Abstract: A method for forming a multi-gate semiconductor structure is provided. A substrate including a fin structure is received. First portions of the fin structure are removed to expose a source/drain region of the fin structure. A semiconductor layer is formed in the source/drain region. Second portions of the fin structure are removed to expose a channel region of the fin structure. A surface of the channel region of the fin structure is cleaned. An interfacial layer is formed over the cleaned surface of the channel region of the fin structure.

Abstract: Training data models using machine learning can include training a computer data model of data distribution using a training data set. The training data set includes training data and additional training data, and the training data and the additional training data being represented by layers of data representing the data distribution of the training data set. The computer data model using the additional training data is iteratively trained for each of the layers of the training data set. Statistical noise is added randomly to each of the layers of the training data set. Data variations are detected in each of the layers of the additional training data. The data variations are diluted in each of the additional layers of the training data, and the computer data model is retrained for the training data set using the diluted data variations in each of the layers of the additional training data.

Abstract: A computer-implemented process for modifying a training dataset includes the following operations. The training dataset is benchmarked using a State Of The Art (SOTA) neural network to determine a benchmark for the training dataset. The training set is divided into a plurality of slices. A sequence of a plurality of atomic operations are selected using a selection strategy generator operating on one of the plurality of slices. The sequence of the plurality of atomic operations is applied to modify the one of the plurality of slices to generate a revised one of the plurality of slices. Reverse reinforcement learning is performed on the revised one of the plurality of slices using the benchmark and the SOTA neural network. The training dataset is modified by replacing the one of the plurality of slices with the revised one of the plurality of slices to generate a modified training dataset.

Abstract: Described are an ethylene-vinyl alcohol (EVOH) copolymer composition, and a preparation method therefor. The composition contains an EVOH copolymer, element potassium, and element sodium, wherein the mass ratio of element sodium to element potassium is 0.1:1 to 1:1. By controlling the contents of element sodium and element potassium in an EVOH resin composition to fall within a specific proportion range, the heat resistance of the resulting EVOH resin composition is greatly improved, the initial decomposition temperature can be increased to 370-400° C., the maximum decomposition temperature can be increased to 400-440° C., and thus EVOH resin can adapt to the process requirement for a higher processing temperature. Moreover, further adding acyl-containing carboxylic acid and a phosphorus-containing compound/boron-containing compound can improve the thermal yellowing resistance of the EVOH resin composition, where the value of the yellowing index (YI) after 5-hour thermal treatment at 150° C.

Abstract: A system for calibrating a three-dimensional scanning device includes a structured-light scanner capable of performing a structured-light operation, and a processor that performs calibration on a device under calibration (DUC). The structured-light scanner captures a base image by performing the structured-light operation prior to calibration. The structured-light scanner captures a calibration image with respect to corresponding DUC during calibration, and the calibration image is inputted to the processor, which determines transformation mapping from the calibration image to the base image. The determined transformation is then transferred to the DUC during calibration.

Abstract: A high electron mobility transistor (HEMT) includes a substrate, a channel layer disposed on the substrate, a barrier layer disposed on the channel layer, a first passivation layer disposed on the barrier layer, a plurality of trenches through at least a portion of the first passivation layer, and a conductive plate structure disposed on the first passivation layer. The conductive plate structure includes a base portion over the trenches and a plurality of protruding portions extending from a lower surface of the base portion and into the trenches.

Abstract: A depth processor including a region of interest determination circuit and a depth decoder is provided. The region of interest determination circuit is configured to determine a size of a region of interest of an input image. The depth decoder is coupled to the region of interest determination circuit and configured to generate a depth map of the input image according to a filter size. The filter size is set according to the size of the region of interest of the input image.

Abstract: A semiconductor wafer defect detection system captures test images of a semiconductor wafer. The system analyzes the test images with an analysis model trained with a machine learning process. The analysis model generates simulated integrated circuit layouts based on the test images. The system detects defects in the semiconductor wafer by comparing the simulated integrated circuit layouts to reference integrated circuit layouts.

Abstract: A method includes forming isolation regions extending into a semiconductor substrate. A semiconductor strip is between the isolation regions. The method further includes recessing the isolation regions so that a top portion of the semiconductor strip protrudes higher than top surfaces of the isolation regions to form a semiconductor fin, measuring a fin width of the semiconductor fin, generating an etch recipe based on the fin width, and performing a thinning process on the semiconductor fin using the etching recipe.

