Abstract: The invention discloses a high-k dielectric layer, a fabricating method thereof and a multi-function equipment implementing such fabricating method. The high-k dielectric layer of the invention includes M atomic-layer-deposited films formed in sequence on a material layer of a semiconductor device, where M is an integer larger than 1. The material layer can be a semiconductor layer, a metal layer or another dielectric layer. Each atomic-layer-deposited film is formed of an oxide and formed by an atomic layer deposition (ALD) process. N assigned films among the M atomic-layer-deposited films are bombarded by a non-reactive gas plasma during or after the cycles of the ALD process, where N is a natural number and less than or equal to M.

Abstract: A system module applied to the machine controller for simulating a machine operation screen based on a non-invasive data-extraction system, is disclosed. An image capture device of the system module can receive an original operation screen outputted from the machine controller, and transmit the original operation screen to the non-invasive data-extraction system and a high-speed image process unit for extraction of the information shown on the operation screen. The software control system can extract the operational information of the machine controller in real time, to create a machine operation flow for generating a simulated machine operation screen which is then outputted to a screen of the machine controller. As a result, the site working staff can be provided with operational information associated with the machine in real time, for example, the operational information includes currently executed operation screen, position of mouse cursor and pop-up window detection result.

Abstract: A system module of customizing a screen image based on a non-invasive data-extraction system, and a method thereof are disclosed. The system module is applicable to a machine controller controlling a machine, and sensors are disposed around the machine. In the system module, an image capture device receives an image of an original screen from the machine controller, and transmits the image to the non-invasive data-extraction system for extracting information, and a software control system integrates data measured by the sensors with the information, and combined the integration result with a customized screen image, and an extra control component is embedded in an original operation screen of the machine controller. The customized screen image is shown on the machine controller to display information by more visual manner. Furthermore, the signal receiving device and an HID simulation device can be used to provide a basic function of a KVM switch.

Abstract: An extreme ultra violet (EUV) radiation source apparatus includes a collector, a target droplet generator for generating a tin (Sn) droplet, a rotatable debris collection device and a chamber enclosing at least the collector and the rotatable debris collection device. The rotatable debris collection device includes a first end support, a second end support and a plurality of vanes, ends of which are supported by the first end support and the second end support, respectively. A surface of at least one of the plurality of vanes is coated by a catalytic layer, which reduces a SnH4 to Sn.

Abstract: An extreme ultraviolet (EUV) lithography system includes a collector designed to collect and reflect EUV radiation, a cover integrated with the collector, a first exhaust line connected to the cover and configured to receive debris vapor from the collector, a debris trapper connected to the first exhaust line and configured to trap the debris vapor, and a second exhaust line connected to the debris trapper.

Abstract: An extreme ultraviolet (EUV) lithography system includes a collector designed to collect and reflect EUV radiation, a cover integrated with the collector, a first exhaust line connected to the cover and configured to receive debris vapor from the collector, a debris trapper connected to the first exhaust line and configured to trap the debris vapor, and a second exhaust line connected to the debris trapper.

Abstract: An apparatus comprises a process chamber, and a loadlock connected to the process chamber. The loadlock is configured to have a wafer holder disposed therein. The wafer holder is configured to store a plurality of wafers, and is configured to transport the plurality of wafers away from the loadlock.

Abstract: One or more techniques or systems for cleaning wafers during semiconductor fabrication or an associated brush are provided herein. In some embodiments, the brush includes a brush body and one or more inner hole supports within the brush body. For example, a first inner hole support and a second inner hole support define a first inner hole associated with a first size. For another example, a third inner hole support and a fourth inner hole support define a second inner hole associated with a second size different than the first size. In some embodiments, a cleaning solution is applied to a wafer based on a first flow rate at a first brush position and based on a second flow rate at a second brush position. In this manner, a flow field associated with wafer cleaning is provided, thus enhancing cleaning efficiency, for example.

Abstract: A pixel array substrate with new pixel design and a liquid crystal display panel with the pixel array substrate are provided. The pixel array substrate includes a plurality of data lines, a plurality of scan lines and a plurality of pixels. Each of the pixels comprises a first electrode, a first connecting line, a second electrode and a second connecting line. The first electrode is electrically connected with corresponding data line and scan line through the first connecting line, and having a slit. The second pixel is electrically connected with corresponding data line and scan line through the second connecting line. At least a part of the second connecting line is exposed by the slit of the first electrode.

Abstract: Provided are a single-stranded nucleic acid aptamer simultaneously and specifically binding to various types of microorganisms, and a method of manufacturing the nucleic acid aptamer. For example, provided are a probe that is capable of simultaneously detecting or diagnosing a variety of microorganisms, and a method of manufacturing an aptamer having characteristics of such a probe.

Abstract: Among other things, one or more techniques for creating an array model for analog device modeling are provided. In an embodiment, the array model represents a mean value or a standard deviation value of an analog device characteristic for an analog device based on a physical location of the analog device within a circuit layout, where the physical location is identified using a physical set of coordinates. The physical set of coordinates maps to an array set of coordinates of the array model. In this manner, a mean value and a standard deviation value are obtainable from the array model using the array set of coordinates. The mean value and the standard deviation value are usable to model the analog device, and thus a circuit within which the analog device is used, to obtain a more accurate or realistic prediction of operation or behavior, for example.

