Abstract: Electrical overstress protection via silicon controlled rectifier (SCR) trigger amplification control is provided. In certain configurations, an overstress protection circuit includes a control circuit for detecting presence of an overstress event between a first pad and a second pad of an interface, and a discharge circuit electrically connected between the first pad and the second pad and selectively activated by the control circuit. The interface corresponds to an electronic interface of an integrated circuit (IC), a System on a Chip (SoC), or System in-a-Package (SiP). The discharge circuit includes a first smaller SCR and a second larger SCR. In response to detecting an overstress event, the control circuit activates the smaller SCR, which in turn activates the larger SCR to provide clamping between the first pad and the second pad.

Abstract: A communication interface protection device includes a first electrical overstress (EOS) protection switch electrically connected to a first terminal and a second EOS protection switch electrically connected to a second terminal. Each of the first and second EOS protection switches includes a first semiconductor-controlled rectifier (SCR) and a second SCR and a first diode having a cathode electrically connected to an anode of the first SCR and a second diode having a cathode electrically connected to an anode of the second SCR. The first EOS protection device is configured to be activated in response to an EOS condition that causes a first bias between the first and second terminals, and wherein the second EOS protection device is configured to be activated in response to an EOS condition that causes a second bias between the first and second terminals.

Abstract: Fault tolerant switches are provided herein. In certain embodiments, a fault tolerant switch includes a switch, a gate driver, and a clamp. The switch includes a switch p-type field effect transistor (PFET) and a switch n-type field effect transistor (NFET) electrically connected in series and controlled by the gate driver. Additionally, the clamp is electrically connected in parallel with the switch, and includes a forward protection circuit including a first diode and a first clamp FET in series, and a reverse protection circuit including a second diode and a second clamp FET in series. The clamp further includes a first gate bias circuit configured to bias a gate of the first clamp FET and a second gate bias circuit configured to bias a gate of the second clamp FET.

Abstract: Fault tolerant switches are provided herein. In certain embodiments, a fault tolerant switch includes a switch, a gate driver, and a clamp. The switch includes a switch p-type field effect transistor (PFET) and a switch n-type field effect transistor (NFET) electrically connected in series and controlled by the gate driver. Additionally, the clamp is electrically connected in parallel with the switch, and includes a forward protection circuit including a first diode and a first clamp FET in series, and a reverse protection circuit including a second diode and a second clamp FET in series. The clamp further includes a first gate bias circuit configured to bias a gate of the first clamp FET and a second gate bias circuit configured to bias a gate of the second clamp FET.

Abstract: Micro-electromechanical switch (MEMS) devices can be fabricated using integrated circuit fabrication techniques and materials. Such switch devices can provide cycle life and insertion loss performance suiting for use in a broad range of applications including, for example, automated test equipment (ATE), switching for measurement instrumentation (such as a spectrum analyzer, network analyzer, or communication test system), and uses in communication systems, such as for signal processing. MEMS devices can be vulnerable to electrical over-stress, such as associated with electrostatic discharge (ESD) transient events. A solid-state clamp circuit can be incorporated in a MEMS device package to protect one or more MEMS devices from damaging overvoltage conditions. The clamp circuit can include single or multiple blocking junction structures having complementary current-voltage relationships, such as to help linearize a capacitance-to-voltage relationship presented by the clamp circuit.

Abstract: A method includes acts for establishing a subscription for an entity. The method includes receiving, at a cloud service provider, a request from an entity to establish a subscription. The request includes credentials for the entity that are not proper credentials for an organization associated with the entity that the entity should use to access services for the organization. The method further includes performing a corrective action based on detecting one or more factors to determine that the entity is associated with the organization. The method further includes providing services based on the corrective action.

Abstract: A method includes acts for establishing a subscription for an entity. The method includes receiving, at a cloud service provider, a request from an entity to establish a subscription. The request includes credentials for the entity that are not proper credentials for an organization associated with the entity that the entity should use to access services for the organization. The method further includes performing a corrective action based on detecting one or more factors to determine that the entity is associated with the organization. The method further includes providing services based on the corrective action.

Abstract: Distributed switches to suppress transient electrical overstress-induced latch-up are provided. In certain configurations, an integrated circuit (IC) or semiconductor chip includes a transient electrical overstress detection circuit that activates a transient overstress detection signal in response to detecting a transient electrical overstress event between a pair of power rails. The IC further includes mixed-signal circuits and latch-up suppression switches distributed across the IC, and the latch-up suppression switches temporarily clamp the power rails to one another in response to activation of the transient overstress detection signal to inhibit latch-up of the mixed-signal circuits.

Abstract: Deployment and servicing tasks associated with multi-tier, distributed applications, application environments and data centers are automated so that a person does not have to manually perform these tasks. All of the information describing and defining the distributed service is modeled and stored in a re-useable service template that can be used to drive an automated system to programmatically deploy and manage the service over time. Deployment and servicing of a distributed application can be automated using re-useable models that capture hardware and workload definitions. The re-useable models in the form of service templates enable delta-based servicing of the application. The service can be deployed to one or more physical machines, one or more virtual machines or to a combination thereof. A default deployment plan can be customized with instance-specific customizations of service parameters.

Abstract: A method includes acts for establishing a subscription for an entity. The method includes receiving, at a cloud service provider, a request from an entity to establish a subscription. The request includes credentials for the entity that are not proper credentials for an organization associated with the entity that the entity should use to access services for the organization. The method further includes performing a corrective action based on detecting one or more factors to determine that the entity is associated with the organization. The method further includes providing services based on the corrective action.

