Abstract: A hydrogen leakage monitoring system is disposed on a vehicle body of a vehicle. The hydrogen leakage monitoring system includes a speed sensor, an inclination sensor, a hydrogen concentration sensor and a processor. The speed sensor is configured to sense a vehicle speed. The inclination sensor is configured to sense an inclination angle of the vehicle body. The hydrogen concentration sensor is configured to sense an actual hydrogen leakage value of a hydrogen device. The processor is configured to obtain the inclination degree value according to the vehicle speed and the inclination angle, obtain a hydrogen leakage threshold according to the inclination degree value, and initiate a corresponding process based on the actual hydrogen leakage value being greater than the hydrogen leakage threshold.

Abstract: Polymers polymerized from an alpha-olefin monomer and a carbon monoxide monomer. The polymers include a carbon-based backbone formed from carbons of the alpha-olefin monomer and the carbon of the carbon monoxide monomer. The polymer includes in-backbone ketones formed from the carbon monoxide monomer. The in-backbone ketones may include isolated ketones, alpha-branched ketones, or both. Methods of forming the polymer and compositions containing the polymer.

Abstract: The present disclosure provides a method for preventing and/or repairing ocular cell damage by using a Streptococcus thermophilus iHA318 strain and its metabolites.

Abstract: A voltage provision circuit includes a first NMOS transistor gated with a first control signal and sourced with a ground voltage, a second NMOS transistor gated with a second control signal complementary to the first control signal and sourced with the ground voltage, a first PMOS transistor sourced with a first supply voltage, a second PMOS transistor sourced with the first supply voltage, and a voltage modulation circuit that is coupled between the first to second PMOS transistors and the first to second NMOS transistors, and is configured to provide a first intermediate signal based on the first and second control signals. The first intermediate signal has a first logic state corresponding to the first supply voltage and a second logic state corresponding to a second supply voltage that is a fraction of the first supply voltage.

Abstract: The present disclosure provides a memory device, a semiconductor device, and a method of operating a memory device. A memory device includes a memory cell, a bit line, a word line, a select transistor, a fuse element, and a heater. The bit line is connected to the memory cell. The word line is connected to the memory cell. The select transistor is disposed in the memory cell. A gate of the select transistor is connected to the word line. The fuse element is disposed in the memory cell. The fuse element is connected to the bit line and the select transistor. The heater is configured to heat the fuse element.

Abstract: A spindle device includes a shaft housing, a spindle, a bearing liner, a damping adjustment piston and an actuating assembly. The spindle is disposed through the shaft housing. A bearing component surrounds a shaft. The bearing liner is sleeved on the bearing component and has a liner conical surface facing away from the bearing component. The liner conical surface is non-parallel to an axial direction. A damping chamber is formed between the shaft housing and the bearing liner to be filled with a damping fluid. The damping adjustment piston is slidably located within the damping chamber and has a piston conical surface facing the liner conical surface. The piston conical surface is non-parallel to the axial direction. The actuating assembly is to drive the damping adjustment piston to move relative to the bearing liner to adjust a gap formed between the piston conical surface and the liner conical surface.

Abstract: Video messaging systems and methods utilize a video messaging component based on a video messaging component container stored in a data store. The video messaging component container includes a collaborative video list that shows a list of video content generated by users of the video messaging component. Iterations of the video messaging component are rendered in host applications on client devices. As video content is generated by the iterations, the collaborative video list is updated to include the video content, and the iterations of the video messaging component are updated to reflect changes to the collaborative video list in real-time.

Abstract: A multi-fuse memory cell is disclosed. The circuit includes: a first fuse element electrically coupled to a first transistor, a gate of the first transistor is electrically coupled to a first selection signal; a second fuse element electrically coupled to a second transistor, a gate of the second transistor is electrically coupled to a second selection signal, both the first transistor and the second transistor are grounded; and a programming transistor electrically coupled to the first fuse element and the second fuse element, wherein a gate of the programming transistor is electrically coupled to a programming signal.

Abstract: A circuit structure is provided. The circuit structure may include a first die area including an output gate, a second die area including a circuit and an input gate and a die-to-die interconnect. The input gate may include a transistor. The circuit may be connected between the die-to-die interconnect and a gate region of the transistor. The circuit may include a MOS transistor. A first source/drain region of the MOS transistor may be connected to the die-to-die interconnect.

Abstract: A circuit includes a voltage divider circuit configured to generate a feedback voltage according to an output voltage, an operational amplifier configured to output a driving signal according to the feedback voltage and a reference voltage and a pass gate circuit including multiple current paths. The current paths are controlled by the driving signal and connected in parallel between the voltage divider circuit and a power reference node.

Abstract: Methods for reading a memory are provided. In response to a first address signal, a first signal is obtained according to first data of the memory and a second signal is obtained according to second data of the memory by a decoding circuit. Binary representation of the first signal is complementary to that of the second signal. A first sensing signal is provided according to a reference signal and the first signal and a second sensing signal is provided according to the reference signal and the second signal by a sensing circuit. An output corresponding to the first sensing signal or the second sensing signal is output in response to a control signal, by an output buffer.

