Abstract: An interior weld for furniture having a tubular member is disclosed. The weld has a first tubular member and a second tubular member. The first tubular member is adapted to receive the tubular second member. An edge of the tubular second member contacts an inner surface of the first tubular member. A weld is formed on the inner surface of the first tubular member at the contact point where the second tubular member contacts the first tubular member. There is a weld at that contact point which immovably attaches the second member to the first member.

Abstract: A system and method for designing a complex electronic circuit by simulating blocks of the circuit using various simulators to produce a net list, designing the physical layout of the circuit using a layout tool that produces a layout verses schematic reference file, mapping the reference file to the net list to create a mapping file, and analyzing the mapping file to verify that the layout meets various criteria. Each block may be verified using simulation tools that are appropriate for that piece of the overall circuit, and using conditions that may maximize the strain on the circuit. The results from the simulations are compared to the physical layout to determine if the physical layout is able to properly conduct the electrical signals.

Abstract: An integrated circuit is provided, which includes a transistor device under test, an AC drive circuit, an AC bias circuit and a DC bias circuit. The AC drive circuit generates an AC drive signal. The AC bias circuit biases the transistor device under AC bias conditions in response to the AC drive signal. The DC bias circuit biases the transistor device under DC bias conditions. A switch circuit selectively couples the transistor device to the AC bias circuit in an AC stress mode and to the DC bias circuit in a DC measurement mode.

Abstract: A signal deskew circuit is provided, which includes first and second signal branches, each branch extending between a start location and a respective end location. Each signal branch includes a send path and a return path, which have substantially the same propagation delays. An adjustable delay buffer is coupled in the send and return paths of a first of the signal branches and has a delay, which is adjustable based on a respective adjust signal. A skew sensor coupled to the return paths of the first and second signal branches, which generates the respective adjust signal for the adjustable delay buffer based on a phase difference between signals on the return paths of the first and second signal branches.

Abstract: TDF testing has become a requirement for any and all product applications for which product quality is of utmost concern, e.g. storage components. The specific problem with regard to TDF testing is that most production test systems cannot exceed a 200 Mhz effective TDF test rate. A higher speed solution for use with existing tester platforms is provided, without having to spend significant capital resources to upgrade to newer tester platforms. One solution adds circuitry to the test hardware used to interface to the DUT. Another solution adds circuitry to the actual design prior to releasing it for processing.

Abstract: A linear capacitor design providing shielding on all sides of the linear capacitor. In one aspect the capacitor provides a signal side metal layer substantially enclosed by a dielectric material which is, in turn, substantially enclosed by an upper and lower metal shield layer. in another aspect, the upper and lower shield metal layers may be coupled by a plurality of vias. In another aspect, a plurality of alternating intermediate layers provide signal side metal and shield metal separated by dielectric material such that each signal side layer is substantially enclosed by one or more shield metal layers. In another aspect, multiple intermediate signal side metal layers are conductively coupled to one another by a plurality of vias and multiple shield metal layers are conductively coupled to one another by a plurality of vias.

Abstract: An interior weld for furniture having a tubular member is disclosed. The weld has a first tubular member and a second tubular member. The first tubular member is adapted to receive the tubular second member. An edge of the tubular second member contacts an inner surface of the first tubular member. A weld is formed on the inner surface of the first tubular member at the contact point where the second tubular member contacts the first tubular member. There is a weld at that contact point which immovably attaches the second member to the first member.

Abstract: A signal deskew circuit is provided, which includes first and second signal branches, each branch extending between a start location and a respective end location. Each signal branch includes a send path and a return path, which have substantially the same propagation delays. An adjustable delay buffer is coupled in the send and return paths of a first of the signal branches and has a delay, which is adjustable based on a respective adjust signal. A skew sensor coupled to the return paths of the first and second signal branches, which generates the respective adjust signal for the adjustable delay buffer based on a phase difference between signals on the return paths of the first and second signal branches.

Abstract: An interior weld for furniture having a tubular member is disclosed. The weld has a first tubular member and a second tubular member. The first tubular member is adapted to receive the tubular second member. An edge of the tubular second member contacts an inner surface of the first tubular member. A weld is formed on the inner surface of the first tubular member at the contact point where the second tubular member contacts the first tubular member. There is a weld at that contact point which immovably attaches the second member to the first member.

Abstract: The combination of a base, with which at least one sheet layer can be operatively supported to be cut, a guide assembly, and a cutting blade assembly. The cutting blade assembly includes first and second cutting blades. The cutting blade assembly is selectively changeable between a) a first state wherein the first cutting blade is in a first operative position and the second cutting blade is in a first inactive position, and b) a second state wherein the second cutting blade is in a second operative position and the first cutting blade is in a second inactive position. The cutting blade assembly cooperates with the guide assembly to be movable guidingly in a cutting path. The first cutting blade in the first operative position causes cutting of a sheet layer operatively supported on the base as the cutting blade assembly is moved in the cutting path.

