Abstract: A security key is configured to be replaced when a device is replaced in a machine-to-machine (M2M) system. A method for operating a first device may include: receiving a first message including first information associated with security key replacement from a second device or a third device; receiving a third message including second information associated with security key replacement, which is generated based on a second message including a security key replacement indication, from the second device or the third device; and replacing the security key.

Abstract: A semiconductor device includes a first impurity region, a channel pattern, a second impurity region, a gate structure, a first contact pattern, a second contact pattern and a spacer. The first impurity region may be formed on a substrate. The channel pattern may protrude from an upper surface of the substrate. The second impurity region may be formed on the channel pattern. The gate structure may be formed on a sidewall of the channel pattern and the substrate adjacent to the channel pattern, and the gate structure may include a gate insulation pattern and a gate electrode. The first contact pattern may contact an upper surface of the second impurity region. The second contact pattern may contact a surface of the gate electrode. The spacer may be formed between the first and second contact patterns. The spacer may surround a portion of a sidewall of the second contact pattern, and the spacer may contact a sidewall of each of the first and second contact patterns.

Abstract: A method and apparatus for providing an edge transfer according to the movement of a device are provided. The method includes receiving a handover decision and handover information from a network, when a device performs the handover and a network function virtualization instance of the source edge is transferred to the target edge. The method then transfers an M2M service instance of the source edge to an M2M edge node.

Abstract: A semiconductor device includes a substrate that includes a peripheral region, a first active pattern on the peripheral region, a first source/drain pattern on the first active pattern, a first channel pattern formed on the first active pattern and connected to the first source/drain pattern, wherein the first channel pattern includes semiconductor patterns that are stacked and spaced apart from each other, a first gate electrode that extends in a first direction and crosses the first channel pattern, a gate insulating layer interposed between the first gate electrode and the first channel pattern, a first gate contact disposed on the first gate electrode and that extends in the first direction, and a first dielectric layer interposed between the first gate electrode and the first gate contact. The first dielectric layer is interposed between the first gate contact and the first gate electrode and extends in the first direction.

Abstract: A semiconductor device includes a first active pattern on a substrate; a first gate electrode crossing the first active pattern; source/drain patterns in an upper portion of the first active pattern and at opposite sides, respectively, of the first gate electrode; a first gate capping pattern on the first gate electrode; an interlayer insulating layer on the source/drain patterns; first and second active contacts penetrating the interlayer insulating layer and being respectively connected to the pair of source/drain patterns; and a first interconnection layer on the first and second active contacts. The first interconnection layer may include a first insulating structure covering a top surface of the second active contact; and a first interconnection line covering a top surface of the first active contact and extending on the first insulating structure, and covering a top surface of the first gate capping pattern between the first and second active contacts.

Abstract: A semiconductor device may include a substrate including a first region and a second region and a first active pattern on the first region. The first active pattern may include a pair of first source/drain patterns and a first channel pattern therebetween, and the first channel pattern may include a plurality of first semiconductor patterns stacked on the substrate. The semiconductor device may further include a first gate electrode, which is provided on the first channel patterns, and a supporting pattern, which is provided on side surfaces of the plurality of first semiconductor patterns to connect the side surfaces of the plurality of first semiconductor patterns to each other.

Abstract: A method for operating a machine-to-machine (M2M) device in an M2M system includes generating a request message including information associated to deletion of a resource, the deletion being performed in response to an operation, and transmitting the request message to a counterpart M2M device. The information includes at least one of information notifying that the resource is deleted in response to the operation, information indicating the resource, information indicating at least one operation that is a condition of the deletion, information indicating content of the condition, or information for identifying an entity that performs an operation causing the deletion.

Abstract: A method and apparatus of managing information are configured to replace parts of an Internet of Things (IoT) device in a machine-to-machine (M2M) system. A method for operating a first device may include receiving a first message for requesting registration of at least one resource related to a second device including a plurality of parts, generating at least one resource comprising information on the plurality of parts, and transmitting, to the second device, a second message for recommending replacement of a part corresponding to a condition for replacing at least one of the plurality of parts when the condition is satisfied.

