Abstract: Various devices, systems and methods are disclosed where a noise signal component of a sensor signal is used to obtain information about a sensor device. A device may include an evaluation circuit that is configured to receive a sensor signal having a noise signal component, and the evaluation circuit is further configured to evaluate the noise signal component to obtain information about a sensor device generating the sensor signal.

Abstract: Devices and methods are provided which facilitate detecting of a disturbance parameter being outside a predetermined range. Such disturbance parameter may for example cause dependent failures in redundant circuits, for example redundant circuits being arranged on a same substrate.

Abstract: The present disclosure teaches a sensor system comprising at least two sensor elements causing increased reliability of individual sensor signals due to increased diagnostic coverage using diverse signal paths, diverse signal representations of sensor signals, merging of individual sensor signals maintaining independence of individual sensor signals comprised in protocol representations thereof.

Abstract: An apparatus (100) for providing an joint error correction code (140) for a combined data frame (254) comprising first data (112) of a first data channel and second data (122) of a second data channel comprises a first error code generator (110) configured to provide, based on a linear code, information on a first error correction code (114a, 114b) using the first data (112). The apparatus further comprises a second error code generator (120) configured to provide, based on the linear code, information on a second error correction code (124) using the second data (122). The apparatus is configured to provide the joint error correction code (140) using the information on the first error correction code (114a, 114b) and the information on the second error correction code (124).

Abstract: The disclosure includes embodiments that apply to an interconnect architecture having multiple system masters and at least one shared resource. The disclosure provides a system and method for providing synchronization for transactions in a multi-master interconnect architecture that employs at least one shared resource, or slave component.

Abstract: According to an embodiment, a DSL transceiver is set in a low power mode and moved out of the low power mode responsive to the DSL transceiver receiving data. Data is transmitted only on a first group of sub-carriers when moving the DSL transceiver out of the low power mode, the first group of sub-carriers being a subset of the sub-carriers available to the DSL transceiver for transmission.

Abstract: The present invention provides for an apparatus for measuring a curvature of a surface of a wafer in a multi-wafer epitaxial reactor.

Abstract: A flat light emitting plate, a method for calibrating a pyrometer and a method for determining the temperature of a semiconducting wafer inside a processing chamber by said pyrometer. The invention provides a method for calibrating a pyrometer by means of a cold source which is also applicable to processing chambers with a narrow slit. According to the invention, a flat light emitting plate for simulating thermal radiation is provided, comprising a main body made of a transparent material, a light emission area located on an upper surface of the light emitting plate for emitting light, at least one light source located on a lateral surface of the light emitting plate, at least one detector located on a lateral surface of the light emitting plate, and a regulating circuit for adjusting the intensity of light emitted by the light sources.

Abstract: An apparatus for measuring a curvature of a surface (1), comprising means for irradiating a first light beam (S1), a second light beam (S2) and a third light beam (S3) onto a surface (1) of a sample (12), a detector (5) comprising at least one detector plane and being adapted to detect a first position of the reflected first light beam (S1), a second position of the reflected second light beam (S2) and a third position of the reflected third light beam (S3) in the at least one detector plane, means for determining a first distance between the first position of the first light beam (S1) and the third position of the third light beam (S3) and a second distance between the second position of the second light beam (S2) and the third position of the third light beam (S3), and means for determining a mean curvature of the surface from the first distance and the second distance.

Abstract: A pyrometer that is adapted for detecting radiation in the range of 250 to 450 nm is disclosed. The pyrometer can be used for determining the temperature of a matter thermally emitting only ultraviolet-radiation. In particular, the pyrometer can include: a detector having an active area adapted for measuring thermal radiation, a longpass filter having a cut-off wavelength in the range of 400 to 450 nm, means adapted for alternately activating and deactivating the longpass filter, means adapted for measuring a first thermal radiation signal when the longpass filter is deactivated and adapted for measuring a second thermal radiation signal when the longpass filter is activated, and means adapted for determining a temperature corresponding to the measured thermal radiation from a difference of the first radiation signal and the second radiation signal.

