Abstract: A memory device includes a memory array, a multiply-accumulate (MAC) circuit and an encoder-decoder circuit. The MAC circuit performs a MAC operation on an encoded weight data stored in the memory array and an input data to generate a partial MAC result. An encoder of the encoder-decoder circuit is configured to encode m weight bits among n weight bits of weight data according to an encryption key to generate the encoded weight data, wherein m and n are positive integers, and m is less than n. A decoder of the encoder-decoder circuit is configured to detect an error in the partial MAC result according to the encryption key to generate a decoded partial MAC result.

Abstract: A computing circuit is provided. The computing circuit is disposed in a memory device and electrically coupled to a memory cell of the memory device. The computing circuit includes a weight decoder, a multiplier, an adder tree, and an accumulator. The weight decoder is configured to obtain a compressed weight from the memory cell and generate a decoded weight based on the compressed weight. The multiplier is configured to generate a partial-product by multiplying an input signal with the decoded weight. The adder tree is configured to generate a partial-sum by performing an addition operation based on the partial-product. The accumulator is configured to generate an accumulated sum by performing an accumulation operation based on the partial-sum and output an output signal based on the accumulated sum. The accumulated sum is left shifted based on a shift signal.

Abstract: An encoding system may be provided. The encoding system may comprise a first stage and a second stage. The first stage may be configured to receive a first input, decode the first input, and produce a first output comprising the decoded first input. The second stage may be configured to receive a second input, receive the first output from the first stage, and convert the first input and the second input from a first coding system to a second coding system based on the second input and the first output. The second stage may produce a second output comprising the converted first input and the converted second input.

Abstract: An Input/Output (I/O) circuit for a memory device is provided. The I/O circuit includes a charge integration circuit coupled to a bitline of the memory device. The charge integration circuit provides a sensing voltage based on a decrease of a voltage on the bitline. A comparator is coupled to the charge integration circuit. The comparator compares the sensing voltage with a reference voltage and provides an output voltage based on the comparison. A time-to-digital converter coupled to the comparator. The time-to-digital convertor converts a time associated with the output voltage to a digital value.

Abstract: Various embodiments provide methods for configuring a phase-change random-access memory (PCRAM) structures, such as PCRAM operating in a single-level-cell (SLC) mode or a multi-level-cell (MLC) mode. Various embodiments may support a PCRAM structure being operating in a SLC mode for lower power and a MLC mode for lower variability. Various embodiments may support a PCRAM structure being operating in a SLC mode or a MLC mode based at least in part on an error tolerance for a neural network layer.

Abstract: A circuit includes a reference voltage node, first and second data lines, a sense amplifier, first and second switching devices coupled between the first and second data lines and first and second input terminals of the sense amplifier, third and fourth switching devices coupled between the first and second data lined and first and second nodes, fifth and sixth switching devices coupled between the first and second nodes and the reference voltage node, and first and second capacitive devices coupled between the first and second nodes and second and first input terminals. Each of the first through fourth switching devices is switched on and each of the fifth and sixth switching devices is switched off in a first operational mode, and each of the first through fourth switching devices is switched off and each of the fifth and sixth switching devices is switched on in a second operational mode.

Abstract: A computation apparatus and a computation method with input swapping are provided. The computation apparatus includes a non-zero detection circuit, a swapper policy circuit, a swapper matrix circuit, and an adder tree. The non-zero detection circuit is configured to receive input vectors, inspect non-zero operands in the input vectors and generate a non-zero indicative signal indicating the non-zero operands. The swapper policy circuit is configured to receive and interpret the non-zero indicative signal, and generate multiplexer (MUX) selection signals for swapping the non-zero operands according to a set of swapping policies. The swapper matrix circuit is configured to receive the input vectors and the MUX selection signal, and perform swapping on operands in the input vectors according to the MUX selection signal. The adder tree is configured to receive the input vectors with the swapped operands and perform additions on the input vectors to output a computation result.

Abstract: A memory test circuit is provided. The memory test circuit is disposed in a memory chip and electrically coupled to a memory macro of the memory chip. A high speed clock receives an input signal and an external clock signal. The input signal includes a plurality of test bits. A finite state machine controller provides a pattern type. A pattern generator generates and provides a test signal to at least one memory cell of the memory chip to write the test signal to the at least one memory cell based on the pattern type and the external clock signal. A test frequency of the test signal is determined based on the high speed clock. An output comparator outputs a comparison signal based on a difference between the test signal and a readout signal corresponding to the test signal read from the at least one memory cell.

Abstract: A memory test circuit is provided. The memory test circuit is disposed in a memory array and including: a test array, including test cells out of memory cells of the memory array; a write multiplexer, configured to selectively output one of a test signal and a reference voltage based on a write measurement signal, wherein the test signal is output to write into at least one test cell and the reference voltage is output to a sense amplifier; and a read multiplexer, configured to selectively receive and output one of a readout signal corresponding to the test signal and an amplified signal based on a read measurement signal, wherein the readout signal is read from the at least one test cell and the amplified signal is obtained for a read margin evaluation from the sense amplifier by amplifying a voltage difference between the readout signal and the reference voltage.

