Abstract: A multiple-view-angle cargo security inspection method for inspecting an object using a cargo security inspection system, the cargo security inspection system including a radiation source for generating a beam of rays for transmitting through the object to be inspected and a data collecting unit for collecting the transmission projection data after the beam of rays has transmitted through the inspected object, the method including a scanning step including: rotating the radiation source and/or the object about a rotation axis so as to achieve a relative rotation, thereby positioning the radiation source in a plurality of discrete positions with different view angles with respect to the inspected object, wherein, in each view angle, the radiation source moves along a straight line in a direction parallel to the rotation axis and at the same time scans the inspected object so as to acquire the transmission projection data at each view angle.

Abstract: A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. The set of geometric parameters is selected to a set of optimization parameters. The number of optimization parameters within the set of optimization parameters is less than the number of geometric parameters within the set of geometric parameters. A set of selected optimization parameters is selected from the set of optimization parameters. The parameters of the set of selected geometric parameters are used as parameters of the selected profile model. The selected profile model is tested against one or more termination criteria.

Abstract: A device for inspecting contraband in an aviation cargo containers includes: a turntable located at an object inspecting position and configured to carry the object to be inspected and bring the object into rotation; an object conveying system; a scanning system including a radiation source and a detector which can synchronously move in the vertical direction; a turntable drive/control system which drives and controls rotation of said turntable so that the turntable can continuously rotate about its rotation axis or rotate to any predetermined angular position; a scanning drive/control system which drives and controls the radiation source and the detector into synchronous movement in the vertical direction so that the radiation source and the detector can continuously move in the vertical direction or move to any predetermined vertical position. The device of the present invention can scan the object and form images in various scanning modes to meet different needs.

Abstract: A device for inspecting contraband in an aviation cargo container includes: a turntable and a scanning system, the scanning system including a radiation source; a detector; a radiation source mounting structure; and a detector mounting structure for mounting the detector. Each of said radiation source mounting structure and said detector mounting structure includes at least one column assembly. The radiation source and the detector are mounted on the column assembly and allowed to synchronously ascend and descend along said column assembly. By combining different movement modes of the turntable and the scanning system, the device of the present invention can scan the object in various scanning modes. The device is stable in structure, convenient in installation, and occupies a small space. The device can inspect aviation containers over two meters long and/or over two meters wide and achieve a relatively high passing rate of the objects.

Abstract: An oxynitride pad layer and a masking layer are formed on an ultrathin semiconductor-on-insulator substrate containing a top semiconductor layer comprising silicon. A first portion of a shallow trench is patterned in a top semiconductor layer by lithographic masking of an NFET region and an etch, in which exposed portions of the buried insulator layer is recessed and the top semiconductor layer is undercut. A thick thermal silicon oxide liner is formed on the exposed sidewalls and bottom peripheral surfaces of a PFET active area to apply a high laterally compressive stress. A second portion of the shallow trench is formed by lithographic masking of a PFET region including the PFET active area. A thin thermal silicon oxide or no thermal silicon oxide is formed on exposed sidewalls of the NFET active area, which is subjected to a low lateral compressive stress or no lateral compressive stress.

Abstract: Golf clubs, clubheads for golf clubs, and methods for making clubheads are disclosed. An exemplary clubhead includes a rear component and a front component affixed to the rear component. The rear component is made at least partially of a FeAlMn alloy having a density in a range of 6.2 to 7.2 g/cm3. The front component includes at least a portion of the face of the clubhead and is made of a material other than the FeAlMn alloy used to make the rear component. For example, the FeAlMn alloy contains (by weight) maximally 1% C, 27-32% Mn, 6-10% Al, 3-5% Cr, maximally 1% Si, and the balance being Fe. The reduced density of the rear component, compared to the density of conventional iron-type clubheads, provides more discretionary mass for manipulation in the clubhead, without sacrificing performance of the face of the clubhead.

Abstract: A golf club component, such as a golf club head and/or a golf club shaft, can comprise a golf club component substrate having an outer layer of titanium carbide, typically comprising at least forty percent (40%) carbon content. Alternatively, a golf club component can comprise a golf club component substrate, at least a portion of which is enveloped by a first coating layer of, for example, electroplated nickel, a second coating layer of, for example, electroplated chromium or palladium, and a third coating layer of titanium carbide applied by physical vapor deposition. The titanium carbide layer is durable and can provide the golf club component with a desired aesthetic appearance, such as a black color. Additionally, the golf club component can be coated with a fourth coating layer, such as a layer comprising a sealant or clear coat material.

Abstract: An optical metrology system includes a photometric device with a source configured to generate and direct light onto a structure, and a detector configured to detect light diffracted from the structure and to convert the detected light into a measured diffraction signal. A processing module of the optical metrology system is configured to receive the measured diffraction signal from the detector to analyze the structure. The optical metrology system also includes a generic interface disposed between the photometric device and the processing module. The generic interface is configured to provide the measured diffraction signal to the processing module using a standard set of signal parameters. The standard set of signal parameters includes a reflectance parameter, a first polarization parameter, a second polarization parameter, and a third polarization parameter.

Abstract: An energy harvesting system and method. An array of cantilevers with PZT films is electrically connected to an energy harvesting device that converts vibration energy to electrical energy. An AC output signal provided by the cantilevers can be rectified to a DC output, thereby avoiding impairment in total electrical output. The DC output terminals can be connected in parallel and/or in series in order to achieve a higher voltage and/or a higher current that prevents the output from different cantilevers from counteracting one another. The connection circuitry includes one or more rectifying components integrated with one or more micro-cantilevers into a single integrated circuit chip. An oscillograph can be utilized to monitor the DC output voltage signal from an associated testing circuit.

