Abstract: A solid-state imaging device including: an analog-digital converter unit in column parallel arrangement, the analog-digital converter unit having a plurality of pixels arranged to convert an incident light quantity to an electric signal, in which an analog signal obtained from the pixel is converted into a digital signal, wherein the analog-digital converter unit is configured of: a comparator operable to compare a value of a column signal line from which an analog signal obtained by the pixel is outputted with a value of a reference line, and a counter operable to measure a time period by the time when comparison done by the comparator is finished and to store the comparison result, wherein the solid-state imaging device further includes: a module for controlling an output of the comparator operable to control the output of the comparator depending on the output of the comparator.

Abstract: A negative electrode for a secondary battery includes a negative electrode current collector and a negative electrode active material layer provided in the negative electrode current collector and which is alloyed with the negative electrode current collector at least at a part of an boundary face between it and the negative electrode current collector, wherein the negative electrode current collector has a first surface on which the negative electrode active material layer is formed and a second surface on which the negative electrode active material layer is not formed, the negative electrode having a portion in which the second surfaces of the negative electrode current collector are opposed to each other.

Abstract: There is provided a solid-state image pickup device including: a pixel array portion which includes a plurality of unit pixels each having a photoelectric conversion element and an output transistor for outputting a signal according to charge obtained by photoelectric conversion of the photoelectric conversion element; a comparing portion which compares the signal output from each of the unit pixels with a ramp-shaped reference signal; a measuring portion which starts an operation in synchronization with the supply of the reference signal to the comparing portion, performs the operation until the comparison output of the comparing portion is inverted, and measures a time until the comparison of the comparing portion is finished; and a detecting portion which detects a predetermined image pickup condition and fixes the comparison output of the comparing portion to a state before the comparison starts when the image pickup condition is detected.

Abstract: A CMOS image sensor includes column-parallel ADCs. Each of the ADCs includes a comparator and an up/down counter. With this configuration, digital values of pixels in a plurality of rows can be added without using additional circuits, such as an adder and a line memory device, and the frame rate can be increased while maintaining constant sensitivity.

Abstract: A solid-state image-pickup device having a plurality of analog-to-digital converters that has a plurality of pixels converting an incident-light quantity into an electrical signal and that converts an analog signal obtained from each of the pixels into a digital signal is provided. The analog-to-digital converter includes a plurality of comparators, wherein each of the comparators compares a reference voltage changing over time to the analog signal and wherein different reference voltages are transmitted to the comparators, and at least one counter that counts a time period required to finish the comparison made by the comparator, that stores information about a result of the counting, and that has different count numbers.

Abstract: A transmission component is incorporated into a transmission in which an input shaft, an output shaft, or a gear is rotatably supported by a rolling bearing. The component has a nitriding layer at a surface layer and an austenite grain with a grain size number falling within a range exceeding 10. This provides a transmission component having an increased anti-crack strength, enhanced dimensional stability, and a long fatigue life. A method of manufacturing such a transmission component and a tapered roller bearing are also provided.

Abstract: A column analog-to-digital converter having a voltage comparator and a counter is arranged for each a vertical signal line. The voltage comparator compares a pixel signal inputted via the vertical signal line at each row control signal line with a reference voltage, thereby generating a pulse signal having a length in time axis corresponding to the magnitude of a reset component and a signal component. The counter counts a clock to measure the width of the pulse signal until the end of the comparison operation of the comparator, and stores a count at the end of the comparison. A communication and timing controller controls the voltage comparator and the counter so that, in a first process, the voltage comparator performs a comparison operation on a reset component with the counter performing a down-counting operation, and so that, in a second process, the voltage controller performs the comparison operation on a signal component with the counter performing an up-counting operation.

Abstract: A solid-state image pick up device including a pixel array unit having unit pixels arranged in a matrix pattern. Each unit pixel includes a photoelectric converter. Additionally, the solid-state image pick up device has column signal lines that correspond to the respective columns of the matrix pattern, a row scanning means for selectively controlling each unit pixel, and an analog-digital converting unit for converting analog signals output from the unit pixels in a row selectively controlled by the row scanning means. The analog-digital converting unit further includes an asynchronous counter which performs counting in two modes and the asynchronous counter includes a counter processor configured so that when switching between the count modes occurs, a running count value is broken and there is an interval between the count modes and when a mode begins the running count value is reset to the value before the running count value was broken.

Abstract: A CMOS image sensor includes column-parallel ADCs. Each of the ADCs includes a comparator and an up/down counter. With this configuration, digital values of pixels in a plurality of rows can be added without using additional circuits, such as an adder and a line memory device, and the frame rate can be increased while maintaining constant sensitivity.

Abstract: A semiconductor device includes a semiconductor substrate having an element region on a surface thereof, an active element being formed in the element region. An insulating layer is formed on the semiconductor substrate and covers the active element. An inductor is formed on the insulating layer and overlaps with the active element.

Abstract: A column analog-to-digital converter having a voltage comparator and a counter is arranged for each a vertical signal line. The voltage comparator compares a pixel signal inputted via the vertical signal line at each row control signal line with a reference voltage, thereby generating a pulse signal having a length in time axis corresponding to the magnitude of a reset component and a signal component. The counter counts a clock to measure the width of the pulse signal until the end of the comparison operation of the comparator, and stores a count at the end of the comparison. A communication and timing controller controls the voltage comparator and the counter so that, in a first process, the voltage comparator performs a comparison operation on a reset component with the counter performing a down-counting operation, and so that, in a second process, the voltage controller performs the comparison operation on a signal component with the counter performing an up-counting operation.