Abstract: A circuit includes a sense amplifier, a first clamping circuit, a second clamping circuit, and a feedback circuit. The first clamping circuit includes first clamping branches coupled in parallel between the sense amplifier and a memory array. The second clamping circuit includes second clamping branches coupled in parallel between the sense amplifier and a reference array. The feedback circuit is configured to selectively enable or disable one or more of the first clamping branches or one or more of the second clamping branches in response to an output data outputted by the sense amplifier.

Abstract: The disclosure provides a method for controlling a sense amplifier. The control device includes a latch circuit and a control circuit. The latch circuit receives a plurality of memory data signals from the sense amplifier, wherein the latch circuit respectively generates a plurality of reference data signals based on the plurality of memory data signals. The control circuit is coupled to the latch circuit, provides an enable signal to the sense amplifier in response to a pass gate signal of the sense amplifier, and stops providing the enable signal in response to at least one of the plurality of reference data signals, wherein the enable signal controls a sensing period of the sense amplifier.

Abstract: A memory array, a memory structure and an operation method of a memory array are provided. The memory array includes memory cells, floating gate transistors, bit lines and word lines. The memory cells each comprise a capacitor and an electrically programmable non-volatile memory (NVM) serially connected to the capacitor, and further comprise a write transistor with a first source/drain terminal coupled to a common node of the capacitor and the electrically programmable NVM. The floating gate transistors respectively have a gate terminal electrically floated and coupled to the capacitors of a column of the memory cells. The bit lines respectively coupled to the electrically programmable NVMs of a row of the memory cells. The word lines respectively coupled to gate terminals of the write transistors in a row of the memory cells.

Abstract: A memory device and a semiconductor die are provided. The memory device includes single-level-cells (SLCs) and multi-level-cells (MLCs). Each of the SLCs and the MLCs includes: a phase change layer; and a first electrode, in contact with the phase change layer, and configured to provide joule heat to the phase change layer during a programming operation. The first electrode in each of the MLCs is greater in footprint area as compared to the first electrode in each of the SLCs.

Abstract: A memory device, such as a MRAM device, includes a plurality of memory macros, where each includes an array of memory cells and a first ECC circuit configured to detect data errors in the respective memory macro. A second ECC circuit that is remote from the plurality of memory macros is communicatively coupled to each of the plurality of memory macros. The second ECC circuit is configured to receive the detected data errors from the first ECC circuits of the plurality of memory macros and correct the data errors.

Abstract: A method includes: generating a first difference between a first resistance value of a first memory cell and a first predetermined resistance value; generating a first signal based on the first difference; applying the first signal to the first memory cell to adjust the first resistance value; and after the first signal is applied to the first memory cell, comparing the first resistance value and the first predetermined resistance value, to further adjust the first resistance value until the first resistance value reaches the first predetermined resistance value. A memory device is also disclosed herein.

Abstract: A method of storing an input data of a data set into a memory storage having bit cells. The method includes determining a bit value of a characterization bit in the input data. The method also includes writing each of remaining bits in the input data into one of the bit cells as a first state if the characterization bit has a first value, and writing each of remaining bits in the input data into the bit cells as a second state if the characterization bit has a second value that is complement to the first value. In the method, either reading the bit cell with the first state consumes less energy than reading the bit cell with the second state or the bit cell with the first state has less retention errors than the bit cell with the second state.

Abstract: The sense amplifier circuit includes a differential amplifier, a first switch, and a second switch. The differential amplifier includes a first input node, a second input node, a first output node, and a second output node. The differential amplifier amplifies a voltage difference of the first output node and the second output node according to a first input voltage of the first input node and a second input voltage of the second input node. A control node of the first (second) switch is coupled to a control line, the first (second) switch is coupled to the first (second) input node, and the first (second) switch is coupled to the first (second) output node. The first (second) switch pre-charges the first (second) input node by a first (second) output voltage of the first (second) output node while the control line is received a select signal.

Abstract: The disclosure introduces a shift register is configured to enter a low power mode by disabling a portion of flip-flops (FFs) that handles upper bits of input data. The shift register includes first FF(s), second FF(s) and gating circuit. The first flip-flop (FF), includes input terminal coupled to first portion of input data. The second FF includes input terminal coupled to second portion of input data, an output terminal, a clock terminal coupled to a clock signal, a power terminal coupled to a supply power. The second portion of the input data is subsequent to the first portion of the input data. The gating circuit is coupled to the output terminal of the first FF, and configured to disable the second FF for storing the second portion of a subsequent input data according to output data currently being stored in the first FF.

Abstract: Disclosed is a methods and apparatus which can improve defect tolerability of a hardware-based neural network. In one embodiment, a method for performing a calculation of values on first neurons of a first layer in a neural network, includes: receiving a first pattern of a memory cell array; determining a second pattern of the memory cell array according to a third pattern; determining at least one pair of columns of the memory cell array according to the first pattern and the second pattern; switching input data of two columns of each of the at least one pair of columns of the memory cell array; and switching output data of the two columns in each of the at least one pair of columns of the memory cell array so as to determine the values on the first neurons of the first layer.

Abstract: A memory device includes a set of word lines, a set of bit lines, a source line having first and second source line contacts, a set of transistors serially coupled between the first and second source line contacts of the source line, and a set of data storage elements. The set of transistors has gates coupled to corresponding word lines in the set of word lines. Each data storage element in the set of data storage elements is coupled between a common terminal of a corresponding pair of adjacent transistors in the set of transistors, and a corresponding bit line in the set of bit lines.