Abstract: The profile of a single feature formed on a wafer can be determined by obtaining an optical signature of the single feature using a beam of light focused on the single feature. The obtained optical signature can then be compared to a set of simulated optical signatures, where each simulated optical signature corresponds to a hypothetical profile of the single feature and is modeled based on the hypothetical profile.

Abstract: A method of generating a library of simulated-diffraction signals (simulated signals) of a periodic grating includes obtaining a measured-diffraction signal (measured signal). Hypothetical parameters are associated with a hypothetical profile. The hypothetical parameters are varied within a range to generate a set of hypothetical profiles. The range to vary the hypothetical parameters is adjusted based on the measured signal. A set of simulated signals is generated from the set of hypothetical profiles.

Abstract: A proton-exchange composite includes a polymer matrix formed from a proton-exchange polymer and ionomer particles distributed therein. The polymer has side chains with ionic groups. The particles have an average particle size of less than 20 nm and include an oligomeric ionomer that interacts with the polymer and attracts the ionic groups on its side chains. The composite may be formed by a method in which an initiator is bonded to silica particulates. The initiator is used to initiate polymerization of a precursor monomer to form a salt form of the oligomeric ionomer bonded to the silica particulates, which is then reacted with an acid to produce the oligomeric ionomer, thus forming the ionomer particles. The ionomer particles are dispersed in a solution containing a solvent and the polymer dissolved therein. The solvent is removed. The residue is cured to form the composite.

Abstract: One or more simulated diffraction signals for use in determining the profile of a structure formed on a semiconductor wafer can be generated, where the profile varies in more than one dimension. Intermediate calculations are generated for variations in a hypothetical profile of the structure in a first dimension and a second dimension, where each intermediate calculation corresponds to a portion of the hypothetical profile of the structure. The generated intermediate calculations are then stored and used in generating one or more simulated diffraction signals for one or more hypothetical profiles of the structure.

Abstract: A structure formed on a semiconductor wafer is examined by obtaining measurements of cross polarization components of diffraction beams, which were obtained from scanning an incident beam over a range of azimuth angles to obtain an azimuthal scan. A zero azimuth position is determined based on the azimuthal scan. The cross polarization components are zero at the zero azimuth position. A measured diffraction signal is obtained using an azimuth angle to be used in optical metrology of the structure. Misalignment of the azimuth angle is detected using the measured diffraction signal and the determined zero azimuth position.

Abstract: A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. The set of geometric parameters is selected to a set of optimization parameters. The number of optimization parameters within the set of optimization parameters is less than the number of geometric parameters within the set of geometric parameters. A set of selected optimization parameters is selected from the set of optimization parameters. The parameters of the set of selected geometric parameters are used as parameters of the selected profile model. The selected profile model is tested against one or more termination criteria.

Abstract: The profile of a single feature formed on a wafer can be determined by obtaining an optical signature of the single feature using a beam of light focused on the single feature. The obtained optical signature can then be compared to a set of simulated optical signatures, where each simulated optical signature corresponds to a hypothetical profile of the single feature and is modeled based on the hypothetical profile.

Abstract: A multiple-view-angle cargo security inspection method for inspecting an object using a cargo security inspection system, the cargo security inspection system including a radiation source for generating a beam of rays for transmitting through the object to be inspected and a data collecting unit for collecting the transmission projection data after the beam of rays has transmitted through the inspected object, the method including a scanning step including: rotating the radiation source and/or the object about a rotation axis so as to achieve a relative rotation, thereby positioning the radiation source in a plurality of discrete positions with different view angles with respect to the inspected object, wherein, in each view angle, the radiation source moves along a straight line in a direction parallel to the rotation axis and at the same time scans the inspected object so as to acquire the transmission projection data at each view angle.

Abstract: An optical metrology system includes a photometric device with a source configured to generate and direct light onto a structure, and a detector configured to detect light diffracted from the structure and to convert the detected light into a measured diffraction signal. A processing module of the optical metrology system is configured to receive the measured diffraction signal from the detector to analyze the structure. The optical metrology system also includes a generic interface disposed between the photometric device and the processing module. The generic interface is configured to provide the measured diffraction signal to the processing module using a standard set of signal parameters. The standard set of signal parameters includes a reflectance parameter, a first polarization parameter, a second polarization parameter, and a third polarization parameter.

Abstract: A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. A set of optimization parameters is selected for the profile model using one or more input diffraction signals and one or more parameter selection criteria. The selected profile model and the set of optimization parameters are tested against one or more termination criteria. The process of selecting a profile model, selecting a set of optimization parameters, and testing the selected profile model and set of optimization parameters is performed until the one or more termination criteria are met.

Abstract: A latch mechanism includes a latch hook and an anti-chuck latch, the latch mechanism being connected to a removable seat assembly having a seat back movable between an upright and a folded position. When the seat back is in a folded position, the anti-chuck hook of the latch rotates such that the seat may be removed from a striker in the floor of the vehicle. When the seat back is moved from the folded position, a cam is driven to engage a pawl to lock the anti-chuck hook in a position such that the seat may not be removed from the striker bar even when the latch hook is released.