Abstract: A system and method for evaluating multiple corner case static timing analyses. For each node within the analysis, the variability and margin of the node is used to create a risk factor that is used to identify nodes for further analysis. In some cases, a subset of nodes may be selected for static timing analysis with several additional corner cases. The variability of the node may be determined by the difference between the maximum and minimum value of the node between corner case analyses. The margin may be determined by the difference between the actual timing and the required timing. Various ratios using variability and margin may be used to identify those nodes on which to perform further analysis.

Abstract: An automatically scramming nuclear reactor system. One embodiment comprises a core having a coolant inlet end and a coolant outlet end. A cooling system operatively associated with the core provides coolant to the coolant inlet end and removes heated coolant from the coolant outlet end, thus maintaining a pressure differential therebetween during a normal operating condition of the nuclear reactor system. A guide tube is positioned within the core with a first end of the guide tube in fluid communication with the coolant inlet end of the core, and a second end of the guide tube in fluid communication with the coolant outlet end of the core. A control element is positioned within the guide tube and is movable therein between upper and lower positions, and automatically falls under the action of gravity to the lower position when the pressure differential drops below a safe pressure differential.

Abstract: A test vehicle a system and method for evaluating an interconnect module manufacturing process while dynamically testing performance with high-speed operational frequencies is disclosed. An interconnect module designed at many of the manufacturing process limits offers complete and fast failure analysis so that manufacturing defects can be quickly located and the process improved. Failure analysis, particularly on 90 nm technologies and beyond is becoming extremely difficult. At-speed testing is also becoming very important to the yield and reliability of products. This invention incorporates a self-timed speed circuit that can detect subtle resistive faults and also show the exact location in the array where the speed fault occurred based on test program datalogs from scan flip flops.

Abstract: A test vehicle for evaluating a manufacturing process for integrated circuits that uses a more space efficient layout of library driving cells arranged to produce circuits that exercise many interconnections that may be designed at the minimum design parameters of a manufacturing process. The cells can be configured to operate as ring oscillators increasing the effective circuit frequency of the test module allowing higher frequency circuit testing, and shortening the time it takes to perform life cycle testing. Visibly marking cells, combined with electrically isolating error prone circuit segments makes, identifying defects much more efficient. The accessibility of many testing methods allows quick location of root cause failures, which allows improvements to be made to the manufacturing process.

Abstract: Static timing analysis results from multiple corner cases are combined to create a differential results table that may be used to identify components that are a high risk for failure. These results may be combined with a schematic analysis tool that finds overlapping logic cones for specific nodes of a circuit such as a failing output pin. These tools are specifically adapted to assist an engineer in the design and debugging of complex circuits, such as integrated circuits.

Abstract: A test vehicle a system and method for evaluating an interconnect module manufacturing process while dynamically testing performance with high-speed operational frequencies is disclosed. The test vehicle incorporates a self-timed or gated speed circuit that can detect subtle resistive faults and also show the exact location in the array where the speed fault occurred based on test program data logs from scan flip flops. One embodiment incorporates a gated clock in the gated speed circuit producing gated data that delivers greater statistical properties with respect to Integrated Circuit Direct Drain Quiescent Current (IDDQ) testing.

Abstract: A test vehicle a system and method for evaluating an interconnect module manufacturing process while dynamically testing performance with high-speed operational frequencies is disclosed. An interconnect module designed at many of the manufacturing process limits offers complete and fast failure analysis so that manufacturing defects can be quickly located and the process improved. Failure analysis, particularly on 90 nm technologies and beyond is becoming extremely difficult. At-speed testing is also becoming very important to the yield and reliability of products. This invention incorporates a self-timed speed circuit that can detect subtle resistive faults and also show the exact location in the array where the speed fault occurred based on test program datalogs from scan flip flops.

Abstract: A test vehicle for evaluating a manufacturing process for integrated circuits comprises a staircase of vias and traces arranged for maximum test coverage. The staircase may be combined with several functional cells to produce circuits that exercise many interconnections that may be designed at the minimum design parameters of manufacturing process. The accessibility of many testing methods allows an engineer to quickly find root cause failures and thus make improvements to the manufacturing process.

Abstract: A test vehicle for evaluating a manufacturing process for integrated circuits comprises a staircase of vias and traces arranged for maximum test coverage. The staircase may be combined with several functional cells to produce circuits that exercise many interconnections that may be designed at the minimum design parameters of manufacturing process. The accessibility of many testing methods allows an engineer to quickly find root cause failures and thus make improvements to the manufacturing process.