Patents by Inventor Takahiro Kitano

Takahiro Kitano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6518199
    Abstract: The present invention relates to a method for performing coating and developing treatment for a substrate, which comprises the steps of: supplying a coating solution to the substrate to form a coating film on the substrate; performing heat treatment for the substrate on which the coating film is formed; cooling the substrate after the heat treatment; performing exposure processing for the coating film formed on the substrate; and developing the substrate after the exposure processing, and further comprises the step of supplying a treatment gas to form a treatment film on a surface of the coating film after the step of forming the coating film and before the step of performing the exposure processing for the substrate.
    Type: Grant
    Filed: May 9, 2001
    Date of Patent: February 11, 2003
    Assignee: Tokyo Electron Limited
    Inventors: Junichi Kitano, Yuji Matsuyama, Takahiro Kitano, Hidetami Yaegashi
  • Patent number: 6514344
    Abstract: The present invention is a film forming unit for forming a film on a substrate by supplying a coating solution on the substrate from a discharge nozzle, including moving means for moving the discharge nozzle, wherein the moving means comprises a supporting member for supporting the discharge nozzle, a moving member for moving the supporting member, a guide shaft passing through bearing portion which is formed in the supporting member, and an air supply mechanism for supplying air to a space between the bearing portion and the guide shaft. The discharge nozzle discharges the coating solution while moving along the guide shaft. On the substrate the coating solution is applied along the locus of the discharge nozzle movement. Since air is supplied to the space between the bearing portion and the guide shaft, the supporting member can be made to be in the state of floating relative the guide shaft.
    Type: Grant
    Filed: December 14, 2000
    Date of Patent: February 4, 2003
    Assignee: Tokyo Electron Limited
    Inventors: Takahiro Kitano, Masateru Morikawa, Yukihiko Esaki, Nobukazu Ishizaka, Norihisa Koga, Kazuhiro Takeshita, Hirofumi Ookuma, Masami Akimoto
  • Publication number: 20030002161
    Abstract: The invention relates to a lens sheet applicable to a screen for a pixel type projection TV characterized in high quality and definition and a simple producing method thereof. The inventive lens sheet has a shielding layer without any axial misalignment at front and rear sides. The lens sheet comprises a lens portion with a plurality of lens elements arranged in at least one side and a shielding layer provided in a non-transmitting portion of a light radiation plane, in which the shielding layer is provided on a layer made of a cured photo-curing composition (A). The photo-curing composition (A) is composed of 100 weight parts of photo-curing resin composition (a) having a surface free energy of 30 mN/m or more and 0.01 to 10 weight parts of compound (b) having a surface free energy of 25 mN/m or less.
    Type: Application
    Filed: June 13, 2002
    Publication date: January 2, 2003
    Applicant: Kuraray Co., Ltd.
    Inventors: Atsushi Nagasawa, Takahiro Kitano, Katsuya Fujisawa, Junichi Tanaka, Tatsufumi Watanabe
  • Publication number: 20020176928
    Abstract: When a coating film is formed on a substrate, the inplane uniformity of the thickness of the coating film is enhanced to improve through put. Above the substrate, there are provided main and auxiliary nozzles separately movable, and monitoring means for monitoring the state of the surface of the substrate to detect the occurrence of an uncoated region on the surface of the substrate. On the basis of previously prepared coating data, a coating liquid is spirally applied on the substrate by the main nozzle. Then, if the monitoring means detects the occurrence of the uncoated region in a coated region in which the coating liquid has been applied by the main nozzle, a control part detects whether it is required to supply the coating liquid to the uncoated region. If it is required, the coating liquid is supplied to the uncoated region by the auxiliary nozzle. On the other hand, the portion of occurrence of the uncoated region has been grasped by the control part.
    Type: Application
    Filed: May 23, 2002
    Publication date: November 28, 2002
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Tomohide Minami, Shinichi Sugimoto, Takahiro Kitano, Jun Ookura, Hiroaki Kurishima
  • Publication number: 20020155228
    Abstract: This invention aims to make it possible to obtain curing surfaces with different surface free energies, and to provide a method of curing an ionizing radiation curing resin composition which can be used as a coating material. Further, it aims to provide a surface modification method which permits surfaces of different surface free energy to be obtained. The above object is achieved by a method of curing a mixture comprising an ionizing radiation curing resin, characterized in that at least part of a mixture comprising 0.01-10 weight parts of a compound (b) having a surface free energy not exceeding 25 mN/m relative to 100 weight parts of an ionizing radiation curing resin composition (a) having a surface free energy of at least 30 mN/m, is cured by irradiating it with ionizing radiation in contact with a medium having a surface free energy higher than that of the ionizing radiation curing resin composition (a).
