Abstract: Memory devices and methods for operating the same are provided. A memory device can include at least one command contact and at least one data contact. The memory device can be configured to detect a condition in which the at least one command contact is connected to a controller and the at least one data contact is disconnected from the controller, and to enter, based at least in part on detecting the condition, a first operating mode with a lower nominal power rating than a second operating mode. Memory modules including one or more such memory devices can be provided, and memory systems including controllers and such memory modules can also be provided.

Abstract: Methods, systems, and devices for performing safety event detection for a memory device are described. For example, a memory array of a memory device may operate in a first mode of operation (e.g., a normal mode of operation). An event associated with a reduction of data integrity for the memory array may be detected. In some cases, the event may be associated with a temperature of the memory device, a voltage level detected at the memory device, an error event at the memory device, or the like. Based on the detected event, it may be determined whether to adjust the operation of the memory device to a second mode of operation (e.g., a safe mode of operation). The second mode of operation may correspond to a mode of operation that increases data retention characteristics.

Abstract: Methods, systems, and devices for extended error detection for a memory device are described. For example, during a read operation, the memory device may perform an error detection operation capable of detecting single-bit errors, double-bit errors, and errors that impact more than two bits and indicate the detected error to a host device. The memory device may use parity information to perform an error detection procedure to detect and/or correct errors within data retrieved during the read operation. In some cases, the memory device may associate each bit of the data read during the read operation with two or more bits of parity information. For example, the memory device may use two or more sets of parity bits to detect errors within a matrix of the data. Each set of parity bits may correspond to a dimension of the matrix of data.

Abstract: Memory devices and methods for operating the same are provided. A memory device can include at least one command contact and at least one data contact. The memory device can be configured to detect a condition in which the at least one command contact is connected to a controller and the at least one data contact is disconnected from the controller, and to enter, based at least in part on detecting the condition, a first operating mode with a lower nominal power rating than a second operating mode. Memory modules including one or more such memory devices can be provided, and memory systems including controllers and such memory modules can also be provided.

Abstract: Methods, systems, and apparatus to selectively implement single-error correcting (SEC) operations or single-error correcting and double-error detecting (SECDED) operations, without noticeably impacting die size, for information received from a host device. For example, a host device may indicate that a memory system is to implement SECDED operations using one or more communications (e.g., messages). In another example, the memory system may be hardwired to perform SECDED for certain options. The memory system may adapt circuitry associated with SEC operations to implement SECDED operations without noticeably impacting die size. To implement SECDED operations using SEC circuitry, the memory system may include some additional circuitry to repurpose the SEC circuitry for SECDED operations.

Abstract: Methods, systems, and devices for refresh rate control for a memory device are described. For example, a memory array of a memory device may be refreshed according to a first set of refresh parameters, such as a refresh rate. The memory device may detect an event at the memory device associated with a reduction in data integrity. In some cases, the event may be associated with a temperature of the memory device, a voltage level detected at the memory device, an error event at the memory device, or the like. As a result of detecting the event, the memory device may adapt one or more of the set of refresh parameters, such as increasing the refresh rate for the memory array. In some cases, the memory device may adapt the set of refresh parameters by increasing a quantity of rows of the memory array that are refreshed during a refresh operation, decreasing a periodicity between refresh operations, or both.

Abstract: Methods, systems, and devices for refresh rate management for a memory device are described. A memory device may receive refresh commands for a memory array (e.g., from a host device). The memory device may determine that a refresh rate associated with the refresh commands is below a threshold, and the threshold may be based on a condition of the memory array. The memory device may transmit signaling (e.g., to a host device) indicating that the refresh rate associated with the refresh commands is below the threshold. Additionally or alternatively, the memory device may switch from a first mode of operation to a second mode of operation based on determining that the refresh rate associated with the refresh commands is below the threshold. The second mode of operation may restrict access to at least a portion of the memory array. Additionally or alternatively, the second mode of operation may include a self-refresh mode.

Abstract: Memory devices and methods for operating the same are provided. A memory device can include at least one command contact and at least one data contact. The memory device can be configured to detect a condition in which the at least one command contact is connected to a controller and the at least one data contact is disconnected from the controller, and to enter, based at least in part on detecting the condition, a first operating mode with a lower nominal power rating than a second operating mode. Memory modules including one or more such memory devices can be provided, and memory systems including controllers and such memory modules can also be provided.

Abstract: Memory devices and methods for operating the same are provided. A memory device can include at least one command contact and at least one data contact. The memory device can be configured to detect a condition in which the at least one command contact is connected to a controller and the at least one data contact is disconnected from the controller, and to enter, based at least in part on detecting the condition, a first operating mode with a lower nominal power rating than a second operating mode. Memory modules including one or more such memory devices can be provided, and memory systems including controllers and such memory modules can also be provided.

Abstract: Methods, systems, and devices for error correction management are described. A system may include a memory device that supports internal detection and correction of corrupted data, and whether such detection and correction functionality is operating properly may be evaluated. A known error may be included (e.g., intentionally introduced) into either data stored at the memory device or an associated error correction codeword, among other options, and data or other indications subsequently generated by the memory device may be evaluated for correctness in view of the error. Thus, either the memory device or a host device coupled with the memory device, among other devices, may determine whether error detection and correction functionality internal to the memory device is operating properly.

