Abstract: A data transmission circuit includes a data transmission unit and a data receiving unit. The data transmission unit generates transmission data based on first chip data and transmit the transmission data via a Through Silicon Via (TSV). The data receiving unit differentially amplifies the transmission data with respect to a reference voltage to generate second chip data.

Abstract: A delay locked loop circuit includes a clock buffering block to generate first and second internal clocks corresponding to first and second edges of a source clock in response to a clock buffering control signal, respectively, wherein generation of the second internal clock is controlled by a duty correcting operation terminating signal and a delay locking signal, a delay locking block to compare phases of the first and second internal clocks with those of first and second feedback clocks, respectively, to enable the delay locking signal according to a delay locking and delay the first and second internal clocks as many as times corresponding to the comparison results, respectively, thereby outputting first and second delay locking clocks, a duty correcting block to mix phases of the first and second delay locking clocks, and a first signal generating block to generate the duty correcting operation terminating signal.

Abstract: A delay locked loop circuit includes a delay locking block configured to delay an input clock and output the delayed input clock as an internal clock to compensate a skew of an external clock and the internal clock, a pulse generating block configured to sequentially output a plurality of pulse signals that control an operation of the delay locking block and enable one of the plurality of pulse signals in response to a detection signal, wherein the plurality of pulse signals is shifted by being synchronized with the input clock, and a pulse detecting block configured to output the detection signal in case all of the plurality of pulse signals are disabled.

Abstract: A semiconductor memory device includes: a delay locked loop (DLL) clock buffer for buffering a system clock in response to the a buffer enable signal; a DLL circuit for generating a delay locked loop (DLL) clock by performing a delay locking operation using the buffered system clock; and a DLL clock buffer controller for generating the buffer enable signal in response to a code signal and a clock enable signal, the code signal containing information about whether to perform the delay locking operation.

Abstract: A semiconductor memory device includes a delay locked loop for achieving a delay locked state by correcting a phase difference between a reference clock and an internal delayed clock and for indicating the state that a larger delay amount than a maximum delay amount of a delay line is required, or a smaller delay amount than a minimum delay amount of delay line is required. A control unit resets the delay locked loop according to the state of the delay line.

Abstract: A semiconductor memory device includes a delay locked loop for achieving a delay locked state by correcting a phase difference between a reference clock and an internal delayed clock and for indicating the state that a larger delay amount than a maximum delay amount of a delay line is required, or a smaller delay amount than a minimum delay amount of delay line is required. A control unit resets the delay locked loop according to the state of the delay line.

Abstract: A data input device of a semiconductor memory apparatus includes input means configured to input data; precharge means configured to supply a precharge voltage for converting inputted data to a differential signal; enable means configured to enable the input means and the precharge means to operate; and control means configured to control a current amount of the enable means in a standby mode.

Abstract: A delay locked loop circuit includes a clock buffering block to generate first and second internal clocks corresponding to first and second edges of a source clock in response to a clock buffering control signal, respectively, wherein generation of the second internal clock is controlled by a duty correcting operation terminating signal and a delay locking signal, a delay locking block to compare phases of the first and second internal clocks with those of first and second feedback clocks, respectively, to enable the delay locking signal according to a delay locking and delay the first and second internal clocks as many as times corresponding to the comparison results, respectively, thereby outputting first and second delay locking clocks, a duty correcting block to mix phases of the first and second delay locking clocks, and a first signal generating block to generate the duty correcting operation terminating signal.

Abstract: A delay locked loop circuit includes a delay locking block configured to delay an input clock and output the delayed input clock as an internal clock to compensate a skew of an external clock and the internal clock, a pulse generating block configured to sequentially output a plurality of pulse signals that control an operation of the delay locking block and enable one of the plurality of pulse signals in response to a detection signal, wherein the plurality of pulse signals is shifted by being synchronized with the input clock, and a pulse detecting block configured to output the detection signal in case all of the plurality of pulse signals are disabled.

Abstract: A semiconductor memory device includes first positive and negative data lines driven with voltage levels contrary to each other in response to first data and second positive and negative data lines driven with voltage levels contrary to each other in response to second data, wherein one of the second positive and negative data lines is disposed between the first positive and negative data lines.

Abstract: A test circuit in a memory device includes a first compression unit configured to compress data of a plurality of cells to transmit first compressed data to a plurality of input/output lines, and a second compression unit configured to compress the first compressed data on the plurality of input/output line to output second compressed data to at least one output pin, wherein the second compression unit operates in a low compressing mode and a high compressing mode in response to a data compression selecting signal.

