Abstract: A control circuit, a memory system and a control method are provided. The control circuit is configured to control a plurality of memory cells of a memory array. The control circuit comprises a program controller. The program is configured to program a first electrical characteristic distribution and a second electrical characteristic distribution of the memory cells according to error tolerance of a first bit of a data type. A first overlapping area between the first electrical characteristic distribution and the second electrical characteristic distribution is smaller than a first predetermined value.

Abstract: Disclosed is a methods and apparatus which can improve defect tolerability of a hardware-based neural network. In one embodiment, a method for performing a calculation of values on first neurons of a first layer in a neural network, includes: receiving a first pattern of a memory cell array; determining a second pattern of the memory cell array according to a third pattern; determining at least one pair of columns of the memory cell array according to the first pattern and the second pattern; switching input data of two columns of each of the at least one pair of columns of the memory cell array; and switching output data of the two columns in each of the at least one pair of columns of the memory cell array so as to determine the values on the first neurons of the first layer.

Abstract: A memory array, a memory structure and an operation method of a memory array are provided. The memory array includes memory cells, floating gate transistors, bit lines and word lines. The memory cells each comprise a capacitor and an electrically programmable non-volatile memory (NVM) serially connected to the capacitor, and further comprise a write transistor with a first source/drain terminal coupled to a common node of the capacitor and the electrically programmable NVM. The floating gate transistors respectively have a gate terminal electrically floated and coupled to the capacitors of a column of the memory cells. The bit lines respectively coupled to the electrically programmable NVMs of a row of the memory cells. The word lines respectively coupled to gate terminals of the write transistors in a row of the memory cells.

Abstract: A device includes a write bit line and a read bit line extending in a first direction, and a write word line and a read word line extending in a second direction perpendicular to the first direction. The device further includes a memory cell including a write transistor and a read transistor. The write transistor includes a first gate connected to the write word line, a first source/drain connected to the write bit line, and a second source/drain connected to a data storage node. The read transistor includes a second gate connected to the data storage node, a third source/drain connected to the read bit line, and a fourth source/drain connected to the read word line.

Abstract: Memory systems and operating method of a memory system are provided. The memory system utilized for performing a computing-in-memory (CiM) operation comprises a memory array and a processing circuit. The memory array comprises a plurality of memory cells. The processing circuit is coupled to the memory array and comprises a programming circuit and a control circuit. The programming circuit is coupled to the memory array and configured to perform a write operation for programming electrical characteristics of the memory cells. The control circuit is coupled to the programming circuit and configured to: receive a plurality of weight data corresponding to a plurality of weight values; and control the write operation performed by the programming circuit, so the electrical characteristics of the memory cells are programmed following a sequential order of the weight values.

Abstract: A programming circuit includes a time difference converter circuit and a pulse generator circuit. The converter circuit is configured to receive a first pulse from a first neuron device and a second pulse from a second neuron device, and to output a time difference signal corresponding to a time difference between the first pulse and the second pulse. The pulse generator circuit includes an input coupled to the output of the time difference converter circuit to receive the time difference signal, and an output at which the pulse generator circuit is configured to output a program voltage corresponding to the time difference signal. The output of the pulse generator circuit is configured to be coupled to a synapse device coupled between the first neuron device and the second neuron device to program a weight value in the synapse device with the program voltage.

Abstract: A memory device, such as a MRAM device, includes a plurality of memory macros, where each includes an array of memory cells and a first ECC circuit configured to detect data errors in the respective memory macro. A second ECC circuit that is remote from the plurality of memory macros is communicatively coupled to each of the plurality of memory macros. The second ECC circuit is configured to receive the detected data errors from the first ECC circuits of the plurality of memory macros and correct the data errors.

Abstract: A memory device that includes a memory array and a pre-charge selecting circuit is introduced. The memory array includes a plurality of memory cells that are coupled to a plurality of bit lines and a plurality of word lines, wherein the plurality of word lines are configured to receive an input vector. The pre-charge selecting circuit is configured to selectively pre-charge a selected bit line according to a value of the input vector. The pre-charge selecting circuit is configured to determine whether the value of the input vector is less than a predefined threshold, and generate a gated pre-charge signal to skip pre-charging the selected bit line in response to determining that the value of the input vector is less than the predefined threshold.

Abstract: A control circuit, a memory system and a control method are provided. The control circuit is configured to control a plurality of memory cells of a memory array. The control circuit comprises a program controller. The program is configured to program a first electrical characteristic distribution and a second electrical characteristic distribution of the memory cells according to error tolerance of a first bit of a data type. A first overlapping area between the first electrical characteristic distribution and the second electrical characteristic distribution is smaller than a first predetermined value.

Abstract: Embodiments include monitoring a partial sum of a multiply accumulate calculation for certain conditions. When the certain conditions are met, a reduced read energy is used to read out memory contents instead of the regular read energy used. The reduced read energy may be obtained by reducing a pre-charge voltage, withholding a pre-charge voltage or providing a ground signal, and/or by reducing voltage hold times (i.e., reducing the time a pre-charge voltage is provided and/or discharged).

