Patents by Inventor Yoshimasa Suzuki

Yoshimasa Suzuki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7687749
    Abstract: It is an object to provide a magnetron for a small-sized microwave oven which takes safety standards and a noise into consideration, in a magnetron 10 for a microwave oven, a pair of choke coils 16 and 17 are provided in a filter case 11, and a height H1 of the internal surface of the filter case 11 is set to be 35 to 45 mm, an outside diameter d3 of an air-core type inductance 25 is set to be 5.5 to 7.5 mm and a sectional area S of a high frequency absorbing member 27 is set to be 5 to 16 mm2. In the magnetron 10 for a microwave oven, an electrostatic capacity between capacitor terminals 15A and 15B and the filter case 11 is increased to be 500 to 700 pF.
    Type: Grant
    Filed: April 19, 2006
    Date of Patent: March 30, 2010
    Assignee: Panasonic Corporation
    Inventors: Hiroshi Ochiai, Etsuo Saitou, Yoshimasa Suzuki, Nagisa Kuwahara
  • Patent number: 7681439
    Abstract: A measuring apparatus comprising: a reference member held in fixed position and orientation with respect to a workpiece during measurement; a stylus for scanning a surface of the workpiece while being displaced upward and downward in accordance with unevenness of the surface of the workpiece; a displacement gauge for measuring a displacement of a specific part of the stylus relative to the reference member; and a scanner for causing the stylus to scan the workpiece along the surface; wherein the fixed position and orientation of the reference member with respect to the workpiece are not changed even during the operation of the scanner; the up-and-down displacement of the specific part of the stylus is measured relative to the reference member; a fine shape of the workpiece is detected in accordance with the measured displacement of the specific part of the stylus.
    Type: Grant
    Filed: August 22, 2007
    Date of Patent: March 23, 2010
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Satoshi Koga, Yoshimasa Suzuki
  • Publication number: 20100055365
    Abstract: A polyimide tube composed of a polyimide resin composition in which 5 to 23.5 volume percent of boron nitride and 1 to 15 volume percent of an acicular substance are dispersed as a filler in a polyimide resin on the basis of the total volume of the composition, a method of producing the tube, a method of producing a polyimide varnish used for producing the tube, and a fixing belt including the tube as a base member are provided.
    Type: Application
    Filed: October 5, 2007
    Publication date: March 4, 2010
    Applicants: Sumitomo Electric Industries Ltd., Sumitomo Electric Fine Polymer, Inc.
    Inventors: Shingo Nakajima, Jun Sugawara, Akira Mizoguchi, Naoki Onmori, Yoshimasa Suzuki, Kazuhiro Kizawa, Yusuke Uchiba
  • Publication number: 20100014098
    Abstract: An oblique incidence interferometer enlarges a measurement range without increasing a size of the apparatus. The oblique incidence interferometer includes a light source for emitting coherent light in an oblique direction to a measurement object; a light collimating unit for collimating the coherent light from the light source; a beam dividing unit for dividing the collimated beam from the light collimating unit into a measurement beam and a reference beam; a beam combining unit for combining the measurement beam reflected by the measurement object with the reference beam; and an image pickup device for picking up images of interference fringes representing a surface shape of the measurement object. The oblique incidence interferometer also includes a measurement range expanding device for enlarging a light measurement range on the measurement object in a lateral direction of the measurement range.
    Type: Application
    Filed: July 16, 2009
    Publication date: January 21, 2010
    Applicant: MITUTOYO CORPORATION
    Inventors: Yoshimasa Suzuki, Reiya Ootao
  • Publication number: 20090232564
    Abstract: The invention offers a method of producing an OA apparatus roller that can increase the thermal conductivity of the surface layer composed of a fluororesin layer by decreasing its thickness, that has an excellent parting ability, that can prevent the rubber layer from deteriorating, and that is free from foreign matters adhering onto the inner surface of a hollow cylindrical mold even when the hollow cylindrical mold is used. The invention also offers an OA apparatus roller produced by the foregoing method. The method of producing an OA apparatus roller is provided with a step of forming an elastic layer and a surface layer in this order on a core metal. In this method, the surface layer is formed by using a fluororesin dispersion and the fluororesin dispersion contains a surfactant, a film-thickening agent, and a viscosity-increasing agent with a total content of 1.0 to 5.0 wt %.