Abstract: Electrical overstress protection via silicon controlled rectifier (SCR) trigger amplification control is provided. In certain configurations, an overstress protection circuit includes a control circuit for detecting presence of an overstress event between a first pad and a second pad of an interface, and a discharge circuit electrically connected between the first pad and the second pad and selectively activated by the control circuit. The interface corresponds to an electronic interface of an integrated circuit (IC), a System on a Chip (SoC), or System in-a-Package (SiP). The discharge circuit includes a first smaller SCR and a second larger SCR. In response to detecting an overstress event, the control circuit activates the smaller SCR, which in turn activates the larger SCR to provide clamping between the first pad and the second pad.

Abstract: Deployment and servicing tasks associated with multi-tier, distributed applications, application environments and data centers are automated so that a person does not have to manually perform these tasks. All of the information describing and defining the distributed service is modeled and stored in a re-useable service template that can be used to drive an automated system to programmatically deploy and manage the service over time. Deployment and servicing of a distributed application can be automated using re-useable models that capture hardware and workload definitions. The re-useable models in the form of service templates enable delta-based servicing of the application. The service can be deployed to one or more physical machines, one or more virtual machines or to a combination thereof. A default deployment plan can be customized with instance-specific customizations of service parameters.

Abstract: Apparatus and methods for transient overstress protection with false condition shutdown are provided herein. In certain configurations, a high-voltage tolerant actively-controlled protection circuit includes a transient overstress detection circuit, a clamp circuit electrically connected between a first node and a second node, a bias circuit that biases the clamp circuit, and a false condition shutdown circuit. The transient overstress detection circuit generates a detection signal indicating whether or not a transient overstress event is detected between the first and second nodes. Additionally, the false condition shutdown circuit generates a false condition shutdown signal based on low pass filtering a voltage difference between the first and second nodes, thereby determining independently whether or not power is present. The bias circuit controls operation of the clamp circuit in an on state or an off state based on the detection signal and the false condition shutdown signal.

Abstract: Apparatus and methods for actively-controlled trigger and latch release thyristor are provided. In certain configurations, an actively-controlled protection circuit includes an overvoltage sense circuit, a thyristor or silicon controlled rectifier (SCR) that is electrically connected between a signal node and a discharge node, and an active trigger and latch release circuit. The overvoltage sense circuit controls a voltage of a dummy supply node based on a voltage of the signal node, and the active trigger and latch release circuit detects presence of a transient overstress event at the signal node based on the voltage of the dummy supply node. The active trigger and latch release circuit provides one or more trigger signals to the SCR to control the SCR's activation voltage, and the active trigger and latch release circuit activates or deactivates the one or more trigger signals based on whether or not the transient overstress event is detected.

Abstract: Apparatus and methods for compound semiconductor protection clamps are provided herein. In certain configurations, a compound semiconductor protection clamp includes a resistor-capacitor (RC) trigger network and a metal-semiconductor field effect transistor (MESFET) clamp. The RC trigger network detects when an ESD/EOS event is present between a first node and a second node, and activates the MESFET clamp in response to detecting the ESD/EOS event. When the MESFET clamp is activated, the MESFET clamp provides a low impedance path between the first and second nodes, thereby providing ESD/EOS protection. When deactivated, the MESFET clamp provides high impedance between the first and second nodes, and thus operates with low leakage current and small static power dissipation.

Abstract: Deployment and servicing tasks associated with multi-tier, distributed applications, application environments and data centers are automated so that a person does not have to manually perform these tasks. All of the information describing and defining the distributed service is modeled and stored in a re-useable service template that can be used to drive an automated system to programmatically deploy and manage the service over time. Deployment and servicing of a distributed application can be automated using re-useable models that capture hardware and workload definitions. The re-useable models in the form of service templates enable delta-based servicing of the application. The service can be deployed to one or more physical machines, one or more virtual machines or to a combination thereof. A default deployment plan can be customized with instance-specific customizations of service parameters.

Abstract: A method includes acts for establishing a subscription for an entity. The method includes receiving, at a cloud service provider, a request from an entity to establish a subscription. The request includes credentials for the entity that are not proper credentials for an organization associated with the entity that the entity should use to access services for the organization. The method further includes performing a corrective action based on detecting one or more factors to determine that the entity is associated with the organization. The method further includes providing services based on the corrective action.

Abstract: Distributed switches to suppress transient electrical overstress-induced latch-up are provided. In certain configurations, an integrated circuit (IC) or semiconductor chip includes a transient electrical overstress detection circuit that activates a transient overstress detection signal in response to detecting a transient electrical overstress event between a pair of power rails. The IC further includes mixed-signal circuits and latch-up suppression switches distributed across the IC, and the latch-up suppression switches temporarily clamp the power rails to one another in response to activation of the transient overstress detection signal to inhibit latch-up of the mixed-signal circuits.

Abstract: In certain configurations, an input/output (IO) interface of a semiconductor chip includes a pin, an interface switch connected to the pin, and an overstress detection and active control circuit that controls a resistance of the interface switch with active feedback. The overstress detection and active control circuit increases a resistance of the interface switch in response to detection of a transient overstress event between a first node and a second node. Accordingly, the overstress detection and active control circuit provides separate detection and logic control to selectively modify the resistance of the interface switch such that the interface switch operates with low resistance during normal operating conditions and with high resistance during overstress conditions.

Abstract: A method includes acts for establishing a subscription for an entity. The method includes receiving, at a cloud service provider, a request from an entity to establish a subscription. The request includes credentials for the entity that are not proper credentials for an organization associated with the entity that the entity should use to access services for the organization. The method further includes performing a corrective action based on detecting one or more factors to determine that the entity is associated with the organization. The method further includes providing services based on the corrective action.