Abstract: Methods, systems, and devices for performing memory command verification are described. A system may include a memory device and a memory controller, which may be external (e.g., a host device). The memory device may receive, from the memory controller, a command indicating a type of operation and an address. The memory device may decode the command and execute an operation (e.g., the operation corresponding to the decoded command) at an execution location on the memory device. The system (e.g., the memory device or the memory controller) may determine whether the executed operation and execution location match the type of operation and address indicated in the command, and the system may thereby determine an error associated with the decoding, the execution, or both of the command.

Abstract: Methods, systems, and devices for flexible bus management are described. A memory device may transfer data between the memory device and another device (e.g., host device) using a bus including a plurality of data pins. The memory device may transfer data according to a first bus configuration (e.g., according to a first width corresponding to using all of the data pins). After receiving an indication to adjust the configuration, the memory device may adjust the first bus configuration to a second bus configuration where the bus operates according to a second width (e.g., using a subset of the data pins). The memory device may adjust the bus width between the other device and the memory device without adjusting an internal bus width of the memory device (e.g., internal busses that transfer data from the data pins to various components within the memory device).

Abstract: Methods, systems, and devices for command block management are described. A memory device may receive a command (e.g., from a host device). The memory device may determine whether the command is defined by determining if the command is included within a set of defined commands. In the case that a received command is absent from the set of defined commands (e.g., the command is undefined), the memory device may block the command from being decoded for execution by the memory device. In some cases, the memory device may switch from a first operation mode to a second operation mode based on receiving an undefined command. The second operation mode may restrict an operation of the memory device, while the first mode may be less restrictive, in some cases. Additionally or alternatively, the memory device may indicate the undefined command to another device (e.g., the host device).

Abstract: Methods, systems, and devices are described herein for using codewords to detect or correct errors in data (e.g., data stored in a memory device). A host device may generate one or more codewords associated with data to be stored in the memory device. In some cases, the host device may generate one or more codewords for error detection and correction (e.g., corresponding to data transmitted by the host device to the memory device). In some cases, the host device may transmit the codewords and the associated data using an extended (e.g., adjustable) burst length such that the one or more codewords may be included in the burst along with the data. Additionally or alternatively, the host device may transmit one or more of the codewords over one or more channels different than the one or more channels used to transmit the data.

Abstract: Methods, systems, and devices for row hammer protection for a memory device are described. A memory device may identify a threshold of related row accesses (e.g., access commands or activates to a same row address or a row address space) for a memory array. In a first operation mode, the memory device may execute commands received from a host device on the memory array. The memory device may determine that a metric of the received row access commands satisfies the threshold of related row accesses. The memory device may switch the memory array from the first operation mode to a second operation mode based on satisfying the threshold. The second operation mode may restrict access to at least one row of the memory, while the first mode may be less restrictive. Additionally or alternatively, the memory device may notify the host device that the metric has satisfied the threshold.

Abstract: Memory devices and methods for operating the same are provided. A memory device can include at least one command contact and at least one data contact. The memory device can be configured to detect a condition in which the at least one command contact is connected to a controller and the at least one data contact is disconnected from the controller, and to enter, based at least in part on detecting the condition, a first operating mode with a lower nominal power rating than a second operating mode. Memory modules including one or more such memory devices can be provided, and memory systems including controllers and such memory modules can also be provided.

Abstract: A memory device includes 4 memory banks each of which includes first and second arrays of memory cells. A mode register is programmed with a bit that selects a high-power, large-page operating mode or a low-power, small-page operating mode. In the high-power mode, a row decoder is coupled to the row lines in both the first and second arrays. In the low-power mode, the row decoder is coupled to the row lines in only one of the arrays as determined by the state of an array select signal. The array select signal corresponds to the most significant bit of the column address, but it is applied to the memory device at the time the row address is applied to the memory device. Sense amplifiers coupled to the first and second arrays may also be selectively enabled when the row lines for the corresponding array are coupled to the row decoder.

Abstract: A memory device includes 4 memory banks each of which includes first and second arrays of memory cells. A mode register is programmed with a bit that selects a high-power, large-page operating mode or a low-power, small-page operating mode. In the high-power mode, a row decoder is coupled to the row lines in both the first and second arrays. In the low-power mode, the row decoder is coupled to the row lines in only one of the arrays as determined by the state of an array select signal. The array select signal corresponds to the most significant bit of the column address, but it is applied to the memory device at the time the row address is applied to the memory device. Sense amplifiers coupled to the first and second arrays may also be selectively enabled when the row lines for the corresponding array are coupled to the row decoder.

Abstract: A memory device includes 4 memory banks each of which includes first and second arrays of memory cells. A mode register is programmed with a bit that selects a high-power, large-page operating mode or a low-power, small-page operating mode. In the high-power mode, a row decoder is coupled to the row lines in both the first and second arrays. In the low-power mode, the row decoder is coupled to the row lines in only one of the arrays as determined by the state of an array select signal. The array select signal corresponds to the most significant bit of the column address, but it is applied to the memory device at the time the row address is applied to the memory device. Sense amplifiers coupled to the first and second arrays may also be selectively enabled when the row lines for the corresponding array are coupled to the row decoder.

Abstract: A memory device includes 4 memory banks each of which includes first and second arrays of memory cells. A mode register is programmed with a bit that selects a high-power, large-page operating mode or a low-power, small-page operating mode. In the high-power mode, a row decoder is coupled to the row lines in both the first and second arrays. In the low-power mode, the row decoder is coupled to the row lines in only one of the arrays as determined by the state of an array select signal. The array select signal corresponds to the most significant bit of the column address, but it is applied to the memory device at the time the row address is applied to the memory device. Sense amplifiers coupled to the first and second arrays may also be selectively enabled when the row lines for the corresponding array are coupled to the row decoder.