Patents by Inventor Toshimitsu Konuma

Toshimitsu Konuma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6894312
    Abstract: Plurality of pixels (102) are arranged on the substrate. Each of the pixels (102) is provided with an EL element which utilizes as a cathode a pixel electrode (105) connected to a current control TFT (104). On a counter substrate (110), a light shielding film (112) is disposed at the position corresponding to periphery of each pixel (102), while a color filter (113) is disposed at the position corresponding to each of the pixels (102). This light shielding film makes the contour of the pixels clear, resulting in an image display with high definition. In addition, it is possible to fabricate the EL display device of the present invention with most of an existing manufacturing line for liquid crystal display devices. Thus, an amount of equipment investment can be significantly reduced, thereby resulting in a reduction in the total manufacturing cost.
    Type: Grant
    Filed: July 26, 2002
    Date of Patent: May 17, 2005
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Mayumi Mizukami, Toshimitsu Konuma
  • Publication number: 20050099120
    Abstract: To provide a method of improving an efficiency for extracting light in a self light-emitting device using an organic EL material. In the self light-emitting device having a structure in which an EL layer (102) is sandwiched between a transparent electrode (103) and a cathode (101), a film thickness of the EL layer (102) and a film thickness of the transparent electrode (102) are equivalent to the film thicknesses in which there is no occurrence of a guided light, and an inert gas is filled in a space between the transparent electrode (103) and a cover material (105).
    Type: Application
    Filed: December 22, 2004
    Publication date: May 12, 2005
    Inventors: Tetsuo Tsutsui, Toshimitsu Konuma, Mayumi Mizukami
  • Patent number: 6885027
    Abstract: A structure for reducing the OFF current of an active matrix display. In the active matrix display, plural TFTs are connected in series with each one pixel electrode. Of these TFTs connected in series, at least one TFT excluding the TFTs located at opposite ends is maintained in conduction. Alternatively, at least one capacitor is connected between the junction of the drain and source of each TFT connected in series and an AC grounded point. Thus, the amount of electric charge released from auxiliary capacitors during cutoff of the TFTs is reduced.
    Type: Grant
    Filed: October 10, 2002
    Date of Patent: April 26, 2005
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Yasuhiko Takemura, Toshiji Hamatani, Toshimitsu Konuma, Jun Koyama, Yuji Kawasaki, Shunpei Yamazaki
  • Patent number: 6872672
    Abstract: An object of the invention is reducing a manufacturing cost of an EL display device and an electronic device equipped therewith. In an active matrix type EL display device, an EL material for a pixel portion is formed by coating steps using a dispenser device. As a discharge port of the dispenser is made into a linear shape, the throughput is increased. Such the dispenser device is used, so that it is possible to simplify the EL layer forming steps, then, to reduce the manufacturing cost.
    Type: Grant
    Filed: August 16, 2002
    Date of Patent: March 29, 2005
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Mayumi Mizukami, Toshimitsu Konuma
  • Publication number: 20050064641
    Abstract: In etching using an etching solution, irradiating ultraviolet light is irradiated into a resist patterned on an etching substrate or a film formed on the etching substrate and then an etching solution is applied to the etching substrate while rotating the etching substrate. Also, ozone water is applied in contact with the resist and then an etching solution is applied to the etching substrate while rotating the etching substrate. In crystallization using a metal element such as nickel for promoting crystallization of silicon, irradiating ultraviolet light is irradiated into a resist patterned on an substrate or a film formed on the substrate and then a nickel solution is applied to the substrate while rotating the substrate. Also, ozone water is applied in contact with the resist and then the nickel solution is applied to the substrate while rotating the substrate.
    Type: Application
    Filed: November 1, 2004
    Publication date: March 24, 2005
    Applicant: Semiconductor Energy Laboratory Co., Ltd.
    Inventor: Toshimitsu Konuma
  • Publication number: 20050056832
    Abstract: There is provided an electronic device having high reliability and high color reproducibility. A pixel structure is made such that a switching FET (201) and an electric current controlling FET (202) are formed on a single crystal semiconductor substrate (11), and an EL element (203) is electrically connected to the electric current controlling FET (202). The fluctuation in characteristics of the electric current controlling FET (202) is very low among pixels, and an image with high color reproducibility can be obtained. By taking hot carrier measures in the electric current controlling FET (202), the electronic device having high reliability can be obtained.
    Type: Application
    Filed: October 5, 2004
    Publication date: March 17, 2005
    Inventors: Shunpei Yamazaki, Toshimitsu Konuma, Jun Koyama, Kazutaka Inukai, Mayumi Mizukami
  • Patent number: 6867431
    Abstract: A TFT formed on an insulating substrate source, drain and channel regions, a gate insulating film formed on at least the channel region and a gate electrode formed on the gate insulating film. Between the channel region and the drain region, a region having a higher resistivity is provided in order to reduce an Ioff current. A method for forming this structure comprises the steps of anodizing the gate electrode to form a porous anodic oxide film on the side of the gate electrode; removing a portion of the gate insulating using the porous anodic oxide film as a mask so that the gate insulating film extends beyond the gate electrode but does not completely cover the source and drain regions. Thereafter, an ion doping of one conductivity element is performed. The high resistivity region is defined under the gate insulating film.
