Patents by Inventor Yoshiyasu Ito

Yoshiyasu Ito has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080140299
    Abstract: A fuel injection control apparatus of an internal combustion engine is disclosed. This apparatus is provided with a crank angle detector that includes a signal rotor having a number of tooth portions and a toothless portion. The crank angle detector outputs a first signal corresponding to each tooth portion and a second signal corresponding to the toothless portion. A control computer selectively carries out a first calculation process for calculating the timing of fuel injection using the first signal and a second calculation process for calculating the timing of fuel injection using the second signal. When carrying out the second calculation process, the control computer calculates the timing of fuel injection using the length of time gained by dividing the length of time gained through detection of the toothless portion by the number of tooth portions which can be aligned in the toothless portion.
    Type: Application
    Filed: November 8, 2007
    Publication date: June 12, 2008
    Inventors: Yoshiya Yamamura, Yoshiyasu Ito
  • Publication number: 20080131665
    Abstract: A ceramics composite member includes a structure in which a first ceramic member and a second ceramic member are integrated with a joint portion. The joint portion has a texture in which a silicon phase having an average diameter of 0.05 ?m or more and 10 ?m or less is continuously provided in a network form in interstices of silicon carbide particles having an average particle diameter of 0.1 ?m or more and 0.1 mm or less.
    Type: Application
    Filed: November 29, 2007
    Publication date: June 5, 2008
    Inventors: Shoko Suyama, Yoshiyasu Ito, Shigeki Maruyama, Norihiko Handa
  • Patent number: 7364227
    Abstract: A movable roof opening-closing structure rotatively opening and closing a movable roof toward backward at an outside of a vehicle body through a linkage equipped with a first link bar and a second link bar, wherein the linkage is configured with an inequilateral four-bar linkage having a fixed bar at a vehicle body side, and wherein an instant center of the movable roof against the vehicle body when the movable roof is at an entirely closing position is located at one of positions where is ahead of a front end of the movable roof and behind of a rear end of the movable roof.
    Type: Grant
    Filed: November 10, 2005
    Date of Patent: April 29, 2008
    Assignees: Yachiyo Kogyo Kabushiki Kaisha, Honda Motor Co., Ltd.
    Inventors: Yoshiyasu Ito, Hiroyuki Tsukamoto, Akio Kobori, Michio Tamura, Akihiko Kuribayashi
  • Patent number: 7361272
    Abstract: The present invention is to provide an anisotropic porous material for a fluid filter which can perform a separation process of a large amount of fluid with high accuracy, which can achieve high flux, and which can improve detergent properties. The anisotropic porous material includes a plurality of pores. Each of the pores has an anisotropic shape in which a major axis and a minor axis can be defined. An arrangement of the pores has an orientation.
    Type: Grant
    Filed: November 6, 2006
    Date of Patent: April 22, 2008
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Tsuneji Kameda, Yoshiyasu Ito, Takahiko Shindo, Yuuji Hisazato
  • Patent number: 7342997
    Abstract: The dead time of a pulse type X-ray detector is measured without estimation of a true X-ray intensity. The first and the second conditions are used for varying an intensity of an X-ray entering the X-ray detector. The first condition may be the slit width of a receiving slit, at least three kinds of slit width being selected. The second condition may be with or without an absorption plate. The first observed X-ray intensities are observed, with the absorption plate inserted, for three or more values in slit width. Next, the second observed X-ray intensities are observed similarly but with the absorption plate removed. A predetermined relational expression is made up among the first observed X-ray intensity, the second observed X-ray intensity, a ratio k of the second observed X-ray intensity to the first observed X-ray intensity (depending upon attenuation in X-ray intensity caused by the absorption plate) and the dead time ? of the X-ray detector.
    Type: Grant
    Filed: May 16, 2006
    Date of Patent: March 11, 2008
    Assignee: Rigaku Corporation
    Inventors: Tomoyasu Ueda, Yoshiyasu Ito, Kazuhiko Omote
  • Publication number: 20080002812
    Abstract: A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention includes three aspects. The first aspect is that an equipment constant is determined and an unknown void or particle content is calculated based on the equipment constant. The second aspect is that a plurality of samples having unknown matrix densities are prepared, the matrix densities are determined so that differences in the matrix densities among the samples become a minimum, and a void or particle content is calculated based on the matrix density and the scale factor of the X-ray small angle scattering. The third aspect is for a plurality of samples having unknown particle densities, and executes procedures similar to those of the second aspect.
    Type: Application
    Filed: August 23, 2007
    Publication date: January 3, 2008
    Applicant: Rigaku Corporation
    Inventor: Yoshiyasu ITO
  • Publication number: 20070249721
    Abstract: The object of the present invention is to provide a hair restorer which exhibits a stimulatory effect on hair restoration against hair loss, hair thinning, split ends, hair graying, etc., with higher stability and safety than those of known hair restorers containing 5-aminolevulinic acids as active components. By using 5-aminolevulinic acid or its salt or its derivative, and a composition containing iron sodium diethylenetriaminepentaacetate or iron ammonium diethylenetriaminepentaacetate as active components, a hair restorer and a method for restoring hair which are excellent in hair growth promotion, and stability and safety, are provided.