Abstract: A method of computing power service and a device are provided. The method is performed by a first terminal and includes: receiving first indication information from a second terminal, where the first indication information is used to indicate that the second terminal expects the first terminal to perform computing processing on target data; performing computing processing on the target data to obtain a processing result; and sending the processing result to the second terminal.

Abstract: A semiconductor device includes a substrate having thereon at least one active area and at least one trench isolation region adjacent to the at least one active area. A charge trapping structure is disposed on the at least one active area and at least one trench isolation region. At least one divot is disposed in the at least one trench isolation region adjacent to the charge trapping structure. A silicon oxide layer is disposed in the at least one divot. A gate oxide layer is disposed on the at least one active area around the charge trapping structure.

Abstract: Provided is a device for verifying a radiotherapy system, including at least two of a first verification phantom, a second verification phantom, and a third verification phantom, wherein a slot for holding a film is provided in the first verification phantom, a first positioning member is disposed at a center of the second verification phantom, a second positioning member is disposed at a center of the third verification phantom, and a center point of the first verification phantom, a center point of the first positioning member and a center point of the second positioning member are coaxial.

Abstract: A method for forming a high electron mobility transistor includes the steps of forming an epitaxial stack on a substrate, forming a gate structure on the epitaxial stack, forming an insulating layer covering the epitaxial stack and the gate structure, forming a passivation layer on the insulating layer, forming an opening on the gate structure and through the passivation layer to expose the insulating layer, and removing a portion of the insulating layer through the opening to form an air gap between the gate structure and the passivation layer.

Abstract: A semiconductor wafer defect detection system captures test images of a semiconductor wafer. The system analyzes the test images with an analysis model trained with a machine learning process. The analysis model generates simulated integrated circuit layouts based on the test images. The system detects defects in the semiconductor wafer by comparing the simulated integrated circuit layouts to reference integrated circuit layouts.

Abstract: Aspects of the subject disclosure may include, for example, obtaining a list of a plurality of communication channels, each communication channel being associated with at least one respective feature of a plurality of features; correlating each communication channel in the list with at least one respective user response of a plurality of user responses; receiving an identification of a new communication channel that does not exist in the list, the new communication channel being associated with at least one feature of the plurality of features; determining, based upon the at least one feature that is associated with the new communication channel, with which one or more of the plurality of communication channels in the list the new communication channel is similar, resulting in a determination; and assigning, based upon the determination, at least one of the plurality of user responses to the new communication channel. Other embodiments are disclosed.

Abstract: An enclosure for receiving a plurality of storage components is provided. The enclosure includes a deck, a top cover, a front panel, a stress distributing member, and a pair of component housings. The front panel is disposed between the deck and the top cover disposed over the deck. The stress distributing member traverses an entire width of the deck and is fastened to the deck and the top cover. A front section is defined between the front panel and the stress distributing member. The component housings are arranged in the front section. Each of the component housings has a front end facing outward the enclosure and a back end facing inward the enclosure. Each of the component housings is configured to receive at least a set of one or more of the storage components, and ends of the stress distributing member extend beyond the front ends of the component housings.

Abstract: A server system comprises a deck, a front panel arranged on the deck and defining a collecting space; two doors arranged on opposite sides of the deck, and being perpendicular to the front panel; two receiving frame structures arranged between the doors in a back to back arrangement, and configured to receive multiple rows and columns of a plurality of storage drives horizontally, wherein two periphery corridors are each defined between one of the doors and one of the receiving frame structure facing the one door; two circuit boards arranged between the two receiving frame structures, wherein the two circuit boards comprise a plurality of slits, wherein a central corridor is defined between the two circuit boards; a storage cover disposed above the deck over the two periphery corridors, the central corridor, the two receiving frame structures, and the two circuit boards.

Abstract: A method and an apparatus for determining a transmission delay, a device, and a storage medium are provided. The method includes: obtaining first information; and determining a first delay based on the first information. The first information includes an internal processing delay of a server or a server processing resource, and the first delay includes a delay between a terminal and a gateway.

Abstract: A method, computer program product and computer system to provide topic guide during document drafting is provided. A processor retrieves at least one section of text from a document. A processor receives a target topic for the document. A processor extracts at least one local topic from the at least one section of text. A processor generates a semantic network comprising the at least one local topic and the target topic. A processor determines a deviation value for the at least one local topic based on a distance between the at least one local topic and the target topic in the semantic network. A processor, in response to the deviation value exceeding a threshold value, alerts a user that the at least one section of text from the document is off-topic from the target topic.