Abstract: An integrated circuit includes a main clock tree, a reference clock trunk, a reference clock buffer and a calibration circuit. The main clock tree transmits a main operation clock to an internal node via serially-coupled buffers to form a local clock at an internal node. The reference clock buffer transmits a main reference clock via the reference clock trunk to form a reference clock at a terminal node. The calibration circuit compares phases of the local clock and the reference clock to accordingly generate a control signal, so the main clock tree can adjust phase of the local clock according to the control signal.

Abstract: A diode includes a substrate, a first insulating layer, a second insulating layer, a well, a deep doped region, a first doped region, and a second doped region. The first insulating layer is disposed on the substrate. The second insulating layer is disposed on the substrate, and defines a cell region with the first insulating layer. The well is disposed on the substrate and beneath the cell region. The deep doped region is disposed in the well and beneath the cell region. The first doped region is disposed in the cell region and on the deep doped region. The second doped region is disposed adjacent to the first doped region. The second doped region is disposed on the deep doped region, and is electrically isolated from the well through the deep doped region and the first doped region.

Abstract: A receiver circuit including an external terminal, a level shifter, a reset circuit, and an inverting circuit is provided. The external terminal receives the external signal. The level shifter shifts a voltage swing range of the external signal to generate a level shifting signal. The level shifter includes a pull-up unit and a pull-down unit coupled in series. The pull-up unit and the pull-down unit are alternatively switched respectively according to the external signal and the internal signal, and thus a leakage path of the level shifter is cut off for different states of the external signal. The reset circuit couples the external terminal and the level shifter and provides a reset path according to the external signal for assisting the switching of the pull-up unit and the pull-down unit. The inverting circuit couples the level shifter and inverts the level shifting signal to generate the internal signal.

Abstract: A silicon controlled rectifier includes a substrate, a well, a deep doped region, a first doped region, a second doped region, a third doped region, and a fourth doped region. The well is disposed on the substrate and underneath a cell region. The deep doped region is disposed in the well. The first doped region has a first conductivity type, and is disposed in the well. The second doped region and third doped region have the first conductivity type and are disposed on the deep doped region. The fourth doped region has a second conductivity type, and is disposed between the second doped region and the third doped region. The fourth doped region is disposed on the deep doped region, and is electrically isolated from the well through the deep doped region, the second doped region, and the third doped region.

Abstract: A differential circuit system is provided. The differential circuit system includes: a different circuit set including a plurality of differential circuits, a voltage regulator, and a current drainage circuit set. The differential circuits are electrically connected between a first node and a second node, and each differential circuit generates a current flowing from the first node to the second node. A high voltage is provided to the first node and a low voltage is provided to the second node. The first node receives an external voltage. According to the first voltage, the voltage regulator generates the low voltage. The low voltage is provided to the second node. The current drainage circuit set generates a drainage current in between the second node and a ground voltage. A superposed current flowing to the voltage regulator is difference of the summation of currents minus the conducting current.

Abstract: An integrated circuit includes a main clock tree, a reference clock trunk, a reference clock buffer and a calibration circuit. The main clock tree transmits a main operation clock to an internal node via serially-coupled buffers to form a local clock at an internal node. The reference clock buffer transmits a main reference clock via the reference clock trunk to form a reference clock at a terminal node. The calibration circuit compares phases of the local clock and the reference clock to accordingly generate a control signal, so the main clock tree can adjust phase of the local clock according to the control signal.

Abstract: A signal transmission circuit is provided. The signal transmission circuit includes a first driving circuit including a first differential output pair, a plurality of input/output units and a calibration module. The first differential output pair includes a positive and a negative ends. The plurality of input/output units receive a positive and a negative control signals and generate a first superimposed current at the first differential output pair. The calibration module transmits a calibration signal to the first driving circuit. The calibration module sets operation of each of the input/output unit in the first driving circuit, and generates the first superimposed current flowing to a first external resistor according to the positive and the negative control signals.

Abstract: A differential circuit system is provided. The differential circuit system includes: a different circuit set including a plurality of differential circuits, a voltage regulator, and a current drainage circuit set. The differential circuits are electrically connected between a first node and a second node, and each differential circuit generates a current flowing from the first node to the second node. A high voltage is provided to the first node and a low voltage is provided to the second node. The first node receives an external voltage. According to the first voltage, the voltage regulator generates the low voltage. The low voltage is provided to the second node. The current drainage circuit set generates a drainage current in between the second node and a ground voltage. A superposed current flowing to the voltage regulator is difference of the summation of currents minus the conducting current.

Abstract: A two-stage post driver circuit includes a controlling circuit, a pull-up unit and a pull-down unit. A first N-type transistor of the pull-down unit and a first P-type transistor of the pull-up unit are both connected to an output pad. The controlling circuit is used for controlling the first N-type transistor and the first P-type transistor. Consequently, when the pull-up unit or the pull-down unit is turned on, the voltage difference between the drain terminal and the source terminal of the first N-type transistor or the first P-type transistor is lower than a voltage stress.