Abstract: A fusible structure includes: a metal line in a first metal layer extending along a first direction; and a first dummy structure disposed proximal to the metal line relative to a second direction, the second direction being perpendicular to the first direction, the first dummy structure being in a second metal layer. Relative to the first direction, the metal line includes first, second and third portions, the second portion being between the first portion and third portion. Relative to a third direction that is perpendicular to the first direction and the second direction, the first portion has a first thickness and the second portion has a second thickness, the first thickness being greater than the second thickness.

Abstract: A memory circuit includes a non-volatile memory cell, a comparator and a detection circuit. The comparator is coupled to the non-volatile memory cell, and configured to generate a first output signal. The comparator including a first input terminal and a first output terminal. The first input terminal is coupled to the non-volatile memory cell by a first node, and configured to receive a first voltage. The first output terminal is configured to output the first output signal. The detection circuit is coupled to the comparator and the non-volatile memory cell. The detection circuit is configured to latch the first output signal and disrupt a current path between at least the non-volatile memory cell and the comparator. The detection circuit includes a first inverter coupled to the first output terminal of the comparator and configured to generate an inverted first output signal.

Abstract: The present disclosure relates generally to ion implantation, and more particularly, to systems and processes for adjusting a ribbon beam angle of an ion implantation system. An exemplary ion implantation system includes an ion source configured to generate a ribbon beam, a wafer chuck configured to hold a wafer during implantation by the ribbon beam, a dipole magnet disposed between the ion source and the wafer chuck, and a controller. The dipole magnet includes at least two coils configured to adjust a ribbon beam angle of the ribbon beam at one or more locations along a path of the ribbon beam between the ion source and the wafer held in the wafer chuck. The controller is configured to control the ion source, the wafer chuck, and the dipole magnet.

Abstract: An imaging optical lens assembly includes five optical elements with refractive power. The five optical elements, in order from an object side to an image side along an optical path, are a first optical element, a second optical element, a third optical element, a fourth optical element, and a fifth optical element. The first optical element has an object-side surface being concave in a paraxial region thereof. The third optical element has negative refractive power.

Abstract: An IC device includes an active area positioned in a substrate, first and second contact structures overlying and electrically connected to the active area, a conductive element overlying and electrically connected to each of the first and second contact structures, an anti-fuse transistor device including a dielectric layer between a gate structure and the active area, a first selection transistor overlying the active area adjacent to each of the anti-fuse transistor device and the first contact structure, and a second selection transistor overlying the active area adjacent to each of the anti-fuse transistor device and the second contact structure.

Abstract: A multi-fuse memory cell is disclosed. The circuit includes: a first fuse element electrically coupled to a first transistor, a gate of the first transistor is electrically coupled to a first selection signal; a second fuse element electrically coupled to a second transistor, a gate of the second transistor is electrically coupled to a second selection signal, both the first transistor and the second transistor are grounded; and a programming transistor electrically coupled to the first fuse element and the second fuse element, wherein a gate of the programming transistor is electrically coupled to a programming signal.

Abstract: A method (fabricating a fusible structure) includes forming a metal line that extends in a first direction, the forming a metal line including: configuring the mask such that the metal line has a first portion that is between a second portion and a third portion; and using an optical proximity correction technique with a mask so that the first portion has a first thickness that is thinner than a second thickness of each of the second portion and the third portion; and forming a first dummy structure proximal to the metal line and aligned with the first portion relative to the first direction.

Abstract: A communication device for detecting an object includes a power module, an antenna array, a first sensor pad, a second sensor pad, and a control unit. The antenna array is excited by the power module, and is configured to provide a first beam group and a second beam group. The first sensor pad is disposed adjacent to the first side of the antenna array. A first capacitance is formed between the first sensor pad and the object. The second sensor pad is disposed adjacent to the second side of the antenna array. A second capacitance is formed between the second sensor pad and the object. The control unit controls the power module according to the first capacitance and the second capacitance, so as to selectively apply at least one power backoff operation to the first beam group and/or the second beam group.

Abstract: A built-in self-tester (BIST) of a semiconductor device including: an input/output (I/O) circuit including an output buffer and an input buffer, an output of the output buffer being coupled at an I/O terminal to an input of the input buffer, the I/O terminal being configured to receive or provide an external I/O signal; one or more resistive-network cell regions arranged to affect a reference current received at the I/O terminal; and a switching arrangement configured to selectively couple the one or more resistive-network cell regions alternatively to a first reference voltage during a first phase or a second reference voltage during a second phase, the switching arrangement being further configured to determine electrostatic discharge (ESD) damage to metal-oxide-semiconductor (MOS) transistors included in the semiconductor device based on (1) phase and (2) an output signal of the input buffer