Abstract: A DA conversion device includes the following elements. A higher-bit current source cell portion includes uniformly weighted higher-bit current source cells to generate an identical constant current. A lower-bit current source cell portion includes a lower-bit current source cells that are weighted to generate 1/two-to-the-power-of-certain-numbers constant currents. A constant current source selection controller includes a lower-bit controller having a scaler that uses clocks scaled down to 1/two-to-the-power-of-certain-numbers to select the lower-bit current source cells, and a higher-bit controller having shift registers and using a signal indicating a carry bit or a borrow bit used in the lower-bit controller to sequentially activate shift outputs of the shift registers, and uses the shift outputs to select the higher-bit current source cells. Constant current outputs of the selected current source cells are added and output so that an output current corresponding to the digital input signal is obtained.

Abstract: A CMOS image sensor includes column-parallel ADCs. Each of the ADCs includes a comparator and an up/down counter. With this configuration, digital values of pixels in a plurality of rows can be added without using additional circuits, such as an adder and a line memory device, and the frame rate can be increased while maintaining constant sensitivity.

Abstract: The present invention provides a solid-state imaging device including: a pixel array block; a row scanning device; and an analogue-digital conversion device, the analogue-digital conversion device including: a comparing device having a reset device; a counting device that counts a comparison period from initiation to completion of comparison performed by the comparing device; and a changing device that changes a voltage at the other input terminal to a predetermined voltage after a resetting operation performed by the reset device.

Abstract: A column analog-to-digital converter having a voltage comparator and a counter is arranged for each a vertical signal line. The voltage comparator compares a pixel signal inputted via the vertical signal line at each row control signal line with a reference voltage, thereby generating a pulse signal having a length in time axis corresponding to the magnitude of a reset component and a signal component. The counter counts a clock to measure the width of the pulse signal until the end of the comparison operation of the comparator, and stores a count at the end of the comparison. A communication and timing controller controls the voltage comparator and the counter so that, in a first process, the voltage comparator performs a comparison operation on a reset component with the counter performing a down-counting operation, and so that, in a second process, the voltage controller performs the comparison operation on a signal component with the counter performing an up-counting operation.

Abstract: A semiconductor device, including a semiconductor substrate having an element region on a surface thereof, an electrical element being formed in the element region; an insulating layer formed on the semiconductor substrate and covering the electrical element; and an inductor formed on the insulating layer and overlapping with the element region. In an exemplary embodiment, the element region is free from being overlapped by a center axis of the inductor. In another exemplary embodiment, the inductor includes a wiring region, a center region, and a wiring pattern formed in the wiring region and winding spirally to surround the center region, the element region being free from being overlapped by the center region. In a further exemplary embodiment, the inductor includes a voltage controlled oscillator, and the electrical element is electrically connected to the inductor and includes at least one of a varactor and a MOSFET.

Abstract: In an analog-to-digital conversion method for converting a difference signal component representing a difference between a reference component and a signal component in an analog signal to be processed into digital data, in a first process, a signal corresponding to one of the reference component and the signal component is compared with a reference signal for conversion into the digital data. Concurrently with the comparison, counting is performed in one of a down-count mode and an up-count mode, and a count value at a time of completion of the comparison is held. In a second process, a signal corresponding to the other one of the reference component and the signal component is compared with the reference signal. Concurrently with the comparison, counting is performed in the other one of the down-count mode and the up-count mode, and a count value at a time of completion of the comparison is held.

Abstract: A column analog-to-digital converter having a voltage comparator and a counter is arranged for each a vertical signal line. The voltage comparator compares a pixel signal inputted via the vertical signal line at each row control signal line with a reference voltage, thereby generating a pulse signal having a length in time axis corresponding to the magnitude of a reset component and a signal component. The counter counts a clock to measure the width of the pulse signal until the end of the comparison operation of the comparator, and stores a count at the end of the comparison. A communication and timing controller controls the voltage comparator and the counter so that, in a first process, the voltage comparator performs a comparison operation on a reset component with the counter performing a down-counting operation, and so that, in a second process, the voltage controller performs the comparison operation on a signal component with the counter performing an up-counting operation.

Abstract: A DA conversion device includes the following elements. A higher-bit current source cell portion includes uniformly weighted higher-bit current source cells to generate an identical constant current. A lower-bit current source cell portion includes a lower-bit current source cells that are weighted to generate 1/two-to-the-power-of-certain-numbers constant currents. A constant current source selection controller includes a lower-bit controller having a scaler that uses clocks scaled down to 1/two-to-the-power-of-certain-numbers to select the lower-bit current source cells, and a higher-bit controller having shift registers and using a signal indicating a carry bit or a borrow bit used in the lower-bit controller to sequentially activate shift outputs of the shift registers, and uses the shift outputs to select the higher-bit current source cells. Constant current outputs of the selected current source cells are added and output so that an output current corresponding to the digital input signal is obtained.

Abstract: A solid-state image pick up device including a pixel array unit having unit pixels arranged in a matrix pattern. Each unit pixel includes a photoelectric converter. Additionally, the solid-state image pick up device has column signal lines that correspond to the respective columns of the matrix pattern, a row scanning means for selectively controlling each unit pixel, and an analog-digital converting unit for converting analog signals output from the unit pixels in a row selectively controlled by the row scanning means. The analog-digital converting unit further includes an asynchronous counter which performs counting in two modes and the asynchronous counter includes a counter processor configured so that when switching between the count modes occurs, a running count value is broken and there is an interval between the count modes and when a mode begins the running count value is reset to the value before the running count value was broken.