Abstract: Memory circuits that read the bit state of memory cells are disclosed. In some embodiments, a memory circuit, includes a memory cell configured to store a bit. A reference line is configured to receive a reference signal and a data line is configured to receive a data signal. The data line is configured to be selectively coupled to the memory cell. A charge voltage select unit is configured to charge the reference line and the data line in response to a select signal being in a first select state and discharge the reference line and the data line in response to the select signal being in a second select state. A sense amplifier is configured to compare the data signal and the reference signal to sense a bit state of the bit stored by the memory cell.

Abstract: A memory device includes a current source and a memory array. The current source is configured to provide a current to a first node. The memory array is coupled to the current source at the first node. The memory array includes memory cells. First terminals of the memory cells are coupled to the first node. Each of the memory cells has a first resistance in response to having a first data value, and has a second resistance in response to having a second data value. The second data value is N times the first data value. The second resistance is approximately one-Nth of the first resistance, for N being a positive integer larger than one. A method of operating a memory device is also disclosed herein.

Abstract: A memory device and a method of correcting error in a memory device is provided. The memory device controller includes a memory array, a tie-breaker array, a write controller, a verify circuit, and a controller. The memory array includes a plurality of memory cells. The tie-breaker array includes a plurality of tie-breaker rows. The write controller is configured to apply a programming voltage to the memory array. The verify circuit is configured to apply a verify voltage to verify whether the memory cells in the memory array are in an unambiguous state or not. The controller is configured to enable one or more tie-breaker rows in additions to the memory array to adjust an output of the memory array when the memory cells in the memory array are in an ambiguous state.

Abstract: Various embodiments provide methods for configuring a phase-change random-access memory (PCRAM) structures, such as PCRAM operating in a single-level-cell (SLC) mode or a multi-level-cell (MLC) mode. Various embodiments may support a PCRAM structure being operating in a SLC mode for lower power and a MLC mode for lower variability. Various embodiments may support a PCRAM structure being operating in a SLC mode or a MLC mode based at least in part on an error tolerance for a neural network layer.

Abstract: An encoding system may be provided. The encoding system may comprise a first stage and a second stage. The first stage may be configured to receive a first input, decode the first input, and produce a first output comprising the decoded first input. The second stage may be configured to receive a second input, receive the first output from the first stage, and convert the first input and the second input from a first coding system to a second coding system based on the second input and the first output. The second stage may produce a second output comprising the converted first input and the converted second input.

Abstract: A random number generator that includes control circuit, an oscillation circuit, an oscillation detection circuit and a latch circuit is introduced. The control circuit sweeps a configuration of a bias control signal among a plurality of configurations. The oscillation circuit generates an oscillation signal based on the configuration of the bias control signal. The oscillation detection circuit detects an onset of the oscillation signal, and outputs a lock signal. The latch circuit latches the oscillation signal according to a trigger signal to output a random number, wherein the trigger signal is asserted after the lock signal is outputted, and the configuration of bias control signal is locked after the lock signal is outputted. A method for generating a random number and an operation method of a random number generator are also introduced.

Abstract: A method, device, and system for performing a partial sum accumulation of a product of input vectors and weight vectors in a wordwise-input and bitwise-weight manner results in a partial accumulated product sum. The partial accumulated product sum is compared with a threshold condition after each weight bit, and when the partial accumulated product sum meets the threshold condition, a skip indicator is asserted to indicate that remaining computations of a sum accumulation are skipped.

Abstract: Various embodiments provide methods for configuring a phase-change random-access memory (PCRAM) structures, such as PCRAM operating in a single-level-cell (SLC) mode or a multi-level-cell (MLC) mode. Various embodiments may support a PCRAM structure being operating in a SLC mode for lower power and a MLC mode for lower variability. Various embodiments may support a PCRAM structure being operating in a SLC mode or a MLC mode based at least in part on an error tolerance for a neural network layer.

Abstract: A memory device that includes a memory array and a memory controller is introduced. The memory controller is configured to adjust a program strength of the program pulse according to the configurable ratio of the first bit value and the second bit value to generate an adjusted program pulse or to adjust a bias voltage pair according to the configurable ratio of the first bit value and the second bit value to generate an adjusted bias voltage pair. The memory controller is further configured to generate the random bit stream with the configurable ratio of the first bit value and the second bit value according to the data stored in the plurality of memory cells included in the memory array after applying the adjusted program pulse or according to the data stored in the plurality of memory cells after being biased by the adjusted bias voltage pair.

Abstract: An encode apparatus and an encode method may be provided. The encoding apparatus may comprise a first stage and a second stage. The first stage may be configured to receive a first input, decode the first input, and produce a first output comprising the decoded first input. The second stage may be configured to receive a second input, receive the first output from the first stage, and convert the first input and the second input from a first coding system to a second coding system based on the second input and the first output. The second stage may produce a second output comprising the converted first input and the converted second input.