    Type: Application
    Filed: July 6, 2004
    Publication date: October 25, 2007
    Inventor: Yoshiyasu Ito
  • Patent number: 7272206
    Abstract: A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention includes three aspects. The first aspect is that an equipment constant is determined and an unknown void or particle content is calculated based on the equipment constant. The second aspect is that a plurality of samples having unknown matrix densities are prepared, the matrix densities are determined so that differences in the matrix densities among the samples become a minimum, and a void or particle content is calculated based on the matrix density and the scale factor of the X-ray small angle scattering. The third aspect is for a plurality of samples having unknown particle densities, and executes procedures similar to those of the second aspect.
    Type: Grant
    Filed: March 4, 2005
    Date of Patent: September 18, 2007
    Assignee: Rigaku Corporation
    Inventor: Yoshiyasu Ito
  • Patent number: 7248669
    Abstract: A method and apparatus for analyzing a membrane structure by fitting simulated operation data to measured data obtained by X-ray reflectivity measurement to analyze the membrane structure. The analysis result obtained by the fitting can be prevented from falling into a local solution, so as to obtain an analysis result of the membrane structure with high accuracy. The method for analyzing a membrane structure for analyzing a structure of a membrane specimen having a single layer membrane or a multi-layer membrane by an X-ray reflectivity measurement, includes a step of simultaneously analyzing plural pieces of measured data obtained by measuring the membrane specimen under plural sets of measuring conditions different from each other in at least one of a resolution and a dynamic range.
    Type: Grant
    Filed: October 6, 2004
    Date of Patent: July 24, 2007
    Assignee: Rigaku Corporation
    Inventors: Yoshiyasu Ito, Kazuhiko Omote
  • Publication number: 20070104941
    Abstract: The present invention is to provide an anisotropic porous material for a fluid filter which can perform a separation process of a large amount of fluid with high accuracy, which can achieve high flux, and which can improve detergent properties. The anisotropic porous material includes a plurality of pores. Each of the pores has an anisotropic shape in which a major axis and a minor axis can be defined. An arrangement of the pores has an orientation.
    Type: Application
    Filed: November 6, 2006
    Publication date: May 10, 2007
    Inventors: Tsuneji Kameda, Yoshiyasu Ito, Takahiro Shindo, Yuuji Hisazato
  • Publication number: 20070031633
    Abstract: A sputtering target contains Si and C as its major components and includes a texture in which a Si phase continuously exists in a net shape in gaps among SiC crystal grains. An average diameter of the Si phase is controlled to 1000 nm or less. The sputtering target is sputtered in an oxygen-containing gas, thereby depositing an optical thin film containing Si and O as its major components, and a third element other than the major components, a total amount of the third element being within a range from 10 to 2000 ppm.
    Type: Application
    Filed: March 7, 2006
    Publication date: February 8, 2007
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yasuhiro Satoh, Tsukasa Nakai, Sumio Ashida, Shoko Suyama, Yoshiyasu Ito
  • Publication number: 20060285642
    Abstract: The dead time of a pulse type X-ray detector is measured without estimation of a true X-ray intensity. The first and the second conditions are used for varying an intensity of an X-ray entering the X-ray detector. The first condition may be the slit width of a receiving slit, at least three kinds of slit width being selected. The second condition may be with or without an absorption plate. The first observed X-ray intensities are observed, with the absorption plate inserted, for three or more values in slit width. Next, the second observed X-ray intensities are observed similarly but with the absorption plate removed. A predetermined relational expression is made up among the first observed X-ray intensity, the second observed X-ray intensity, a ratio k of the second observed X-ray intensity to the first observed X-ray intensity (depending upon attenuation in X-ray intensity caused by the absorption plate) and the dead time ? of the X-ray detector.
    Type: Application
    Filed: May 16, 2006
    Publication date: December 21, 2006
    Applicant: Rigaku Corporation
    Inventors: Tomoyasu Ueda, Yoshiyasu Ito, Kazuhiko Omote
  • Patent number: 7098459
    Abstract: Disclosed herein is a sample-analyzing method, in which an incident beam slit is provided between an X-ray source and a sample, a receiving side beam slit is provided between the sample and an X-ray detector, the X-ray detector detects X-rays scattered again from the sample and coming through the receiving side beam slit when the sample is irradiated with the X-rays applied through the incident beam slit, and a value is measured from a value detected by the X-ray detector. In the method, a true value is measured from the value, by using a slit function representing an influence which the incident beam slit and receiving side beam slit impose on the detected value. The slit function is determined from an intensity distribution of the X-rays scattered again from the sample. The method obtains an accurate slit function in accordance with the structure of the optical system employed and can therefore analyze the sample with high precision.