Abstract: A duty cycle corrector includes a delay unit configured to adjust an input clock and an inverted input clock with a delay value controlled in response to one or more control signals and to generate a positive clock and a negative clock, and a duty detector configured to receive the positive clock and the negative clock, to detect duty ratios of the positive clock and the negative clock and to generate the one or more control signals.

Abstract: A delay locked loop (DLL) circuit for a synchronous dynamic random access memory (SDRAM) enables a more stable operation when the semiconductor operates in a power-down mode for low power. The present invention can prevent a phase update operation from being interrupted when the DLL circuit enters a power-down mode. For the above purpose, an off operation of a clock buffer is delayed until a clock signal notifying a final period of the phase update is activated.

Abstract: A semiconductor memory device is capable of controlling a delay locked loop appropriately based on operation modes, particularly in a fast power-down mode to reduce an amount of current maximumly. The semiconductor memory device includes a delay-locked clock signal generating unit, a mode signal generating unit, and a delay locking control unit. The delay-locked clock signal generating unit performs a delay locking operation on a clock signal, thereby generating a delay- locked clock signal. The mode signal generating unit enables a fast precharge power-down mode signal in a fast precharge power-down mode. The delay locking control unit controls the delay-locked clock signal generating unit to be activated in a predetermined cycle in response to the fast precharge power-down mode signal.

Abstract: A semiconductor memory device is capable of controlling a delay locked loop appropriately based on operation modes, particularly in a fast power-down mode to reduce an amount of current maximally. The semiconductor memory device includes a delay-locked clock signal generating unit, a mode signal generating unit, and a delay locking control unit. The delay-locked clock signal generating unit performs a delay locking operation on a clock signal, thereby generating a delay-locked clock signal. The mode signal generating unit enables a fast precharge power-down mode signal in a fast precharge power-down mode. The delay locking control unit controls the delay-locked clock signal generating unit to be activated in a predetermined cycle in response to the fast precharge power-down mode signal.

Abstract: A register controlled DLL circuit occupies a relatively small area in a semiconductor device by reducing the number of flip-flops for generating timing pulses that are used to control a DLL operation and sequentially toggled. The registered controlled DLL circuit for generating a DLL clock by delaying internal clocks includes a timing pre-pulse generating unit configured to generate a plurality of timing pre-pulses activated sequentially in response to a source clock, the plurality of pre-pulses being repeated two or more times in each delay shifting update period, a mask signal generating unit configured to generating a mask signal having a logic level varied according to toggling of a predetermined one of the timing pre-pulses, and a timing pulse outputting unit configured to output the plurality of timing pre-pulses as a plurality of timing pulses in response to the mask signal.

Abstract: A Delayed Locked Loop Circuit of DLL comprises a buffer that receives a power-down signal and an inverted signal of a first clock signal; first and second delay lines an output device that outputs signals corresponding to the output signals of the first and second delay lines respectively; a replica delay unit, a phase comparator for comparing a phase difference between the output signal of the second buffer and the output signal of the replica delay unit; and a delay line controller for controlling delay times of the first delay line and the second delay line by corresponding to a comparison result of the phase comparator. The DLL circuit is configured such that the first and second buffers are disabled when the power-down mode entry notifying signal corresponding to a power-down mode is provided.

Abstract: Semiconductor device and semiconductor memory device include a plurality of internal circuits configured to perform test operations in response to their respective test mode signals and a plurality of test-off units configured to control the test operations of the internal circuits to be disabled in response to a test-off signal.

Abstract: The present invention relates to an apparatus and a method for detecting a failure of data in the semiconductor memory device. The semiconductor memory device according to the present invention includes: a global I/O line for transferring data between an external circuit and a local I/O line; an I/O sense amplifier for controlling a data transmission between the local I/O line and the global I/O line; and an I/O sense amplifier control unit for controlling the I/O sense amplifier in response to a test mode signal in order to test the semiconductor memory device, independent of the data outputted from a memory cell.

Abstract: A semiconductor memory device including a delay locked loop can minimize current consumption during a precharge power down mode. The delay locked loop includes a buffer control block for generating a clock buffer enable signal in response to first and second signals, wherein the first signal represents a precharge power down mode and the second signal represents a reset of the delay locked loop, a clock buffering block, controlled by the clock buffer enable signal, for buffering an external clock to generate a reference clock, and a feedback loop for delaying the reference clock until a delay locking state to thereby output a DLL output clock.