Abstract: A molded package includes: a mold compound; a first power semiconductor die encapsulated by the mold compound; and a first temperature sense cavity formed in a surface of the mold compound. The molded package is devoid of temperature sense terminals. The first temperature sense cavity is dimensioned to receive a temperature sensor and/or a combined area of each sidewall and a bottom of the first temperature sense cavity is greater than an area of an opening in the surface of the mold compound that delineates the first temperature sense cavity. A corresponding power module and a power electronics assembly that includes the molded package or the power module are also described.

Abstract: A method of forming a semiconductor package includes providing a first metal substrate; and mounting a stacked arrangement on the first metal substrate, the stacked arrangement comprising a semiconductor die, wherein mounting the stacked arrangement includes: providing a first layer of attachment material between the first metal substrate and the stacked arrangement; and providing a second layer of attachment material within the stacked arrangement at an interface with the semiconductor die, wherein at least one of the first and second layers of attachment material is a compressible layer that includes one or more elastomeric elements embedded within a matrix of solder material.

Abstract: A package is disclosed. In one example, the package comprises a carrier, a first chip with an integrated transistor and comprising a first terminal attached on the carrier, a second terminal, and a third terminal, wherein the first terminal and the third terminal are formed on one main surface of the first chip and the second terminal is formed on an opposing other main surface of the first chip. A conductive structure is attached on the second terminal, an encapsulant is at least partially encapsulating the carrier, the first chip, and the conductive structure, and an insulating layer is arranged on a surface portion of the conductive structure or of the carrier. The surface portion is exposed beyond the encapsulant.

Abstract: A power semiconductor package includes a plurality of first power semiconductor dies attached to a first metallization layer and a plurality of second power semiconductor dies attached to a second metallization layer. A first structured metal frame disposed above the first metallization layer is electrically connected to a load terminal of each first power semiconductor die. A second structured metal frame disposed above the second metallization layer is electrically connected to a load terminal of each second power semiconductor die and to the first metallization layer. A first lead is electrically connected to the second metallization layer. A second lead is electrically connected to the second metallization layer. A third lead interposed between the first and second leads is electrically connected to the first structured metal frame. A fourth lead is electrically connected to the second structured metal frame.

Abstract: An electronic module is disclosed. In one example, the electronic module includes a first substrate, a first dielectric layer on the first substrate, at least one electronic chip, which is mounted with a first main surface directly or indirectly on partial region of the first dielectric layer, a second substrate over a second main surface of the at least one electronic chip, and an electrical contacting for the electric contact of the at least one electronic chip through the first dielectric layer. The first adhesion layer on the first substrate extends over an area, which exceeds the first main surface.

Abstract: A power semiconductor package includes first power semiconductor dies attached to a metallization layer of at least one first power electronics carrier and second power semiconductor dies attached to a metallization layer of at least one second power electronics carrier. A first lead frame includes a first structured metal frame electrically connected to a load terminal of each first power semiconductor die, and a second structured metal frame electrically connected to a load terminal of each second power semiconductor die and to the metallization layer of the first power electronics carrier. A second lead frame above the first lead frame includes first and second leads electrically connected to the metallization layer of the second power electronics carrier, a third lead between the first and second leads and electrically connected to the first structured metal frame, and a fourth lead electrically connected to the second structured metal frame.

Abstract: A package includes a single integral electrically conductive body, a first chip with an integrated transistor and including a first terminal, a second terminal, and a third terminal, wherein the second terminal and the third terminal are formed on one main surface of the first chip and the first terminal is formed on an opposing main surface of the first chip, and a second chip with an integrated transistor and comprising a fourth, fifth and sixth terminals, wherein the fourth terminal and the sixth terminal are formed on one main surface of the second chip and the fifth terminal is formed on another surface of the second chip, wherein the first chip and the second chip are connected to form a half bridge.

Abstract: A semiconductor package is disclosed. In one example, the package includes a non-power chip including a first electrical contact arranged at a first main surface of the non-power chip. The semiconductor package further includes a power chip comprising a second electrical contact arranged at a second main surface of the power chip. A first electrical redistribution layer coupled to the first electrical contact and a second electrical redistribution layer coupled to the second electrical contact. When measured in a first direction vertical to at least one of the first main surface or the second main surface, a maximum thickness of at least a section of the first electrical redistribution layer is smaller than a maximum thickness of the second electrical redistribution layer.

Abstract: A device includes a first semiconductor chip including a first face, wherein a first contact pad is arranged over the first face. The device further includes a second semiconductor chip including a first face, wherein a first contact pad is arranged over the first face, wherein the first semiconductor chip and the second semiconductor chip are arranged such that the first face of the first semiconductor chip faces in a first direction and the first face of the second semiconductor chip faces in a second direction opposite to the first direction. The first semiconductor chip is located laterally outside of an outline of the second semiconductor chip.

Abstract: A method is disclosed. In one example, the method comprises mounting an electronic component on an adhesive base structure on a temporary carrier, and dissolving at least part of the base structure by irradiating the base structure with electromagnetic radiation to thereby release the electronic component.