    Type: Application
    Filed: February 19, 2002
    Publication date: October 24, 2002
    Applicant: KURARAY CO., LTD.
    Inventors: Atsushi Nagasawa, Takahiro Kitano, Keiji Kubo, Katsuya Fujisawa
  • Patent number: 6467976
    Abstract: The present invention has a processing zone having a coating unit for forming a coating film on a substrate, a developing unit for performing development of the substrate, a heat treatment unit for performing heat treatment of the substrate, and a first transfer device for transferring the substrate from/to the coating unit, the developing unit and the heat treatment unit, an interface section in which the substrate is transferred at least on a path between the processing zone and an exposure processing unit outside the system for performing exposure processing for the substrate, a casing for housing the processing zone and the interface section, a gas supply device for supplying an inert gas into the interface section, and an exhaust portion through which an atmosphere in the interface section is discharged, and the heat treatment unit, and a second transfer device for transferring the substrate on a path between the heat treatment unit and the exposure processing unit are disposed in the interface section.
    Type: Grant
    Filed: May 7, 2001
    Date of Patent: October 22, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Yuji Matsuyama, Junichi Kitano, Takahiro Kitano
  • Publication number: 20020148566
    Abstract: The present invention relates to a processing unit for processing a substrate, which comprises a chamber for housing the substrate and forming a hermetically closeable processing room, and an exhauster for exhausting an atmosphere in the processing room from an upper portion of the chamber to reduce a pressure in the processing room. The processing unit of the present invention includes a current plate for controlling an atmospheric current formed in the processing room when the pressure is reduced, and the chamber has a mounting table for mounting the substrate thereon, an almost cylindrical lid body with its lower face open for covering the substrate on the mounting plate from above and forming the processing room integrally with the mounting table, and a supporting member for supporting the current plate so that the current plate is parallel to the mounting plate.
    Type: Application
    Filed: April 16, 2002
    Publication date: October 17, 2002
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Takahiro Kitano, Shinichi Sugimoto, Shinji Kobayashi, Naoya Hirakawa, Akira Fukutomi, Nobukazu Ishizaka
  • Publication number: 20020150691
    Abstract: The present invention relates to a processing method for processing a substrate, and comprises a step of coating a coating solution on a surface of the substrate while relatively moving a coating solution discharge nozzle and the substrate and discharging the coating solution from the nozzle onto the substrate. Thereafter, the substrate is exposed to a solvent atmosphere of the coating solution or the pressure is temporarily applied thereto in a container. Thereafter, the pressure inside the container in which the substrate is housed is reduced to dry the coating solution on the substrate. According to the present invention, it is possible to narrow the so-called edge cutting width, which is at a periphery part of the substrate and is not commercialized, and to maintain an in-plane uniformity of the coating film.
    Type: Application
    Filed: April 15, 2002
    Publication date: October 17, 2002
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Takahiro Kitano, Shinichi Sugimoto, Shinji Kobayashi, Naoya Hirakawa, Akira Fukutomi, Nobukazu Ishizaka
  • Publication number: 20020150679
    Abstract: A coating solution is sprayed on a rotating wafer held horizontally from a nozzle provided above the wafer while the nozzle is travelling over the wafer from a wafer center to a wafer outer area, thus spirally spraying the coating solution on the wafer. The nozzle stops when the coating solution has reached the wafer outer area and the coating solution is sprayed in circle on the wafer outer area while the wafer is rotating. A coating solution including a component of a coating film and a solvent may be sprayed on a first area to be coated of the wafer and the coating solution and a solvent for the coating film may be sprayed on a second edge area located outside the first area of the wafer.
    Type: Application
    Filed: April 16, 2002
    Publication date: October 17, 2002
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Tomohide Minami, Shinichi Sugimoto, Takahiro Kitano, Jun Ookura, Hiroaki Kurishima
  • Publication number: 20020134304
    Abstract: The present invention is a coating unit for applying a coating solution to a substrate which includes: a discharge nozzle for reciprocating in a predetermined direction above the substrate and discharging the coating solution to the substrate; a holder for holding the substrate and horizontally movable in one direction perpendicular to the predetermined direction; and a cover for covering an upper face of the substrate when the substrate is moved in the one direction to be more forward than the discharge nozzle as viewed from a plane, wherein a lower face of the cover is inclined such as to be higher on the discharge nozzle side. According to the present invention, the cover covering the upper face of the substrate restrains a solvent from evaporating from the coating solution applied on the substrate to secure flatness of a coating film.
