Abstract: Damage to a corner cutting edge or degradation of the roughness of a surface of workpiece caused by changes in the cutting edge strength of the corner cutting edge or variations of cutting load is prevented.

Abstract: The distribution states of defects are analyzed on the basis of the coordinates of defects detected by an inspection apparatus to classify them into a distribution feature category, or any one of repetitive defect, congestion defect, linear distribution defect, ring/lump distribution defect and random defect. In the manufacturing process for semiconductor substrates, defect distribution states are analyzed on the basis of defect data detected by an inspection apparatus, thereby specifying the cause of defect in apparatus or process.

Abstract: Arrangements for inspecting a specimen on which plural patterns are formed; capturing a first image of a first area; capturing a second image of a second area in which patterns which are essentially the same with the patterns formed in the first area; creating data relating to corresponding pixels of the first and second images, for each pixel; determining a threshold for each pixel for detecting defects directly in accordance with the first and second images; and detecting defects on the specimen by processing the first and second images by using the threshold for each pixel and information of a scattered diagram of brightness of the first and second images, wherein the threshold is determined by using information of brightness of a local region of at least one of the first and second images, with the local region including an aimed pixel and peripheral pixels of the aimed pixel.

Abstract: With the objective of achieving defect kind training in a short period of time to teach classification conditions of defects detected as a result of inspecting a thin film device, according to one aspect of the present invention, there is provided a visual inspection method, and an apparatus therefor, comprising the steps of: detecting defects based on inspection images acquired by optical or electronic defect detection means, and at the same time calculating features of the defects; and classifying the defects according to classification conditions set beforehand, wherein said classification condition setting step further includes the steps of: collecting defect features over a large number of defects acquired beforehand from the defect detection step; sampling defects based on the distribution of the collected defect features over the large number of defects; and setting defect classification conditions based on the result of reviewing the sampled defects.

Abstract: A plurality of chip discharge flutes are located on an outer periphery of a tip portion of the end mill body which rotates on its axis. Helix angles between the axis and the cutting edges in the chip discharge flutes, of which are at least one or more; are different from others. A cross-section perpendicular to the axis shows that a flute bottom face in a main flute portion forms a concavely curved shape from the rake face to a point where the flute bottom face, touches a web thickness circle of the end mill body, forms a linear shape, and goes toward the end mill rotating direction; and a flute bottom face in a sub-flute portion forms a linear shape, intersects with the flute bottom face in the main flute portion at an obtuse angle, goes further toward the end mill rotating direction.

Abstract: A method of inspecting patterns, including: adjusting a brightness of at least one of a first bright field image and a second bright field image detected from a specimen and directed to similar patterns on differing parts of the specimen, so as to more closely match a brightness; comparing the images which are adjusted in brightness to match with each other to detect dissimilarities indicative of a defect of the pattern, wherein in adjusting the brightness, the brightness between the first bright field image and the second bright field image is adjusted by performing a gradation conversion of at least one of the brightness between the first bright field image and the second bright field image; and wherein in the comparing, said defect of the pattern is detected by using information of a scattered diagram of brightness of the first bright field image and the second bright field image.

Abstract: With the objective of achieving defect kind training in a short period of time to teach classification conditions of defects detected as a result of inspecting a thin film device, according to one aspect of the present invention, there is provided a visual inspection method, and an apparatus therefor, comprising the steps of: detecting defects based on inspection images acquired by optical or electronic defect detection means, and at the same time calculating features of the defects; and classifying the defects according to classification conditions set beforehand, wherein said classification condition setting step further includes the steps of: collecting defect features over a large number of defects acquired beforehand from the defect detection step; sampling defects based on the distribution of the collected defect features over the large number of defects; and setting defect classification conditions based on the result of reviewing the sampled defects.

Abstract: In a process for manufacturing a semiconductor wafer, defect distribution state analysis is performed so as to facilitate identification of the defect cause including a device cause and a process cause by classifying the defect distribution state according to the defect position coordinates detected by the inspection device, into one of the distribution characteristic categories: repeated defects, clustered defects, arc-shaped regional defects, radial regional defects, line type regional defects, ring and blob type regional defects, and random defects.

Abstract: A classification model optimum for realization of a defect classification request by a user is not known by the user. Then, the user sets a classification model which is not necessarily suitable and makes classification, resulting in degradation in classification performance. Therefore, the present invention automatically generates plural potential classification models and combines class likelihoods calculated from the plural classification models to classify. To combine, an index about the adequacy of each model, in other words, an index indicating a reliable level of likelihood calculated from the each potential classification model, is also calculated. Considering the calculated result, the class likelihoods calculated from the plural classification models are combined to execute classification.

Abstract: An optical disc recording apparatus (10) is provided with a tracking servo (13) for tracking a spiral track of concave and convex marks, an analog signal processor (14) for extracting a reproduction signal corresponding to the concave and convex marks, a digital signal processor (15) for extracting a channel clock synchronized with a channel bit length of the concave and convex marks, and a sub-information recording section (30) for recording sub-information by irradiating laser light based on the tracking to the spiral track. The sub-information recording section (30) records all the sub-information by repeating a process of recording a part of the sub-information by discretely irradiating laser light at a specified interval and with a specified frequency in synchronism with a channel clock by one tracking to form recordable marks on a reflective film a plurality of times.