    Type: Grant
    Filed: June 10, 2003
    Date of Patent: August 29, 2006
    Assignee: Rigaku Corporation
    Inventors: Kazuhiko Omote, Akito Sasaki, Yoshiyasu Ito
  • Patent number: 7080915
    Abstract: The present invention adopts a particle dispersed silicon material, comprising silicon carbide as dispersion particles, as a mirror substrate, subjects the mirror substrate to mirror finish polishing to form a mirror body, forms a reflecting film on the mirror body to form a mirror, and uses the mirror to form a large aperture optical system.
    Type: Grant
    Filed: April 13, 2004
    Date of Patent: July 25, 2006
    Assignee: NEC Toshiba Space Systems, Ltd.
    Inventors: Katsuhiko Tsuno, Shoko Suyama, Tsuneji Kameda, Yoshiyasu Ito
  • Publication number: 20060119143
    Abstract: A movable roof opening-closing structure rotatively opening and closing a movable roof toward backward at an outside of a vehicle body through a linkage equipped with a first link bar and a second link bar, wherein the linkage is configured with an inequilateral four-bar linkage having a fixed bar at a vehicle body side, and wherein an instant center of the movable roof against the vehicle body when the movable roof is at an entirely closing position is located at one of positions where is ahead of a front end of the movable roof and behind of a rear end of the movable roof.
    Type: Application
    Filed: November 10, 2005
    Publication date: June 8, 2006
    Applicants: YACHIYO KOGYO KABUSHIKI KAISYA, HONDA MOTOR CO., LTD.
    Inventors: Yoshiyasu Ito, Hiroyuki Tsukamoto, Akio Kobori, Michio Tamura, Akihiko Kuribayashi
  • Patent number: 7039161
    Abstract: A method and apparatus for analyzing a film structure analyze particle or pore size distribution with high accuracy and evaluate a shape of a surface or interface even in the case where the absolute amount of particles or pores in the thin film is small.
    Type: Grant
    Filed: October 19, 2004
    Date of Patent: May 2, 2006
    Assignee: Rigaku Corporation
    Inventors: Yoshiyasu Ito, Kazuhiko Omote
  • Publication number: 20050195940
    Abstract: A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention includes three aspects. The first aspect is that a equipment constant is determined and an unknown void or particle content is calculated based on the equipment constant. The second aspect is that a plurality of samples having unknown matrix densities are prepared, the matrix densities are determined so that the difference in the matrix densities among the samples become a minimum, and a void or particle content is calculated based on the matrix density and the scale factor of the X-ray small angle scattering. The third aspect is for a plurality of samples having unknown particle densities and executes procedures similar to those of the second aspect.
    Type: Application
    Filed: March 4, 2005
    Publication date: September 8, 2005
    Applicant: Rigaku Corporation
    Inventor: Yoshiyasu Ito
  • Patent number: 6920200
    Abstract: Provided is a novel density-nonuniform multilayer analyzing method that readily and highly accurately enables analyzing the state of distribution and interfacial condition of particulate matter in a density-nonuniform multilayer film. The method includes the step of, by using a scattering function representing an X-ray scattering curve according to a fitting parameter indicating a state of distribution of particulate matter, calculating a simulated X-ray scattering curve under the same conditions as those under which an actually measured X-ray scattering curve is measured, and the step of performing fitting between the simulated X-ray scattering curve and the actually measured X-ray scattering curve while the fitting parameter is being changed.
    Type: Grant
    Filed: June 6, 2003
    Date of Patent: July 19, 2005
    Assignee: Rigaku Corporation
    Inventors: Yoshiyasu Ito, Kazuhiko Omote
  • Publication number: 20050105686
    Abstract: A method for analyzing a film structure and an apparatus therefor are provided that analyze particle or pore size distribution with high accuracy and evaluate a shape of a surface or interface even in the case where the absolute amount of the particles or pores in the thin film is small.
    Type: Application
    Filed: October 19, 2004
    Publication date: May 19, 2005
    Inventors: Yoshiyasu Ito, Kazuhiko Omote
  • Publication number: 20050102110
    Abstract: Such a method for analyzing a membrane structure by fitting simulated operation data to measured data obtained by X-ray reflectivity measurement to analyze the membrane structure, and an apparatus therefor are provided, in which the analysis result obtained by the fitting can be prevented from falling into a local solution, so as to obtain an analysis result of the membrane structure with high accuracy. The method for analyzing a membrane structure for analyzing a structure of a membrane specimen having a single layer membrane or a multi-layer membrane by an X-ray reflectivity measurement, contains a step of simultaneously analyzing plural pieces of measured data obtained by measuring the membrane specimen under plural sets of measuring conditions different from each other in at least one of a resolution and a dynamic range.
    Type: Application
    Filed: October 6, 2004
    Publication date: May 12, 2005
    Inventors: Yoshiyasu Ito, Kazuhiko Omote