Abstract: A non-volatile memory device and a method for programming a non-volatile memory device are provided. The non-volatile memory device includes a memory array and a memory controller. The memory array includes a plurality of memory cells. The memory controller is configured to regulate a programming operation by applying a program pulse generated according to a set pulse and a reset pulse to each of the memory cells. The memory controller determines whether a memory cell resistance of each of the memory cells is within a target range and apply the program pulse to each of the memory cells until the memory cell resistances of all of the memory cells are within the target range.

Abstract: A memory device that includes a memory array and a memory controller is introduced. The memory controller is configured to adjust a program strength of the program pulse according to the configurable ratio of the first bit value and the second bit value to generate an adjusted program pulse or to adjust a bias voltage pair according to the configurable ratio of the first bit value and the second bit value to generate an adjusted bias voltage pair. The memory controller is further configured to generate the random bit stream with the configurable ratio of the first bit value and the second bit value according to the data stored in the plurality of memory cells included in the memory array after applying the adjusted program pulse or according to the data stored in the plurality of memory cells after being biased by the adjusted bias voltage pair.

Abstract: An encode apparatus and an encode method may be provided. The encoding apparatus may comprise a first stage and a second stage. The first stage may be configured to receive a first input, decode the first input, and produce a first output comprising the decoded first input. The second stage may be configured to receive a second input, receive the first output from the first stage, and convert the first input and the second input from a first coding system to a second coding system based on the second input and the first output. The second stage may produce a second output comprising the converted first input and the converted second input.

Abstract: A system includes at least one processor, a memory device and a dropout device. The at least one processor is configured to establish a neural network that comprises a first layer and a second layer. The memory device is coupled to the at least one processor and configured to store a plurality of weight values that are associated with the first layer and the second layer in the neural network. The dropout device is configured to deny an assessment to at least one of the plurality of weight values stored in the memory device, in response to a dropout control signal, and the second layer of the neural network being computed regardless of the at least one of the plurality of weight values that is not accessed. A method is also disclosed herein.

Abstract: A method includes: applying a first signal to memory cells in a memory device, to adjust resistance values of the memory cells; after applying the first signal, applying a second signal to the memory cells other than a first memory cell in the memory cells, to further adjust the resistance values of the memory cells other than the first memory cell. A memory device is also disclosed herein.

Abstract: A method is disclosed including following operations. A first signal is applied to memory cells in a memory device, to adjust resistance values of the memory cells. After the first signal is applied, a second signal is applied to the memory cells other than the first memory cell, to further adjust the resistance values of the plurality of memory cells other than the first memory cell. After the second signal is applied, data corresponding to the first predetermined resistance value and the second predetermined resistance value is stored in the first memory cell and the second memory cell, respectively. The first signal is configured for controlling a first memory cell in the memory cells to have a first predetermined resistance value. The second signal is configured for controlling a second memory cell in the memory cells to have a second predetermined resistance value.

Abstract: A method is disclosed including following operations. A first signal is applied to memory cells in a memory device, to adjust resistance values of the memory cells. After the first signal is applied, a second signal is applied to the memory cells other than the first memory cell, to further adjust the resistance values of the plurality of memory cells other than the first memory cell. After the second signal is applied, data corresponding to the first predetermined resistance value and the second predetermined resistance value is stored in the first memory cell and the second memory cell, respectively. The first signal is configured for controlling a first memory cell in the memory cells to have a first predetermined resistance value. The second signal is configured for controlling a second memory cell in the memory cells to have a second predetermined resistance value.

Abstract: Disclosed is a methods and apparatus which can improve defect tolerability of a hardware-based neural network. In one embodiment, a method for performing a calculation of values on first neurons of a first layer in a neural network, includes: receiving a first pattern of a memory cell array; determining a second pattern of the memory cell array according to a third pattern; determining at least one pair of columns of the memory cell array according to the first pattern and the second pattern; switching input data of two columns of each of the at least one pair of columns of the memory cell array; and switching output data of the two columns in each of the at least one pair of columns of the memory cell array so as to determine the values on the first neurons of the first layer.

Abstract: A memory device, such as a MRAM device, includes a plurality of memory macros, where each includes an array of memory cells and a first ECC circuit configured to detect data errors in the respective memory macro. A second ECC circuit that is remote from the plurality of memory macros is communicatively coupled to each of the plurality of memory macros. The second ECC circuit is configured to receive the detected data errors from the first ECC circuits of the plurality of memory macros and correct the data errors.

Abstract: A selective bit-line sensing method is provided. The selective bit-line sensing method includes the steps of: generating a neuron weights information, the neuron weights information defines a distribution of 0's and 1's storing in the plurality of memory cells of the memory array; and selectively determining either the plurality of bit-lines or the plurality of complementary bit-lines to be sensed in a sensing operation according to the neuron weights information. When the plurality of bit-lines are determined to be sensed, the plurality of first word-lines are activated by the artificial neural network system through the selective bit-line detection circuit, and when the plurality of complementary bit-lines are determined to be sensed, the plurality of second word-lines are activated by the artificial neural network system.