    Type: Grant
    Filed: September 16, 1994
    Date of Patent: March 15, 2005
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Toshimitsu Konuma, Akira Sugawara, Yukiko Uehara, Hongyong Zhang, Atsunori Suzuki, Hideto Ohnuma, Naoaki Yamaguchi, Hideomi Suzawa, Hideki Uochi, Yasuhiko Takemura
  • Publication number: 20050029522
    Abstract: Failure light emission of an EL element due to failure film formation of an organic EL material in an electrode hole 46 is improved. By forming the organic EL material after embedding an insulator in an electrode hole 46 on a pixel electrode and forming a protective portion 41b, failure film formation in the electrode hole 46 can be prevented. This can prevent concentration of electric current due to a short circuit between a cathode and an anode of the EL element, and can prevent failure light emission of an EL layer.
    Type: Application
    Filed: August 30, 2004
    Publication date: February 10, 2005
    Inventors: Toshimitsu Konuma, Junya Maruyama
  • Patent number: 6853431
    Abstract: An improved liquid crystal device and manufacturing method for same are described. In the device, a pair of substrates, between which a liquid crystal layer is disposed, is joined with pillars inbetween functioning as spacers which are provided of photocurable resin by photolithography. With this structure, the spacers can be in surface contact with the inside surfaces of the substrates on which electrode arrangement and active devices are formed.
    Type: Grant
    Filed: November 27, 2002
    Date of Patent: February 8, 2005
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Masahiko Sato, Masakazu Odaka, Akira Mase, Toru Takayama, Kaoru Tabata, Chizuru Ishigaki, Ippei Kobayashi, Toshimitsu Konuma, Toshiharu Yamaguchi, Toshio Watanabe, Osamu Aoyagi, Hiroyuki Sakayori, Akio Osabe, Shunpei Yamazaki
  • Patent number: 6847163
    Abstract: To provide a method of improving an efficiency for extracting light in a self light-emitting device using an organic EL material. In the self light-emitting device having a structure in which an EL layer (102) is sandwiched between a transparent electrode (103) and a catrode (101), a film thickness of the EL layer (102) and a film thickness of the transparent electrode (102) are equivalent to the film thicknesses in which there is no occurrence of a guided light, and an inert gas is filled in a space between the transparent electrode (103) and a cover material (105).
    Type: Grant
    Filed: October 25, 2000
    Date of Patent: January 25, 2005
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Tetsuo Tsutsui, Toshimitsu Konuma, Mayumi Mizukami
  • Publication number: 20040256621
    Abstract: A TFT formed on an insulating substrate source, drain and channel regions, a gate insulating film formed on at least the channel region and a gate electrode formed on the gate insulating film. Between the channel region and the drain region, a region having a higher resistivity is provided in order to reduce an Ioff current. A method for forming this structure comprises the steps of anodizing the gate electrode to form a porous anodic oxide film on the side of the gate electrode; removing a portion of the gate insulating using the porous anodic oxide film as a mask so that the gate insulating film extends beyond the gate electrode but does not completely cover the source and drain regions. Thereafter, an ion doping of one conductivity element is performed. The high resistivity region is defined under the gate insulating film.
    Type: Application
    Filed: July 20, 2004
    Publication date: December 23, 2004
    Applicant: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Toshimitsu Konuma, Akira Sugawara, Yukiko Uehara, Hongyong Zhang, Atsunori Suzuki, Hideto Ohnuma, Naoaki Yamaguchi, Hideomi Suzawa, Hideki Uochi, Yasuhiko Takemura
  • Patent number: 6833560
    Abstract: Failure light emission of an EL element due to failure film formation of an organic EL material in an electrode hole 46 is improved. By forming the organic EL material after embedding an insulator in an electrode hole 46 on a pixel electrode and forming a protective portion 41b, failure film formation in the electrode hole 46 can be prevented. This can prevent concentration of electric current due to a short circuit between a cathode and an anode of the EL element, and can prevent failure light emission of an EL layer.
    Type: Grant
    Filed: February 13, 2001
    Date of Patent: December 21, 2004
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Toshimitsu Konuma, Junya Maruyama
  • Publication number: 20040216677
    Abstract: There is provided a film formation apparatus which is capable of forming an EL layer using an EL material with high purity. The EL material is purified by sublimation immediately before film formation in the film formation apparatus, to thereby remove oxygen, water, and another impurity, which are included in the EL material. Also, when film formation is performed using the EL material (high purity EL material) obtained by purifying with sublimation as an evaporation source, a high purity EL layer can be formed.
    Type: Application
    Filed: May 27, 2004
    Publication date: November 4, 2004
    Applicant: Semiconductor Energy Laboratory Co., Ltd, a Japan corporation
    Inventors: Shunpei Yamazaki, Toshimitsu Konuma, Takeshi Nishi
  • Patent number: 6809343
    Abstract: There is provided an electronic device having high reliability and high color reproducibility. A pixel structure is made such that a switching FET (201) and an electric current controlling FET (202) are formed on a single crystal semiconductor substrate (11), and an EL element (203) is electrically connected to the electric current controlling FET (202). The fluctuation in characteristics of the electric current controlling FET (202) is very low among pixels, and an image with high color reproducibility can be obtained. By taking hot carrier measures in the electric current controlling FET (202), the electronic device having high reliability can be obtained.
