Abstract: A first transistor and a second transistor are stacked. The first transistor and the second transistor have a gate electrode in common. At least one of semiconductor films used in the first transistor and the second transistor is an oxide semiconductor film. With the use of the oxide semiconductor film as the semiconductor film in the transistor, high field-effect mobility and high-speed operation can be achieved. Since the first transistor and the second transistor are stacked and have the gate electrode in common, the area of a region where the transistors are disposed can be reduced.

Abstract: Provided is a semiconductor device with a novel structure in which the power consumption can be reduced. The semiconductor device includes a sensor, a sample-and-hold circuit to which a sensor signal of the sensor is input, an analog-digital converter circuit to which an output signal of the sample-and-hold circuit is input, a control circuit, a battery, and an antenna.

Abstract: An inspection device having a plurality of functions is achieved. The performance of an inspection device is improved. A structure of an inspection device is simplified. A structure of an imaging device is simplified. The inspection device includes a light source having a function of emitting infrared light, a light source having a function of emitting visible light, and an imaging portion which are provided over a substrate having flexibility, and inspects a fruit or vegetable. A first image based on light including reflected light of the infrared light, and a second image and a third image based on tight including reflected light of the visible light are captured by the imaging portion. The inspection device has a function of detecting one or more of the sugar content, the acidity, and a physiological disorder of a fruit or vegetable on the basis of the first image.

Abstract: A novel semiconductor device is provided. Alternatively a memory device which can retain more multi-level data is provided. One of a source or a drain of a write transistor is electrically connected to a bit line, and the other of the source or the drain of the write transistor is electrically connected to a data retaining portion. Data written to the data retaining portion is provided to the data retaining portion through a write bit line and the write transistor. Rising of a threshold voltage which is caused in a write operation can be inhibited and more multi-level data can be retained(stored) through electrically connecting a back gate of the write transistor to the write bit line.

Abstract: A novel authentication system is provided. In addition, a method for recording an unlocking history is provided. The authentication system includes an arithmetic device and an input/output device. The arithmetic device supplies first control data and second control data, and is supplied with a sensor signal. The input/output device includes an electric lock and a reading portion, and the electric lock is unlocked on the basis of the second control data. The reading portion is supplied with the first control data, supplies the sensor signal, and includes a light-emitting element and a pixel array. The light-emitting element emits light including infrared rays, the pixel array includes pixels, the pixels each include an imaging circuit and a photoelectric conversion element, the imaging circuit is electrically connected to the photoelectric conversion element, the imaging circuit includes a transistor, and the transistor includes an oxide semiconductor film.

Abstract: A semiconductor device that conducts error detection and correction on multilevel data is provided. The semiconductor device includes a first gray code converter circuit, a second gray code converter circuit, a gray code inverter circuit, an ECC encoder circuit, an ECC decoder circuit, and a memory portion. When input data is retained in the semiconductor device, the first gray code converter circuit converts the input data to data in a gray code format, and the ECC encoder circuit generates inspection data in accordance with the data. The memory portion retains the input data and the inspection data. When the input data that has been retained is output from the semiconductor device, the second gray code converter circuit converts the input data read out from the memory portion into data in a gray code format, and the ECC decoder circuit conducts error detection and correction on the data and the inspection data read out from the memory portion.

Abstract: An imaging device that can obtain imaging data corresponding to high-resolution images in a short period of time is provided. The imaging device includes a pixel including a photoelectric conversion element and n (n is an integer more than 2 inclusive) retention circuits. The photoelectric conversion element and the n retention circuits are stacked. One electrode of the photoelectric conversion element is electrically connected to the first to n-th retention circuits. The retention circuits include OS transistors with an extremely low off-state current feature, and can retain imaging data for a long time. In the first to n-th periods, the imaging device obtains the first to n-th imaging data and retains it in the first to n-th retention circuits. Then, the first to n-th imaging data retained in the first to n-th retention circuits are read out. The read imaging data is output outside the imaging data through AD conversion.

Abstract: A semiconductor device capable of stable operation with low power consumption is provided. A logic circuit having a circuit configuration using a transistor including an oxide semiconductor in a channel formation region is included. The logic circuit is a two-input/two-output two-wire logic circuit. Transistors included in the logic circuit each include a gate and a back gate. An input terminal is electrically connected to one of a gate and a back gate of a transistor electrically connected to a wiring for supplying a high power supply potential. An output terminal is connected to the other of the gate and the back gate of the transistor electrically connected to the wiring for supplying a high power supply potential. An output terminal is electrically connected to one of a source and a drain of a transistor electrically connected to a wiring for supplying a low power supply potential.

Abstract: An imaging device includes a first semiconductor substrate and a second semiconductor substrate. The first semiconductor substrate includes a photoelectric conversion device and a first transistor. The second semiconductor substrate includes a second transistor, a third transistor, and a fourth transistor. One electrode of the photoelectric conversion device is electrically connected to one of a source and a drain of the first transistor. The other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor and a gate of the third transistor. One of a source and a drain of the third transistor is electrically connected to one of a source and a drain of the fourth transistor. The photoelectric conversion device and at least parts of the second transistor, the third transistor, and the fourth transistor overlap with each other.

Abstract: Image processing in accordance with the shape of a display device is performed at high speed with low power consumption, without the use of a large frame memory or a high-throughput GPU. Used is a data conversion circuit including: a latch circuit that takes in data from input data in synchronization with a writing clock signal and stores the data as writing data; a memory circuit that stores the writing data and outputs the writing data to an external circuit as readout data in synchronization with a readout clock signal; and a clock selection control circuit. The writing clock signal is one of a plurality of clock signals with different frequencies and is output in accordance with control by the clock selection control circuit.