    Type: Application
    Filed: December 15, 2008
    Publication date: September 17, 2009
    Applicant: Sumitomo Electric Fine Polymer, Inc.
    Inventors: Yoshimasa Suzuki, Masahiro Habuka, Yoshitaka Ikeda
  • Patent number: 7570362
    Abstract: In optical measurement utilizing total reflection, various types of measurement are selectively performed. The invention provides an optical measurement apparatus using total reflection, including a light source, a measurement optical system, and a light detector. The measurement optical system is an infinity-corrected positive lens formed of an optical member having a planar surface orthogonal to an optical axis of the measurement optical system at a front focal position. One side of the optical axis of the measurement optical system is used as a projection optical system for radiating measurement light onto a specimen, and another side is used as a photometric optical system for acquiring reflected light from the specimen.
    Type: Grant
    Filed: August 19, 2008
    Date of Patent: August 4, 2009
    Assignee: Olympus Corporation
    Inventors: Shinichi Dosaka, Yoshimasa Suzuki
  • Publication number: 20090189087
    Abstract: A measuring device includes a light source, a holding member for holding a sample, a first concave mirror and a second concave mirror, the second concave mirror being arranged on the light path from the light source to the holding member, the first concave mirror being arranged vis-a-vis the second concave mirror with the holding member interposed between them, the first concave mirror and the second concave mirror being arranged with their concave surfaces facing each other, the first concave mirror being larger than the second concave mirror in terms of their outer dimensions.
    Type: Application
    Filed: December 22, 2008
    Publication date: July 30, 2009
    Applicant: OLYMPUS CORPORATION
    Inventor: Yoshimasa SUZUKI
  • Publication number: 20090189080
    Abstract: A measuring instrument has a light source for irradiating light including rays of light having the wavelength of excitation light, an objective lens for focusing light irradiated from the light source to a predetermined focusing position, a first mirror for directly reflecting light from the objective lens, a second mirror for reflecting light reflected by the first mirror, the second mirror having an aperture P, and a measuring device for measuring light generated from a sample and having a wavelength different from the wavelength of excitation light, and the sample being arranged between the first mirror and the second mirror, the focusing position of the objective lens being made to agree with the position of the aperture P, and the measuring device being adapted to measure light of a wavelength different from the wavelength of excitation light generated from the sample and passing through the aperture P.
    Type: Application
    Filed: January 27, 2009
    Publication date: July 30, 2009
    Applicant: OLYMPUS CORPORATION
    Inventors: Yoshimasa Suzuki, Mitsuru Namiki
  • Publication number: 20090176637
    Abstract: The invention offers an OA apparatus roller that has a surface layer formed by applying fluororesin and baking it, that has various excellent properties without impairing the parting ability and thermal conductivity, and that is suitable for mass production. An OA apparatus roller is produced by forming an elastic layer and a surface layer in this order on a core metal. In the roller, the surface layer is composed of a plurality of fluororesin layers and has a thickness of 6 to 30 ?m. An OA apparatus roller has a structure in which of the multiple fluororesin layers forming the surface layer, at least one layer is a fluororesin layer containing filler. An OA apparatus roller has a structure in which of the multiple fluororesin layers forming the surface layer, the outermost layer is a fluororesin layer containing no filler and at least one layer other than the outermost layer is a fluororesin layer containing filler.
    Type: Application
    Filed: December 31, 2008
    Publication date: July 9, 2009
    Applicant: SUMITOMO ELECTRIC FINE POLYMER, INC.
    Inventors: Yoshimasa Suzuki, Masahiro Habuka, Yoshitaka Ikeda
  • Patent number: 7530610
    Abstract: A door handle for a vehicle including a handle for opening and closing a vehicle door, and a base fixed to an outer panel of the vehicle door and rotatably supporting the handle includes an opening formed on the outer panel and including a portion having a first width, and a base frame formed on one end side of the base and including a portion having a second width larger than the first width. The portion having the second width of the base frame intrudes into a vehicle interior side of the outer panel through the opening when the base frame is fixed to the outer panel from a vehicle exterior side. The door handle for a vehicle further includes a tightening portion formed on the other end side of the base and tightening the base relative to the outer panel.