Abstract: Disclosed herein are an object recognition apparatus of an automated driving system using error removal based on object classification and a method using the same. The object recognition method is configured to train a multi-object classification model based on deep learning using training data including a data set corresponding to a noise class, into which a false-positive object is classified, among classes classified by the types of objects, to acquire a point cloud and image data respectively using a LiDAR sensor and a camera provided in an autonomous vehicle, to extract a crop image, corresponding to at least one object recognized based on the point cloud, from the image data and input the same to the multi-object classification model, and to remove a false-positive object classified into the noise class, among the at least one object, by the multi-object classification model.

Abstract: The present disclosure relates to detecting an abnormal behaviour in a machine-to-machine (M2M) system. A method for operating a first device may include receiving, from a second device, a request message related to a detection of an abnormal behaviour in a target device and, when the abnormal behaviour is detected, transmitting a notification of the occurrence of the abnormal behaviour to the second device. The abnormal behaviour may be detected based on information that is expected to be received or is received by the first device from the target device.

Abstract: Disclosed herein are a method and procedure for processing protection data for protecting data privacy in an M2M system. According to an embodiment of the present disclosure, an M2M apparatus located in an M2M platform in an M2M system includes a communicator configured to transmit and receive a signal and a processor configured to control the communicator. Herein, the processor generates a resource at a resource generation request for administering data received by the communicator, generates a resource at a resource generation request for storing the data received by the communicator, determines whether the data received by the communicator are protection data, and when the data are determined as protection data, performs data processing for privacy protection.

Abstract: A hairdryer is described. The hairdryer includes an air intake aperture which has a variable airflow cross section. The hairdryer also includes an air expulsion aperture with a fan positioned between the air intake aperture and the air expulsion aperture. The air intake aperture is adapted to regulate amount of air flowing out of the air expulsion aperture.

Abstract: The present invention relates to a method of performing group management in a machine-to-machine (M2M) system. Herein, the group management method may include controlling a group member included in a group based on a group resource.

Abstract: Disclosed herein are an apparatus and method for providing a customized traffic guidance service. The method may include acquiring data about one or more nearby objects, detecting surrounding traffic conditions based on the data about the nearby objects, determining whether to provide a customized traffic guidance service, selecting one or more target objects to which the customized traffic guidance service is to be provided and guidance information to be provided to each of the target objects, generating a customized traffic guidance message for the selected guidance information, and transmitting the customized traffic guidance message to the corresponding target object.

Abstract: A method for performing resource offloading in an M2M system is provided. The method is performed based on an offloaded resource and offloaded attributes. The method includes generating an offloading request message that requests offloading of a source resource. In response to the offloading request message, the method includes offloading the source resource for which the offloading is requested. An offloaded resource is generated using the offloaded source resource. Herein, the offloaded resource includes synchronization modes designating synchronization methods with the offloaded source resource as offloaded attributes.

Abstract: A method for performing resource offloading in an M2M system is provided. The method is performed based on an offloaded resource and offloaded attributes. The method includes generating an offloading request message that requests offloading of a source resource. In response to the offloading request message, offloading the source resource for which the offloading is requested. An offloaded resource is then generated using the offloaded source resource. Herein, the offloaded resource includes synchronization modes designating synchronization methods with the offloaded source resource as offloaded attributes.

Abstract: A liveness check in a machine-to-machine (M2M) system is provided. A method for operating an M2M device includes generating a resource including information on a liveness check for a local device and confirming whether a probe signal for the liveness check is received from the local device. The liveness status of the local device is determined based on whether the probe signal is received.

Abstract: The present invention relates to a method of performing group management in a machine-to-machine (M2M) system. Herein, the group management method may include controlling a group member included in a group based on a group resource.

Abstract: A semiconductor device includes a first active pattern on a substrate; a first gate electrode crossing the first active pattern; source/drain patterns in an upper portion of the first active pattern and at opposite sides, respectively, of the first gate electrode; a first gate capping pattern on the first gate electrode; an interlayer insulating layer on the source/drain patterns; first and second active contacts penetrating the interlayer insulating layer and being respectively connected to the pair of source/drain patterns; and a first interconnection layer on the first and second active contacts. The first interconnection layer may include a first insulating structure covering a top surface of the second active contact; and a first interconnection line covering a top surface of the first active contact and extending on the first insulating structure, and covering a top surface of the first gate capping pattern between the first and second active contacts.