Abstract: A sample shape measuring method includes a step of preparing illumination light passing through a predetermined illumination region, a step of applying the illumination light to a sample, and a predetermined processing step. The predetermined illumination region is set such that the illumination light is applied to part of inside of a pupil and outside of the pupil, a light intensity of the illumination light incident on the predetermined illumination region differs between a center and a periphery. The predetermined processing step includes a step of receiving light transmitted through the observation optical system, a step of obtaining a quantity of light of the received light, a step of calculating a difference or a ratio between the quantity of light and a reference quantity of light, and a step of calculating an amount of tilt in a surface of the sample from the difference or the ratio.

Abstract: A sample shape measuring method includes a step of preparing illumination light passing through a predetermined illumination region, a step of applying the illumination light to a sample, and a predetermined processing step. The predetermined illumination region is set so as not to include the optical axis at a pupil position of the illumination optical system and is set such that the illumination light is applied to part of the inside of the pupil and the outside of the pupil at a pupil position of the observation optical system. The predetermined processing step includes a step of receiving light, a step of obtaining the quantity of light, a step of calculating the difference or the ratio between the quantity of light and a reference quantity of light, and a step of calculating the amount of tilt in the surface of the sample from the difference or the ratio.

Abstract: A specimen observation apparatus includes: a light source; an illumination optical system; a stage; an imaging optical system; and a reflection member disposed at a position opposed to the imaging optical system across the stage. The illumination optical system is disposed so as to apply illumination light from the light source to a specimen. The imaging optical system is disposed at a position at which the illumination light that is transmitted through the specimen and thereafter reflected by the reflection member to be transmitted through the specimen again enters, and is configured to form an optical image of the specimen. The optical image is formed in a state in which a position of the specimen and a focus position of the imaging optical system are different from each other.

Abstract: A fluorocarbon resin composite includes a fluorocarbon resin layer on a base, in which a fluorocarbon resin constituting the fluorocarbon resin layer is crosslinked by electron beam irradiation, and the base has a desired shape obtained by machining. The fluorocarbon resin is composed of a tetrafluoroethylene-perfluoro(alkyl vinyl ether) copolymer, polytetrafluoroethylene, or a mixture of the tetrafluoroethylene-perfluoro(alkyl vinyl ether) copolymer and polytetrafluoroethylene. A fluorocarbon resin composite, cookware, and a roller and a belt for use in office automation equipment are each produced by applying an uncrosslinked fluorocarbon resin on a base, subjecting the fluorocarbon resin to electron beam irradiation in a low-oxygen atmosphere to crosslink the fluorocarbon resin while the temperature of the fluorocarbon resin is maintained at a temperature equal to or higher than the melting point of the fluorocarbon resin, and machining the base into a desired shape.

Abstract: A sample observation device includes an illumination optical system and an observation optical system, and the illumination optical system includes a light source, a condenser lens, and an aperture member, and the observation optical system includes an objective lens and an imaging lens, and the aperture member has a light-shielding part or a darkening part, and a transmission part, and the transmission part is located outside of an outer edge of the light-shielding part or the darkening part, and an image of an inner edge of the transmission part is formed inside of an outer edge of a pupil of the objective lens, and an image of an outer edge of the transmission part is formed outside of the outer edge of the pupil of the objective lens, and the following conditional expression is satisfied. 0.005?Ratio?0.9.

Abstract: A microscope system (100) includes a microscope (10) and an observation unit (20) provided separately from the microscope. The microscope includes a microscope objective lens (3), an image pickup element (31) disposed at a position at which an image is formed through the microscope objective lens, and a first control apparatus (32) connected with the image pickup element. The observation unit includes a second control apparatus (21), a display device (22, 22a, 22b) connected with the second control apparatus, and a magnifier optical system (25a, 25b) arranged at a predetermined distance from the display device. The microscope system further includes a communication apparatus (21) for communication between the first control apparatus and the second control apparatus so that an image picked up by the image pickup apparatus is displayed on the display device.

