Abstract: A data processing apparatus and method are provided that use monitoring circuitry to control operating parameters of the data processing apparatus. The data processing apparatus has functional circuitry for performing data processing, the functional circuitry including error correction circuitry configured to detect errors in operation of the functional circuitry and to repair those errors in operation. Tuneable monitoring circuitry monitors a characteristic indicative of changes in signal propagation delay within the functional circuitry and produces a control signal dependent on the monitored characteristic. In a continuous tuning mode operation, the tuneable monitoring circuitry modifies the dependency between the monitored characteristic and the control signal in dependence upon certain characteristics of the errors detected by the error correction circuitry.

Abstract: An instruction processing pipeline 6 is provided. This has error detection and error recovery circuitry 20 associated with one or more of the pipeline stages. If an error is detected within a signal value within that pipeline stage, then it can be repaired. Part of the error recovery may be to flush upstream program instructions from the instruction pipeline 6. When multi-threading, only those instructions from a thread including an instruction which has been lost as a consequence of the error recovery need to be flushed from the instruction pipeline 6. Instruction can also be selected for flushing in dependence upon characteristics such as privileged level, number of dependent instructions etc.

Abstract: An integrated circuit 2 includes logic circuitry 10 and sequential storage elements 8. Both the logic circuit 10 and sequential storage elements 8 can be subject to particle strikes giving rise to single event upset errors. These single event upset errors can be detected by detecting a transition in the stored value stored by the sequential storage elements 8 occurring outside of a valid transition period associated with that sequential storage element 8.

Abstract: Tuning limits are set for operational parameters in a processing stage within a data processing apparatus for processing a signal and outputting it at an output time. If a signal output between the output time and a predetermined time later does not have a stable value, the predetermined time later being before a next output time, an error is signaled. A tuning circuit adjusts an operational parameter of the processing stage in accordance with a tuning limit. A signal passing along a critical path of the processing stage tuned to the tuning limit is expected to reach the output of the processing stage at a preset time later than the output time, the preset time being less than the predetermined time.

Abstract: A data processing system 2 is used to perform processing operations to generate a result value. The processing circuitry which generates the result value has an error resistant portion 32 and an error prone portion 30. The probability of an error in operation of the error prone portion for a given set of operating parameters (clk, V) is greater than the probability of an error for that same set of operating parameters within the error resistant portion. Error detection circuitry 38 detects any errors arising in the error prone portion. Parameter control circuitry 40 responds to detected errors to adjust the set of operating parameters to maintain a non-zero error rate in the errors detected by the error detection circuitry. Errors within the one or more bits generated by the error prone portion are not corrected as the apparatus is tolerant to errors occurring within such bit values of the result value.

Abstract: An integrated circuit is provided with domino logic including a speculative node and a checker node. Precharged circuitry precharges both the speculative node and the checker node. Logic circuitry provides a discharge path for the speculative node and the checker node in dependence upon input signal values. Evaluation control circuitry first couples the speculative node to the logic circuitry and then subsequently couples the checker node to the logic circuitry such that these can be discharged if the input signals to the logic circuitry have appropriate values. Error detection circuitry detects an error when the speculative node and the checker node are not one of both discharged or both undischarged.

Abstract: An apparatus and method are provided for detecting an approaching error condition within a data processing apparatus. The data processing apparatus includes a second sequential storage structure which is arranged to latch the output signal generated by combinatorial circuitry dependent on a second clock signal. The second sequential storage structure has a main storage element to latch a value of the output signal for provision to subsequent combinatorial circuitry, and transition detection circuitry for detecting a change of the value of the output signal latched by the main storage element during a predetermined timing window, said change indicating an approaching error condition whilst the value stored in the main storage element is still correct. The second sequential storage structure can be operated in either a first mode of operation or a second mode of operation.

Abstract: An integrated circuit includes a plurality of processing stages each including processing logic 1014, a non-delayed signal-capture element 1016, a delayed signal-capture element 1018 and a comparator 1024. The non-delayed signal-capture element 1016 captures an output from the processing logic 1014 at a non-delayed capture time. At a later delayed capture time, the delayed signal-capture element 1018 also captures a value from the processing logic 1014. An error detection circuit 1026 and error correction circuit 1028 detect and correct random errors in the delayed value and supplies an error-checked delayed value to the comparator 1024. The comparator 1024 compares the error-checked delayed value and the non-delayed value and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the error-checked delayed value.

Abstract: An instruction processing pipeline 6 is provided. This has error detection and error recovery circuitry 20 associated with one or more of the pipeline stages. If an error is detected within a signal value within that pipeline stage, then it can be repaired. Part of the error recovery may be to flush upstream program instructions from the instruction pipeline 6. When multi-threading, only those instructions from a thread including an instruction which has been lost as a consequence of the error recovery need to be flushed from the instruction pipeline 6. Instruction can also be selected for flushing in dependence upon characteristics such as privileged level, number of dependent instructions etc.

Abstract: An integrated circuit is provided with domino logic including a speculative node and a checker node. Precharged circuitry precharges both the speculative node and the checker node. Logic circuitry provides a discharge path for the speculative node and the checker node in dependence upon input signal values. Evaluation control circuitry first couples the speculative node to the logic circuitry and then subsequently couples the checker node to the logic circuitry such that these can be discharged if the input signals to the logic circuitry have appropriate values. Error detection circuitry detects an error when the speculative node and the checker node are not one of both discharged or both undischarged.

