jason L. Nevill, Kenneth W. Marr, Renato C. Padilla
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Patent number: 10359963Abstract: The present disclosure relates to partially written block treatment. An example method comprises maintaining, internal to a memory device, a status of a last written page corresponding to a partially written block. Responsive to receiving, from a controller, a read request to a page of the partially written block, the example method can include determining, from page map information maintained internal to the memory device and from the status of the last written page, which of a number of different read trim sets to use to read the page of the partially written block corresponding to the read request.Type: GrantFiled: January 23, 2017Date of Patent: July 23, 2019Assignee: Micron Technology, Inc.Inventors: Sivagnanam Parthasarathy, Terry M. Grunzke, Lucia Botticchio, Walter Di Francesco, Vamshi K. Indavarapu, Gianfranco Valeri, Renato C. Padilla, Ali Mohammadzadeh, Jung Sheng Hoei, Luca De Santis
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Patent number: 10359933Abstract: A memory having a memory controller is configured to operate a hybrid cache including a dynamic cache including x-level cell (XLC) (e.g., multi-level cell (MLC)) blocks and a static cache including single level cell (SLC) blocks. A method of operating the memory includes storing at least a portion of host data into the SLC blocks as static cache; and storing at least another portion of host data into XLC blocks in an SLC mode as dynamic cache responsive to a burst of host data being determined to be greater than the static cache can handle. At least one of the static cache or dynamic cache may be disabled based on monitoring a workload of the hybrid cache relative to a Total Bytes Written (TBW) specification, such as by counting program-erase (PE) cycles of different portions of memory, or responsive to the workload exceeding a predetermined threshold defining one or more switch points.Type: GrantFiled: September 19, 2016Date of Patent: July 23, 2019Assignee: Micron Technology, Inc.Inventors: Kishore K. Muchherla, Ashutosh Malshe, Sampath K. Ratnam, Peter Feeley, Michael G. Miller, Christopher S. Hale, Renato C. Padilla
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Patent number: 10340016Abstract: A memory device comprising a main memory and a controller operably connected to the main memory. The main memory can comprise a plurality of memory addresses, each corresponding to a single one of a plurality of word lines. Each memory address can be included in a tracked subset of the plurality of memory addresses. Each tracked subset can include memory addresses corresponding to more than one of the plurality of word lines. The controller is configured to track a number of read operations for each tracked subset, and to scan, in response to the number of read operations for a first tracked subset exceeding a first threshold value, a portion of data corresponding to each word line of the first tracked subset to determine an error count corresponding to each word line of the first tracked subset.Type: GrantFiled: June 26, 2017Date of Patent: July 2, 2019Assignee: Micron Technology, Inc.Inventors: Renato C. Padilla, Jung Sheng Hoei, Michael G. Miller, Roland J. Awusie, Sampath K. Ratnam, Kishore Kumar Muchherla, Gary F. Besinga, Ashutosh Malshe, Harish R. Singidi
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Patent number: 10331553Abstract: An example apparatus for garbage collection can include a memory including a plurality of mixed mode blocks. The example apparatus can include a controller. The controller can be configured to write a first portion of sequential host data to the plurality of mixed mode blocks of the memory in a single level cell (SLC) mode. The controller can be configured to write a second portion of sequential host data to the plurality of mixed mode blocks in an XLC mode. The controller can be configured to write the second portion of sequential host data by performing a garbage collection operation. The garbage collection operation can include adding more blocks to a free block pool than a quantity of blocks that are written to in association with writing the second portion of sequential host data to the plurality of mixed mode blocks.Type: GrantFiled: April 4, 2017Date of Patent: June 25, 2019Assignee: Micron Technology, Inc.Inventors: Kishore K. Muchherla, Sampath K. Ratnam, Peter Feeley, Michael G. Miller, Daniel J. Hubbard, Renato C. Padilla, Ashutosh Malshe, Harish R. Singidi
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Patent number: 10325668Abstract: Apparatuses and methods for operating mixed mode blocks. One example method can include tracking single level cell (SLC) mode cycles and extra level cell (XLC) mode cycles performed on the mixed mode blocks, maintaining a mixed mode cycle count corresponding to the mixed mode blocks, and adjusting the mixed mode cycle count differently for mixed mode blocks operated in a SLC mode than for mixed blocks operated in a XLC mode.Type: GrantFiled: April 5, 2017Date of Patent: June 18, 2019Assignee: Micron Technology, Inc.Inventors: Kishore K. Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Gary F. Besinga, Scott A. Stoller, Sampath K. Ratnam, Renato C. Padilla, Peter Feeley
