Patents by Inventor Sampath K. Ratnam

Sampath K. Ratnam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210117318
    Abstract: A processing device in a memory system determines a rate at which an amount of valid data is decreasing on a first block of the memory device and determines whether the rate at which the amount of valid data is decreasing on the first block satisfies a threshold criterion. Responsive to the rate at which the amount of valid data is decreasing on the first block satisfying the threshold criterion, the processing device performs a media management operation on the first block of the memory device.
    Type: Application
    Filed: December 23, 2020
    Publication date: April 22, 2021
    Inventors: Kishore Kumar Muchherla, Sampath K. Ratnam, Ashutosh Malshe, Peter Sean Feeley
  • Publication number: 20210109805
    Abstract: A determination that a programming operation has been performed on a memory cell can be made. An amount of time that has elapsed since the programming operation has been performed on the memory cell can be identified. A determination as to whether the amount of time that has elapsed satisfies a threshold time condition can be made. In response to determining that the amount of time that has elapsed satisfies the threshold time condition an operation can be performed on the memory cell to change or maintain a voltage condition of the memory cell.
    Type: Application
    Filed: December 21, 2020
    Publication date: April 15, 2021
    Inventors: Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Sivagnanam Parthasarathy, Qisong Lin, Shane Nowell, Mustafa N. Kaynak
  • Patent number: 10977173
    Abstract: A memory system includes: a memory array including a plurality of memory cells, the plurality of memory cells including a plurality of cache memory cells; and a controller coupled to the memory array, the controller configured to: track usage of a first subset of the plurality of cache memory cells operating in a single-level cell (SLC) mode, wherein the tracking includes monitoring for an idle time event; and designate a storage mode for a second subset of the plurality of cache memory cells based on the tracked usage of the first subset, wherein the storage mode determines a storage density to be used for data writes.
    Type: Grant
    Filed: October 22, 2018
    Date of Patent: April 13, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Yun Li, Kishore Kumar Muchherla, Peter Feeley, Ashutosh Malshe, Daniel J. Hubbard, Christopher S. Hale, Kevin R. Brandt, Sampath K. Ratnam
  • Patent number: 10977174
    Abstract: A request to add content to a system data structure can be received. A first set of blocks of a common pool of blocks are allocated to the system data structure and a second set of blocks of the common pool of blocks are allocated to user data. A determination can be made as to whether a garbage collection operation associated with the first set of blocks of the common pool allocated to the system data structure satisfies a garbage collection performance condition. Responsive to determining that the garbage collection operation satisfies the garbage collection performance condition, a block from the common pool can be allocated to the first set of blocks allocated to the system data structure.
    Type: Grant
    Filed: December 31, 2018
    Date of Patent: April 13, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Kishore Kumar Muchherla, Kulachet Tanpairoj, Peter Feeley, Sampath K. Ratnam, Ashutosh Malshe
  • Patent number: 10963340
    Abstract: User data that is to be stored at a memory system can be received. System data associated with the memory system can be identified and the user data and the system data can be stored at the memory system based on an error control operation. A subset of the system data can be identified and the subset of the system data can be stored at the memory system based on another error control operation.
    Type: Grant
    Filed: July 6, 2018
    Date of Patent: March 30, 2021
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Vamsi Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla
  • Patent number: 10949344
    Abstract: An example apparatus for garbage collection can include a memory including a plurality of mixed mode blocks. The example apparatus can include a controller. The controller can be configured to write a first portion of sequential host data to the plurality of mixed mode blocks of the memory in a single level cell (SLC) mode. The controller can be configured to write a second portion of sequential host data to the plurality of mixed mode blocks in an XLC mode. The controller can be configured to write the second portion of sequential host data by performing a garbage collection operation. The garbage collection operation can include adding more blocks to a free block pool than a quantity of blocks that are written to in association with writing the second portion of sequential host data to the plurality of mixed mode blocks.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: March 16, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Kishore K. Muchherla, Sampath K. Ratnam, Peter Feeley, Michael G. Miller, Daniel J. Hubbard, Renato C. Padilla, Ashutosh Malshe, Harish R. Singidi
  • Publication number: 20210072926
    Abstract: A program operation is executed on a memory sub-system. In response to receiving a request to execute a read operation, executing a first program suspend operation to suspend the program operation. In response to a completion of the read operation, a program resume operation is executed to resume execution of the program operation. A delay period is established following execution of the program resume operation during which execution of the program operation is completed. A second program suspend operation is executed following the delay period.