    Type: Application
    Filed: March 21, 2002
    Publication date: September 26, 2002
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Shinji Kobayashi, Takahiro Kitano, Masateru Morikawa, Kazuhiro Takeshita, Yoshiyuki Kawafuchi
  • Publication number: 20020136829
    Abstract: A film forming apparatus comprising a substrate holding section for holding a substrate to be processed, a nozzle unit arranged and opposing the substrate holding section, having a discharge hole for continuously applying film-forming solution, in the form of a slender stream, to a surface of a substrate held by the substrate holding section, and a drive mechanism for driving the substrate and the nozzle unit relative to each other, thereby to coat the surface of the substrate with the solution, while the nozzle unit is applying the solution, in the form of a slender stream, to the surface of the substrate.
    Type: Application
    Filed: May 20, 2002
    Publication date: September 26, 2002
    Inventors: Takahiro Kitano, Masateru Morikawa, Masami Akimoto, Kazuhiro Takeshita
  • Publication number: 20020127879
    Abstract: The present invention has a processing zone having a coating unit for forming a coating film on a substrate, a developing unit for performing development of the substrate, a heat treatment unit for performing heat treatment of the substrate, and a first transfer device for transferring the substrate from/to the coating unit, the developing unit and the heat treatment unit, an interface section in which the substrate is transferred at least on a path between the processing zone and an exposure processing unit outside the system for performing exposure processing for the substrate, a casing for housing the processing zone and the interface section, a gas supply device for supplying an inert gas into the interface section, and an exhaust portion through which an atmosphere in the interface section is discharged, and the heat treatment unit, and a second transfer device for transferring the substrate on a path between the heat treatment unit and the exposure processing unit are disposed in the interface section.
    Type: Application
    Filed: May 7, 2001
    Publication date: September 12, 2002
    Applicant: Tokyo Electron Limited
    Inventors: Yuji Matsuyama, Junichi Kitano, Takahiro Kitano
  • Publication number: 20020124798
    Abstract: The present invention is a film forming unit for discharging a coating solution from a coating solution discharge nozzle toward a substrate to form a layer on a surface of the substrate, which has a supply flow path for supplying a cleaning fluid to a discharge flow path continuing to a discharging port of the coating solution discharge nozzle. When the cleaning fluid is positively supplied directly to the discharge flow path of the coating solution discharge nozzle, the supply pressure of the cleaning fluid as well as the capability of cleaning is added. Therefore, further effective cleaning is attained in compare with the conventional case where a coating solution discharge nozzle is simply dipped into a cleaning fluid. In consequence, even when the discharging port of the nozzle is minute, it is possible to perfectly remove the contamination. This allows the discharge pressure to remain constant so as to form a uniform coating layer on the substrate.
    Type: Application
    Filed: December 15, 2000
    Publication date: September 12, 2002
    Applicant: Tokyo Electron Limited
    Inventors: Takahiro Kitano, Masateru Morikawa, Yukihiko Esaki, Nobukazu Ishizaka, Norihisa Koga, Kazuhiro Takeshita, Hirofumi Ookuma, Masami Akimoto
  • Publication number: 20020124797
    Abstract: The present invention is a film forming unit for applying a coating solution to a substrate to form a coating film on the substrate, which has a heating and/or cooling member brought into direct or indirect contact with said substrate for changing a temperature of at least a peripheral portion of the substrate. By changing the temperature of a perimeter portion of the substrate by means of it, a temperature of the coating solution applied on the substrate can be changed. Consequently, surface tension of the coating solution decreases or increases, and swelling of the coating solution occurring at the substrate perimeter portion and reduction in film thickness can be prevented. As a result, a coating film with a predetermined film thickness is formed also on the perimeter portion of the substrate, thus making it possible to enhance yield.
    Type: Application
    Filed: December 13, 2000
    Publication date: September 12, 2002
    Applicant: Tokyo Electron Limited
    Inventors: Takahiro Kitano, Shinji Kobayashi, Yukihiko Esaki, Masateru Morikawa
  • Publication number: 20020127340
    Abstract: In a coating and developing treatment for a substrate, the present invention comprises the steps of: supplying a coating solution to the substrate to form a coating layer on the substrate; performing a developing treatment for the substrate in the processing zone after it undergoes an exposure processing by an aligner not included in the system; and carrying the substrate into the chamber after the step of forming the coating layer and before the exposure processing and thereafter reducing the pressure inside the airtightly closed chamber to a predetermined pressure to remove impurities adhering to the substrate inside the chamber from the substrate for a predetermined time, wherein the predetermined pressure and the predetermined time are adjusted based on the density of the impurities measured inside the processing zone.