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Patent number: 10318378Abstract: The present disclosure includes a redundant array of independent NAND for a three dimensional memory array. A number of embodiments include a three-dimensional array of memory cells, wherein the array includes a plurality of pages of memory cells, a number of the plurality of pages include a parity portion of a redundant array of independent NAND (RAIN) stripe, and the parity portion of the RAIN stripe in each respective page comprises only a portion of that respective page.Type: GrantFiled: February 25, 2016Date of Patent: June 11, 2019Assignee: Micron Technology, IncInventors: Jung Sheng Hoei, Sampath K. Ratnam, Renato C. Padilla, Kishore K. Muchherla, Sivagnanam Parthasarathy, Peter Feeley
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Patent number: 10303535Abstract: Apparatus include controllers configured to iteratively program a group of memory cells to respective desired data states; determine whether a power loss to the apparatus is indicated while iteratively programming the group of memory cells; and if a power loss to the apparatus is indicated, to change the desired data state of the particular memory cell before continuing with the programming. Apparatus further include controllers configured to read a particular memory cell of a last written page of memory cells, determine whether a threshold voltage of the particular memory cell is less than a particular voltage level, and to mark the last written page of memory cells as affected by power loss during a programming operation of the last written page of memory cells when the threshold voltage of the particular memory cell is determined to be higher than the particular voltage level.Type: GrantFiled: March 5, 2018Date of Patent: May 28, 2019Assignee: Micron Technology, Inc.Inventors: Michael G. Miller, Ashutosh Malshe, Violante Moschiano, Peter Feeley, Gary F. Besinga, Sampath K. Ratnam, Walter Di-Francesco, Renato C. Padilla, Jr., Yun Li, Kishore Kumar Muchherla
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Publication number: 20190073251Abstract: Apparatus having an array of memory cells include a controller configured to read a particular memory cell of a last written page of memory cells of a block of memory cells of the array of memory cells, determine whether a threshold voltage of the particular memory cell is less than a particular voltage level, and mark the last written page of memory cells as affected by power loss during a programming operation of the last written page of memory cells when the threshold voltage of the particular memory cell is determined to be higher than the particular voltage level.Type: ApplicationFiled: November 2, 2018Publication date: March 7, 2019Applicant: MICRON TECHNOLOGY, INC.Inventors: Michael G. Miller, Ashutosh Malshe, Violante Moschiano, Peter Feeley, Gary F. Besinga, Sampath K. Ratnam, Walter Di-Francesco, Renato C. Padilla, JR., Yun Li, Kishore Kumar Muchherla
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Publication number: 20190043592Abstract: Several embodiments of memory devices and systems with read level calibration are disclosed herein. In one embodiment, a memory device includes a controller operably coupled to a main memory having at least one memory region and calibration circuitry. The calibration circuitry is operably coupled to the at least one memory region and is configured to determine a read level offset value corresponding to a read level signal of the at least one memory region. In some embodiments, the calibration circuitry is configured to obtain the read level offset value internal to the main memory. The calibration circuitry is further configured to output the read level offset value to the controller.Type: ApplicationFiled: September 10, 2018Publication date: February 7, 2019Inventors: Gary F. Besinga, Peng Fei, Michael G. Miller, Roland J. Awusie, Kishore Kumar Muchherla, Renato C. Padilla, Harish R. Singidi, Jung Sheng Hoei, Gianni S. Alsasua
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Publication number: 20190043590Abstract: Several embodiments of memory devices and systems with read level calibration are disclosed herein. In one embodiment, a memory device includes a controller operably coupled to a main memory having at least one memory region and calibration circuitry. The calibration circuitry is operably coupled to the at least one memory region and is configured to determine a read level offset value corresponding to a read level signal of the at least one memory region. In some embodiments, the calibration circuitry is configured to obtain the read level offset value internal to the main memory. The calibration circuitry is further configured to output the read level offset value to the controller.Type: ApplicationFiled: August 4, 2017Publication date: February 7, 2019Inventors: Gary F. Besinga, Peng Fei, Michael G. Miller, Roland J. Awusie, Kishore Kumar Muchherla, Renato C. Padilla, Harish R. Singidi, Jung Sheng Hoei, Gianni S. Alsasua
