Abstract: The present invention relates to a method for calibrating a pyrometer, a method for determining the temperature of a semiconducting wafer and a system for determining the temperature of a semiconducting wafer. It is an object of the present invention to provide a method for calibrating a pyrometer which overcomes the disadvantages of the prior art.

Abstract: The present invention relates to a method and an apparatus for determining the layer thickness and the refractive index of a sample. It is an object of the present invention to provide a method for determining the layer thickness of a sample (layer) having high light scattering characteristics that allows a fast (real-time process) and cost-effective measurement having a high accuracy.

Abstract: According to an embodiment, a DSL transceiver is set in a low power mode and moved out of the low power mode responsive to the DSL transceiver receiving data. Data is transmitted only on a first group of sub-carriers when moving the DSL transceiver out of the low power mode, the first group of sub-carriers being a subset of the sub-carriers available to the DSL transceiver for transmission.

Abstract: According to an embodiment, a DSL transceiver includes a power mode controller and a transmitter. The power mode controller is configured to set the DSL transceiver in a low power mode and move the DSL transceiver out of the low power mode responsive to the DSL transceiver receiving data. The transmitter is configured to transmit data only on a first group of sub-carriers when the power mode controller is moving the DSL transceiver out of the low power mode, the first group of sub-carriers being a subset of the sub-carriers available to the DSL transceiver for transmission.

Abstract: A base station for wireless communication comprises a receiver and a processor. The receiver has a first operating state and a second operating state with different power consumption levels. In the first operating state, the receiver is configured to receive a signal. The processor is coupled to the receiver to switch the receiver between the first and second operating states.

Abstract: A method for the computer-aided ascertainment of a clock tree structure which couples a clock generation unit to a multiplicity of switching elements ascertains first switching elements from the multiplicity of switching elements, the first switching elements infringing a prescribed, first time-based switching criterion. In further method steps, the first switching elements are linked to the clock generation unit, and a first buffer element is inserted between the clock generation unit and the first switching elements. An integrated semiconductor circuit has a multiplicity of switching elements which are coupled to a clock generation unit via a clock tree structure. It also has a multiplicity of first switching elements which infringe a time-based switching criterion, which multiplicity is ascertained from the multiplicity of switching elements. A buffer element is inserted into the clock tree structure between the clock generation unit and the first switching elements.

Abstract: Allocation of a plurality of channels in a wireless network is described. The allocation process has each base station serving the sectors in the network scan each unused channel of the plurality of channels in its served sector. The signal quality of each scanned, unused channel is measured and sorted according to the measured signal quality. The quality-sorted unused channels are then ordered according to a statistical algorithm. An ordered list of available channels is generated according to results of the statistical algorithm ordering. This ordered list is broadcast to each access terminal (AT) registered with the base station. New communication between the base station and its registered ATs is then initiated using one of the unused channels in the ordered list.

Abstract: Devices and methods for providing data via a network are disclosed.

Abstract: Methods and apparatuses for processing data are provided. In one embodiment, a data processing operation which is assigned a predefined maximum duration is started. The progress of the data processing operation is checked at a predefined point in time and a priority of the data processing operation is changed on the basis of the progress of the data processing operation.

Abstract: The invention relates to a device and a method for the measurement of the curvature of a surface (1), which is more exact and less expensive than prior art devices. The device comprises a light source (2) for the irradiation of a light beam (3) onto the surface (1), in which a birefingent element (4) is arranged between light source (2) and surface (1), in which furthermore a detector (5) is arranged for the detection of the partial beams (6,7), that are reflected from the surface (1), and at least one main axis (17) of the birefringent element (4) is positioned with respect to the light beam (3) of the light source (2) in such a way, that the light beam (3) of the light source (2) is split up into at least two parallel beams (6,7).

Abstract: A method and a device for testing an integrated circuit are defined by the fact that the testing of the integrated circuit is begun by a self-test device contained in the integrated circuit before the integrated circuit is connected to an external testing device that reads out and/or evaluates the results of the self test. The integrated circuit and the wafer are constructed in such a way that this is readily possible with little outlay. An integrated circuit that includes the self-test device and a wafer including such integrated circuits is also disclosed.

Abstract: Apparatus and method for determining an expected exceeding of a maximum allowed power consumption of a mobile electronic device is provided, wherein the method includes determining power consumption of the device in a current operating state, determining, for a first process executable by a processor of the device, process-specific power consumption of the device which would be caused by execution of the first process, determining as to whether an expected exceeding of a maximum allowed power consumption would occur for a case in which a new instance of the first executable process would be executed, which is currently not executed, and that possible present instances of the first executable process, which are currently executed, are continued to be executed, and if it has been determined that an expected exceeding of a maximum allowed power consumption would occur, outputting information about the expected exceeding of the maximum allowed power consumption.