    Type: Grant
    Filed: August 9, 2005
    Date of Patent: May 12, 2009
    Assignee: Aisin Seiki Kabushiki Kaisha
    Inventors: Tetsurou Tanimoto, Masaki Nishikawa, Yoshimasa Suzuki
  • Publication number: 20090086211
    Abstract: In optical measurement utilizing total reflection, various types of measurement are selectively performed. The invention provides an optical measurement apparatus using total reflection, including a light source, a measurement optical system, and a light detector. The measurement optical system is an infinity-corrected positive lens formed of an optical member having a planar surface orthogonal to an optical axis of the measurement optical system at a front focal position. One side of the optical axis of the measurement optical system is used as a projection optical system for radiating measurement light onto a specimen, and another side is used as a photometric optical system for acquiring reflected light from the specimen.
    Type: Application
    Filed: August 19, 2008
    Publication date: April 2, 2009
    Inventors: Shinichi Dosaka, Yoshimasa Suzuki
  • Patent number: 7511827
    Abstract: An interferometer comprises a wavelength-variable light source. A reference light and a measurement light are synthesized, and the synthesized light is split into a plurality of split lights. A certain phase difference is provided between the split lights through phase shifting optical members. A plurality of interference fringe images formed by the phase-shifted split lights are captured at an imaging unit. Biases, amplitudes and the amounts of phase shift of the interference fringes formed by the plurality of split lights are calculated, based on interference fringe intensities of the imaged interference fringes, which are obtained by disposing a calibrating substrate instead of the measuring object varying the wavelength of the emitted light to plural values, and operating the imaging unit to capture a plurality of images of interference fringes obtained by the split lights.
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: March 31, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, David W. Sesko
  • Patent number: 7499178
    Abstract: An oblique incidence interferometer is provided for applying a light at a certain angle from the normal to a measurement surface of a target to be measured and measuring a light reflected from the target. A beam splitter element and beam synthesizer element splits the light from a light source into a measurement light to be applied to the target and a reference light serving as the measurement reference. It also orthogonalizes the polarization directions of the measurement light reflected from the target and the reference light and synthesizes the lights. A three-way split prism splits the synthesized light into a plurality of split lights. Imaging units are provided to capture a plurality of interference fringe images formed in accordance with the plurality of split lights. A ¼-waveplate is provided on either one of an entry side and an exit side of the three-way split prism. Polarizers are provided on imaging surfaces of the imaging units.
    Type: Grant
    Filed: June 28, 2007
    Date of Patent: March 3, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, Reiya Ootao
  • Publication number: 20090021747
    Abstract: A shape measuring apparatus includes a probe for scanning across a surface to be measured, while vibrating up and down; a minute-vibration generation section for vibrating the probe up and down; a vertical movement control section for moving the probe up and down to keep a constant contact force or a constant distance between the surface to be measured and the probe; a scanning section for scanning the surface to be measured with the probe; a displacement sensor for measuring the vertical displacement of the probe and outputting a probe displacement signal; and a signal processing section for obtaining information about the contact force or the distance between the surface to be measured and the probe from a high-frequency component of the probe displacement signal, and for obtaining information about profile of the surface to be measured from a low-frequency component of the signal obtained when the surface to be measured is scanned such that the distance or the contact force is kept constant.
    Type: Application
    Filed: July 18, 2008
    Publication date: January 22, 2009
    Applicant: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Satoshi Koga, Yoshimasa Suzuki
  • Publication number: 20080302148
    Abstract: A door handle device is provided with: a handle member 10; a handle frame member 20 swingably supporting the handle member 10, the handle frame member being fixed to a door 50; and a key cylinder cover 49 integrated with a key cylinder device 30 capable of locking the door 50. The handle member 10 has a swing center axis O about which the handle member 10 swings relative to the handle frame member 20. On the slide center axis O, an engagement pin 14 is interposed between the handle member 10 and the key cylinder cover 49.