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Patent number: 10199111Abstract: Several embodiments of memory devices and systems with read level calibration are disclosed herein. In one embodiment, a memory device includes a controller operably coupled to a main memory having at least one memory region and calibration circuitry. The calibration circuitry is operably coupled to the at least one memory region and is configured to determine a read level offset value corresponding to a read level signal of the at least one memory region. In some embodiments, the calibration circuitry is configured to obtain the read level offset value internal to the main memory. The calibration circuitry is further configured to output the read level offset value to the controller.Type: GrantFiled: August 4, 2017Date of Patent: February 5, 2019Assignee: Micron Technology, Inc.Inventors: Gary F. Besinga, Peng Fei, Michael G. Miller, Roland J. Awusie, Kishore Kumar Muchherla, Renato C. Padilla, Harish R. Singidi, Jung Sheng Hoei, Gianni S. Alsasua
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Publication number: 20180374549Abstract: A memory device comprising a main memory and a controller operably connected to the main memory is provided. The main memory can comprise a plurality of memory addresses, each corresponding to a single one of a plurality of word lines. Each memory address can be included in a tracked subset of the plurality of memory addresses. Each tracked subset can include memory addresses corresponding to more than one of the plurality of word lines. The controller is configured to track a number of read operations for each tracked subset, and to scan, in response to the number of read operations for a first tracked subset exceeding a first threshold value, a portion of data corresponding to each word line of the first tracked subset to determine an error count corresponding to each word line of the first tracked subset.Type: ApplicationFiled: June 26, 2017Publication date: December 27, 2018Inventors: Renato C. Padilla, Jung Sheng Hoei, Michael G. Miller, Roland J. Awusie, Sampath K. Ratnam, Kishore Kumar Muchherla, Gary F. Besinga, Ashutosh Malshe, Harish R. Singidi
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Publication number: 20180293003Abstract: The present disclosure includes memory blocks erasable in a single level cell mode. A number of embodiments include a memory comprising a plurality of mixed mode blocks and a controller. The controller may be configured to identify a particular mixed mode block for an erase operation and, responsive to a determined intent to subsequently write the particular mixed mode block in a single level cell (SLC) mode, perform the erase operation in the SLC mode.Type: ApplicationFiled: April 7, 2017Publication date: October 11, 2018Inventors: Kishore K. Muchherla, Sampath K. Ratnam, Peter Feeley, Michael G. Miller, Preston A. Thomson, Renato C. Padilla, Ashutosh Malshe
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Publication number: 20180293001Abstract: Apparatuses and methods for operating mixed mode blocks. One example method can include tracking single level cell (SLC) mode cycles and extra level cell (XLC) mode cycles performed on the mixed mode blocks, maintaining a mixed mode cycle count corresponding to the mixed mode blocks, and adjusting the mixed mode cycle count differently for mixed mode blocks operated in a SLC mode than for mixed blocks operated in a XLC mode.Type: ApplicationFiled: April 5, 2017Publication date: October 11, 2018Inventors: Kishore K. Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Gary F. Besinga, Scott A. Stoller, Sampath K. Ratnam, Renato C. Padilla, Peter Feeley
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Publication number: 20180285258Abstract: An example apparatus for garbage collection can include a memory including a plurality of mixed mode blocks. The example apparatus can include a controller. The controller can be configured to write a first portion of sequential host data to the plurality of mixed mode blocks of the memory in a single level cell (SLC) mode. The controller can be configured to write a second portion of sequential host data to the plurality of mixed mode blocks in an XLC mode. The controller can be configured to write the second portion of sequential host data by performing a garbage collection operation. The garbage collection operation can include adding more blocks to a free block pool than a quantity of blocks that are written to in association with writing the second portion of sequential host data to the plurality of mixed mode blocks.Type: ApplicationFiled: April 4, 2017Publication date: October 4, 2018Inventors: Kishore K. Muchherla, Sampath K. Ratnam, Peter Feeley, Michael G. Miller, Daniel J. Hubbard, Renato C. Padilla, Ashutosh Malshe, Harish R. Singidi
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Publication number: 20180210653Abstract: The present disclosure relates to partially written block treatment. An example method comprises maintaining, internal to a memory device, a status of a last written page corresponding to a partially written block. Responsive to receiving, from a controller, a read request to a page of the partially written block, the example method can include determining, from page map information maintained internal to the memory device and from the status of the last written page, which of a number of different read trim sets to use to read the page of the partially written block corresponding to the read request.Type: ApplicationFiled: January 23, 2017Publication date: July 26, 2018Inventors: Sivagnanam Parthasarathy, Terry M. Grunzke, Lucia Botticchio, Walter Di Francesco, Vamshi K. Indavarapu, Gianfranco Valeri, Renato C. Padilla, Ali Mohammadzadeh, Jung Sheng Hoei, Luca De Santis