Abstract: A semiconductor device in which an increase of circuit area is prevented is provided. A semiconductor device including a control circuit with a plurality of scan chain circuits, a DA converter electrically connected to the control circuit, and a plurality of potential holding units electrically connected to the DA converter is provided. The plurality of potential holding units each include a transistor including an oxide semiconductor in a channel formation region and a capacitor electrically connected to the transistor. In accordance with digital data held in any one of the plurality of scan chain circuits, an output potential output from the DA converter is held in any one of the plurality of potential holding units.

Abstract: A first transistor and a second transistor are stacked. The first transistor and the second transistor have a gate electrode in common. At least one of semiconductor films used in the first transistor and the second transistor is an oxide semiconductor film. With the use of the oxide semiconductor film as the semiconductor film in the transistor, high field-effect mobility and high-speed operation can be achieved. Since the first transistor and the second transistor are stacked and have the gate electrode in common, the area of a region where the transistors are disposed can be reduced.

Abstract: A semiconductor device having a novel structure is provided. The semiconductor device includes a plurality of operation circuits that can switch different kinds of operation processing; a plurality of switch circuits that can switch a connection state between the operation circuits; and a controller. The operation circuit includes a first memory that stores data corresponding to a weight parameter used in the plurality of kinds of operation processing. The operation circuit executes a product-sum operation by switching weight data in accordance with a context. The switch circuit includes a second memory that stores data for switching a plurality of connection states in response to switching of a second context signal. The controller generates a second context signal on the basis of a first context signal. The amount of data stored in the second memory can be smaller than the amount of data stored in the first memory in the operation circuit.

Abstract: A first transistor and a second transistor are stacked. The first transistor and the second transistor have a gate electrode in common. At least one of semiconductor films used in the first transistor and the second transistor is an oxide semiconductor film. With the use of the oxide semiconductor film as the semiconductor film in the transistor, high field-effect mobility and high-speed operation can be achieved. Since the first transistor and the second transistor are stacked and have the gate electrode in common, the area of a region where the transistors are disposed can be reduced.

Abstract: A semiconductor device that conducts error detection and correction on multilevel data is provided. The semiconductor device includes a first gray code converter circuit, a second gray code converter circuit, a gray code inverter circuit, an ECC encoder circuit, an ECC decoder circuit, and a memory portion. When input data is retained in the semiconductor device, the first gray code converter circuit converts the input data to data in a gray code format, and the ECC encoder circuit generates inspection data in accordance with the data. The memory portion retains the input data and the inspection data. When the input data that has been retained is output from the semiconductor device, the second gray code converter circuit converts the input data read out from the memory portion into data in a gray code format, and the ECC decoder circuit conducts error detection and correction on the data and the inspection data read out from the memory portion.

Abstract: A semiconductor device in which an increase of circuit area is prevented is provided. A semiconductor device including a control circuit with a plurality of scan chain circuits, a DA converter electrically connected to the control circuit, and a plurality of potential holding units electrically connected to the DA converter is provided. The plurality of potential holding units each include a transistor including an oxide semiconductor in a channel formation region and a capacitor electrically connected to the transistor. In accordance with digital data held in any one of the plurality of scan chain circuits, an output potential output from the DA converter is held in any one of the plurality of potential holding units.

Abstract: A novel semiconductor device is provided. Alternatively a memory device which can retain more multi-level data is provided. One of a source or a drain of a write transistor is electrically connected to a bit line, and the other of the source or the drain of the write transistor is electrically connected to a data retaining portion. Data written to the data retaining portion is provided to the data retaining portion through a write bit line and the write transistor. Rising of a threshold voltage which is caused in a write operation can be inhibited and more multi-level data can be retained(stored) through electrically connecting a back gate of the write transistor to the write bit line.

Abstract: To provide a novel device, a device with low power consumption, or a versatile device, the device includes a decoder, a driver circuit, and a display portion. The driver circuit includes a plurality of circuits. The display portion includes a plurality of display panels. The decoder has a function of generating a signal corresponding to an image displayed on the display portion. The decoder has a function of determining the necessity of rewriting an image of each of the display panels by detecting a change in the image of each of the display panels. The circuit has a function of outputting a signal to a display panel for which that image rewriting is determined to be necessary. The circuit has a function of stopping output of a signal to a display panel for which image rewriting is determined to be unnecessary.

Abstract: A semiconductor device that is less likely to be affected by a soft error is provided. The semiconductor device includes a first memory, a second memory, a processor that can be connected to the first memory and the second memory, and a selector for selectively connecting one of the first memory and the second memory to the processor. The probability of occurrence of a soft error of the first memory is higher than that of the second memory. When an error derived from a soft error is detected in the first memory, the selector connects the second memory to the processor. The semiconductor device can stably operate even when moved from an environment where a soft error is less likely to occur to an environment where a soft error is likely to occur.

Abstract: Image processing in accordance with the shape of a display device is performed at high speed with low power consumption, without the use of a large frame memory or a high-throughput GPU. Used is a data conversion circuit including: a latch circuit that takes in data from input data in synchronization with a writing clock signal and stores the data as writing data; a memory circuit that stores the writing data and outputs the writing data to an external circuit as readout data in synchronization with a readout clock signal; and a clock selection control circuit. The writing clock signal is one of a plurality of clock signals with different frequencies and is output in accordance with control by the clock selection control circuit.