Abstract: The invention provides an information recording device, an information reproducing device, and an information recording medium capable of securely protecting copyright of main information, and preventing illegal access to the recorded main information. The information recording device (3) is provided with a medium unique information generating section (9) that generates second sub information by data-converting stamper unique information based on disc identification information that differs for each optical disc after transferring main information and first sub information from a stamper (1?) having the main information and the first sub information recorded therein onto an optical disc (1), and a medium unique information recording section (10) that records the second sub information in the optical disc (1) having recorded therein in advance the main information and the first sub information in a form different from the forms of the main information and the first sub information.

Abstract: A refrigerant transportation hose having excellent flexibility and high resistance to permeation of refrigerant. The refrigerant transportation hose includes an innermost layer formed by using polyamide resin, a low-permeation layer formed on an outer peripheral surface of the innermost layer and rubber layers (of an inner rubber layer and an outer rubber layer) formed on an outer peripheral surface of the low-permeation layer, wherein the low-permeation layer is a resin film in thickness of 5 to 100 ?m made of polyvinyl alcohol having a degree of saponification of not less than 90%.

Abstract: A pattern data examination method and system capable of accurately and speedily examining a circuit pattern without failing to extract pattern contour data are provided. While pattern comparison is ordinarily made by using a secondary electron image, a contour of a pattern element is extracted by using a backscattered electron image said to be suitable for observation and examination of a three dimensional configuration of a pattern element, and pattern inspection is executed by using the extracted contour of the pattern element. More specifically, pattern inspection is executed by comparing a contour of a pattern element with design data such as CAD data to measure a difference between the contour and the data, and by computing, for example, the size of the circuit pattern element from the contour of a pattern.

Abstract: In a process for manufacturing a semiconductor wafer, defect distribution state analysis is performed so as to facilitate identification of the defect cause including a device cause and a process cause by classifying the defect distribution state according to the defect position coordinates detected by the inspection device, into one of the distribution characteristic categories: repeated defects, clustered defects, arc-shaped regional defects, radial regional defects, line type regional defects, ring and blob type regional defects, and random defects.

Abstract: A pattern data examination method and system capable of accurately and speedily examining a circuit pattern without failing to extract pattern contour data are provided. While pattern comparison is ordinarily made by using a secondary electron image, a contour of a pattern element is extracted by using a backscattered electron image said to be suitable for observation and examination of a three dimensional configuration of a pattern element, and pattern inspection is executed by using the extracted contour of the pattern element. More specifically, pattern inspection is executed by comparing a contour of a pattern element with design data such as CAD data to measure a difference between the contour and the data, and by computing, for example, the size of the circuit pattern element from the contour of a pattern.

Abstract: With the objective of achieving defect kind training in a short period of time to teach classification conditions of defects detected as a result of inspecting a thin film device, according to one aspect of the present invention, there is provided a visual inspection method, and an apparatus therefor, comprising the steps of: detecting defects based on inspection images acquired by optical or electronic defect detection means, and at the same time calculating features of the defects; and classifying the defects according to classification conditions set beforehand, wherein said classification condition setting step further includes the steps of: collecting defect features over a large number of defects acquired beforehand from the defect detection step; sampling defects based on the distribution of the collected defect features over the large number of defects; and setting defect classification conditions based on the result of reviewing the sampled defects.

Abstract: A two-dimensional encoder stores data on a holographic memory. The encoder encodes data of k bits (where k is an integer and k?3) into n pixels arranged two-dimensionally (where n is an integer and n?6). The encoder includes a first processing section 31 for classifying the n pixels into first and second groups of subblocks 11 and 12 using k1 bits out of the data of k bits (where k1 is an integer and k1?1). Each of the subblocks 11 in the first group consists of m pixels (where m is an integer and m?2), and the number of the subblocks 11 forming the first group is s1 (where s1 is an integer and s1?2). Each of the subblocks 12 in the second group also consists of m pixels, and the number of the subblocks 12 forming the second group is s2 (where s2 is an integer and s2?1).

Abstract: A recording medium for storing a data stream is comprised of first error correcting codes obtained by encoding first information, second error correcting codes obtained by encoding second information, and synchronization signals. In the data stream, the second error correcting codes and the synchronization signals alternatively interleave the first error correcting codes. The second error correcting codes have the same number of corrections as the first error correcting codes. A code length of the second error correcting codes is shorter than a code length of the first error correcting codes.

Abstract: A composite hose with a corrugated metal tube has a hose body having a corrugated metal tube and an outer layer. The corrugated metal tube includes a non-corrugated straight-walled portion on an end portion thereof, and a rigid insert pipe is inserted in the straight-walled portion. A socket fitting is fitted on the hose body by being swaged thereon radially inwardly, and an inner circumferential end portion of the collar portion and an outer circumferential surface of the insert pipe compress an extending portion of the straight-walled portion to fix the straight-walled portion onto the insert pipe and provide a seal between the outer circumferential surface of the insert pipe and an inner circumferential surface of the straight-walled portion. A fracture preventing mechanism is provided on a hose end portion for preventing fracture of the straight-walled portion.

Abstract: With the objective of achieving defect kind training in a short period of time to teach classification conditions of defects detected as a result of inspecting a thin film device, according to one aspect of the present invention, there is provided a visual inspection method, and an apparatus therefore, comprising the steps of: detecting defects based on inspection images acquired by optical or electronic defect detection means, and at the same time calculating features of the defects; and classifying the defects according to classification conditions set beforehand, wherein said classification condition setting step further includes the steps of: collecting defect features over a large number of defects acquired beforehand from the defect detection step; sampling defects based on the distribution of the collected defect features over the large number of defects; and setting defect classification conditions based on the result of reviewing the sampled defects.