    Type: Application
    Filed: November 20, 2020
    Publication date: March 11, 2021
    Inventors: Jiangang Wu, Sampath K. Ratnam, Yang Zhang, Guang Chang Ye, Kishore Kumar Muchherla, Hong Lu, Karl D. Schuh, Vamsi Pavan Rayaprolu
  • Patent number: 10942796
    Abstract: Apparatus having an array of memory cells include a controller configured to read a particular memory cell of a last written page of memory cells of a block of memory cells of the array of memory cells, determine whether a threshold voltage of the particular memory cell is less than a particular voltage level, and mark the last written page of memory cells as affected by power loss during a programming operation of the last written page of memory cells when the threshold voltage of the particular memory cell is determined to be higher than the particular voltage level.
    Type: Grant
    Filed: August 19, 2019
    Date of Patent: March 9, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Michael G. Miller, Ashutosh Malshe, Violante Moschiano, Peter Feeley, Gary F. Besinga, Sampath K. Ratnam, Walter Di-Francesco, Renato C. Padilla, Jr., Yun Li, Kishore Kumar Muchherla
  • Patent number: 10936416
    Abstract: The present disclosure includes a redundant array of independent NAND for a three dimensional memory array. A number of embodiments include a three-dimensional array of memory cells, wherein the array includes a plurality of pages of memory cells, a number of the plurality of pages include a parity portion of a redundant array of independent NAND (RAIN) stripe, and the parity portion of the RAIN stripe in each respective page comprises only a portion of that respective page.
    Type: Grant
    Filed: May 3, 2019
    Date of Patent: March 2, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Jung Sheng Hoei, Sampath K. Ratnam, Renato C. Padilla, Kishore K. Muchherla, Sivagnanam Parthasarathy, Peter Feeley
  • Patent number: 10936392
    Abstract: A processing device in a memory system receives a memory command indicating a read window size and a first read voltage and identifies a read window for a first data block of the memory component having the read window size and centered at the first read voltage. The processing device determines whether a number of bit flips for the first data block within the read window exceeds an error threshold and, in response to the number of bit flips exceeding the error threshold, refreshes data stored on the first data block of the memory component.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: March 2, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Jung Sheng Hoei, Peter Sean Feeley, Sampath K. Ratnam, Sead Zildzic, Kishore Kumar Muchherla
  • Patent number: 10915400
    Abstract: One or more blocks from a pool of storage area blocks of the memory component are allocated to a first set of purposed blocks. First write operations are performed to write first data to first data stripes at user blocks of the memory component. Whether the blocks in the first set of purposed blocks satisfy a condition indicating that the first set of purposed blocks are to be retired is determined. Responsive to the blocks in the first set of purposed blocks satisfying the condition, one or more other blocks from the pool of storage area blocks of the memory component are allocated to a second set of purposed blocks. Second write operations are performed to write second data to second data stripes at the user blocks of the memory component.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: February 9, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Kishore Kumar Muchherla, Harish R. Singidi, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Sampath K. Ratnam
  • Patent number: 10915444
    Abstract: A processing device in a memory system determines whether a first data block of a plurality of data blocks on the memory component satisfies a first threshold criterion pertaining to a first number of the plurality of data blocks having a lower amount of valid data than a remainder of the plurality of data blocks. Responsive to the first data block satisfying the first threshold criterion, the processing device determines whether the first data block satisfies a second threshold criterion pertaining to a second number of the plurality of data blocks having been written to more recently than the remainder of the plurality of data blocks. Responsive to the first data block satisfying the second threshold criterion, the processing device determines whether a rate of change of an amount of valid data on the first data block satisfies a third threshold criterion.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: February 9, 2021
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Kishore Kumar Muchherla, Sampath K. Ratnam, Ashutosh Malshe, Peter Sean Feeley
  • Patent number: 10871923
    Abstract: A program operation is executed on a memory sub-system. During execution of the program operation, a request to execute a read operation on the memory sub-system is received. In response to receiving the request, a program suspend operation to suspend the program operation is executed. The read operation is executed on the memory sub-system in response to a completion of the program suspend operation. In response to completion of the read operation, a program resume operation is executed. A program suspend delay period is established following execution of the program resume operation during which a subsequent read operation is stored in a queue.
    Type: Grant
    Filed: March 6, 2019
    Date of Patent: December 22, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Jiangang Wu, Sampath K. Ratnam, Yang Zhang, Guang Chang Ye, Kishore Kumar Muchherla, Hong Lu, Karl D. Schuh, Vamsi Pavan Rayaprolu
  • Patent number: 10872009
    Abstract: A number of operations that have been performed on one or more memory cells that are proximate to a particular memory cell of the memory component can be identified. A determination as to whether the particular memory cell has transitioned from a state associated with a decreased error rate to another state associated with an increased error rate can be made based on the identified number of operations. In response to determining that the particular memory cell has transitioned from the state associated with the decreased error rate to the another state associated with the increased error rate, an operation can be performed on the particular memory cell to transition the particular memory cell from the another state associated with the increased error rate to the state associated with the decreased error rate.