Abstract: Methods and apparatuses for determining a number of clock cycles during an execution of a command by a processor, determining a value associated with the number of clock cycles, storing an indicator indicative of the command, responsive to the value indicative of the execution time exceeding a threshold value.

Abstract: A non-volatile memory element for storing at least one data item, having a readable memory cell which can be written on with a first part of a data item, the memory cell exhibiting a first characteristic which is electrically irreversibly modifiable according to the first partial data item, at least one readable second memory cell which can be written on by a second partial data item, the second memory cell being electrically irreversibly modifiable according to the second partial data item, and a reader device which is coupled to the first memory cell and second memory cell. The memory element is configured such that the first partial data item and second partial data item are respectively determined according to the data item. The reader device is configured such that it determines the stored data item by comparing the first partial data item with the second partial data item.

Abstract: A method for the determination of characteristic layer parameters by means of spectral-optical measurements, that allow for precise measurements of the sample temperature even under the conditions of industrial growth processes and furthermore avoids the detection of thermal radiation and reflected radiation by means of twofold phase sensitive frequency modulation by using so called chopper and lock-in amplifier respectively. The wobbling and/or rotating of the sample to be measured is compensated and/or the pyrometer optical path and the optical path of the spectral-optical system are guided separately of each other and/or a separation of the radiation signal for the temperature measurement and the radiation signal for the spectral-optical measurement is implemented by blanking of the irradiated light.

Abstract: An integrated circuit and an associated packaged integrated circuit are provided which improve testability and reduce the test costs. The integrated circuit contains an integrated functional circuit to be tested, a test interface that connects the functional circuit to a test apparatus which performs a function test on the functional circuit to ascertain a test result, and an integrated self-marking apparatus that produces a marking on the basis of the test result. The marking can be magnetic or optical or electrical, volatile or nonvolatile, and thermally or electrically activated. The test apparatus includes an external test unit or an integrated self-test unit. Nonvolatile memory elements store the test results in a buffer.

Abstract: A method for the computer-aided ascertainment of a clock tree structure which couples a clock generation unit to a multiplicity of switching elements ascertains first switching elements from the multiplicity of switching elements, the first switching elements infringing a prescribed, first time-based switching criterion. In further method steps, the first switching elements are linked to the clock generation unit, and a first buffer element is inserted between the clock generation unit and the first switching elements. An integrated semiconductor circuit has a multiplicity of switching elements which are coupled to a clock generation unit via a clock tree structure. It also has a multiplicity of first switching elements which infringe a time-based switching criterion, which multiplicity is ascertained from the multiplicity of switching elements. A buffer element is inserted into the clock tree structure between the clock generation unit and the first switching elements.

Abstract: The invention relates to a device and a method for the measurement of the curvature of a surface (1). It is the object of the present invention to provide a device for the determination of the curvature of a surface (1), that is more exact and less expensive as the devices of the prior art. Therefore the device comprises a light source (2) for the irradiation of a light beam (3) onto the surface (1), in which a birefingent element (4) is arranged between light source (2) and surface (1), in which furthermore a detector (5) is arranged for the detection of the partial beams (6,7), that are reflected at the surface (1), and at least one main axis (17) of the birefringent element (4) is positioned with respect to the light beam (3) of the light source (2) in such a way, that the light beam (3) of the light source (2) is split up into at least two parallel beams (6,7), if necessary with the help of additional optical elements.

Abstract: A non-volatile memory element for storing at least one data item, having a readable memory cell which can be written on with a first part of a data item, the memory cell exhibiting a first characteristic which is electrically irreversibly modifiable according to the first partial data item, at least one readable second memory cell which can be written on by a second partial data item, the second memory cell being electrically irreversibly modifiable according to the second partial data item, and a reader device which is coupled to the first memory cell and second memory cell. The memory element is configured such that the first partial data item and second partial data item are respectively determined according to the data item. The reader device is configured such that it determines the stored data item by comparing the first partial data item with the second partial data item.

Abstract: An integrated circuit and an associated packaged integrated circuit are provided which improve testability and reduce the test costs. The integrated circuit contains an integrated functional circuit to be tested, a test interface that connects the functional circuit to a test apparatus which performs a function test on the functional circuit to ascertain a test result, and an integrated self-marking apparatus that produces a marking on the basis of the test result. The marking can be magnetic or optical or electrical, volatile or nonvolatile, and thermally or electrically activated. The test apparatus includes an external test unit or an integrated self-test unit. Nonvolatile memory elements store the test results in a buffer.