    Type: Application
    Filed: August 1, 2005
    Publication date: December 11, 2008
    Applicant: AISIN SEIKI KABUSHIKI KAISHA
    Inventors: Tetsurou Tanimoto, Masaki Nishikawa, Yoshimasa Suzuki
  • Patent number: 7422251
    Abstract: A door handle device includes a handle member having a counterweight, a handle frame member configured to be fixed to a door and having an opening portion, the handle frame member being slidably engaged with the handle member while the counterweight being inserted through the opening portion. The door handle device further includes a first engaging shaft portion provided on the handle frame member, a second engaging shaft portion provided on the handle frame member, a first through hole provided on the handle member, a second through hole provided on the handle member, and an interposition member provided on a lower end contacting point between the handle member and the handle frame member after the handle member being slid relative to the handle frame member and engaged with the handle frame member at the smallest engaging angle therebetween.
    Type: Grant
    Filed: August 5, 2005
    Date of Patent: September 9, 2008
    Assignee: Aisin Seiki Kabushiki Kaisha
    Inventors: Tetsurou Tanimoto, Masaki Nishikawa, Yoshimasa Suzuki
  • Patent number: 7397570
    Abstract: A wavelength-variable light source is configured to emit a light with a wavelength (?), which is variable within a scan width (??). An interferometer has a coherent length (?L), which is determinable from (??) and (?). A controller determines an appropriate magnitude of the scan width (??) while a CCD camera captures a fringe image in an exposure time (Te), which is set longer than a time for wavelength scanning.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: July 8, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, David W. Sesko
  • Publication number: 20080047335
    Abstract: A measuring apparatus comprising: a reference member held in fixed position and orientation with respect to a workpiece during measurement; a stylus for scanning a surface of the workpiece while being displaced upward and downward in accordance with unevenness of the surface of the workpiece; a displacement gauge for measuring a displacement of a specific part of the stylus relative to the reference member; and a scanner for causing the stylus to scan the workpiece along the surface; wherein the fixed position and orientation of the reference member with respect to the workpiece are not changed even during the operation of the scanner; the up-and-down displacement of the specific part of the stylus is measured relative to the reference member; a fine shape of the workpiece is detected in accordance with the measured displacement of the specific part of the stylus.
    Type: Application
    Filed: August 22, 2007
    Publication date: February 28, 2008
    Applicant: MITUTOYO CORPORATION
    Inventors: Kazuhiko Kawasaki, Satoshi Koga, Yoshimasa Suzuki
  • Publication number: 20080002212
    Abstract: An oblique incidence interferometer is provided for applying a light at a certain angle from the normal to a measurement surface of a target to be measured and measuring a light reflected from the target. A beam splitter element and beam synthesizer element splits the light from a light source into a measurement light to be applied to the target and a reference light serving as the measurement reference. It also orthogonalizes the polarization directions of the measurement light reflected from the target and the reference light and synthesizes the lights. A three-way split prism splits the synthesized light into a plurality of split lights. Imaging units are provided to capture a plurality of interference fringe images formed in accordance with the plurality of split lights. A ¼-waveplate is provided on either one of an entry side and an exit side of the three-way split prism. Polarizers are provided on imaging surfaces of the imaging units.
    Type: Application
    Filed: June 28, 2007
    Publication date: January 3, 2008
    Applicant: MITUTOYO CORPORATION
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, Reiya Ootao
  • Patent number: 7271952
    Abstract: A microscope imaging apparatus and a biological-specimen examination system that can accurately carry out measurement even for an object under examination having substantial brightness non-uniformity are provided. The microscope imaging apparatus includes a stage that holds the object under examination, an illumination unit that illuminates the object under examination, an image-acquisition unit that acquires images of the object under examination, and a motion unit that moves the stage and the image-acquisition unit relative to each other. The image-acquisition unit includes an imaging device capable of image acquisition using a time delay integration method. When acquiring a plurality of images of the object under examination, the exposure time during which accumulated charge is produced in the imaging device is made different for each of the acquired images, and the plurality of images are combined into a single image.
    Type: Grant
    Filed: January 18, 2007
    Date of Patent: September 18, 2007
    Assignee: Olympus Corporation
    Inventors: Yoshimasa Suzuki, Kayuri Muraki