Patents by Inventor Yanxiang Liu

Yanxiang Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Applying negative gate voltage to wordlines adjacent to wordline associated with read or verify to reduce adjacent wordline disturb
    Patent number: 7995386
    Abstract: Systems, methods, and devices that facilitate applying a predefined negative gate voltage to wordlines adjacent to a selected wordline associated with a memory cell selected during a read or verify operation to facilitate reducing adjacent wordline disturb are presented. A memory component can comprise an optimized operation component that can apply a predefined negative gate voltage to wordlines adjacent to a selected wordline associated with a memory cell selected for a read or verify operation, based at least in part on predefined operation criteria, to facilitate reducing adjacent wordline disturb in the selected memory cell to facilitate reducing a shift in the voltage threshold and maintain a desired operation window. The optimized operation component optionally can include an evaluator component that can facilitate determining whether a negative gate voltage applied to adjacent wordlines is to be adjusted to facilitate reducing adjacent wordline disturb below a predetermined threshold amount.
    Type: Grant
    Filed: November 21, 2008
    Date of Patent: August 9, 2011
    Assignee: Spansion LLC
    Inventors: Yuji Mizuguchi, Mark W. Randolph, Darlene Gay Hamilton, Yi He, Zhizheng Liu, Yanxia (Emma) Lin, Xianmin Yi, Gulzar Kathawala, Amol Ramesh Joshi, Kuo-Tung Chang, Edward Franklin Runnion, Sung-Chul Lee, Sung-Yong Chung, Yanxiang Liu, Yu Sun
  • APPLYING NEGATIVE GATE VOLTAGE TO WORDLINES ADJACENT TO WORDLINE ASSOCIATED WITH READ OR VERIFY TO REDUCE ADJACENT WORDLINE DISTURB
    Publication number: 20100128521
    Abstract: Systems, methods, and devices that facilitate applying a predefined negative gate voltage to wordlines adjacent to a selected wordline associated with a memory cell selected during a read or verify operation to facilitate reducing adjacent wordline disturb are presented. A memory component can comprise an optimized operation component that can apply a predefined negative gate voltage to wordlines adjacent to a selected wordline associated with a memory cell selected for a read or verify operation, based at least in part on predefined operation criteria, to facilitate reducing adjacent wordline disturb in the selected memory cell to facilitate reducing a shift in the voltage threshold and maintain a desired operation window. The optimized operation component optionally can include an evaluator component that can facilitate determining whether a negative gate voltage applied to adjacent wordlines is to be adjusted to facilitate reducing adjacent wordline disturb below a predetermined threshold amount.
    Type: Application
    Filed: November 21, 2008
    Publication date: May 27, 2010
    Applicant: SPANSION LLC
    Inventors: Yuji Mizuguchi, Mark W. Randolph, Darlene Gay Hamilton, Yi He, Zhizheng Liu, Yanxia (Emma) Lin, Xianmin Yi, Gulzar Kathawala, Amol Ramesh Joshi, Kuo-Tung Chang, Edward Franklin Runnion, Sung-Chul Lee, Sung-Yong Chung, Yanxiang Liu, Yu Sun