    Type: Grant
    Filed: July 25, 2018
    Date of Patent: December 22, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Sivagnanam Parthasarathy, Qisong Lin, Shane Nowell, Mustafa N. Kaynak
  • Publication number: 20200387324
    Abstract: A processing device in a memory system determines sensitivity value of a memory page in the memory system. The processing device assigns the memory page to a sensitivity tier of a plurality of sensitivity tiers based on a corresponding sensitivity value, wherein each sensitivity tier has a corresponding range of sensitivity values. The processing device further determines a targeted scan interval for each sensitivity tier of the plurality of sensitivity tiers and scans a subset of a plurality of memory pages in the memory component, wherein the subset comprises a number of memory pages from each sensitivity tier determined according to the corresponding targeted scan interval of each sensitivity tier.
    Type: Application
    Filed: June 5, 2019
    Publication date: December 10, 2020
    Inventors: Kishore Kumar Muchherla, Gary F. Besinga, Cory M. Steinmetz, Pushpa Seetamraju, Jiangang Wu, Sampath K. Ratnam, Peter Feeley
  • Publication number: 20200371690
    Abstract: A system includes a memory component and a processing device to determine an amount of data stored at a region of a memory component and determine, based on the amount of data stored in the region of the memory component. The processing device determines a frequency to perform an operation on one or more memory cells of the region of the memory component. The processing device performs the operation on the one or more memory cells at the frequency to maintain the one or more memory cells of the region of the memory component in a first state associated with a first error rate for data stored at the one or more memory cells. The first error rate is less than a second error rate associated with a second state of the one or more memory cells.
    Type: Application
    Filed: August 13, 2020
    Publication date: November 26, 2020
    Inventors: Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Harish R. Singidi, Ashutosh Malshe, Kishore Kumar Muchherla
  • Patent number: 10846165
    Abstract: Performing a first set of scans on a memory device in a memory system with a first time interval between each scan of the first set of scans to detect errors on the memory device, determining, from performing the first set of scans, that a rate of errors being detected on the memory device is changing, and performing a second set of scans with a second time interval between each scan of the second set of scans to detect errors on the memory device, in response to determining that the rate of errors being detected on the memory device is changing, wherein the second time interval is different than the first time interval.
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: November 24, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Kevin R. Brandt, William C. Filipiak, Michael G. McNeeley, Kishore K. Muchherla, Sampath K. Ratnam, Akira Goda, Todd A. Marquart
  • Publication number: 20200348881
    Abstract: A processing device, operatively coupled with a memory device, is configured to identify a temperature related to a memory device of a plurality of memory devices; to determine, whether the temperature satisfies a threshold temperature condition; responsive to detecting that the temperature related to the memory device satisfies the threshold temperature condition, to identify an entry associated with the memory device from a plurality of entries in a data structure, wherein each entry of the plurality of entries corresponds to one of the plurality of memory devices; to determine a parameter value associated with the memory device from the entry, wherein the parameter value is for a programming operation to store data at the memory device; to adjust the parameter value associated with the memory device to generate an adjusted parameter value; and to store the adjusted parameter value in the entry of the data structure.
    Type: Application
    Filed: July 15, 2020
    Publication date: November 5, 2020
    Inventors: Mustafa N Kaynak, Sampath K. Ratnam, Zixiang Loh, Nagendra Prasad Ganesh Rao, Larry K. Koudele, Vamsi Pavan Rayaprolu, Patrick R. Khayat, Shane Nowell
  • Publication number: 20200293203
    Abstract: A memory block of a non-volatile memory device is identified. The memory block has a first region and a second region, where a storage density of the first region is larger than the second region. Data is programmed at the first region of the memory block. An attribute of the memory block based on a sensor is received during programming of the data at the memory block. The attribute characterizes the data being programmed at the first region. The attribute is stored at a volatile during programming of the data at the memory block. The attribute is stored on a memory page of the second region responsive to the programming of the data at the first region being complete.
    Type: Application
    Filed: June 1, 2020
    Publication date: September 17, 2020
    Inventors: Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Kishore Kumar Muchherla, Harish R. Singidi, Ashutosh Malshe, Gianni S. Alsasua
  • Publication number: 20200285416
    Abstract: A program operation is executed on a memory sub-system. During execution of the program operation, a request to execute a read operation on the memory sub-system is received. In response to receiving the request, a program suspend operation to suspend the program operation is executed. The read operation is executed on the memory sub-system in response to a completion of the program suspend operation. In response to completion of the read operation, a program resume operation is executed. A program suspend delay period is established following execution of the program resume operation during which a subsequent read operation is stored in a queue.
    Type: Application
    Filed: March 6, 2019
    Publication date: September 10, 2020
    Inventors: Jiangang Wu, Sampath K. Ratnam, Yang Zhang, Guang Chang Ye, Kishore Kumar Muchherla, Hong Lu, Karl D. Schuh, Vamsi Pavan Rayaprolu