Abstract: A receiver circuit is provided which receives an external signal of high voltage and provides a corresponding internal signal of low voltage. The receiver circuit includes a voltage limiter, a level down shifter and an inverter of low operation voltage. The level down shifter has a front node and a back node, and includes a transistor with a gate and a source respectively coupled to the voltage limiter and the inverter at the front node and the back node. The voltage limiter limits level of the external signal transmitted to the front node, the level down shifter shifts down a signal of the front node by a cross voltage to generate a signal of the back node, and the inverter inverts the signal of the back node to generate the internal signal.

Abstract: A two-stage post driver circuit includes a controlling circuit, a pull-up unit and a pull-down unit. A first N-type transistor of the pull-down unit and a first P-type transistor of the pull-up unit are both connected to an output pad. The controlling circuit is used for controlling the first N-type transistor and the first P-type transistor. Consequently, when the pull-up unit or the pull-down unit is turned on, the voltage difference between the drain terminal and the source terminal of the first N-type transistor or the first P-type transistor is lower than a voltage stress.

Abstract: ESD protection circuit is provided, which includes a detection circuit, a trigger circuit and a clamp circuit. The detection circuit includes two stacked capacitors reflecting occurrence of ESD events. The trigger circuit includes three stacked transistors controlling triggering of the clamp circuit according to operation of the detection circuit. The clamp circuit includes two stacked transistors conducting ESD path when triggered.

Abstract: A two-stage post driver circuit includes a controlling circuit, a pull-up unit and a pull-down unit. A first N-type transistor of the pull-down unit and a first P-type transistor of the pull-up unit are both connected to an output pad. The controlling circuit is used for controlling the first N-type transistor and the first P-type transistor. Consequently, when the pull-up unit or the pull-down unit is turned on, the voltage difference between the drain terminal and the source terminal of the first N-type transistor or the first P-type transistor is lower than a voltage stress.

Abstract: A two-stage post driver circuit includes a controlling circuit, a pull-up unit and a pull-down unit. A first N-type transistor of the pull-down unit and a first P-type transistor of the pull-up unit are both connected to an output pad. The controlling circuit is used for controlling the first N-type transistor and the first P-type transistor. Consequently, when the pull-up unit or the pull-down unit is turned on, the voltage difference between the drain terminal and the source terminal of the first N-type transistor or the first P-type transistor is lower than a voltage stress.

Abstract: A two-stage post driver circuit includes a controlling circuit, a pull-up unit and a pull-down unit. A first N-type transistor of the pull-down unit and a first P-type transistor of the pull-up unit are both connected to an output pad. The controlling circuit is used for controlling the first N-type transistor and the first P-type transistor. Consequently, when the pull-up unit or the pull-down unit is turned on, the voltage difference between the drain terminal and the source terminal of the first N-type transistor or the first P-type transistor is lower than a voltage stress.

Abstract: For a negative-powered IC, an ESD protection circuit includes a negative voltage clamping circuit configured to provide a path for discharging ESD transient currents associated with different negative power supplies of the IC.

Abstract: A two-stage post driver circuit includes a controlling circuit, a pull-up unit and a pull-down unit. A first N-type transistor of the pull-down unit and a first P-type transistor of the pull-up unit are both connected to an output pad. The controlling circuit is used for controlling the first N-type transistor and the first P-type transistor. Consequently, when the pull-up unit or the pull-down unit is turned on, the voltage difference between the drain terminal and the source terminal of the first N-type transistor or the first P-type transistor is lower than a voltage stress.

Abstract: A receiver circuit is provided which receives an external signal of high voltage and provides a corresponding internal signal of low voltage. The receiver circuit includes a voltage limiter, a level down shifter and an inverter of low operation voltage. The level down shifter has a front node and a back node, and includes a transistor with a gate and a source respectively coupled to the voltage limiter and the inverter at the front node and the back node. The voltage limiter limits level of the external signal transmitted to the front node, the level down shifter shifts down a signal of the front node by a cross voltage to generate a signal of the back node, and the inverter inverts the signal of the back node to generate the internal signal.

Abstract: ESD protection circuit is provided, which includes a detection circuit, a trigger circuit and a clamp circuit. The detection circuit includes two stacked capacitors reflecting occurrence of ESD events. The trigger circuit includes three stacked transistors controlling triggering of the clamp circuit according to operation of the detection circuit. The clamp circuit includes two stacked transistors conducting ESD path when triggered.

Abstract: For a negative-powered IC, an ESD protection circuit includes a negative voltage clamping circuit configured to provide a path for discharging ESD transient currents associated with different negative power supplies of the IC.