Abstract: A base station for wireless communication comprises a receiver and a processor. The receiver has a first operating state and a second operating state with different power consumption levels. In the first operating state, the receiver is configured to receive a signal. The processor is coupled to the receiver to switch the receiver between the first and second operating states.

Abstract: A method for calibrating a pyrometer a temperature of a calibration sample is determined from the ratio of a first reflectance and a second reflectance and the pyrometer is calibrated by assigning the determined temperature of the calibration sample with a thermal radiation signal measured by the pyrometer.

Abstract: The present invention provides for an apparatus for measuring a curvature of a surface of a wafer in a multi-wafer epitaxial reactor.

Abstract: A system, having a stream cache and a storage. The stream cache includes a stream cache controller adapted to control or mediate input data transmitted through the stream cache; and a stream cache memory. The stream cache memory is adapted to both store at least first portions of the input data, as determined by the stream cache controller, and to further output the stored first portions of the input data to a processor. The storage is adapted to receive and store second portions of the input data, as determined by the stream cache controller, and to further transmit the stored second portions of the input data for output to the processor.

Abstract: Allocation of a plurality of channels in a wireless network is described. The allocation process has each base station serving the sectors in the network scan each unused channel of the plurality of channels in its served sector. The signal quality of each scanned, unused channel is measured and sorted according to the measured signal quality. The quality-sorted unused channels are then ordered according to a statistical algorithm. An ordered list of available channels is generated according to results of the statistical algorithm ordering. This ordered list is broadcast to each access terminal (AT) registered with the base station. New communication between the base station and its registered ATs is then initiated using one of the unused channels in the ordered list.

Abstract: The present invention relates to a method and an apparatus for determining the layer thickness and the refractive index of a sample. It is an object of the present invention to provide a method for determining the layer thickness of a sample (layer) having high light scattering characteristics that allows a fast (real-time process) and cost-effective measurement having a high accuracy.

Abstract: Methods and apparatuses for determining a number of clock cycles during an execution of a command by a processor, determining a value associated with the number of clock cycles, storing an indicator indicative of the command, responsive to the value indicative of the execution time exceeding a threshold value.

Abstract: Apparatus and method for determining an expected exceeding of a maximum allowed power consumption of a mobile electronic device is provided, wherein the method includes determining power consumption of the device in a current operating state, determining, for a first process executable by a processor of the device, process-specific power consumption of the device which would be caused by execution of the first process, determining as to whether an expected exceeding of a maximum allowed power consumption would occur for a case in which a new instance of the first executable process would be executed, which is currently not executed, and that possible present instances of the first executable process, which are currently executed, are continued to be executed, and if it has been determined that an expected exceeding of a maximum allowed power consumption would occur, outputting information about the expected exceeding of the maximum allowed power consumption.

Abstract: An apparatus for measuring a curvature of a surface (1), comprising means for irradiating a first light beam (S1), a second light beam (S2) and a third light beam (S3) onto a surface (1) of a sample (12), a detector (5) comprising at least one detector plane and being adapted to detect a first position of the reflected first light beam (S1), a second position of the reflected second light beam (S2) and a third position of the reflected third light beam (S3) in the at least one detector plane, means for determining a first distance between the first position of the first light beam (S1) and the third position of the third light beam (S3) and a second distance between the second position of the second light beam (S2) and the third position of the third light beam (S3), and means for determining a mean curvature of the surface from the first distance and the second distance.

Abstract: A pyrometer that is adapted for detecting radiation in the range of 250 to 450 nm is disclosed. The pyrometer can be used for determining the temperature of a matter thermally emitting only ultraviolet-radiation. In particular, the pyrometer can include: a detector having an active area adapted for measuring thermal radiation, a longpass filter having a cut-off wavelength in the range of 400 to 450 nm, means adapted for alternately activating and deactivating the longpass filter, means adapted for measuring a first thermal radiation signal when the longpass filter is deactivated and adapted for measuring a second thermal radiation signal when the longpass filter is activated, and means adapted for determining a temperature corresponding to the measured thermal radiation from a difference of the first radiation signal and the second radiation signal.