Abstract: A power semiconductor module includes an encapsulation encapsulating power semiconductor dies. The encapsulation includes lateral sides connecting first and second opposite sides. First and second power contacts are electrically coupled to the power semiconductor dies. An isolation part arranged between the power contacts electrically isolates the contacts from one another. The power contacts have a flat shape and are stacked such that their broadest surfaces at least partially overlap. A first portion of the power contacts is parallel to a first plane. A second portion is twisted and/or bent with respect to the first portion such that the second portion is parallel to a second plane arranged at a non-zero angle with respect to the first plane. At least a part of the first portion is encapsulated by the encapsulation. At least a part of the second portion is exposed from the encapsulation at one of the lateral sides.

Abstract: A power semiconductor device includes: at least one substrate; at least one power semiconductor die arranged over the at least one substrate; a first leadframe arranged over the at least one power semiconductor substrate and over the at least one power semiconductor die, the first leadframe being arranged at least partially in a first plane and including one or more connecting portions extending out of the first plane in a first direction; and a second leadframe at least partially arranged in a second plane above or below the first plane and including one or more attachment sites. The one or more connecting portions extend into the second plane at the one or more attachment sites. The one or more connecting portions are arranged at a non-zero distance from the second leadframe, the non-zero distance being bridged by weld seams at the one or more attachment sites.

Abstract: A method for fabricating a semiconductor device includes providing a semiconductor die, arranging an electrical connector over the semiconductor die, the electrical connector including a conductive core, an absorbing feature arranged on a first side of the conductive core, and a solder layer arranged on a second side of the conductive core, opposite the first side and facing the semiconductor die, and soldering the electrical connector onto the semiconductor die by heating the solder layer with a laser, wherein the laser irradiates the absorbing feature and absorbed energy is transferred from the absorbing feature through the conductive core to the solder layer.

Abstract: A device includes a first semiconductor chip including a first face, wherein a first contact pad is arranged over the first face. The device further includes a second semiconductor chip including a first face, wherein a first contact pad is arranged over the first face, wherein the first semiconductor chip and the second semiconductor chip are arranged such that the first face of the first semiconductor chip faces in a first direction and the first face of the second semiconductor chip faces in a second direction opposite to the first direction. The first semiconductor chip is located laterally outside of an outline of the second semiconductor chip.

Abstract: A method of fabricating a semiconductor device package includes: providing a die carrier; disposing at least one semiconductor die on the die carrier, the semiconductor die comprising at least one contact pad on a main face remote from the carrier; electrically connecting the semiconductor die or another electrical device with an electrical connector; applying an encapsulant above the semiconductor die, the die carrier, and the electrical connector; and screwing a metallic drilling screw through the encapsulant so that an end of the drilling screw contacts the electrical connector.

Abstract: A semiconductor package includes a semiconductor die thermally coupled to a planar metal pad, an encapsulant body that encapsulates the semiconductor die and includes a recess that extends from an outer upper side of the encapsulant body towards a rear side of the planar metal pad, and an insert arranged within the recess that is thermally coupled to the planar metal pad and extends to the outer upper side of the encapsulant body, wherein the insert that is arranged within the recess includes a curable polymer compound.

Abstract: The semiconductor device package comprises a die carrier, at least one semiconductor die disposed on the carrier, the semiconductor die comprising at least one contact pad on a main face remote from the carrier, an encapsulant disposed above the semiconductor die, an electrical connector electrically connected with the contact pad, a drilling screw screwed through the encapsulant and connected with the electrical connector.

Abstract: A chip package is provided. The chip package includes an electrically conductive carrier structure, a first power chip on the carrier structure having a control contact pad and a second power chip on the carrier structure having a control contact pad. The first and second power chips are arranged with their respective control contact pad facing a redistribution layer. A logic chip is arranged with a logic contact pad facing a redistribution layer, wherein the redistribution layer connects the logic contact pad with the respective control pads of the power chips.

Abstract: A semiconductor device includes: a carrier including an electronic circuit; a plurality of semiconductor chip packages mounted on the carrier, each of the chip packages including an encapsulation encapsulating the semiconductor chip, a plurality of contact structures electrically connecting the semiconductor chip with the electronic circuit, and at least one cooling structure protruding from the encapsulation; and a cooling element thermally conductively connected to at least one cooling structure of each of at least two of the plurality of semiconductor chip packages.

Abstract: A method for fabricating a semiconductor device includes providing a semiconductor die, arranging an electrical connector over the semiconductor die, the electrical connector including a conductive core, an absorbing feature arranged on a first side of the conductive core, and a solder layer arranged on a second side of the conductive core, opposite the first side and facing the semiconductor die, and soldering the electrical connector onto the semiconductor die by heating the solder layer with a laser, wherein the laser irradiates the absorbing feature and absorbed energy is transferred from the absorbing feature through the conductive core to the solder layer.