Abstract: A grazing incidence interferometer is configured to measure a profile of a target surface using a measurement beam radiated on the target surface in a direction oblique to a normal line of the target surface and reflected on the target surface to cause an interference with a reference beam. The grazing incidence interferometer includes: a light source to emit light; a first polarization beam splitter that splits the light from the light source into the reference beam and the measurement beam; a ratio changer that changes a light amount ratio between the reference beam and the measurement beam; a second polarization beam splitter that synthesizes the measurement beam reflected on the target surface and the reference beam; and an image capturing camera that receives the synthesized beam of the reference beam and the measurement beam.

Abstract: A focusing method includes a step of preparing a microscope, a step of mounting a sample, and a predetermined processing step, the predetermined processing step includes a step of receiving light emitted from the observation optical system, a step of obtaining the quantity of light based on light from a predetermined region of the received light, a step of calculating a difference or a ratio between the quantity of light in the predetermined region and the quantity of light as a reference, a step of comparing a calculation result with a threshold, and a step of changing the distance between the sample and the observation optical system, and in the step of preparing, a partial region of illumination light is shielded or darkened, and when the result of the calculation is equal to or smaller than the threshold, the predetermined processing step is terminated.

Abstract: A sample observation device includes an illumination optical system and an observation optical system. The illumination optical system includes a light source, a condenser lens, and an aperture member. The observation optical system includes an objective lens and an imaging lens. The aperture member has a light-shielding part or a darkening part, and a transmission part. The transmission part is disposed asymmetrically with respect to an optical axis of the illumination optical system. An image of an inner edge of the transmission part is formed inside of an outer edge of a pupil of the objective lens. An image of an outer edge of the transmission part is formed outside of the outer edge of the pupil of the objective lens.

Abstract: A sample observation device includes an illumination optical system and an observation optical system, and the illumination optical system includes a light source, a condenser lens and an aperture member, and the observation optical system includes an objective lens and an imaging lens, and the aperture member has a light-shielding part or a darkening part and a transmission part, and the aperture member is disposed so that the light-shielding part or the darkening part includes an optical axis of the illumination optical system, and an image of an inner edge of the transmission part is formed inside of an outer edge of the pupil of the objective lens, and an image of an outer edge of the transmission part is formed outside of the outer edge of the pupil of the objective lens.

Abstract: Provided are a polyimide tube including a polyimide resin composition, wherein the polyimide resin composition contains a polyimide resin in which an acicular highly thermally conductive filler such as carbon nanotubes is dispersed in 15 volume percent or more relative to the total volume of the composition; the acicular highly thermally conductive filler has an orientation of 1.3 or more, the orientation being represented by the modulus of elasticity of the polyimide resin composition in the circumferential direction/the modulus of elasticity of the polyimide resin composition in the axial direction; and the polyimide tube has high thermal conductivity, is excellent in terms of mechanical strength and indentation strength, and provides a high fixing property and an excellent offsetting property; a process for producing such a tube; and a fixing belt including such a tube serving as a base member.

Abstract: A sample observation method includes an acquisition of for acquiring an electronic image of a sample, and a subtraction step of subtracting a DC component from a signal of the electronic image, and the acquisition step is performed in a state of bright-field observation, the electronic image at the subtraction step is an image acquired in a first predetermined state, and in the first predetermined state, at least a position of the sample and a in-focus position of an image forming optical system are different.

Abstract: A microscope objective lens has an aspheric-surface lens, and a first lens nearest to an object side is a negative lens. It is desirable that at least any one surface of the first lens nearest to the object side is an aspheric surface. Moreover, it is desirable that the microscope objective lens satisfies the following conditional expression (1) ?20<f1/f<?0.1??(1) where, f1 denotes a focal length of the first lens nearest to the object side, and f denotes a focal length of the overall microscope objective lens system.

Abstract: A grazing incidence interferometer is configured to measure a profile of a target surface using a measurement beam radiated on the target surface in a direction oblique to a normal line of the target surface and reflected on the target surface to cause an interference with a reference beam. The grazing incidence interferometer includes: a light source to emit light; a first polarization beam splitter that splits the light from the light source into the reference beam and the measurement beam; a ratio changer that changes a light amount ratio between the reference beam and the measurement beam; a second polarization beam splitter that synthesizes the measurement beam reflected on the target surface and the reference beam; and an image capturing camera that receives the synthesized beam of the reference beam and the measurement beam.