Abstract: A method and a circuit for generating a reference voltage are provided. The circuit includes: a first column of dummy neurons with weight 0 and a second column of dummy neurons with weight 1, wherein the plurality word-lines are connected to the dummy neurons in the first and second columns, respectively; a bit-line connected to a voltage source and the first column of dummy neurons; a complementary bit-line is connected to the voltage source and the second column of dummy neurons, wherein when the artificial neural network system is operated to sense the neurons of the memory cell array, one or more of the plurality of word-lines are activated, and the corresponding dummy neurons of the first column and the second column are activated to generate the reference voltage at the output end for sensing the neurons of the memory cell array.

Abstract: A control method for a solid state storage device is provided. Firstly, an elapsed time period of the solid state storage device is counted when the solid state storage device is in a normal working state. Then, a read refresh operation is performed on a memory array of the solid state storage device at a first time interval.

Abstract: A first memory cell including a phase change material. The first memory cell is programmable to store one data value of a plurality of data values. The plurality of data values are represented by a plurality of non-overlapping ranges of resistance of the first memory cell. At least one testing pulse is applied to the first memory cell to establish a cell resistance of the first memory cell in an intermediate range of resistance, the intermediate range of resistance in between first and second adjacent ranges in the plurality of non-overlapping ranges of resistance representing the plurality of data values. After applying the at least one testing pulse to the first memory cell, it is determined whether to apply at least one healing pulse to repair the first memory cell, depending on relative values of (i) the cell resistance in the intermediate range of resistance and (ii) a reference resistance in the intermediate range of resistance.

Abstract: A memory circuit is described that includes an array of memory cells including a plurality of blocks. The circuit includes a controller including logic to execute program sequences for selected blocks in the plurality of blocks. The program sequences include patterns of program/verify cycles. The circuit includes logic to assign different patterns of program/verify cycles to different blocks in the plurality of blocks. The circuit includes logic to change a particular pattern assigned to a particular block in the plurality of blocks. The circuit includes logic to maintain statistics for blocks in the plurality of blocks, about performance of cells in the blocks in response to the patterns of program/verify cycles assigned to the blocks. The controller includes logic to apply a stress sequence to one of the selected blocks, the stress sequence including stress pulses applied to memory cells in the one of the selected blocks.

Abstract: A method is provided for operating a memory device including an array of memory cells including programmable resistive memory elements. Memory cells in the array are programmed to store data by applying program pulses to the memory cells to establish resistance levels within a number N of specified ranges of resistance, where each of the specified ranges corresponds to a particular data value. A drift recovery process is executed to the memory cells, including applying a recovery pulse having a pulse shape to a set of programmed memory cells, where memory cells in the set have resistance levels within two or more of the specified resistance ranges.

Abstract: A method for programming a memory device comprises the following steps: performing an interleaving programming, including: programming a first memory cell during a first time interval and correspondingly verifying the first memory cell during a second time interval; programming a second memory cell during a third time interval and correspondingly verifying the second memory cell during a fourth time interval between the first and second time intervals; and inserting at least one dummy cycle between the first and second time intervals to ensure that a resistance change per unit of time of the first memory cell is less than a threshold.

Abstract: A method for programming a memory device comprises the following steps: performing an interleaving programming, including: programming a first memory cell during a first time interval and correspondingly verifying the first memory cell during a second time interval; programming a second memory cell during a third time interval and correspondingly verifying the second memory cell during a fourth time interval between the first and second time intervals; and inserting at least one dummy cycle between the first and second time intervals to ensure that a resistance change per unit of time of the first memory cell is less than a threshold.

Abstract: A first memory cell including a phase change material. The first memory cell is programmable to store one data value of a plurality of data values. The plurality of data values are represented by a plurality of non-overlapping ranges of resistance of the first memory cell. At least one testing pulse is applied to the first memory cell to establish a cell resistance of the first memory cell in an intermediate range of resistance, the intermediate range of resistance in between first and second adjacent ranges in the plurality of non-overlapping ranges of resistance representing the plurality of data values. After applying the at least one testing pulse to the first memory cell, it is determined whether to apply at least one healing pulse to repair the first memory cell, depending on relative values of (i) the cell resistance in the intermediate range of resistance and (ii) a reference resistance in the intermediate range of resistance.

Abstract: A memory circuit is described that includes an array of memory cells including a plurality of blocks. The circuit includes a controller including logic to execute program sequences for selected blocks in the plurality of blocks. The program sequences include patterns of program/verify cycles. The circuit includes logic to assign different patterns of program/verify cycles to different blocks in the plurality of blocks. The circuit includes logic to change a particular pattern assigned to a particular block in the plurality of blocks. The circuit includes logic to maintain statistics for blocks in the plurality of blocks, about performance of cells in the blocks in response to the patterns of program/verify cycles assigned to the blocks. The controller includes logic to apply a stress sequence to one of the selected blocks, the stress sequence including stress pulses applied to memory cells in the one of the selected blocks.

Abstract: A method for healing phase-change memory device includes steps as follows: At least one memory cell comprising a phase-change material with a shifted current-resistance characteristic function (shifted I-R function) is firstly provided. A healing stress is then applied to the phase-change material to transform the shifted I-R function into an initial current-resistance characteristic function (initial I-R function), wherein the shifted I-R function is a translation function of the initial I-R function.