Abstract: A pixel array substrate with new pixel design and a liquid crystal display panel with the pixel array substrate are provided. The pixel array substrate includes a plurality of data lines, a plurality of scan lines and a plurality of pixels. Each of the pixels comprises a first electrode, a first connecting line, a second electrode and a second connecting line. The first electrode is electrically connected with corresponding data line and scan line through the first connecting line, and having a slit. The second pixel is electrically connected with corresponding data line and scan line through the second connecting line. At least a part of the second connecting line is exposed by the slit of the first electrode.

Abstract: Among other things, one or more systems and techniques for transition time evaluation of a circuit are provided herein. In some embodiments, a comparator is configured to receive a circuit signal from the circuit. The circuit signal is evaluated by the comparator based upon one or more control voltages to create one or more voltage waveforms. In some embodiments, the one or more voltage waveforms have substantially similar slopes. A time converter, such as a time-to-current converter or a time-to-digital converter, is used to evaluate the one or more output waveforms to determine a transition time, such as a rise time or a fall time, of the circuit. In some embodiments, the one or more output waveforms are used to reconstruct a transition waveform representing a waveform of the circuit signal.

Abstract: A pixel structure includes a first conductive layer, a stacked layer, and a third conductive layer. The first conductive layer includes a first gate, a first scan line connected to the first gate, and a capacitor electrode separated from the first scan line. The stacked layer includes a semiconductor layer and a second conductive layer. The second conductive layer includes a data line, a first source connected to the data line, a second source, a first drain, a second drain, a connecting electrode connected to the second source and electrically connected to the first drain, and a coupling electrode connected to the second drain. The third conductive layer includes a first pixel electrode connected to the first drain, a second pixel electrode electrically connected to the connecting electrode, a first extending portion, and a second extending portion.

Abstract: Embodiments of mechanisms for cleaning a wafer are provided. A method for cleaning a wafer includes cleaning a wafer by using a wafer scrubber and cleaning the wafer scrubber in a scrubber cleaning module. An agitated cleaning liquid is applied on the wafer scrubber to clean the wafer scrubber. The method also includes cleaning the wafer or a second wafer by the wafer scrubber after the wafer scrubber is cleaned by the agitated cleaning liquid.

Abstract: Provided is a single-stranded nucleic acid aptamer specifically binding to Klebsiella pneumoniae, and a method for detecting Klebsiella pneumoniae by using the same. The aptamer of the present disclosure, and a method, a composition, a kit or a sensor of using the same may be used to specifically detect Klebsiella pneumoniae present in an aqueous environment, foods, and medical samples and also be applied in fields such as sanitary conditions of foods and medical diagnosis.

Abstract: A pixel driving method is adapted for a liquid crystal display. Each pixel includes a first sub-pixel and a second sub-pixel, in which the first sub-pixel and the second sub-pixel each includes a first display region and a second display region. The pixel driving method includes providing a first voltage to the first displaying region of the first sub-pixel and the second sub-pixel; providing a second voltage to the second displaying region of the first sub-pixel and a third voltage to the second displaying region of the second sub-pixel; and when the provided first voltage is larger than a predetermined voltage, providing the second voltage so that the provided second voltage is smaller than the provided third voltage.

Abstract: An active device array substrate includes a substrate, a first pixel electrode, and a first raised pattern. The first pixel electrode is disposed on or above the substrate, and the first pixel electrode includes a first truck electrode, a second truck electrode, and a plurality of first branch electrodes. The first truck electrode and the second truck electrode intersect to form a first node at the intersection of the first truck electrode and the second truck electrode. The first branch electrodes are connected to the first truck electrode and the second truck electrode to form a plurality of first domains, wherein the first branch electrodes are asymmetrical with respect to the second truck electrode. The first raised pattern is disposed at least between the first node and the substrate to form a first raised structure at least at the first node.

Abstract: A pixel structure and a liquid crystal display (LCD) panel having the same are provided. The pixel structure includes a data line, a scan line, at least one active device, a pixel electrode, and a metal line. The active device is electrically connected to the data line and the scan line. The pixel electrode is electrically connected to the active device and has an opening at the edge of the pixel electrode adjacent to at least one of the data line and the scan line. The metal line is located below the pixel electrode. Besides, a portion of the metal line extending to the edge of the pixel electrode is exposed by the opening. The shortest distance between an edge of the opening of the pixel electrode and the metal line is greater than or substantially equal to 3 ?m.

Abstract: A pixel structure including a first active device, a second active device, a first pixel electrode, a second pixel electrode, a third pixel electrode, a coupling electrode, and a capacitance electrode is provided. The first pixel electrode connected to the first active device and defines a first to a fourth liquid crystal alignment domain having different alignment directions. The second pixel electrode is connected to the coupling electrode and defines a fifth to an eighth liquid crystal alignment domain having different alignment directions. The third pixel electrode is connected to the second active device and defines a ninth and a tenth liquid crystal alignment domain. The coupling electrode is connected between the first active device and the second active device and extended to pass through the first, the second, and the third pixel electrodes. The capacitance electrode respectively overlaps parts of the first, the second, and the third pixel electrodes.