    Type: Grant
    Filed: June 5, 2003
    Date of Patent: October 26, 2004
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Toshimitsu Konuma, Jun Koyama, Kazutaka Inukai, Mayumi Mizukami
  • Patent number: 6773971
    Abstract: There is provided a method by which lightly doped drain (LDD) regions can be formed easily and at good yields in source/drain regions in thin film transistors possessing gate electrodes covered with an oxide covering. A lightly doped drain (LDD) region is formed by introducing an impurity into an island-shaped silicon film in a self-aligning manner, with a gate electrode serving as a mask. First, low-concentration impurity regions are formed in the island-shaped silicon film by using rotation-tilt ion implantation to effect ion doping from an oblique direction relative to the substrate. Low-concentration impurity regions are also formed below the gate electrode at this time. After that, an impurity at a high concentration is introduced normally to the substrate, so forming high-concentration impurity regions. In the above process, a low-concentration impurity region remains below the gate electrode and constitutes a lightly doped drain region.
    Type: Grant
    Filed: September 3, 1997
    Date of Patent: August 10, 2004
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Hongyong Zhang, Yasuhiko Takemura, Toshimitsu Konuma, Hideto Ohnuma, Naoaki Yamaguchi, Hideomi Suzawa, Hideki Uochi
  • Patent number: 6770562
    Abstract: There is provided a film formation apparatus which is capable of forming an EL layer using an EL material with high purity. The EL material is purified by sublimation immediately before film formation in the film formation apparatus, to thereby remove oxygen, water, and another impurity, which are included in the EL material. Also, when film formation is performed using the EL material (high purity EL material) obtained by purifying with sublimation as an evaporation source, a high purity EL layer can be formed.
    Type: Grant
    Filed: October 25, 2001
    Date of Patent: August 3, 2004
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Toshimitsu Konuma, Takeshi Nishi
  • Publication number: 20040141139
    Abstract: An active matrix liquid crystal display having improved reliability. Pixel regions and a peripheral driver circuit are integrally packed on the display. TFTs forming the peripheral driver circuit are located inside a sealing material layer on the side of a liquid crystal material, thus protecting the peripheral driver circuit from external moisture and contaminants. This enhances the long-term reliability of the peripheral driver circuit. Pixel TFTs are arranged in pixel regions. The leads going from the TFTs forming the peripheral driver circuit to the pixel TFTs are shortened. This results in a reduction in the resistance. As a result, the display characteristics are improved.
    Type: Application
    Filed: January 12, 2004
    Publication date: July 22, 2004
    Applicant: Semiconductor Energy Laboratory Co., Ltd., a Japan corporation
    Inventors: Shunpei Yamazaki, Jun Koyama, Yuji Kawasaki, Toshimitsu Konuma, Satoshi Teramoto, Yoshiharu Hirakata
  • Publication number: 20040135146
    Abstract: To provide an electronic device capable of bright image display. A pixel is structured such that a switching TFT and a current controlling TFT are formed on a substrate and an EL element is electrically connected to the current controlling TFT. A gate capacitor formed between a gate electrode of the current controlling TFT and an LDD region thereof holds a voltage applied to the gate electrode, and hence a capacitor (condenser) is not particularly necessary in the pixel, thereby making the effective light emission area of the pixel large.
    Type: Application
    Filed: December 23, 2003
    Publication date: July 15, 2004
    Applicant: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Toshimitsu Konuma, Jun Koyama, Kazutaka Inukai, Mayumi Mizukami
  • Patent number: 6759681
    Abstract: An object of the present invention is to provide an EL display device having a high operation performance and reliability. The switching TFT 201 formed within a pixel has a multi-gate structure, which is a structure which imposes an importance on reduction of OFF current value. Further, the current control TFT 202 has a channel width wider than that of the switching TFT to make a structure appropriate for flowing electric current. Morever, the LDD region 33 of the current control TFT 202 is formed so as to overlap a portion of the gate electrode 35 to make a structure which imposes importance on prevention of hot carrier injection and reduction of OFF current value.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: July 6, 2004
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Jun Koyama, Kunitaka Yamamoto, Toshimitsu Konuma
  • Publication number: 20040080694
    Abstract: A liquid-crystal electro-optical device is offered which can operate at high speeds and easily oriented. The value of the surface tension of liquid crystal-orienting layers is 40 dynes/cm or more, and these layers are rubbed in antiparallel directions to each other. This reduces the pretilt angle of the molecules of a nematic liquid crystal sandwiched between two substrates. The anisotropy of the dielectric constant of the nematic liquid crystal is positive.
    Type: Application
    Filed: December 8, 2003
    Publication date: April 29, 2004
    Applicant: Semiconductor Energy Laboratory Co., Ltd.
    Inventor: Toshimitsu Konuma