Abstract: A profile measuring instrument includes: a fixed member of which position relative to a workpiece having a surface to be profile-measured is fixed; a scanning member supported by the fixed member and movable in a scan direction along the surface of the workpiece relative to the fixed member; a laser interferometer that detects a displacement of the surface of the workpiece along the scan direction. The laser interferometer includes: a polarizing beamsplitter provided to the scanning member; a reference mirror fixed to the fixed member; a measurement optical path extending from the polarizing beamsplitter to the workpiece; and a reference optical path extending from the polarizing beamsplitter to the reference mirror. A difference between an optical path length of the measurement optical path and an optical path length of the reference optical path is a predetermined tolerable error or less.

Abstract: A microscope system (100) includes a microscope (10) and an observation unit (20) provided separately from the microscope. The microscope includes a microscope objective lens (3), an image pickup element (31) disposed at a position at which an image is formed through the microscope objective lens, and a first control apparatus (32) connected with the image pickup element. The observation unit includes a second control apparatus (21), a display device (22, 22a, 22b) connected with the second control apparatus, and a magnifier optical system (25a, 25b) arranged at a predetermined distance from the display device. The microscope system further includes a communication apparatus (21) for communication between the first control apparatus and the second control apparatus so that an image picked up by the image pickup apparatus is displayed on the display device.

Abstract: Provided is a roller for an image-forming apparatus which includes a base member and a fluororesin layer provided on an outer circumferential surface of the base member directly or through an adhesive layer, the roller for an image-forming apparatus being characterized in that the fluororesin layer contains phosphorus-doped tin oxide. The roller for an image-forming apparatus has a surface resistance capable of stably and effectively preventing the occurrence of electrostatic offsets, and also has an excellent releasing property. Also provided is a process for producing the roller for an image-forming apparatus, characterized by including the steps of applying a fluororesin dispersion containing an aqueous dispersion of phosphorus-doped tin oxide onto a base member or an adhesive layer disposed on an outer circumferential surface of the base member, and then sintering the fluororesin.

Abstract: A microscope objective lens satisfies the following conditional expressions (1) and (2). 0.05<NA<0.4??(1) 3 mm<D/NA<50 mm??(2) where, NA denotes a numerical aperture on an object side of the microscope objective lens, and D denotes a total thickness of the microscope objective lens.

Abstract: A fluorocarbon resin composite includes a fluorocarbon resin layer on a base, in which a fluorocarbon resin constituting the fluorocarbon resin layer is crosslinked by electron beam irradiation, and the base has a desired shape obtained by machining. The fluorocarbon resin is composed of a tetrafluoroethylene-perfluoro(alkyl vinyl ether) copolymer, polytetrafluoroethylene, or a mixture of the tetrafluoroethylene-perfluoro(alkyl vinyl ether) copolymer and polytetrafluoroethylene. A fluorocarbon resin composite, cookware, and a roller and a belt for use in office automation equipment are each produced by applying an uncrosslinked fluorocarbon resin on a base, subjecting the fluorocarbon resin to electron beam irradiation in a low-oxygen atmosphere to crosslink the fluorocarbon resin while the temperature of the fluorocarbon resin is maintained at a temperature equal to or higher than the melting point of the fluorocarbon resin, and machining the base into a desired shape.

Abstract: A fluorocarbon resin composite includes a fluorocarbon resin layer on a base, in which a fluorocarbon resin constituting the fluorocarbon resin layer is crosslinked by electron beam irradiation, and the base has a desired shape obtained by machining. The fluorocarbon resin is composed of a tetrafluoroethylene-perfluoro(alkyl vinyl ether) copolymer, polytetrafluoroethylene, or a mixture of the tetrafluoroethylene-perfluoro(alkyl vinyl ether) copolymer and polytetrafluoroethylene. A fluorocarbon resin composite, cookware, and a roller and a belt for use in office automation equipment are each produced by applying an uncrosslinked fluorocarbon resin on a base, subjecting the fluorocarbon resin to electron beam irradiation in a low-oxygen atmosphere to crosslink the fluorocarbon resin while the temperature of the fluorocarbon resin is maintained at a temperature equal to or higher than the melting point of the fluorocarbon resin, and machining the base into a desired shape.