Abstract: An integrated circuit is provided with domino logic including a speculative node and a checker node. Precharged circuitry precharges both the speculative node and the checker node. Logic circuitry provides a discharge path for the speculative node and the checker node in dependence upon input signal values. Evaluation control circuitry first couples the speculative node to the logic circuitry and then subsequently couples the checker node to the logic circuitry such that these can be discharged if the input signals to the logic circuitry have appropriate values. Error detection circuitry detects an error when the speculative node and the checker node are not one of both discharged or both undischarged.

Abstract: An integrated circuit 2 is provided with a plurality of pipeline stages 10. These pipeline stages 10 have speculative processing control circuitry 12 which permits speculative processing in downstream pipeline stages and triggers a first error recovery operation (partial pipeline flushing) if such speculative processing is determined to be based upon an error. The pipeline stage 10 further includes speculative error detecting circuitry 14 which generates a prediction nc regarding whether or not the processing circuitry 18 will produce an error. This prediction is used to trigger a second error recovery operation (partial pipeline stall). This second error recovery operation has a lower performance penalty than the first error recovery operation.

Abstract: A data processing system comprising a memory array having a plurality of memory cells and read circuitry for reading a logic value stored in one of the plurality of memory cells. The read circuitry is operable perform two substantially simultaneous reads of the stored logic value. A voltage controller is provided and is operable to selectively vary a level of a supply voltage to the memory array. Detection circuitry is provided for detecting, in dependence upon the two substantially simultaneous reads, when the supply voltage level causes the read result to be unreliable.

Abstract: A memory circuit includes a memory cell, a pair of conducting lines operable to signal the logic state of the memory cell and read circuitry operable to perform a read operation by detecting a voltage level of at least one of the pair of conducting lines. The memory circuit includes a pull-down circuit having an on configuration in which it is operable to pull-down a voltage level of at least one of the pair of conducting lines so as to affect the read operation and an off-configuration in which the pull-down circuit cannot affect the read operation. Control circuitry is configured to control whether the pull-down circuit is in the on configuration or the off configuration. The memory circuit can be incorporated in a data processing apparatus and a method of operating a memory circuit is provided in which a pull-down circuit is controlled to be in an on configuration or in an off configuration.

Abstract: Interface circuitry is provided for coupling between a memory device and processing circuitry, the processing circuitry issuing a plurality of access signals relating to accesses to be performed in the memory device. The interface circuitry comprises write address latch circuitry for storing a write address signal, and write address decoder circuitry that is responsive to a set first enable signal to decode the write address signal provided from the write address latch circuitry. Further, read address latch circuitry is provided for storing a read address signal issued by the processing circuitry, and read address decoder circuitry is responsive to a set second enable signal for decoding the read address signal provided from the read address latch circuitry. Decoder select latch circuitry is responsive to an access type indication signal from the processing circuitry to generate the first and second enable signals in dependence on that access type indication signal.

Abstract: The application discloses a means of setting tuning limits for operational parameters in a processing stage within a data processing apparatus for processing a signal.

Abstract: An integrated circuit (2) is provided with error detection circuitry (10,12) and error repair circuitry (14). Error tolerance circuitry (16) is responsive to a control parameter to selectively disable the error repair circuitry (14). The control parameter is dependent on the processing performed within the circuit. For example, the control parameter may be generated in dependence upon the program instruction being executed, the output signal value which is in error, the previous behaviour of the circuit or in other ways.

Abstract: Interface circuitry is provided for coupling between a memory device and processing circuitry, the processing circuitry issuing a plurality of access signals relating to accesses to be performed in the memory device. The interface circuitry comprises write address latch circuitry for storing a write address signal, and write address decoder circuitry that is responsive to a set first enable signal to decode the write address signal provided from the write address latch circuitry. Further, read address latch circuitry is provided for storing a read address signal issued by the processing circuitry, and read address decoder circuitry is responsive to a set second enable signal for decoding the read address signal provided from the read address latch circuitry. Decoder select latch circuitry is responsive to an access type indication signal from the processing circuitry to generate the first and second enable signals in dependence on that access type indication signal.

Abstract: An integrated circuit 2 is provided with domino logic including a speculative node 22 and a checker node 24. Precharged circuitry 36 precharges both the speculative node and the checker node. Logic circuitry 26 provides a discharge path for the speculative node and the checker node in dependence upon input signal values. Evaluation control circuitry 28, 30 first couples the speculative node to the logic circuitry and then subsequently couples the checker node to the logic circuitry such that these can be discharged if the input signals to the logic circuitry 26 have appropriate values. Error detection circuitry 32 detects an error when the speculative node and the checker node are not one of both discharged or both undischarged.

Abstract: An integrated circuit includes processing pipeline stages formed of an input register, processing circuit and an output register. The output register employs speculative sampling and uses a subsequent speculation period during which any change in its input is detected and used to indicate a speculation error. In order to reduce the chances of a race condition giving rise to a false positive detection of a speculation error due to a too rapid signal propagation through the processing circuitry a transparent latch is disposed at the approximate midpoint, measured in terms of propagation delay, within the processing circuitry. This transparent latch is non-transmissive during the speculation period of the output register so as to prevent any new signal propagating from the input register during the speculation period from reaching the output register.