    Type: Application
    Filed: May 7, 2001
    Publication date: September 12, 2002
    Applicant: Tokyo Electron Limited
    Inventors: Junichi Kitano, Yuji Matsuyama, Takahiro Kitano
  • Publication number: 20020088393
    Abstract: A coating area of wafer W is divided into, for example, three regions. The wafer W and/or a supply nozzle are driven in a predetermined coating direction and/or a coating direction such that coating start positions of the adjacent divided regions are not next to each other and/or the coating is not continuously performed in order of a coating end position and a coating start position when the coating end position of one region of the adjacent divided regions and the coating start position of the other region are adjacent to each other, whereby forming a liquid film of a resist liquid for each divided region of the surface of wafer W. As a result, a phenomenon, in which the resist liquid is drawn to the coating start position, so as to increase the film thickness of this portion, occurs in only the corresponding region. Resultantly, uniformity of an inner surface of the film thickness can be improved.
    Type: Application
    Filed: March 13, 2002
    Publication date: July 11, 2002
    Inventors: Takahiro Kitano, Masateru Morikawa, Yukihiko Esaki, Nobukazu Ishizaka, Norihisa Koga, Kazuhiro Takeshita, Hirofumi Ookuma, Masami Akimoto
  • Patent number: 6416583
    Abstract: A film forming apparatus comprising a substrate holding section for holding a substrate to be processed, a nozzle unit arranged and opposing the substrate holding section, having a discharge hole for continuously applying film-forming solution, in the form of a slender stream, to a surface of a substrate held by the substrate holding section, and a drive mechanism for driving the substrate and the nozzle unit relative to each other, thereby to coat the surface of the substrate with the solution, while the nozzle unit is applying the solution, in the form of a slender stream, to the surface of the substrate.
    Type: Grant
    Filed: June 9, 1999
    Date of Patent: July 9, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Takahiro Kitano, Masateru Morikawa, Masami Akimoto, Kazuhiro Takeshita
  • Patent number: 6383948
    Abstract: A coating area of wafer W is divided into, for example, three regions. The wafer W and/or a supply nozzle are driven in a predetermined coating direction and/or a coating direction such that coating start positions of the adjacent divided regions are not next to each other and/or the coating is not continuously performed in order of a coating end position and a coating start position when the coating end position of one region of the adjacent divided regions and the coating start position of the other region are adjacent to each other, whereby forming a liquid film of a resist liquid for each divided region of the surface of wafer W. As a result, a phenomenon, in which the resist liquid is drawn to the coating start position, so as to increase the film thickness of this portion, occurs in only the corresponding region. Resultantly, uniformity of an inner surface of the film thickness can be improved.
    Type: Grant
    Filed: December 13, 2000
    Date of Patent: May 7, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Takahiro Kitano, Masateru Morikawa, Yukihiko Esaki, Nobukazu Ishizaka, Norihisa Koga, Kazuhiro Takeshita, Hirofumi Ookuma, Masami Akimoto
  • Patent number: 6371667
    Abstract: A resist solution discharge nozzle for discharging a resist solution to a wafer is moved at a constant speed along a radial direction of the wafer while the wafer is being rotated. During this movement, the amount of the resist solution to be discharged from the resist solution discharge nozzle is gradually decreased. The resist solution discharged to the wafer is applied to the front surface of the wafer drawing a spiral track, and coating amounts of the resist solution per unit area with respect to a central portion and a peripheral portion of the wafer can be made equal. Accordingly, waste of a processing solution supplied onto a substrate can be eliminated, and a uniform processing solution film can be formed on the substrate.
    Type: Grant
    Filed: April 6, 2000
    Date of Patent: April 16, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Takahiro Kitano, Masami Akimoto, Tomohide Minami, Masateru Morikawa
  • Publication number: 20020006737
    Abstract: The present invention relates to a method for performing coating and developing treatment for a substrate, which comprises the steps of: supplying a coating solution to the substrate to form a coating film on the substrate; performing heat treatment for the substrate on which the coating film is formed; cooling the substrate after the heat treatment; performing exposure processing for the coating film formed on the substrate; and developing the substrate after the exposure processing, and further comprises the step of supplying a treatment gas to form a treatment film on a surface of the coating film after the step of forming the coating film and before the step of performing the exposure processing for the substrate.
    Type: Application
    Filed: May 9, 2001
    Publication date: January 17, 2002
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Junichi Kitano, Yuji Matsuyama, Takahiro Kitano, Hidetami Yaegashi